JP2017003969A - 複合フィルムの欠陥判別方法 - Google Patents

複合フィルムの欠陥判別方法 Download PDF

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Publication number
JP2017003969A
JP2017003969A JP2016086648A JP2016086648A JP2017003969A JP 2017003969 A JP2017003969 A JP 2017003969A JP 2016086648 A JP2016086648 A JP 2016086648A JP 2016086648 A JP2016086648 A JP 2016086648A JP 2017003969 A JP2017003969 A JP 2017003969A
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JP
Japan
Prior art keywords
defect
composite film
film
candidate group
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2016086648A
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English (en)
Japanese (ja)
Inventor
ギュン ホン スン
Seung Gyun Hong
ギュン ホン スン
ファン イオム ドン
Dong-Hwan Eom
ファン イオム ドン
ビュン ジェオン ジョー
Joo-Byung Jeon
ビュン ジェオン ジョー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongwoo Fine Chem Co Ltd
Original Assignee
Dongwoo Fine Chem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongwoo Fine Chem Co Ltd filed Critical Dongwoo Fine Chem Co Ltd
Publication of JP2017003969A publication Critical patent/JP2017003969A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2016086648A 2015-06-11 2016-04-25 複合フィルムの欠陥判別方法 Pending JP2017003969A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2015-0082463 2015-06-11
KR1020150082463A KR101998081B1 (ko) 2015-06-11 2015-06-11 복합 필름의 결함 판별 방법

Publications (1)

Publication Number Publication Date
JP2017003969A true JP2017003969A (ja) 2017-01-05

Family

ID=57626640

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016086648A Pending JP2017003969A (ja) 2015-06-11 2016-04-25 複合フィルムの欠陥判別方法

Country Status (4)

Country Link
JP (1) JP2017003969A (zh)
KR (1) KR101998081B1 (zh)
CN (1) CN106248689B (zh)
TW (1) TW201643412A (zh)

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU671984B2 (en) * 1992-02-18 1996-09-19 Neopath, Inc. Method for identifying objects using data processing techniques
JP2003315278A (ja) * 2002-04-22 2003-11-06 Sekisui Chem Co Ltd フィルム欠陥検査装置
JP2004198163A (ja) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
KR20050029860A (ko) * 2003-09-24 2005-03-29 삼성전자주식회사 보상필름 축틀어짐 측정방법과 그 측정장치
CN100520376C (zh) * 2003-10-21 2009-07-29 大发工业株式会社 表面缺陷检查方法及装置
KR20100024753A (ko) 2008-08-26 2010-03-08 주식회사 에이스 디지텍 라인 형태의 이물 검출방법
KR101659333B1 (ko) * 2012-10-18 2016-09-23 주식회사 엘지화학 광학 필름의 총-피치 측정 시스템
KR20140094941A (ko) * 2013-01-23 2014-07-31 (주)쎄미시스코 불량 검사 시스템 및 방법
KR101315103B1 (ko) * 2013-05-16 2013-10-07 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN103439338B (zh) * 2013-08-30 2015-08-12 无锡金视界科技有限公司 薄膜缺陷分类方法
CN104655628A (zh) * 2013-11-20 2015-05-27 西安交大京盛科技发展有限公司 一种工件镀膜缺陷检测装置
CN104316986B (zh) * 2014-10-26 2017-01-11 昆山乐凯锦富光电科技有限公司 一种反射型偏光增亮扩散复合膜

Also Published As

Publication number Publication date
CN106248689B (zh) 2020-05-05
TW201643412A (zh) 2016-12-16
KR20160145997A (ko) 2016-12-21
KR101998081B1 (ko) 2019-07-09
CN106248689A (zh) 2016-12-21

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