JP2016535258A5 - - Google Patents

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JP2016535258A5
JP2016535258A5 JP2016525899A JP2016525899A JP2016535258A5 JP 2016535258 A5 JP2016535258 A5 JP 2016535258A5 JP 2016525899 A JP2016525899 A JP 2016525899A JP 2016525899 A JP2016525899 A JP 2016525899A JP 2016535258 A5 JP2016535258 A5 JP 2016535258A5
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image
uniformity
interest
region
target
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JP2016525899A
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JP2016535258A (ja
JP6506274B2 (ja
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Priority claimed from PCT/US2014/060898 external-priority patent/WO2015065726A1/en
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Publication of JP2016535258A5 publication Critical patent/JP2016535258A5/ja
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JP2016525899A 2013-10-31 2014-10-16 材料のマルチスケール均一性分析 Active JP6506274B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361898304P 2013-10-31 2013-10-31
US61/898,304 2013-10-31
PCT/US2014/060898 WO2015065726A1 (en) 2013-10-31 2014-10-16 Multiscale uniformity analysis of a material

Publications (3)

Publication Number Publication Date
JP2016535258A JP2016535258A (ja) 2016-11-10
JP2016535258A5 true JP2016535258A5 (https=) 2017-10-05
JP6506274B2 JP6506274B2 (ja) 2019-04-24

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JP2016525899A Active JP6506274B2 (ja) 2013-10-31 2014-10-16 材料のマルチスケール均一性分析

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US (1) US9841383B2 (https=)
EP (1) EP3063495A4 (https=)
JP (1) JP6506274B2 (https=)
CN (1) CN105683704B (https=)
WO (1) WO2015065726A1 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10488184B2 (en) 2015-07-13 2019-11-26 Nanometrics Incorporated Interferometric characterization of surface topography
RU2733102C2 (ru) 2016-11-23 2020-09-29 Айбиэс Оф Америка Система контроля бумагоделательной машины
CN108362702A (zh) * 2017-12-14 2018-08-03 北京木业邦科技有限公司 一种基于人工智能的单板缺陷检测方法、系统及设备
EP3502637A1 (en) * 2017-12-23 2019-06-26 ABB Schweiz AG Method and system for real-time web manufacturing supervision
DE102018108696B4 (de) * 2018-04-12 2024-05-02 Ims Messsysteme Gmbh Anordnung und Verfahren zum berührungslosen Bestimmen einer Abmessung einer bewegten Materialbahn
CN108548781B (zh) * 2018-04-17 2021-03-16 郑州磨料磨具磨削研究所有限公司 一种砂轮混料均匀性图像检测方法及装置
CN109001248B (zh) * 2018-06-26 2020-10-02 哈尔滨工业大学 一种基于图像信息熵的沥青混合料冻融损伤评价方法
WO2020047177A1 (en) * 2018-08-28 2020-03-05 Essenlix Corporation Assay accuracy improvement
CN112912717A (zh) * 2018-11-14 2021-06-04 3M创新有限公司 用于表征表面均匀度的方法和系统
CN110672621B (zh) * 2019-10-10 2021-03-05 清华大学 基于光照亮度调整的汽车涂装表面缺陷图像质量优化方法
CN111115028B (zh) * 2019-12-17 2022-04-05 山东交通学院 一种用于涂料检测的连续式进料装置
US11920299B2 (en) 2020-03-06 2024-03-05 Ibs Of America Formation detection system and a process of controlling
JP7734485B2 (ja) * 2020-12-24 2025-09-05 ニッタ・デュポン株式会社 研磨布
CN113671128B (zh) * 2021-08-20 2023-07-11 河北创谱金属材料试验发展有限公司 一种材料均匀性的评价方法
US20230186454A1 (en) * 2021-12-13 2023-06-15 Valco Cincinnati, Inc. Machine vision system for inspecting quality of various non-woven materials
JP2024046288A (ja) * 2022-09-22 2024-04-03 株式会社Screenホールディングス 撮像装置
CN116862917B (zh) * 2023-09-05 2023-11-24 微山县振龙纺织品有限公司 一种纺织品表面质量检测方法及系统
WO2025120405A1 (en) 2023-12-04 2025-06-12 3M Innovative Properties Company Methods of inspecting a curved object and inspection systems
CN118196599A (zh) * 2024-04-29 2024-06-14 南京泽捷辰科技有限公司 配电箱体材料均匀等级识别系统
CN119510399B (zh) * 2024-10-30 2025-08-05 泸州老窖股份有限公司 在线检测加曲均匀度方法及系统

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2999679B2 (ja) * 1994-11-30 2000-01-17 大日本スクリーン製造株式会社 パターン欠陥検査装置
JP2800726B2 (ja) * 1995-07-10 1998-09-21 東洋紡績株式会社 織布の検反装置
US5825501A (en) * 1997-03-14 1998-10-20 Lockheed Martin Energy Systems, Inc. Structure and yarn sensor for fabric
JPH1194767A (ja) 1997-09-19 1999-04-09 Omron Corp 地合検査方法および装置
US6301373B1 (en) 1998-10-01 2001-10-09 Mcgill University Paper quality determination and control using scale of formation data
US6239554B1 (en) 1999-12-30 2001-05-29 Mitutoyo Corporation Open-loop light intensity calibration systems and methods
JP2001266122A (ja) * 2000-03-17 2001-09-28 Dainippon Printing Co Ltd 色ムラ欠陥検査方法及び装置
JP3720714B2 (ja) * 2001-01-31 2005-11-30 日本バイリーン株式会社 被測定物の状態評価方法および状態評価装置
CN1176375C (zh) * 2002-01-14 2004-11-17 东华大学 织物起球等级的客观评估系统
US20050004956A1 (en) 2003-07-02 2005-01-06 North Carolina State University Optical method for evaluating surface and physical properties of structures made wholly or partially from fibers, films, polymers or a combination thereof
CN101103246B (zh) * 2004-11-19 2010-05-12 大赛璐化学工业株式会社 自动判别系统
JP4165580B2 (ja) * 2006-06-29 2008-10-15 トヨタ自動車株式会社 画像処理装置及び画像処理プログラム
CN101226108B (zh) * 2007-01-19 2010-12-22 中国农业机械化科学研究院 一种雾滴分布均匀度的检测方法
CN100578179C (zh) * 2007-08-21 2010-01-06 友达光电(苏州)有限公司 测量发光画面亮度均匀性的方法
TW200951878A (en) 2008-06-02 2009-12-16 Wu-Ja Lin Intensity correction for backlight modules under different inspection angles
TWI384159B (zh) 2009-12-25 2013-02-01 Ability Entpr Co Ltd 校準光源的方法
KR20130139287A (ko) * 2010-10-19 2013-12-20 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화
BR112013020467A2 (pt) * 2011-02-24 2016-10-25 3M Innovative Properties Co sistema para detecção de não uniformidades em materiais à base de manta
US20120327214A1 (en) * 2011-06-21 2012-12-27 HNJ Solutions, Inc. System and method for image calibration
CN103827917B (zh) 2011-07-25 2017-06-09 科英布拉大学 用于使用棋盘图案的一幅或多幅图像的自动相机校准的方法和装置
US8542297B2 (en) 2011-08-05 2013-09-24 Quality Vision International, Inc. Method for automatically adjusting the levels of illumination sources in an optical measurement machine
US8553228B2 (en) 2011-09-30 2013-10-08 3M Innovative Properties Company Web inspection calibration system and related methods
KR101888960B1 (ko) * 2011-10-06 2018-08-17 엘지이노텍 주식회사 도로 평탄도 측정 장치 및 방법

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