JP2017026506A5 - - Google Patents

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JP2017026506A5
JP2017026506A5 JP2015146359A JP2015146359A JP2017026506A5 JP 2017026506 A5 JP2017026506 A5 JP 2017026506A5 JP 2015146359 A JP2015146359 A JP 2015146359A JP 2015146359 A JP2015146359 A JP 2015146359A JP 2017026506 A5 JP2017026506 A5 JP 2017026506A5
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JP
Japan
Prior art keywords
output value
photodetector
wave number
light
incident
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JP2015146359A
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English (en)
Japanese (ja)
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JP6441759B2 (ja
JP2017026506A (ja
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Priority to JP2015146359A priority Critical patent/JP6441759B2/ja
Priority claimed from JP2015146359A external-priority patent/JP6441759B2/ja
Priority to CN201610577108.6A priority patent/CN106370303B/zh
Priority to EP16180886.0A priority patent/EP3133380B1/en
Priority to US15/218,580 priority patent/US10066992B2/en
Publication of JP2017026506A publication Critical patent/JP2017026506A/ja
Publication of JP2017026506A5 publication Critical patent/JP2017026506A5/ja
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Publication of JP6441759B2 publication Critical patent/JP6441759B2/ja
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JP2015146359A 2015-07-24 2015-07-24 分光分析器に用いられる光検出器の出力補正方法 Active JP6441759B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015146359A JP6441759B2 (ja) 2015-07-24 2015-07-24 分光分析器に用いられる光検出器の出力補正方法
CN201610577108.6A CN106370303B (zh) 2015-07-24 2016-07-20 光检测器的输出修正方法和光谱分析装置或分光器
EP16180886.0A EP3133380B1 (en) 2015-07-24 2016-07-22 Photodetector output correction method used for spectroscopic analyzer or spectroscope, spectroscopic analyzer or spectroscope using this method and program for spectroscopic analyzer or spectroscope instructing this method
US15/218,580 US10066992B2 (en) 2015-07-24 2016-07-25 Photodetector output correction method used for spectroscopic analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015146359A JP6441759B2 (ja) 2015-07-24 2015-07-24 分光分析器に用いられる光検出器の出力補正方法

Publications (3)

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JP2017026506A JP2017026506A (ja) 2017-02-02
JP2017026506A5 true JP2017026506A5 (https=) 2018-08-23
JP6441759B2 JP6441759B2 (ja) 2018-12-19

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JP2015146359A Active JP6441759B2 (ja) 2015-07-24 2015-07-24 分光分析器に用いられる光検出器の出力補正方法

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US (1) US10066992B2 (https=)
EP (1) EP3133380B1 (https=)
JP (1) JP6441759B2 (https=)
CN (1) CN106370303B (https=)

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DE102017110269A1 (de) * 2017-05-11 2018-11-15 B. Braun Avitum Ag Online Linearisierung eines optischen Sensors
JP6863831B2 (ja) * 2017-06-15 2021-04-21 株式会社堀場製作所 光検出器の出力補正用演算式の算出方法、及び光検出器の出力補正方法
WO2019014020A1 (en) 2017-07-14 2019-01-17 Zume, Inc. MULTI-MODAL FOOD PREPARATION IMPLEMENTATION IN VEHICLE, COOKING, AND DISTRIBUTION SYSTEMS AND METHODS
US10436709B2 (en) * 2018-01-19 2019-10-08 Endress+Hauser Conducta Inc. Calibration unit for optical detector
JP7014701B2 (ja) 2018-12-14 2022-02-01 株式会社堀場製作所 光学分析装置、並びに光学分析装置に用いられる機械学習装置及びその方法
GB202006311D0 (en) * 2020-04-29 2020-06-10 Ge Healthcare Bio Sciences Ab Method for calibrating an apparatus for measuring the absorbance of light by a substance
JP7611563B2 (ja) * 2020-12-25 2025-01-10 日本分光株式会社 赤外スペクトル測定装置および濃度測定装置
US12222242B2 (en) * 2022-03-22 2025-02-11 Thermo Electron Scientific Instruments Llc Linearization of mercury cadmium telluride photodetectors
JP2024134721A (ja) * 2023-03-22 2024-10-04 セイコーエプソン株式会社 分光装置および形状測定装置

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JP2797797B2 (ja) * 1991-12-16 1998-09-17 信越半導体株式会社 フーリエ変換赤外分光測定方法
JPH0915156A (ja) * 1995-06-28 1997-01-17 Kdk Corp 分光測定方法及び測定装置
JP3660472B2 (ja) 1997-07-08 2005-06-15 日本分光株式会社 インターフェログラム補正方法
DE19824277C2 (de) * 1998-05-29 2000-03-23 Deutsch Zentr Luft & Raumfahrt Verfahren zur spektroskopischen Untersuchung einer elektromagnetischen Strahlung mittels eines Fourier-Spektrometers
US6359278B1 (en) * 1999-12-29 2002-03-19 Ge Marquette Medical Systems, Inc. Optical stabilization of temperature effects on an infrared gas analyzer
US6512223B1 (en) * 2000-10-16 2003-01-28 Wedgewood Technology, Inc. Photometric detector assembly with internal calibration filters
US7088388B2 (en) * 2001-02-08 2006-08-08 Eastman Kodak Company Method and apparatus for calibrating a sensor for highlights and for processing highlights
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US7316322B2 (en) * 2002-12-24 2008-01-08 Kubota Corporation Quality evaluation apparatus for fruits and vegetables
CN1212259C (zh) * 2003-05-14 2005-07-27 汕头市远东轻化装备有限公司 一种气动牵引展平装置
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PL2634551T3 (pl) * 2010-10-28 2021-11-02 Foss Analytical A/S Interferometr i analizator spektroskopowy z transformacją fouriera
WO2013129519A1 (ja) * 2012-02-29 2013-09-06 国立大学法人香川大学 分光特性測定装置及び分光特性測定方法
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