JP2016528749A5 - - Google Patents

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Publication number
JP2016528749A5
JP2016528749A5 JP2016513473A JP2016513473A JP2016528749A5 JP 2016528749 A5 JP2016528749 A5 JP 2016528749A5 JP 2016513473 A JP2016513473 A JP 2016513473A JP 2016513473 A JP2016513473 A JP 2016513473A JP 2016528749 A5 JP2016528749 A5 JP 2016528749A5
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JP
Japan
Prior art keywords
current
frequency converter
silicon
dark current
phototransistor
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JP2016513473A
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English (en)
Japanese (ja)
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JP6243518B2 (ja
JP2016528749A (ja
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Priority claimed from PCT/IB2014/061263 external-priority patent/WO2014184714A1/en
Publication of JP2016528749A publication Critical patent/JP2016528749A/ja
Publication of JP2016528749A5 publication Critical patent/JP2016528749A5/ja
Application granted granted Critical
Publication of JP6243518B2 publication Critical patent/JP6243518B2/ja
Active legal-status Critical Current
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JP2016513473A 2013-05-16 2014-05-07 イメージング検出器 Active JP6243518B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361824020P 2013-05-16 2013-05-16
US61/824,020 2013-05-16
PCT/IB2014/061263 WO2014184714A1 (en) 2013-05-16 2014-05-07 Imaging detector

Publications (3)

Publication Number Publication Date
JP2016528749A JP2016528749A (ja) 2016-09-15
JP2016528749A5 true JP2016528749A5 (enExample) 2017-08-03
JP6243518B2 JP6243518B2 (ja) 2017-12-06

Family

ID=50841915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016513473A Active JP6243518B2 (ja) 2013-05-16 2014-05-07 イメージング検出器

Country Status (8)

Country Link
US (1) US9538107B2 (enExample)
EP (1) EP2997397B1 (enExample)
JP (1) JP6243518B2 (enExample)
KR (1) KR20160010552A (enExample)
CN (1) CN105209932B (enExample)
BR (1) BR112015028336A2 (enExample)
RU (1) RU2015153566A (enExample)
WO (1) WO2014184714A1 (enExample)

Families Citing this family (19)

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CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
JP6257916B2 (ja) * 2013-04-26 2018-01-10 東芝メディカルシステムズ株式会社 光検出装置、放射線検出装置、放射線分析装置及び光検出方法
JP2014230600A (ja) * 2013-05-28 2014-12-11 株式会社東芝 Ｘ線ｃｔ装置およびｘ線ｃｔ装置用ｘ線検出器
EP2871496B1 (en) 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
EP3143430B1 (en) * 2014-10-31 2018-01-10 Koninklijke Philips N.V. Sensor device and imaging system for detecting radiation signals
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
EP3482231B1 (en) * 2016-07-05 2022-09-07 Shenzhen Xpectvision Technology Co., Ltd. Bonding of materials with dissimilar coefficients of thermal expansion
US10107921B1 (en) 2016-09-08 2018-10-23 Koninklijke Philips N.V. Radiation detector and X-ray imaging system
CN109716165B (zh) * 2016-10-27 2022-09-30 深圳帧观德芯科技有限公司 辐射检测器中的暗噪音补偿
EP3542187B1 (en) * 2016-11-15 2021-06-09 Shenzhen Xpectvision Technology Co., Ltd. An image sensor
CN109031393B (zh) 2017-06-09 2020-07-28 京东方科技集团股份有限公司 光电探测电路以及光电探测器
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
US20190154852A1 (en) * 2017-11-16 2019-05-23 NueVue Solutions, Inc. Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT
CN108120729B (zh) * 2017-12-28 2024-04-02 清华大学 Ct检查系统和ct成像方法
JP6776295B2 (ja) * 2018-04-26 2020-10-28 シャープ株式会社 放射線画像撮像装置
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
EP4254017A1 (en) 2022-03-28 2023-10-04 Koninklijke Philips N.V. Photon counting detector and photon counting method

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
DE19945757A1 (de) * 1999-09-24 2001-03-29 Philips Corp Intellectual Pty Röntgendetektor
US6671345B2 (en) 2000-11-14 2003-12-30 Koninklijke Philips Electronics N.V. Data acquisition for computed tomography
CN1438855A (zh) * 2000-11-14 2003-08-27 马科尼医疗系统公司 用于计算的断层成像的数据采集
US6510195B1 (en) 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
US6974973B2 (en) * 2002-11-08 2005-12-13 Micron Technology, Inc. Apparatus for determining temperature of an active pixel imager and correcting temperature induced variations in an imager
US7075091B2 (en) 2004-01-29 2006-07-11 Ge Medical Systems Global Technology Company, Llc Apparatus for detecting ionizing radiation
US7634061B1 (en) 2004-03-26 2009-12-15 Nova R & D, Inc. High resolution imaging system
US7582879B2 (en) 2006-03-27 2009-09-01 Analogic Corporation Modular x-ray measurement system
US20070241377A1 (en) * 2006-04-12 2007-10-18 Semicoa Back-illuminated photo-transistor arrays for computed tomography and other imaging applications
US20100226495A1 (en) * 2007-10-29 2010-09-09 Michael Kelly Digital readout method and apparatus
WO2010100574A2 (en) * 2009-03-06 2010-09-10 Koninklijke Philips Electronics N.V. Advanced temperature compensation and control circuit for single photon counters
EP2411840B1 (en) * 2009-03-26 2018-06-13 Koninklijke Philips N.V. Data acquisition
WO2012127403A2 (en) 2011-03-24 2012-09-27 Koninklijke Philips Electronics N.V. Spectral imaging detector

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