JP2017003482A5 - - Google Patents

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Publication number
JP2017003482A5
JP2017003482A5 JP2015118980A JP2015118980A JP2017003482A5 JP 2017003482 A5 JP2017003482 A5 JP 2017003482A5 JP 2015118980 A JP2015118980 A JP 2015118980A JP 2015118980 A JP2015118980 A JP 2015118980A JP 2017003482 A5 JP2017003482 A5 JP 2017003482A5
Authority
JP
Japan
Prior art keywords
cell
hole
central axis
measuring device
body portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015118980A
Other languages
English (en)
Japanese (ja)
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JP2017003482A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2015118980A priority Critical patent/JP2017003482A/ja
Priority claimed from JP2015118980A external-priority patent/JP2017003482A/ja
Priority to CN201680031407.8A priority patent/CN107735669A/zh
Priority to PCT/JP2016/066165 priority patent/WO2016199636A1/ja
Publication of JP2017003482A publication Critical patent/JP2017003482A/ja
Priority to US15/823,963 priority patent/US10466226B2/en
Publication of JP2017003482A5 publication Critical patent/JP2017003482A5/ja
Pending legal-status Critical Current

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JP2015118980A 2015-06-12 2015-06-12 測定装置 Pending JP2017003482A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015118980A JP2017003482A (ja) 2015-06-12 2015-06-12 測定装置
CN201680031407.8A CN107735669A (zh) 2015-06-12 2016-06-01 测定装置
PCT/JP2016/066165 WO2016199636A1 (ja) 2015-06-12 2016-06-01 測定装置
US15/823,963 US10466226B2 (en) 2015-06-12 2017-11-28 Measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015118980A JP2017003482A (ja) 2015-06-12 2015-06-12 測定装置

Publications (2)

Publication Number Publication Date
JP2017003482A JP2017003482A (ja) 2017-01-05
JP2017003482A5 true JP2017003482A5 (https=) 2018-08-16

Family

ID=57503446

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015118980A Pending JP2017003482A (ja) 2015-06-12 2015-06-12 測定装置

Country Status (4)

Country Link
US (1) US10466226B2 (https=)
JP (1) JP2017003482A (https=)
CN (1) CN107735669A (https=)
WO (1) WO2016199636A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BR112014004797B1 (pt) 2011-10-17 2022-02-15 Kabushiki Kaisha Toshiba Método de decodificação
CN112485164A (zh) * 2019-09-12 2021-03-12 雅玛信过滤器株式会社 测定装置
CN111272986B (zh) * 2020-04-08 2020-10-30 山东鼎程化工科技有限公司 一种液压阀内液压油酸性检测设备
US11733144B2 (en) * 2020-12-14 2023-08-22 Caterpillar Inc. Convertible housing assembly for a particle sensor
US11674536B2 (en) 2020-12-14 2023-06-13 Caterpillar Inc. Guide element for hydraulic fluid
JP7813177B2 (ja) * 2022-04-13 2026-02-12 大塚電子株式会社 ゼータ電位測定用治具セット
USD1098934S1 (en) * 2023-10-19 2025-10-21 Dongwoo Fine-Chem Co., Ltd. Device for measuring particles

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4260258A (en) * 1978-08-14 1981-04-07 Pacific Scientific Company Compact, rugged sensor for optical measurement of the size of particles suspended in a fluid
JPH0336914Y2 (https=) * 1985-05-17 1991-08-05
US4739177A (en) 1985-12-11 1988-04-19 High Yield Technology Light scattering particle detector for wafer processing equipment
DE3674576D1 (de) 1985-12-10 1990-10-31 High Yield Technology Teilchenerfasser fuer waferbearbeitungsgeraet und verfahren zur erfassung eines teilchens.
USRE33213E (en) 1985-12-10 1990-05-08 High Yield Technology Light scattering particle detector for wafer processing equipment
JPS62215843A (ja) * 1985-12-10 1987-09-22 ハイ　イ−ルド　テクノロジ− ウエハ処理装置用の粒子検出器
JPH0533951Y2 (https=) * 1986-01-27 1993-08-27
JPS6395341A (ja) * 1986-10-13 1988-04-26 Kowa Co 液中微粒子測定装置
JP4909288B2 (ja) * 2008-01-10 2012-04-04 日本電信電話株式会社 浮遊粒子状物質測定装置
JP2013142626A (ja) * 2012-01-11 2013-07-22 Yamashin-Filter Corp 不純物粒子測定装置

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