JP2017003969A - Method for discriminating defect of composite film - Google Patents
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Abstract
Description
本発明は、複合フィルムの欠陥判別方法に関する。より詳しくは、製造工程中において、検査不要領域を除くことにより、検査効率を向上させた複合フィルムの欠陥判別方法に関する。 The present invention relates to a defect determination method for a composite film. More specifically, the present invention relates to a method for determining a defect in a composite film in which inspection efficiency is improved by removing an inspection unnecessary region during a manufacturing process.
近年、液晶ディスプレイ、有機発光ディスプレイ、電界放出ディスプレイ（ＦＥＤ）、プラズマ表示パネル（ＰＤＰ）などの様々な画像表示装置が幅広く開発され用いられている。 In recent years, various image display devices such as a liquid crystal display, an organic light emitting display, a field emission display (FED), and a plasma display panel (PDP) have been widely developed and used.
一方、画像表示装置は、製品として出荷する前、製造過程において様々な不良が発生し得るので、複数の検査過程を経ることになる。画像表示装置で最も多用される部品の一つが、偏光フィルム、位相差フィルムなどの複合フィルムであるので、複合フィルムの欠陥は画像表示装置の不良の主な原因の一つである。複合フィルムの欠陥の検出においては、先ず欠陥であるか否かを正確に判定した後、欠陥と判定されると、欠陥による修復（repair）または廃棄、さらには欠陥原因の除去などが製造工程の製造歩留まりの側面から重要である。 On the other hand, since the image display apparatus may have various defects in the manufacturing process before being shipped as a product, it undergoes a plurality of inspection processes. Since one of the most frequently used components in image display devices is a composite film such as a polarizing film and a retardation film, defects in the composite film are one of the main causes of defects in the image display device. In the detection of defects in the composite film, first, it is determined whether or not it is a defect, and if it is determined as a defect, repair or disposal by the defect, and removal of the cause of the defect, etc. This is important in terms of manufacturing yield.
複合フィルムの製造は、工業的な量産のために、通常、ライン工程を用いる。したがって、欠陥の検出は、ラインの特定位置で複合フィルムを連続して撮影し、撮影した部分における欠陥を判別することによって行われる。 The production of the composite film usually uses a line process for industrial mass production. Therefore, the defect is detected by continuously photographing the composite film at a specific position on the line and determining the defect in the photographed portion.
欠陥の判別においては、従来、様々な欠陥を確実に検出するとともに、製造工程で欠陥を検出することにより、製造工程の効率を向上させることが重要であった。これに関し、韓国公開特許第２０１０−２４７５３号（特許文献１）は、異物を含む閉曲線と異物との面積を比較してライン状の異物を判別する方法を開示している。 In the determination of defects, conventionally, it has been important to improve the efficiency of the manufacturing process by reliably detecting various defects and detecting the defects in the manufacturing process. In this regard, Korean Published Patent Application No. 2010-24753 (Patent Document 1) discloses a method of discriminating a line-shaped foreign matter by comparing the areas of a closed curve containing the foreign matter and the foreign matter.
本発明は、工程の効率を大幅に向上させた複合フィルムの欠陥判別方法を提供することを目的とする。 An object of the present invention is to provide a composite film defect discrimination method that greatly improves the efficiency of the process.
また、本発明は、複合フィルムの欠陥を正確に判別する方法を提供することを目的とする。 Another object of the present invention is to provide a method for accurately discriminating defects in a composite film.
１．（Ｓ１）透明基材フィルムの一面に偏光子が接合された複合フィルムの所定領域を撮影した画像から、欠陥候補群領域を選別する段階と、
（Ｓ２）前記欠陥候補群領域から、欠陥が中央に位置する四角形の欠陥候補群の画像を取得し、前記欠陥候補群の画像の４つの頂点部分のそれぞれの平均明るさを測定する段階と、
（Ｓ３）前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさ範囲内である場合、欠陥検査対象から除外する段階と、を含む、複合フィルムの欠陥判別方法。
1. (S1) selecting a defect candidate group region from an image obtained by photographing a predetermined region of a composite film in which a polarizer is bonded to one surface of a transparent substrate film;
(S2) obtaining an image of a rectangular defect candidate group in which a defect is located in the center from the defect candidate group region, and measuring the average brightness of each of the four vertex portions of the defect candidate group image;
(S3) A method of determining a defect in a composite film, comprising: when at least one of the average brightness of the four vertices is within a reference brightness range, excluding it from a defect inspection target.
２．前記項目１において、前記頂点は、欠陥候補群の画像の最外枠部分を除いた残りの部分において決定される、複合フィルムの欠陥判別方法。 2. The composite film defect determination method according to Item 1, wherein the vertex is determined in a remaining portion excluding an outermost frame portion of an image of a defect candidate group.
３．前記項目１において、前記基準明るさ範囲は、透明基材フィルムの正常明るさ範囲である、複合フィルムの欠陥判別方法。 3. The composite film defect determination method according to Item 1, wherein the reference brightness range is a normal brightness range of the transparent base film.
４．前記項目１において、前記（Ｓ３）段階において、前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさの値よりも大きい場合、欠陥検査対象から除外する、複合フィルムの欠陥判別方法。 4). In the item 1, in the step (S3), when at least one of the average brightness of the four vertices is larger than a reference brightness value, the composite film defect determination method is excluded from a defect inspection target. .
５．前記項目１において、前記（Ｓ３）段階において、前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさの値よりも小さい場合、欠陥検査対象から除外する、複合フィルムの欠陥判別方法。 5. In the item 1, in the step (S3), when at least one of the average brightness of the four vertices is smaller than a reference brightness value, the composite film defect determination method is excluded from a defect inspection target. .
６．前記項目１において、前記（Ｓ２）段階の前または（Ｓ３）段階の後に、欠陥検出確定段階をさらに含む、複合フィルムの欠陥判別方法。 6). The composite film defect determination method according to Item 1, further comprising a defect detection confirmation step before the step (S2) or after the step (S3).
７．前記項目１において、前記偏光子は、前記透明基材フィルムよりも大きさが小さい、複合フィルムの欠陥判別方法。 7). In the item 1, the method for discriminating defects of a composite film, wherein the polarizer is smaller in size than the transparent base film.
８．前記項目７において、前記偏光子は、多角形の形状である、複合フィルムの欠陥判別方法。 8). 8. The composite film defect determination method according to item 7, wherein the polarizer has a polygonal shape.
９．前記項目１において、透明基材フィルムに偏光子が接合されるインライン工程で行われる、複合フィルムの欠陥判別方法。 9. In Item 1, the composite film defect determination method is performed in an in-line process in which a polarizer is bonded to a transparent substrate film.
１０．前記項目１において、前記透明基材フィルムは、離型フィルム、保護フィルム、及び位相差フィルムからなる群より選択される、複合フィルムの欠陥判別方法。 10. The composite film defect determination method according to Item 1, wherein the transparent base film is selected from the group consisting of a release film, a protective film, and a retardation film.
本発明の複合フィルムの欠陥判別方法によると、製造工程中で検査不要領域を除くことにより、検査効率を向上させることができる。 According to the defect determination method for a composite film of the present invention, inspection efficiency can be improved by removing an inspection unnecessary region in the manufacturing process.
また、本発明の複合フィルムの欠陥判別方法によると、より正確な欠陥判別により複合フィルムの製造歩留まりを顕著に高めることができ、製造コストを大幅に低減し、資源の浪費も防止できる。 In addition, according to the defect determination method for a composite film of the present invention, the manufacturing yield of the composite film can be remarkably increased by more accurate defect determination, the manufacturing cost can be greatly reduced, and the waste of resources can be prevented.
本発明は、複合フィルムの欠陥判別方法に関する。より詳しくは、（Ｓ１）透明基材フィルムの一面に偏光子が接合された複合フィルムの所定領域を撮影した画像から、欠陥候補群領域を選別する段階と、（Ｓ２）前記欠陥候補群領域から、欠陥が中央に位置する四角形の欠陥候補群の画像を取得し、前記欠陥候補群の画像の４つの頂点部分のそれぞれの平均明るさを測定する段階と、（Ｓ３）前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさ範囲内である場合、欠陥検査対象から除外する段階と、を含むことにより、製造工程中で検査不要領域を除いて欠陥判別工程の効率を向上させるとともに、欠陥判別の正確性を大幅に向上させた、複合フィルムの欠陥判別方法に関する。 The present invention relates to a defect determination method for a composite film. More specifically, (S1) selecting a defect candidate group area from an image obtained by photographing a predetermined area of a composite film in which a polarizer is bonded to one surface of a transparent substrate film, and (S2) from the defect candidate group area Obtaining an image of a rectangular defect candidate group in which the defect is located in the center and measuring an average brightness of each of the four vertex portions of the defect candidate group image; and (S3) averaging the four vertices When at least one of the brightness values is within the reference brightness range, the step of excluding the defect from the defect inspection target is included, thereby improving the efficiency of the defect determination process by excluding the inspection unnecessary area in the manufacturing process. In addition, the present invention relates to a composite film defect determination method that greatly improves the accuracy of defect determination.
通常、光学フィルムの製造は、連続する工程、例えばロール・ツー・ロール（Ｒｏｌｌ−ｔｏ−Ｒｏｌｌ）工程により移送されて行われる。このため、光学フィルムの欠陥を判別するためには、一定方向に移送される光学フィルムの上部で光学フィルムを撮影して画像を取得し、その画像を既に設定された欠陥基準値（明るさ、大きさ等）と比較する工程を行うことになる。 In general, the optical film is manufactured by being transferred by a continuous process, for example, a roll-to-roll process. For this reason, in order to determine the defect of the optical film, an image is obtained by photographing the optical film on the upper part of the optical film transported in a certain direction, and the image is set to a defect reference value (brightness, The size and the like are compared with each other.
しかし、製品として要求される光学フィルムが、互いに異なる２種以上の光学機能性フィルムの積層体（例えば、透明基材フィルムと偏光子との複合フィルム）である場合に、いずれか一つの光学機能性フィルムが様々な形状に設けられる場合があるが、この際、欠陥の判別時に検査不要領域の画像が取得され得る。検査不要領域は、製品に使用されない領域などであり、この領域に欠陥判別工程が行われると、工程の効率が著しく低下することになる。そこで、本発明は、欠陥検査不要領域を除く工程を行うことにより、欠陥判別段階の効率を大幅に向上させるとともに、欠陥判別の正確性をさらに向上させることができる。 However, when the optical film required as a product is a laminate of two or more different optical functional films (for example, a composite film of a transparent substrate film and a polarizer), any one optical function In some cases, the protective film may be provided in various shapes, and in this case, an image of the inspection unnecessary region can be acquired when determining the defect. The inspection unnecessary area is an area that is not used for a product. If a defect determination process is performed in this area, the efficiency of the process is significantly reduced. Therefore, the present invention can greatly improve the efficiency of the defect determination stage and further improve the accuracy of defect determination by performing the process of removing the defect inspection unnecessary region.
以下では、図面を参照して本発明をより詳細に説明する。図１は、本発明の一実施形態に係る複合フィルムの欠陥判別方法のフローチャートを概略的に示す図である。 Hereinafter, the present invention will be described in more detail with reference to the drawings. FIG. 1 is a diagram schematically showing a flowchart of a composite film defect determination method according to an embodiment of the present invention.
本発明において、欠陥判別対象である複合フィルムは、透明基材フィルムの一面に偏光子が接合されている複合フィルムであることとする。 In the present invention, the composite film that is a defect discrimination target is a composite film in which a polarizer is bonded to one surface of a transparent substrate film.
まず、透明基材フィルムの一面に偏光子が接合された複合フィルムの所定領域を撮影した画像から、欠陥候補群領域を選別する（（Ｓ１）段階）。 First, a defect candidate group region is selected from an image obtained by photographing a predetermined region of a composite film in which a polarizer is bonded to one surface of a transparent substrate film (step (S1)).
本発明において、欠陥候補群領域とは、複合フィルムの平均的な均一性から逸脱する部分であり、後述する欠陥検出確定段階により、不良と判別される不良欠陥を含む領域と、良品と判別される良品欠陥を含む領域との両方を意味する。 In the present invention, the defect candidate group region is a portion deviating from the average uniformity of the composite film, and is determined to be a non-defective product from a region including a defective defect that is determined to be defective by a defect detection confirmation stage described later. It means both the area containing the defective product.
本発明において、前記欠陥候補群領域の選別方法は、特に限定されないが、例えば、透明基材フィルムの一面に偏光子が接合された複合フィルムの所定領域を撮影して画像を取得し、取得した画像において、既に設定された複合フィルムの平均的な均一性を逸脱する部分（欠陥候補群）を含む領域の画像を、検査対象の複合フィルムの具体的な種類及び用途に応じて、予め定められた基準によって画像処理ソフトウェアなどを用いて行うことができる。 In the present invention, the method for selecting the defect candidate group region is not particularly limited. For example, a predetermined region of a composite film in which a polarizer is bonded to one surface of a transparent base film is photographed to obtain an image. In the image, an image of a region including a portion (defect candidate group) that deviates from the average uniformity of the composite film that has been set is determined in advance according to the specific type and application of the composite film to be inspected. Depending on the standard, image processing software can be used.
本発明は、前記（Ｓ１）段階で選別された欠陥候補群領域から、欠陥が中央に位置する四角形の欠陥候補群の画像を取得し、前記欠陥候補群の画像の４つの頂点部分のそれぞれの平均明るさを測定する（（Ｓ２）段階）。 The present invention acquires an image of a rectangular defect candidate group in which a defect is located in the center from the defect candidate group region selected in the step (S1), and each of the four vertex portions of the image of the defect candidate group. Average brightness is measured (step (S2)).
本発明に係る複合フィルムは、透明基材フィルムと偏光子との両方が積層された部分のみが製品として生産されるため、製造工程中で、透明基材フィルムの上部に偏光子が様々な形状に形成され、透明基材フィルムのみが存在する部分は後で除去される。したがって、透明基材フィルムのみが存在する領域に欠陥が存在する場合、前記部分は、欠陥判別不要領域となる。 In the composite film according to the present invention, since only a portion where both the transparent base film and the polarizer are laminated is produced as a product, the polarizer has various shapes on the transparent base film in the manufacturing process. The portion where only the transparent base film is present is removed later. Therefore, when a defect exists in the area where only the transparent base film is present, the portion becomes a defect determination unnecessary area.
したがって、（Ｓ１）段階で選別された欠陥候補群領域から、偏光子が接合されていない、透明基材フィルムのみが形成されている部分を予め除くと（（Ｓ２）及び（Ｓ３）段階）、欠陥判別工程の効率を向上させるとともに、欠陥判別の正確性を向上させることができる。 Therefore, if the portion where only the transparent base film is formed, in which the polarizer is not bonded, is formed from the defect candidate group region selected in the step (S1) (steps (S2) and (S3)), It is possible to improve the efficiency of the defect discrimination process and improve the accuracy of the defect discrimination.
また、本発明による複合フィルムの枠部分は、工程上のマージンであり、後で除去される部分である。このことから、偏光子の末端に隣接する欠陥は、製品に含まれないので、前記部分もまた欠陥判別不要領域となる。 Further, the frame portion of the composite film according to the present invention is a margin in the process and is a portion to be removed later. For this reason, since the defect adjacent to the end of the polarizer is not included in the product, the portion also becomes a defect determination unnecessary region.
したがって、（Ｓ１）段階で選別された欠陥候補群領域から、透明基材フィルムのみが形成されている部分との境界である部分を予め除くと（（Ｓ２）及び（Ｓ３）段階）、欠陥判別工程の効率を向上させるとともに、欠陥判別の正確性を向上させることができる。 Therefore, if the part which is a boundary with the part in which only the transparent base film is formed is previously removed from the defect candidate group region selected in the step (S1) (steps (S2) and (S3)), defect determination is performed. While improving the efficiency of a process, the accuracy of defect discrimination can be improved.
前述のように、前記欠陥は良品欠陥と不良欠陥との両方を含むものである。欠陥が中央に位置するようにして取得した四角形の欠陥候補群の画像には、欠陥が偏光子の内部に形成されている場合と、欠陥が透明基材フィルムのみが形成されている所に形成されている場合と、透明基材フィルムのみが形成された所と偏光子とともに積層された部分との境界面に形成されている場合とが全て含まれる。 As described above, the defect includes both non-defective defects and defective defects. In the image of the rectangular defect candidate group acquired with the defect positioned in the center, the defect is formed in the polarizer and when the defect is formed only on the transparent substrate film. The case where it is formed, and the case where it is formed in the boundary surface of the part laminated | stacked with the polarizer and the place where only the transparent base film was formed are included.
本発明の他の一実施形態によると、図２に示すように、前記頂点は、欠陥候補群の画像の最外枠部分を除いた残りの部分において決定することができる。 According to another embodiment of the present invention, as shown in FIG. 2, the vertices can be determined in the remaining portion excluding the outermost frame portion of the defect candidate group image.
撮影後、画像を取得する段階において、カメラのレンズの形状、ノイズの発生等により画像の最外枠部分に歪みが発生することがある。これを考慮し、欠陥候補群の画像の最外枠部分（ピクセル）を除いた残りの部分において頂点を決定すると、前記した問題を防止でき、欠陥判定の正確性をさらに向上できる。 At the stage of acquiring an image after shooting, distortion may occur in the outermost frame portion of the image due to the shape of the lens of the camera, the generation of noise, and the like. Considering this, if the vertices are determined in the remaining portion excluding the outermost frame portion (pixel) of the image of the defect candidate group, the above-described problem can be prevented and the accuracy of the defect determination can be further improved.
次に、前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさ範囲内である場合、欠陥検査対象から除外する（（Ｓ３）段階）。 Next, if at least one of the average brightness of the four vertices is within the reference brightness range, it is excluded from the defect inspection target (step (S3)).
本発明において、基準明るさ範囲とは、欠陥判別工程が不要な領域として既に設定された明るさ範囲を意味し、例えば、偏光子が形成されていない透明基材フィルムの正常明るさ範囲を意味し得る。 In the present invention, the reference brightness range means a brightness range that has already been set as an area that does not require a defect determination step, such as a normal brightness range of a transparent base film in which a polarizer is not formed. Can do.
前記欠陥候補群の画像は、四角形に形成されるため、欠陥が、透明基材フィルムのみが積層された所に形成されるか、または透明基材フィルムのみが形成された部分と偏光子が積層された部分との境界付近に形成される場合、前記四角形の４つの頂点の少なくとも一つは、透明基材フィルムの撮影画像領域となる（図３参照）。したがって、４つの頂点の少なくとも一つが基準明るさ範囲内である場合、欠陥検査対象から除外することにより、欠陥判別の効率を向上させることができる。 Since the image of the defect candidate group is formed in a quadrangle, the defect is formed where only the transparent substrate film is laminated, or the portion where only the transparent substrate film is formed and the polarizer are laminated. When formed in the vicinity of the boundary with the formed portion, at least one of the four vertices of the quadrangle becomes a captured image region of the transparent base film (see FIG. 3). Therefore, when at least one of the four vertices is within the reference brightness range, it is possible to improve the efficiency of defect determination by excluding it from the defect inspection target.
本発明において、前記基準明るさ範囲は、用いられる透明基材フィルムの種類に応じて多様に設定できる。このため、本発明の他の一実施形態によると、透明基材フィルムの正常明るさ範囲が偏光子の正常明るさ範囲よりも大きい場合に、前記（Ｓ３）段階は、４つの頂点の平均明るさのうちの少なくとも一つが基準明るさの値よりも大きい場合、欠陥検査対象から除外する工程により行うことができる。 In the present invention, the reference brightness range can be variously set according to the type of the transparent base film used. For this reason, according to another embodiment of the present invention, when the normal brightness range of the transparent substrate film is larger than the normal brightness range of the polarizer, the step (S3) includes the average brightness of the four vertices. If at least one of the values is larger than the reference brightness value, it can be performed by a step of excluding the defect from the defect inspection target.
また、本発明の他の一実施形態によると、透明基材フィルムの正常明るさ範囲が偏光子の正常明るさ範囲よりも小さい場合に、前記（Ｓ３）段階は、４つの頂点の平均明るさのうちの少なくとも一つが基準明るさの値よりも小さい場合、欠陥検査対象から除外する工程により行うことができる。 According to another embodiment of the present invention, when the normal brightness range of the transparent substrate film is smaller than the normal brightness range of the polarizer, the step (S3) includes the average brightness of the four vertices. If at least one of the values is smaller than the reference brightness value, it can be performed by a step of excluding it from the defect inspection target.
本発明で使用可能な透明基材フィルムの種類としては、特に限定されないが、例えば、離型フィルム、保護フィルム、位相差フィルムなどが挙げられる。 Although it does not specifically limit as a kind of transparent base film which can be used by this invention, For example, a release film, a protective film, retardation film etc. are mentioned.
本発明の一実施形態によると、工程の効率を向上させるために、透明基材フィルムに偏光子が接合されるインライン工程で欠陥判別工程を行うことができる。 According to an embodiment of the present invention, in order to improve the efficiency of the process, the defect determination process can be performed in an inline process in which a polarizer is bonded to the transparent substrate film.
また、本発明による偏光子は、透明基材フィルムよりも大きさが小さいものであってもよく、その形状は特に限定されないが、例えば、三角形、四角形、五角形、六角形などの多角形形状であってもよい。これは、本発明の複合フィルムの欠陥判別方法は、工程の効率向上のために、透明基材フィルムに偏光子が接合されるインライン工程で行われる場合にパターン状に偏光子が形成されるからである。 Further, the polarizer according to the present invention may be smaller in size than the transparent base film, and the shape thereof is not particularly limited. There may be. This is because, in the composite film defect determination method of the present invention, in order to improve the efficiency of the process, the polarizer is formed in a pattern when it is performed in an inline process in which the polarizer is bonded to the transparent substrate film. It is.
本発明の一実施形態によると、（Ｓ２）段階の前または（Ｓ３）段階の後に、欠陥検出確定段階をさらに含むことができる。 According to an embodiment of the present invention, a defect detection confirmation step may be further included before the step (S2) or after the step (S3).
欠陥検出確定段階は、欠陥候補群領域に含まれている欠陥が、不良に該当する欠陥であるか、良品に該当する欠陥であるかを判断する段階である。この判断は、検査対象の複合フィルムの具体的な種類及び用途に応じて予め定められた基準によって、画像処理ソフトウェアなどを用いて行うことができる。 The defect detection confirmation step is a step of determining whether a defect included in the defect candidate group region is a defect corresponding to a defect or a defect corresponding to a non-defective product. This determination can be made using image processing software or the like according to a predetermined standard according to the specific type and application of the composite film to be inspected.
（Ｓ２）段階の前に欠陥検出確定段階を行うと、確定された欠陥から検査不要領域の欠陥を除くことにより、欠陥判別の正確性を向上させることができる。また、（Ｓ３）段階の後に欠陥検出確定段階を行うと、検査不要領域を除いた部分のみにおいて検出確定段階を行うので、欠陥判別の正確性及び欠陥判別工程の効率をさらに向上できる。 When the defect detection confirmation step is performed before the step (S2), the accuracy of defect determination can be improved by removing the defect in the inspection unnecessary region from the confirmed defect. In addition, when the defect detection confirmation step is performed after the step (S3), the detection confirmation step is performed only in the portion excluding the inspection unnecessary region, so that the accuracy of defect determination and the efficiency of the defect determination step can be further improved.
欠陥検出確定段階を行う方法は、特に限定されず、当分野で知られている方法であれば制限なく採用できる。 The method for performing the defect detection confirmation stage is not particularly limited, and any method known in the art can be used without limitation.
以下、本発明の理解を助けるために好適な実施例を提示するが、下記実施例は、本発明を例示するものに過ぎず、本発明の範疇及び技術思想の範囲内で様々な変更及び修正が可能なことは、当業者にとって明らかであり、このような変形及び修正が添付の特許請求の範囲に属することも当然のことである。 Hereinafter, preferred examples are presented to help understanding of the present invention. However, the following examples are merely illustrative of the present invention, and various changes and modifications may be made within the scope and technical idea of the present invention. It will be apparent to those skilled in the art that such changes and modifications are within the scope of the appended claims.
実施例１
ＣＯＰ透明基材フィルムの上部に、ロール・ツー・ロール工程により前記透明基材フィルムの大きさよりも小さい偏光子を接合した後、欠陥候補群領域を選別した。その後、前記欠陥候補群領域から欠陥が中央に位置するようにして１００×１００ピクセルの大きさの欠陥候補群の画像を取得し、前記画像の最外枠の１ピクセルを除いた後、前記画像の各頂点の２×２ピクセル部分の平均明るさを測定した。前記測定した頂点の明るさのうちの少なくとも一つが１０５Ｇｒｅｙ以上の場合、欠陥検査対象から除外した後、残りの欠陥候補群の画像に対して欠陥検出確定段階を行った。
Example 1
After a polarizer smaller than the size of the transparent substrate film was bonded to the upper portion of the COP transparent substrate film by a roll-to-roll process, defect candidate group regions were selected. Thereafter, an image of a defect candidate group having a size of 100 × 100 pixels is obtained from the defect candidate group region so that the defect is located in the center, and after removing one pixel of the outermost frame of the image, the image The average brightness of the 2 × 2 pixel portion of each vertex was measured. When at least one of the measured brightnesses of vertices is 105 Gray or more, the defect detection confirmation step is performed on the remaining defect candidate group images after exclusion from the defect inspection target.
比較例１
実施例による欠陥検査対象の除外工程を行うことなく、欠陥候補群の画像全体に対して欠陥検出確定段階を行った。
Comparative Example 1
The defect detection confirmation stage was performed on the entire image of the defect candidate group without performing the defect inspection target exclusion process according to the example.
評価方法及び評価結果
前記実施例１及び比較例１に基づいて欠陥を測定した後、実際の欠陥検査必要領域、及び欠陥検査不要領域との境界領域における欠陥を図３に示す。図４に示されるように、本発明に係る欠陥判定方法を行った実施例１の場合、欠陥検査必要領域に対してのみ欠陥を判別する工程を行ったことが確認できた。これに対して、比較例１の場合は、欠陥検査不要領域とその境界領域との全てに対して欠陥を判別する工程を行い、検査効率が顕著に低下したことが確認できた。
Evaluation method and evaluation results After measuring the defects based on Example 1 and Comparative Example 1, the defects in the boundary area between the actual defect inspection necessary area and the defect inspection unnecessary area are shown in FIG. As shown in FIG. 4, in the case of Example 1 in which the defect determination method according to the present invention was performed, it was confirmed that the step of determining the defect was performed only on the defect inspection necessary region. On the other hand, in the case of Comparative Example 1, it was confirmed that the inspection efficiency was remarkably lowered by performing a process of determining defects for all of the defect inspection unnecessary area and the boundary area.
Claims (10)
（Ｓ２）前記欠陥候補群領域から、欠陥が中央に位置する四角形の欠陥候補群の画像を取得し、前記欠陥候補群の画像の４つの頂点部分のそれぞれの平均明るさを測定する段階と、
（Ｓ３）前記４つの頂点の平均明るさのうちの少なくとも一つが、基準明るさ範囲内である場合、欠陥検査対象から除外する段階と、を含む、複合フィルムの欠陥判別方法。 (S1) selecting a defect candidate group region from an image obtained by photographing a predetermined region of a composite film in which a polarizer is bonded to one surface of a transparent substrate film;
(S2) obtaining an image of a rectangular defect candidate group in which a defect is located in the center from the defect candidate group region, and measuring the average brightness of each of the four vertex portions of the defect candidate group image;
(S3) A method of determining a defect in a composite film, comprising: when at least one of the average brightness of the four vertices is within a reference brightness range, excluding it from a defect inspection target.
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| JP2003315278A (en) * | 2002-04-22 | 2003-11-06 | Sekisui Chem Co Ltd | Defect inspection device for film |
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