JP2016171133A - Film-like circuit connection material and method for manufacturing connection structural body of circuit member - Google Patents

Film-like circuit connection material and method for manufacturing connection structural body of circuit member Download PDF

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JP2016171133A
JP2016171133A JP2015048592A JP2015048592A JP2016171133A JP 2016171133 A JP2016171133 A JP 2016171133A JP 2015048592 A JP2015048592 A JP 2015048592A JP 2015048592 A JP2015048592 A JP 2015048592A JP 2016171133 A JP2016171133 A JP 2016171133A
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circuit
film
light
connecting material
particles
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JP6661886B2 (en
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将平 山崎
Shohei Yamazaki
将平 山崎
晋 川上
Susumu Kawakami
晋 川上
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Resonac Corp
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Hitachi Chemical Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide: a film-like circuit connection material capable of obtaining sufficient curing of a resin even in the case where a photo-curing resin is cured with light; and a method for manufacturing a connection structural body of a circuit member using the same.SOLUTION: There is disclosed a photo-curing type film-like circuit connection material 100 for bonding a first circuit member and a second circuit member. The film-like circuit connection material 100 includes an adhesive 20 and light reflecting particles 2 dispersed in the adhesive 20. The light reflecting particles 2 are distributed to be offset to one main surface 100a side of the film-like circuit connection material 100 in a thickness direction of the film-like circuit connection material.SELECTED DRAWING: Figure 1

Description

本発明はフィルム状回路接続材料及び回路部材の接続構造体の製造方法に関する。   The present invention relates to a film-like circuit connecting material and a method for producing a circuit member connection structure.

従来、例えば液晶ディスプレイ等の基板とICチップ、FPC(フレキシブル印刷配線板)等の回路部材との接続には、接着剤中に導電粒子を分散させた異方導電性接着剤が用いられている(例えば、特許文献1、2参照)。回路部材を基板に実装するに際して、従来のワイヤーボンディング法に代えて、電極をフェイスダウンで直接接続する方法が採用されてきている。かかる接続方法では、異方導電性接着剤を介して回路部材の電極と基板の電極とを対向させ、回路部材と基板とに圧力を付与しながら熱で異方導電性接着剤を硬化させている。   Conventionally, for example, an anisotropic conductive adhesive in which conductive particles are dispersed in an adhesive is used for connection between a substrate such as a liquid crystal display and a circuit member such as an IC chip or FPC (flexible printed wiring board). (For example, refer to Patent Documents 1 and 2). When the circuit member is mounted on the substrate, a method of directly connecting the electrodes face down has been adopted instead of the conventional wire bonding method. In such a connection method, the electrode of the circuit member and the electrode of the substrate are opposed to each other through the anisotropic conductive adhesive, and the anisotropic conductive adhesive is cured by heat while applying pressure to the circuit member and the substrate. Yes.

特開2003−253217号公報JP 2003-253217 A 特開2003−253239号公報JP 2003-253239 A

近年、電子機器の小型化・薄型化の要求に伴い、回路部材の電極の間隔及び電極幅が非常に小さくなってきている。また、液晶の表示品質の向上に対応するため、ガラス基板の厚みが薄くなる傾向にある。   In recent years, with the demand for downsizing and thinning of electronic devices, the distance between electrodes and the width of electrodes of circuit members have become very small. Moreover, in order to cope with the improvement of the display quality of the liquid crystal, the thickness of the glass substrate tends to be reduced.

表示品質を向上させるためには、熱圧着後の基板の反りを抑える必要があるが、熱のみを利用する接続(実装)方法では、圧着するためのツールと回路部材を支えるステージとの温度差が大きくなるため、熱膨張差に起因する反りが発生する問題があった。   In order to improve the display quality, it is necessary to suppress the warpage of the substrate after thermocompression bonding. However, in the connection (mounting) method using only heat, the temperature difference between the tool for crimping and the stage supporting the circuit member. Therefore, there has been a problem that warpage due to a difference in thermal expansion occurs.

一方、光硬化性樹脂を光によって硬化させる接続(実装)方法が、近年提案されているが、この方法では光と熱とを同時に併用することが可能であるため、通常の熱のみを利用した場合と比べて接続(実装)工程の低温化が期待される。しかし、ガラス等の光透過性の基板上に形成された回路又は端子が光透過性の素材でない場合、光硬化性樹脂の硬化が不充分になる問題があった。   On the other hand, a connection (mounting) method for curing a photocurable resin with light has been proposed in recent years. However, since this method can use light and heat at the same time, only normal heat is used. Compared to the case, a lower temperature of the connection (mounting) process is expected. However, when a circuit or a terminal formed on a light-transmitting substrate such as glass is not a light-transmitting material, there is a problem that the curing of the photocurable resin is insufficient.

本発明はこのような事情に鑑みてなされたものであり、光硬化型でありながら、光を遮蔽する部分を有する回路部材を接続する場合であっても、充分な樹脂の硬化が得られるフィルム状回路接続材料及びこれを用いた回路部材の接続構造体の製造方法を提供することを目的とする。   The present invention has been made in view of the above circumstances, and is a film that can be cured sufficiently even when a circuit member having a light shielding portion is connected while being photocurable. An object of the present invention is to provide a method for manufacturing a connection structure for a circuit member and a circuit member connection structure using the same.

本発明は、第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、上記第一の回路電極と上記第二の回路電極とが電気的に接続されるように接着するための光硬化型のフィルム状回路接続材料に関する。当該フィルム状回路接続材料が、接着剤と、該接着剤中に分散している光反射性粒子とを含み、上記光反射性粒子が、当該フィルム状回路接続材料の厚み方向において、当該フィルム状回路接続材料の一方の主面側に偏って分布している。   The present invention provides a first circuit member having a first circuit board and a first circuit electrode having a first circuit electrode provided on the first circuit board, a second circuit board and the second circuit board. A photo-curing film for adhering the second circuit member having the second circuit electrode so that the first circuit electrode and the second circuit electrode are electrically connected to each other It relates to a circuit connection material. The film-like circuit connecting material includes an adhesive and light-reflective particles dispersed in the adhesive, and the light-reflecting particles are in the film direction in the thickness direction of the film-like circuit connecting material. It is distributed unevenly on one main surface side of the circuit connecting material.

本発明に係るフィルム状回路接続材料によれば、光反射性粒子が、フィルム状回路接続材料の厚み方向において、フィルム状回路接続材料の一方の主面側に偏って分布しているため、光反射性粒子が多く分布していない他方の主面側から照射された光が、回路接続材料の内部に向かう方向に反射(散乱)される。そのため、回路等によって生じる遮光部分に光が充分に到達し、フィルム状回路接続材料を良好に硬化させることができると考えられる。   According to the film-like circuit connecting material according to the present invention, the light-reflective particles are unevenly distributed on one main surface side of the film-like circuit connecting material in the thickness direction of the film-like circuit connecting material. The light irradiated from the other main surface side where many reflective particles are not distributed is reflected (scattered) in the direction toward the inside of the circuit connecting material. Therefore, it is considered that light sufficiently reaches the light-shielding portion generated by the circuit or the like, and the film-like circuit connecting material can be cured well.

フィルム状回路接続材料は、上記一方の主面側に設けられた上記光反射性粒子を含有する光反射層と、導電粒子を含有する導電粒子層と、を備え、これらがこの順に積層されていてよい。   The film-like circuit connecting material includes a light reflecting layer containing the light reflecting particles provided on the one main surface side, and a conductive particle layer containing conductive particles, and these are laminated in this order. It's okay.

フィルム状回路接続材料は、導電粒子を実質的に含有しない非導電粒子層を更に備え、該非導電粒子層が上記光反射性粒子と上記導電粒子層との間に積層されていてよい。あるいは、上記光反射層、上記導電粒子層及び上記非導電粒子層がこの順に積層されていてもよい。   The film-like circuit connecting material may further include a non-conductive particle layer substantially free of conductive particles, and the non-conductive particle layer may be laminated between the light-reflecting particles and the conductive particle layer. Alternatively, the light reflecting layer, the conductive particle layer, and the nonconductive particle layer may be laminated in this order.

本発明はまた、第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、これらの間に当該フィルム状回路接続材料を介在させながら、上記第一の回路電極及び上記第二の回路電極が対向するように配置する工程と、上記フィルム状回路接続材料に光を照射すること及び上記フィルム状回路接続材料を加熱することを含む方法により上記フィルム状回路接続材料を硬化して、上記第一の回路電極と上記第二の回路電極とが電気的に接続されるように接着された接続構造体を得る工程と、を備える、回路部材の接続構造体の製造方法を提供する。   The present invention also provides a first circuit member having a first circuit board and a first circuit electrode provided on the first circuit board, a second circuit board, and the second circuit board. The first circuit electrode and the second circuit electrode are opposed to each other while the film-like circuit connecting material is interposed between the second circuit member having the provided second circuit electrode. And curing the film-like circuit connecting material by a method comprising irradiating the film-like circuit connecting material with light and heating the film-like circuit connecting material, and the first circuit electrode. And a step of obtaining a connection structure bonded so that the second circuit electrode is electrically connected to the second circuit electrode.

上記製造方法では、上記フィルム状回路接続材料が、上記一方の主面が上記第一の回路部材側になる向きで配置され、上記第二の回路基板側から上記フィルム状回路接続材料に上記光が照射されてもよい。また、上記製造方法では、上記第一の回路部材が半導体チップで、上記第二の回路基板が光透過性基板であってもよい。   In the manufacturing method, the film-like circuit connecting material is arranged in a direction in which the one main surface is on the first circuit member side, and the light is applied to the film-like circuit connecting material from the second circuit board side. May be irradiated. In the manufacturing method, the first circuit member may be a semiconductor chip, and the second circuit board may be a light transmissive substrate.

本発明に係るフィルム状回路接続材料によれば、光硬化型でありながら、光を遮蔽する部分を有する回路部材を接続する場合であっても、充分な樹脂の硬化が得られるフィルム状回路接続材料を提供することが可能となる。また、このようなフィルム状回路接続材料を用いることによって、導通を迅速かつ良好に確保できる回路部材の接続構造体の製造方法を提供することが可能となる。   According to the film-like circuit connection material according to the present invention, the film-like circuit connection can be sufficiently cured even when a circuit member having a light shielding portion is connected while being photocurable. It becomes possible to provide the material. Moreover, it becomes possible to provide the manufacturing method of the connection structure of the circuit member which can ensure favorable conduction | electrical_connection rapidly by using such a film-form circuit connection material.

フィルム状回路接続材料の一実施形態を示す模式断面図である。It is a schematic cross section which shows one Embodiment of a film-form circuit connection material. 回路部材の接続構造体を製造する一連の工程図である。It is a series of process drawings which manufacture the connection structure of a circuit member. 図2(b)の工程の模式図である。It is a schematic diagram of the process of FIG.2 (b). (a)は、実施例における評価用基板を示す模式図である。(b)は、回路電極(電極パッド)の拡大模式図である。(A) is a schematic diagram which shows the board | substrate for evaluation in an Example. (B) is an enlarged schematic diagram of a circuit electrode (electrode pad).

以下、本発明の好適な実施形態について説明をするが、本発明はこれらの実施形態に何ら限定されるものではない。また、本明細書において「(メタ)アクリレート」とは、「アクリレート」又はそれに対応する「メタクリレート」を意味する。「(メタ)アクリル酸」等の類似の表現についても同様である。   Hereinafter, preferred embodiments of the present invention will be described, but the present invention is not limited to these embodiments. In the present specification, “(meth) acrylate” means “acrylate” or “methacrylate” corresponding thereto. The same applies to similar expressions such as “(meth) acrylic acid”.

(フィルム状回路接続材料)
本実施形態のフィルム状回路接続材料は、第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、上記第一の回路電極と上記第二の回路電極とが電気的に接続されるように接着するための光硬化型のフィルム状回路接続材料である。
(Film-like circuit connection material)
The film-like circuit connecting material of the present embodiment includes a first circuit board, a first circuit member having a first circuit electrode provided on the first circuit board, a second circuit board, and the first circuit board. To bond a second circuit member having a second circuit electrode provided on a second circuit board so that the first circuit electrode and the second circuit electrode are electrically connected to each other. This is a photocurable film-like circuit connecting material.

図1は、フィルム状回路接続材料の一実施形態を示す模式断面図である。図1のフィルム状回路接続材料100は、接着剤20と、接着剤20中に分散している光反射性粒子2及び導電粒子4とを含む。フィルム状回路接続材料100は、光反射性粒子2を含有する光反射層10と、導電粒子4を含有する導電粒子層30と、導電粒子4を実質的に含有しない非導電粒子層40とから構成される。光反射性粒子2が光反射層10中に含まれることから、光反射性粒子2は、フィルム状回路接続材料100の厚み方向において、フィルム状回路接続材料100の一方の主面100a側に偏って分布している。接着剤20は、光反射層10に含まれる接着剤10a、導電粒子層30に含まれる接着剤30a及び非導電粒子層40に含まれる接着剤40aを含む。接着剤10a、接着剤30a及び接着剤40aは、同一でも異なってもよい。本明細書において、「接着剤」は、回路接続材料のうち、光反射性粒子及び導電粒子以外の成分から構成される硬化性樹脂組成物を意味する。   FIG. 1 is a schematic cross-sectional view showing an embodiment of a film-like circuit connecting material. A film-like circuit connecting material 100 in FIG. 1 includes an adhesive 20 and light-reflective particles 2 and conductive particles 4 dispersed in the adhesive 20. The film-like circuit connecting material 100 includes a light reflecting layer 10 containing the light reflecting particles 2, a conductive particle layer 30 containing the conductive particles 4, and a non-conductive particle layer 40 substantially not containing the conductive particles 4. Composed. Since the light reflective particles 2 are contained in the light reflective layer 10, the light reflective particles 2 are biased toward the one main surface 100 a side of the film-like circuit connection material 100 in the thickness direction of the film-like circuit connection material 100. Distributed. The adhesive 20 includes an adhesive 10 a included in the light reflecting layer 10, an adhesive 30 a included in the conductive particle layer 30, and an adhesive 40 a included in the non-conductive particle layer 40. The adhesive 10a, the adhesive 30a, and the adhesive 40a may be the same or different. In this specification, “adhesive” means a curable resin composition composed of components other than light-reflective particles and conductive particles in a circuit connecting material.

フィルム状回路接続材料の積層構成は、図1の3層構成に限定されず、光反射性粒子が一方の主面側に偏って分布するような構成であればよい。例えば、非導電粒子層40を設けなくてもよいし、光反射層10、導電粒子層30及び非導電粒子層40の順に積層されてもよい。また、フィルム状回路接続材料が4層以上の多層構成(図示せず)を有してもよい。   The laminated configuration of the film-like circuit connecting material is not limited to the three-layer configuration in FIG. 1, and may be any configuration in which the light-reflective particles are unevenly distributed on one main surface side. For example, the non-conductive particle layer 40 may not be provided, or the light reflecting layer 10, the conductive particle layer 30, and the non-conductive particle layer 40 may be stacked in this order. Further, the film-like circuit connecting material may have a multilayer structure (not shown) having four or more layers.

光反射性粒子は、フィルム状回路接続材料の厚み方向において、当該フィルム状回路接続材料の一方の主面側に偏って分布している。より具体的には、フィルム回路接続材料中の光反射性粒子のうち90質量%以上が、一方の主面側からフィルム状回路接続材料の厚みの75%以内、50%以内、30%以内、20%以内、15%以内又は10%以内の範囲に分布してもよい。   The light-reflective particles are distributed unevenly toward one main surface side of the film-like circuit connecting material in the thickness direction of the film-like circuit connecting material. More specifically, 90% by mass or more of the light-reflecting particles in the film circuit connecting material is within 75%, within 50%, within 30% of the thickness of the film-like circuit connecting material from one main surface side. It may be distributed within a range of 20%, 15% or 10%.

フィルム状回路接続材料の全体の厚みは、例えば、2μm〜50μmであってよい。フィルム状回路接続材料の厚みが2μm以上であると、第一の回路部材と第二の回路部材との間にフィルム状回路接続材料が充分に充填される傾向にある。フィルム状回路接続材料の厚みが50μm以下であると、第一の回路部材と第二の回路部材との間の導通が充分に確保される傾向にある。   The total thickness of the film-like circuit connecting material may be, for example, 2 μm to 50 μm. When the thickness of the film-like circuit connecting material is 2 μm or more, the film-like circuit connecting material tends to be sufficiently filled between the first circuit member and the second circuit member. When the thickness of the film-like circuit connecting material is 50 μm or less, electrical conduction between the first circuit member and the second circuit member tends to be sufficiently ensured.

光反射層の厚みは、5μm以下であってよい。また、光反射層の厚みは、0.2μm〜3μm又は0.5μm〜2μmであってよい。光反射層の厚みが5μm以下であると、光反射層の充分な硬化が得やすい傾向にある。光反射層の厚みが0.2μm以上であると、塗工性が良好となる。   The thickness of the light reflecting layer may be 5 μm or less. Moreover, the thickness of the light reflection layer may be 0.2 μm to 3 μm or 0.5 μm to 2 μm. When the thickness of the light reflecting layer is 5 μm or less, sufficient curing of the light reflecting layer tends to be obtained. When the thickness of the light reflecting layer is 0.2 μm or more, the coating property is good.

接着剤10aは、少なくとも光硬化性樹脂及び光重合開始剤を含む。以下、各成分について説明する。   The adhesive 10a includes at least a photocurable resin and a photopolymerization initiator. Hereinafter, each component will be described.

光硬化性樹脂は、光エネルギーによって硬化する性質を有する樹脂である。光硬化性樹脂としては、特に制限されないが、例えば、(メタ)アクリル樹脂、エポキシ樹脂、オキセタン化合物等が挙げられる。   The photocurable resin is a resin having a property of being cured by light energy. Although it does not restrict | limit especially as a photocurable resin, For example, (meth) acrylic resin, an epoxy resin, an oxetane compound etc. are mentioned.

(メタ)アクリル樹脂としては、例えば、エポキシ(メタ)アクリレートオリゴマー、ウレタン(メタ)アクリレートオリゴマー、ポリエーテル(メタ)アクリレートオリゴマー、ポリエステル(メタ)アクリレートオリゴマー等の光重合性オリゴマーなどが挙げられる。これらは単独で使用してもよく、複数を組み合わせて使用してもよい。これらの中でも、接着剤を硬化させたときに硬化収縮を抑制して柔軟性を与えることから、ウレタンアクリレートオリゴマーを用いてよい。   Examples of the (meth) acrylic resin include photopolymerizable oligomers such as epoxy (meth) acrylate oligomers, urethane (meth) acrylate oligomers, polyether (meth) acrylate oligomers, and polyester (meth) acrylate oligomers. These may be used alone or in combination. Among these, a urethane acrylate oligomer may be used because it suppresses curing shrinkage and gives flexibility when the adhesive is cured.

上記光重合性オリゴマーの粘度が高い傾向にあるため、これと上記光重合性オリゴマーより粘度の低い光重合性多官能(メタ)アクリレートモノマーとを組み合わせて用いてよい。光重合性多官能(メタ)アクリレートモノマーとしては、トリメチロールプロパントリ(メタ)アクリレート、ポリエチレングリコールジ(メタ)アクリレート、ポリアルキレングリコールジ(メタ)アクリレート、ペンタエリスリトール(メタ)アクリレート等が挙げられる。これらは単独で使用してもよく、複数を組み合わせて使用してもよい。   Since the viscosity of the photopolymerizable oligomer tends to be high, it may be used in combination with a photopolymerizable polyfunctional (meth) acrylate monomer having a viscosity lower than that of the photopolymerizable oligomer. Examples of the photopolymerizable polyfunctional (meth) acrylate monomer include trimethylolpropane tri (meth) acrylate, polyethylene glycol di (meth) acrylate, polyalkylene glycol di (meth) acrylate, pentaerythritol (meth) acrylate, and the like. These may be used alone or in combination.

エポキシ樹脂としては、例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ノボラック型エポキシ樹脂、脂環式エポキシ樹脂等の液状又は固形のエポキシ樹脂などが挙げられる。これらの中でも、紫外線を照射して硬化させる際に、硬化速度を高めることが可能となることから、脂環式エポキシ樹脂を用いてよい。   Examples of the epoxy resin include liquid or solid epoxy resins such as bisphenol A type epoxy resin, bisphenol F type epoxy resin, novolac type epoxy resin, and alicyclic epoxy resin. Among these, an alicyclic epoxy resin may be used because it is possible to increase the curing rate when it is cured by irradiation with ultraviolet rays.

オキセタン化合物としては、例えば、キシリレンジオキセタン、3−エチル−3−(ヒドロキシメチル)オキセタン、3−エチル−3−(ヘキシルオキシメチル)オキセタン、3−エチル−3−(フェノキシメチル)オキセタンビス{[1−エチル(3−オキセタニル)]メチル}エーテル等が挙げられる。   Examples of oxetane compounds include xylylene oxetane, 3-ethyl-3- (hydroxymethyl) oxetane, 3-ethyl-3- (hexyloxymethyl) oxetane, 3-ethyl-3- (phenoxymethyl) oxetane bis {[ 1-ethyl (3-oxetanyl)] methyl} ether and the like.

光重合開始剤としては、光ラジカル発生剤、光塩基発生剤、光酸発生剤等が挙げられる。光ラジカル発生剤は、上述の(メタ)アクリル樹脂と組み合わせることによって、(メタ)アクリル樹脂を、光ラジカル重合させることができる。また、光塩基発生剤又は光酸発生剤は、上述のエポキシ樹脂又はオキセタン化合物と組み合わせることによって、エポキシ樹脂又はオキセタン化合物を、光アニオン重合又は光カチオン重合させることができる。   Examples of the photopolymerization initiator include a photo radical generator, a photo base generator, and a photo acid generator. By combining the photoradical generator with the above-mentioned (meth) acrylic resin, the (meth) acrylic resin can be photoradically polymerized. In addition, the photobase generator or the photoacid generator can be combined with the above-described epoxy resin or oxetane compound to cause the epoxy resin or oxetane compound to undergo photoanionic polymerization or photocationic polymerization.

光ラジカル発生剤としては、ベンゾインエチルエーテル、イソプロピルベンゾインエーテル等のベンゾインエーテル、ベンジル、ヒドロキシシクロヘキシルフェニルケトン等のベンジルケタール、ベンゾフェノン、アセトフェノン等のケトン類及びその誘導体、チオキサントン類、ビイミダゾール類などが挙げられる。これらの光ラジカル発生剤に、必要に応じて、アミン類、イオウ化合物、リン化合物等の増感剤として作用する成分を任意の割合で添加してもよい。光ラジカル発生剤は、光源の波長、所望の硬化特性等に応じて、適宜選択することができる。   Examples of the photoradical generator include benzoin ethers such as benzoin ethyl ether and isopropyl benzoin ether, benzyl ketals such as benzyl and hydroxycyclohexyl phenyl ketone, ketones such as benzophenone and acetophenone and derivatives thereof, thioxanthones, and biimidazoles. It is done. Components that act as sensitizers such as amines, sulfur compounds, and phosphorus compounds may be added to these photoradical generators at an arbitrary ratio, if necessary. The photo radical generator can be appropriately selected according to the wavelength of the light source, desired curing characteristics, and the like.

光塩基発生剤は、紫外線、可視光等の光照射によって分子構造が変化し、又は分子内で開裂が起こることによって、速やかに1種類以上の塩基性物質を発生させる化合物である。ここでいう塩基性物質とは、例えば、1級アミン類、2級アミン類、3級アミン類、並びにこれらのアミン類が1分子中に2個以上存在するポリアミン類及びその誘導体;イミダゾール類、ピリジン類、モルホリン類及びこれらの誘導体等である。また、光照射によって2種類以上の塩基性物質を発生させる化合物を併用してもよい。   A photobase generator is a compound that rapidly generates one or more types of basic substances by changing the molecular structure upon irradiation with light such as ultraviolet rays or visible light, or by causing cleavage within the molecule. Examples of the basic substance here include primary amines, secondary amines, tertiary amines, and polyamines and derivatives thereof in which two or more of these amines are present in one molecule; imidazoles, Pyridines, morpholines and their derivatives. Moreover, you may use together the compound which generate | occur | produces two or more types of basic substances by light irradiation.

光塩基発生剤としては、α−アミノアセトフェノン骨格を有する化合物を用いてよい。当該骨格を有する化合物は、分子中にベンゾインエーテル結合を有しているため、光照射によって分子内で容易に開裂し、発生する物質が塩基性物質として作用する。α−アミノアセトフェノン骨格を有する化合物の具体例としては、(4−モルホリノベンゾイル)−1−ベンジル−1−ジメチルアミノプロパン(チバスペシャリティケミカルズ社製、商品名イルガキュア369、「イルガキュア」は登録商標)、4−(メチルチオベンゾイル)−1−メチル−1−モルホリノエタン(チバスペシャリティケミカルズ社製、商品名イルガキュア907)等の化合物又はその溶液が挙げられる。   As the photobase generator, a compound having an α-aminoacetophenone skeleton may be used. Since the compound having the skeleton has a benzoin ether bond in the molecule, it is easily cleaved within the molecule by light irradiation, and the generated substance acts as a basic substance. Specific examples of the compound having an α-aminoacetophenone skeleton include (4-morpholinobenzoyl) -1-benzyl-1-dimethylaminopropane (manufactured by Ciba Specialty Chemicals, trade name Irgacure 369, “Irgacure” is a registered trademark), Examples thereof include compounds such as 4- (methylthiobenzoyl) -1-methyl-1-morpholinoethane (manufactured by Ciba Specialty Chemicals, trade name Irgacure 907), and solutions thereof.

光酸発生剤としては、180nm〜750nmの波長成分を含む活性光線の照射によりカチオン種を発生する化合物であれば、特に制限なく公知のものを使用することができる。具体的には、芳香族ジアゾニウム塩、芳香族スルホニウム塩、脂肪族スルホニウム塩、芳香族ヨードニウム塩、ホスホニウム塩、ピリジニウム塩、セレノニウム塩等のオニウム塩、金属アレーン錯体、シラノール/アルミニウム錯体等の錯体化合物、ベンゾイントシレート、o−ニトロベンジルトシレートなどを用いることができる。これらの中でも特に、芳香族スルホニウム塩、脂肪族スルホニウム塩等のスルホニウム塩、芳香族ヨードニウム塩等のヨードニウム塩、鉄−アレーン錯体はカチオン種の発生効率が高いため、好適に用いることができる。また、光酸発生剤がオニウム塩である場合、対アニオンとしては、ヘキサフルオロアンチモネート、ヘキサフルオロホスホネート、テトラフルオロボレート、テトラキス(ペンタフルオロフェニル)ボレート等が反応性の観点から好適に用いられる。   Any known photoacid generator can be used as long as it is a compound that generates a cationic species upon irradiation with actinic rays containing a wavelength component of 180 nm to 750 nm. Specifically, complex compounds such as aromatic diazonium salts, aromatic sulfonium salts, aliphatic sulfonium salts, aromatic iodonium salts, onium salts such as phosphonium salts, pyridinium salts, and selenonium salts, metal arene complexes, and silanol / aluminum complexes. , Benzoin tosylate, o-nitrobenzyl tosylate and the like can be used. Of these, sulfonium salts such as aromatic sulfonium salts and aliphatic sulfonium salts, iodonium salts such as aromatic iodonium salts, and iron-arene complexes can be preferably used because of high generation efficiency of cationic species. When the photoacid generator is an onium salt, hexafluoroantimonate, hexafluorophosphonate, tetrafluoroborate, tetrakis (pentafluorophenyl) borate and the like are preferably used from the viewpoint of reactivity.

また、光酸発生剤としては、トリアリールシリルパーオキサイド誘導体、アシルシラン誘導体、α−スルホニロキシケトン誘導体、α−ヒドロキシメチルベンゾイン誘導体、ニトロベンジルエステル誘導体、α−スルホニルアセトフェノン誘導体等の光照射又は加熱によって有機酸を発生する化合物も使用することができる。具体的には、光照射又は加熱時の酸発生効率の観点から、サンアプロ株式会社製CPIシリーズ、旭電化工業株式会社製アデカオプトマーSPシリーズ、旭電化工業株式会社製アデカオプトンCPシリーズ、Union Carbide社製CyracureUVIシリーズ、チバスペシャリティケミカルズ社製IRGACUREシリーズが好適に用いられる。さらに、必要に応じて、アントラセン、チオキサントン誘導体等に代表される公知の一重項増感剤又は三重項増感剤を併用することができる。   In addition, as a photoacid generator, light irradiation or heating of a triarylsilyl peroxide derivative, an acylsilane derivative, an α-sulfonyloxyketone derivative, an α-hydroxymethylbenzoin derivative, a nitrobenzyl ester derivative, an α-sulfonylacetophenone derivative, etc. Compounds that generate organic acids can also be used. Specifically, from the viewpoint of acid generation efficiency during light irradiation or heating, Sun Apro Co., Ltd. CPI series, Asahi Denka Kogyo Co., Ltd. Adekaoptomer SP series, Asahi Denka Kogyo Co., Ltd. Adeka Opton CP series, Union Carbide The Cyracure UVI series manufactured by Chirasu and the IRGACURE series manufactured by Ciba Specialty Chemicals are preferably used. Furthermore, if necessary, known singlet sensitizers or triplet sensitizers typified by anthracene and thioxanthone derivatives can be used in combination.

光硬化性樹脂の配合量は、接着剤100質量部に対して、70質量部〜99.9質量部であってよい。光重合開始剤の配合量は、接着剤100質量部に対して、0.01質量部〜30質量部であってよい。光重合開始剤の量が0.01質量部以上であると、硬化が充分となり、接着力が向上する傾向にある。また、光重合開始剤の量が30質量部以下であると、光重合開始剤が表面に染み出しを抑制でき、接着力が向上する傾向にある。   The compounding quantity of photocurable resin may be 70 mass parts-99.9 mass parts with respect to 100 mass parts of adhesive agents. The compounding quantity of a photoinitiator may be 0.01 mass part-30 mass parts with respect to 100 mass parts of adhesive agents. When the amount of the photopolymerization initiator is 0.01 parts by mass or more, curing is sufficient and the adhesive force tends to be improved. Further, when the amount of the photopolymerization initiator is 30 parts by mass or less, the photopolymerization initiator can suppress the bleeding to the surface, and the adhesive force tends to be improved.

接着剤は、フィルム形成用樹脂を含んでよい。フィルム形成用樹脂としては、光硬化性樹脂の機能を阻害しないものであれば、特に制限されないが、例えば、フェノキシ樹脂、不飽和ポリエステル樹脂、飽和ポリエステル樹脂、ウレタン樹脂、ブタジエン樹脂、ポリイミド樹脂、ポリアミド樹脂、ポリオレフィン樹脂等が挙げられる。これらは、単独でも複数組み合わせてもよいが、接続信頼性の観点から、フェノキシ樹脂を用いてよい。   The adhesive may include a film forming resin. The resin for film formation is not particularly limited as long as it does not inhibit the function of the photocurable resin. For example, phenoxy resin, unsaturated polyester resin, saturated polyester resin, urethane resin, butadiene resin, polyimide resin, polyamide Examples thereof include resins and polyolefin resins. These may be used alone or in combination, but a phenoxy resin may be used from the viewpoint of connection reliability.

フェノキシ樹脂は、ビスフェノールAとエピクロルヒドリンとを反応させることによって、得ることができる。フェノキシ樹脂は、市販品を用いてもよい。また、配合量は目的に応じて適宜調整することができる。   The phenoxy resin can be obtained by reacting bisphenol A and epichlorohydrin. A commercially available product may be used as the phenoxy resin. Moreover, a compounding quantity can be suitably adjusted according to the objective.

接着剤は、シランカップリング剤を含んでよい。シランカップリング剤としては、特に制限されないが、エポキシ系、アクリル系、チオール系、アミン系など目的に応じて適宜選択することができる。また、配合量は目的に応じて適宜選択することができる。   The adhesive may include a silane coupling agent. Although it does not restrict | limit especially as a silane coupling agent, Epoxy type, an acrylic type, a thiol type, an amine type, etc. can be suitably selected according to the objective. Moreover, a compounding quantity can be suitably selected according to the objective.

接着剤は、無機フィラーを含んでよい。無機フィラーとしては、後述の光反射性粒子以外の成分が挙げられ、例えば、シリカ等が挙げられる。具体例としては、アドマテックス社製のフェニル基含有シラン表面処理球状シリカ等が挙げられる。   The adhesive may include an inorganic filler. Examples of the inorganic filler include components other than the light reflective particles described later, and examples thereof include silica. Specific examples include phenyl group-containing silane surface-treated spherical silica manufactured by Admatechs.

接着剤中に分散している光反射性粒子は、光を反射させる粒子であれば特に制限されないが、適宜選択することができる。光反射性粒子は、その表面が酸化チタン、チタナイト、チタン酸ジルコニウム、酸化亜鉛、銀及びアルミニウムからなる群より選ばれる少なくとも1種の材料により形成されている粒子であってもよい。光反射性粒子の形状は、真球状の球状粒子、鱗片状、針状、紡錘状等の非球状粒子などが挙げられる。具体例としては、石原産業株式会社製球状酸化チタン粒子(CRシリーズ)、石原産業株式会社酸化亜鉛粒子(FZOシリーズ)、JSR株式会社製中空球状粒子(SXシリーズ、XTPシリーズ)、堺化学工業株式会社製紡鍾形酸化チタン粒子(STRシリーズ)、石原産業株式会社製非球状酸化チタン粒子(TTOシリーズ、FTLシリーズ)、堺化学工業株式会社製酸化亜鉛粒子(FINEXシリーズ)などが挙げられる。また、必要に応じて、光反射性粒子を単独又は2種類以上混合して用いてもよい。   The light-reflecting particles dispersed in the adhesive are not particularly limited as long as the particles reflect light, but can be appropriately selected. The light-reflecting particles may be particles whose surfaces are formed of at least one material selected from the group consisting of titanium oxide, titanite, zirconium titanate, zinc oxide, silver and aluminum. Examples of the shape of the light-reflecting particles include spherical particles, non-spherical particles such as scales, needles, and spindles. Specific examples include spherical titanium oxide particles (CR series) manufactured by Ishihara Sangyo Co., Ltd., zinc oxide particles (FZO series) manufactured by Ishihara Sangyo Co., Ltd., hollow spherical particles (SX series, XTP series) manufactured by JSR Corporation, Sakai Chemical Industry Co., Ltd. Examples include company-made spun titanium oxide particles (STR series), non-spherical titanium oxide particles (TTO series, FTL series) manufactured by Ishihara Sangyo Co., Ltd., and zinc oxide particles (FINEX series) manufactured by Sakai Chemical Industry Co., Ltd. Moreover, you may use a light reflective particle individually or in mixture of 2 or more types as needed.

光反射性粒子の配合量は、光反射層中の接着剤100体積部に対して、20体積部以上、25体積部以上又は30体積部以上であってよい。光反射性粒子の配合量が20体積部以上であると、光反射層を形成したとき、面方向に均一に存在させることが可能となる。導電粒子の配合量の上限は、例えば、120体積部以下であってよい。光反射性粒子の配合量が120体積部以下であると、塗工時の筋状の塗りむらを抑制することができる。   The compounding amount of the light reflecting particles may be 20 parts by volume, 25 parts by volume, or 30 parts by volume with respect to 100 parts by volume of the adhesive in the light reflecting layer. When the amount of the light-reflecting particles is 20 parts by volume or more, when the light-reflecting layer is formed, the light-reflecting particles can be uniformly present in the surface direction. The upper limit of the blending amount of the conductive particles may be 120 parts by volume or less, for example. When the blending amount of the light reflective particles is 120 parts by volume or less, streaky coating unevenness at the time of coating can be suppressed.

光反射性粒子の粒子径は、後述の導電粒子の粒子径の60%以下又は50%以下であってよい。なお、平均粒子径は、球状粒子であれば粒子の直径の平均値を示し、非球状粒子であれば粒子の最も長い部分(長径)の平均値を示す。また、平均粒子径は走査型電子顕微鏡(SEM)を用いて、粒子100個の直径又は長径を測定し、その平均値を算出した。   The particle diameter of the light-reflecting particles may be 60% or less or 50% or less of the particle diameter of conductive particles described later. In addition, an average particle diameter will show the average value of the diameter of particle | grains if it is a spherical particle, and will show the average value of the longest part (major axis) of a particle | grain if it is a non-spherical particle. Moreover, the average particle diameter measured the diameter or long diameter of 100 particle | grains using the scanning electron microscope (SEM), and computed the average value.

本実施形態に係るフィルム状回路接続材料は、上記一方の主面側に設けられた上記光反射性粒子を含有する光反射層と、導電粒子を含有する導電粒子層と、を備え、これらがこの順に積層されていてよい。   The film-like circuit connecting material according to the present embodiment includes a light reflecting layer containing the light reflecting particles provided on the one main surface side, and a conductive particle layer containing conductive particles. They may be stacked in this order.

導電粒子層30は、上述の接着剤10aと同一又は異なる組成の接着剤30aと、接着剤30a中に分散している導電粒子4とを含有する。   The conductive particle layer 30 contains an adhesive 30a having the same or different composition as the above-described adhesive 10a, and the conductive particles 4 dispersed in the adhesive 30a.

導電粒子4は、金属のみからなる粒子又は有機若しくは無機のコア粒子の表面に金属層を形成したものを用いることができる。これらのうち、有機コア粒子の表面に金属層を形成したものを用いてよい。金属層を形成する方法は特に限定されないが、スパッタリング、めっき等の方法が挙げられ、簡便であるという観点から、めっきであってよい。金属層の厚みは、10nm以上又は30nm以上であってよい。   As the conductive particles 4, particles made of only metal or those obtained by forming a metal layer on the surface of organic or inorganic core particles can be used. Of these, those obtained by forming a metal layer on the surface of the organic core particles may be used. The method for forming the metal layer is not particularly limited, and examples thereof include sputtering and plating, and plating may be used from the viewpoint of simplicity. The thickness of the metal layer may be 10 nm or more or 30 nm or more.

有機コア粒子は特に限定されないが、ポリメチルメタクリレート、ポリメチルアクリレート等のアクリル樹脂、ポリエチレン、ポリプロピレン、ポリイソブチレン、ポリブタジエン等のポリオレフィン樹脂などが挙げられる。   The organic core particle is not particularly limited, and examples thereof include acrylic resins such as polymethyl methacrylate and polymethyl acrylate, and polyolefin resins such as polyethylene, polypropylene, polyisobutylene, and polybutadiene.

めっき等で形成する金属層の金属は、特に限定されないが、金、銀、銅、白金、亜鉛、鉄、パラジウム、ニッケル、錫、クロム、チタン、アルミニウム、コバルト、ゲルマニウム、カドミウム等の金属、ITO、はんだ等の金属化合物などが挙げられる。耐腐食性の観点からニッケル、パラジウム、金を用いてよい。   The metal of the metal layer formed by plating or the like is not particularly limited, but metal such as gold, silver, copper, platinum, zinc, iron, palladium, nickel, tin, chromium, titanium, aluminum, cobalt, germanium, cadmium, ITO And metal compounds such as solder. From the viewpoint of corrosion resistance, nickel, palladium, and gold may be used.

上記金属層は、単層構造であってもよく、複数の層からなる積層構造であってもよい。単層構造である場合、金属層は、コスト、導電性及び耐腐食性の観点からニッケルであってよい。更に、近年のガラス電極の平坦化を考えると、表面に突起を有するニッケルであってよい。積層構造である場合、ニッケル層の表面に金、パラジウム等の貴金属層を有してもよい。   The metal layer may have a single layer structure or a laminated structure including a plurality of layers. In the case of a single layer structure, the metal layer may be nickel from the viewpoint of cost, conductivity, and corrosion resistance. Furthermore, considering the recent flattening of the glass electrode, it may be nickel having protrusions on the surface. In the case of a laminated structure, a noble metal layer such as gold or palladium may be provided on the surface of the nickel layer.

導電粒子の最外層の表面に、粒径が20nm〜500nm程度の絶縁性微粒子が付着していてよい。絶縁性微粒子は、有機化合物、無機酸化物のいずれであってもよく、両方を混合したものであってもよい。絶縁性微粒子の粒径は、BET法による比表面積換算法、又はX線小角散乱法によって測定することができる。粒径が20nm以上であると、絶縁性微粒子が絶縁膜として作用し、隣接回路電極間の短絡を抑制できる傾向にある。一方、平均粒径が500nm以下であると、対向バンプ電極間で充分な導電性が得られる傾向にある。   Insulating fine particles having a particle size of about 20 nm to 500 nm may adhere to the surface of the outermost layer of the conductive particles. The insulating fine particles may be either an organic compound or an inorganic oxide, or a mixture of both. The particle size of the insulating fine particles can be measured by the specific surface area conversion method by the BET method or the X-ray small angle scattering method. When the particle size is 20 nm or more, the insulating fine particles act as an insulating film, and there is a tendency that a short circuit between adjacent circuit electrodes can be suppressed. On the other hand, when the average particle size is 500 nm or less, sufficient conductivity between the opposing bump electrodes tends to be obtained.

導電粒子の配合量は、導電粒子層中の接着剤100体積部に対して、20体積部以上、25体積部以上又は30体積部以上であってよい。導電粒子の配合量が20体積部以上であると、バンプ電極と回路電極との間に充分な数の導電粒子を介在させることができる。導電粒子の配合量の上限は、120体積部以下であってよい。導電粒子の配合量が120体積部以下であると、圧着した際の隣接回路電極間の短絡を抑制することができる。   The compounding amount of the conductive particles may be 20 parts by volume or more, 25 parts by volume or more, or 30 parts by volume or more with respect to 100 parts by volume of the adhesive in the conductive particle layer. When the blending amount of the conductive particles is 20 parts by volume or more, a sufficient number of conductive particles can be interposed between the bump electrode and the circuit electrode. The upper limit of the blending amount of the conductive particles may be 120 parts by volume or less. The short circuit between adjacent circuit electrodes at the time of crimping | compression-bonding can be suppressed as the compounding quantity of electroconductive particle is 120 volume parts or less.

導電粒子層30の厚みは、0.5μm〜15μmであってよい。導電粒子層30の厚みがこの範囲にあることにより、回路部材を実装したときに良好な導通が得られる傾向にある。   The thickness of the conductive particle layer 30 may be 0.5 μm to 15 μm. When the thickness of the conductive particle layer 30 is within this range, good conduction tends to be obtained when the circuit member is mounted.

非導電粒子層40は、接着剤10a、30aと同一又は異なる組成の接着剤40aを含有し、導電粒子及び光反射性粒子を実質的に含有しない。ここで、「実質的に含有しない」とは、導電粒子又は光反射性粒子の配合量が、非導電性粒子層中の接着剤の100体積部に対して、5体積部以下、3体積部以下又は1体積部以下であってよいことを意味する。非導電粒子層の導電粒子の配合量が0体積部であってもよい。   The non-conductive particle layer 40 contains an adhesive 40a having the same or different composition as the adhesives 10a and 30a, and does not substantially contain conductive particles and light-reflecting particles. Here, “substantially does not contain” means that the blending amount of the conductive particles or light-reflecting particles is 5 parts by volume or less and 3 parts by volume with respect to 100 parts by volume of the adhesive in the non-conductive particle layer. It means that it may be below or 1 part by volume. The volume of the conductive particles in the non-conductive particle layer may be 0 part by volume.

非導電粒子層40の厚みは、0.5μm〜15μmであってよい。非導電粒子層40の厚みがこの範囲にあることにより、充分な樹脂流動を得ることができ、良好な接着性を得ることができる傾向にある。   The thickness of the non-conductive particle layer 40 may be 0.5 μm to 15 μm. When the thickness of the non-conductive particle layer 40 is within this range, sufficient resin flow can be obtained, and good adhesiveness tends to be obtained.

フィルム状回路接続材料100は、例えば、光反射層10、導電粒子層30及び非導電粒子層40を別々に作製した後、それぞれの層を貼り合せることにより作製することができる。例えば、それぞれの層の樹脂成分等をPET(ポリエチレンテレフタレート)樹脂等で形成された離型フィルム上に塗布、乾燥することで各層を得ることができる。次いで、各層を、例えば、ホットロールラミネータを用いて貼り合せることにより、3層型のフィルム状回路接続材料100を作製することができる。   The film-like circuit connecting material 100 can be produced, for example, by separately producing the light reflecting layer 10, the conductive particle layer 30, and the non-conductive particle layer 40, and then bonding the respective layers. For example, each layer can be obtained by applying and drying the resin component of each layer on a release film formed of PET (polyethylene terephthalate) resin or the like. Next, the three-layer film-like circuit connection material 100 can be produced by bonding the layers using, for example, a hot roll laminator.

(回路部材の接続構造体の製造方法)
次に、回路部材の接続構造体の製造方法について説明する。本実施形態の回路部材の接続構造体の製造方法は、第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、これらの間に当該フィルム状回路接続材料を介在させながら、上記第一の回路電極及び上記第二の回路電極が対向するように配置する工程と、上記フィルム状回路接続材料に光を照射すること及び上記フィルム状回路接続材料を加熱することを含む方法により上記フィルム状回路接続材料を硬化して、上記第一の回路電極と上記第二の回路電極とが電気的に接続されるように接着された接続構造体を得る工程と、を備える。上記フィルム状回路接続材料が、上記一方の主面が上記第一の回路部材側になる向きで配置され、上記第二の回路基板側から上記フィルム状回路接続材料に上記光が照射されてもよい。図2(a)〜(c)は、回路部材の接続構造体を製造する一連の工程図である。
(Method for manufacturing circuit member connection structure)
Next, the manufacturing method of the connection structure of a circuit member is demonstrated. The method for manufacturing a circuit member connection structure according to the present embodiment includes a first circuit board, a first circuit member having a first circuit electrode provided on the first circuit board, and a second circuit. A second circuit member having a second circuit electrode provided on the substrate and the second circuit board, while interposing the film-like circuit connecting material therebetween, and the first circuit electrode and Disposing the film-like circuit connection material by a method comprising a step of arranging the second circuit electrodes to face each other, irradiating the film-like circuit connection material with light, and heating the film-like circuit connection material. Curing to obtain a connection structure bonded so that the first circuit electrode and the second circuit electrode are electrically connected to each other. The film-like circuit connecting material is arranged in such a direction that the one main surface is on the first circuit member side, and the film-like circuit connecting material is irradiated with the light from the second circuit board side. Good. 2A to 2C are a series of process diagrams for manufacturing a circuit member connection structure.

まず、フィルム状回路接続材料100と、第一の回路基板54及び該第一の回路基板54上に設けられた第一の回路電極52を有する第一の回路部材50と、第二の回路基板64及び該第二の回路基板64上に設けられた第二の回路電極62を有する第二の回路部材60と、を用意する。次に、第一の回路部材50と、第二の回路部材60とを、これらの間にフィルム状回路接続材料100の一方の主面100aが第一の回路部材50側になる向きで介在させながら、第一の回路電極52及び第二の回路電極62が対向するように配置する(図2(a)を参照)。フィルム状回路接続材料100は、取り扱いが容易であり、第一の回路部材50と第二の回路部材60との間にフィルム状回路接続材料100を容易に介在させることができ、第一の回路電極52と第二の回路電極62との接続作業を容易に行うことができる。   First, a film-like circuit connecting material 100, a first circuit member 50 having a first circuit board 54 and a first circuit electrode 52 provided on the first circuit board 54, and a second circuit board 64 and a second circuit member 60 having a second circuit electrode 62 provided on the second circuit board 64 are prepared. Next, the first circuit member 50 and the second circuit member 60 are interposed between them so that one main surface 100a of the film-like circuit connecting material 100 is on the first circuit member 50 side. However, it arrange | positions so that the 1st circuit electrode 52 and the 2nd circuit electrode 62 may oppose (refer Fig.2 (a)). The film-like circuit connecting material 100 is easy to handle, and the film-like circuit connecting material 100 can be easily interposed between the first circuit member 50 and the second circuit member 60. Connection work between the electrode 52 and the second circuit electrode 62 can be easily performed.

最終的に得られる接続構造体(図2(c))において、第1の回路部材の回路(電極とも表す)と第2の回路部材の回路(電極)との間の間隔が導電粒子の径の1.5倍以下となるように回路(電極)同士を対向させることが好ましい。この場合、圧力の付与によって第1の回路部材の回路(電極)と第2の回路部材の回路(電極)との間で導電粒子が充分に捕捉され、良好な導通を実現できる。   In the finally obtained connection structure (FIG. 2C), the distance between the circuit (also referred to as an electrode) of the first circuit member and the circuit (electrode) of the second circuit member is the diameter of the conductive particles. It is preferable that the circuits (electrodes) face each other so as to be 1.5 times or less. In this case, by applying pressure, the conductive particles are sufficiently captured between the circuit (electrode) of the first circuit member and the circuit (electrode) of the second circuit member, and good conduction can be realized.

第一の回路部材50は、例えば、ICチップ、LSIチップ、抵抗体チップ、コンデンサチップ等の半導体チップであってよい。第一の回路基板54は、例えば、シリコン等が用いられる。また、第一の回路電極52は、その表面が、例えば、金、銀、スズ、ルテニウム、ロジウム、パラジウム、オスミウム、イリジウム、白金及びインジウムスズ酸化物(ITO)から選ばれる1種又は2種以上で構成されてよい。第一の回路電極52は、導電粒子4よりも変形し易くなっていてよい。   The first circuit member 50 may be a semiconductor chip such as an IC chip, an LSI chip, a resistor chip, or a capacitor chip, for example. For example, silicon or the like is used for the first circuit board 54. The surface of the first circuit electrode 52 is, for example, one or more selected from gold, silver, tin, ruthenium, rhodium, palladium, osmium, iridium, platinum, and indium tin oxide (ITO). May be configured. The first circuit electrode 52 may be more easily deformed than the conductive particles 4.

第二の回路部材60は、第二の回路基板64及び該第二の回路基板64上に設けられた第二の回路電極62を有するものであり、第二の回路基板64は、光透過性基板であってよい。第二の回路基板64としては、光透過性基板であれば特に制限されないが、ガラス基板、ポリイミド基板、ポリエチレンテレフタラート基板、ポリカーボネート基板、ポリエチレンナフタレート基板、ガラス強化エポキシ基板、紙フェノール基板、セラミック基板、積層板等が挙げられる。これらの中でも、紫外線に対する透過性に優れることから、ガラス基板、ポリエチレンテレフタラート基板、ポリカーボネート基板、ポリエチレンナフタレート基板であってよい。第二の回路電極62は、第一の回路電極52と同様なものを用いることができる。   The second circuit member 60 includes a second circuit board 64 and a second circuit electrode 62 provided on the second circuit board 64, and the second circuit board 64 is light-transmissive. It may be a substrate. The second circuit board 64 is not particularly limited as long as it is a light-transmitting substrate, but is not limited to glass substrate, polyimide substrate, polyethylene terephthalate substrate, polycarbonate substrate, polyethylene naphthalate substrate, glass reinforced epoxy substrate, paper phenol substrate, ceramic. A board | substrate, a laminated board, etc. are mentioned. Among these, a glass substrate, a polyethylene terephthalate substrate, a polycarbonate substrate, and a polyethylene naphthalate substrate may be used because of excellent transparency to ultraviolet rays. The second circuit electrode 62 can be the same as the first circuit electrode 52.

次いで、フィルム状回路接続材料100に光を照射すること及びフィルム状回路接続材料100を加熱することを含む方法によりフィルム状回路接続材料100を硬化する。このとき、第二の回路基板64側からフィルム状回路接続材料100に方向Bのように光が照射される。また、フィルム状回路接続材料100を加熱し、さらに方向Aに加圧してよい(図2(b)を参照)。フィルム状回路接続材料100は、光反射性粒子2を含むため、第二の回路部材60を透過した光が光反射性粒子2によって反射(散乱)され、光が遮光部分まで光を到達させることが可能となる。そのため、光照射及び加熱した際に、接着剤20の硬化反応が進行し易くなる。   Next, the film-like circuit connection material 100 is cured by a method including irradiating the film-like circuit connection material 100 with light and heating the film-like circuit connection material 100. At this time, the film-like circuit connecting material 100 is irradiated with light in the direction B from the second circuit board 64 side. Further, the film-like circuit connecting material 100 may be heated and further pressurized in the direction A (see FIG. 2B). Since the film-like circuit connecting material 100 includes the light-reflective particles 2, the light transmitted through the second circuit member 60 is reflected (scattered) by the light-reflective particles 2, and the light reaches the light-shielding portion. Is possible. Therefore, when light irradiation and heating are performed, the curing reaction of the adhesive 20 easily proceeds.

図3は、図2(b)の工程の模式図である。まず、光透過部92を有する支持ステージ90を用意する。次に、光透過部92上に第二の回路部材60に配置し、第二の回路部材60上に、フィルム状回路接続材料100及び第一の回路部材50を配置する。光照射部材80から方向Bに光照射をすることにより、光透過部92及び第二の回路部材60を透過した光がフィルム状回路接続材料100に照射される。一方、加熱押圧部材82によって、フィルム状回路接続材料100を加熱し、さらに方向Aに加圧する。   FIG. 3 is a schematic diagram of the process of FIG. First, a support stage 90 having a light transmission part 92 is prepared. Next, the second circuit member 60 is disposed on the light transmission portion 92, and the film-like circuit connection material 100 and the first circuit member 50 are disposed on the second circuit member 60. By irradiating light in the direction B from the light irradiation member 80, the light transmitted through the light transmission part 92 and the second circuit member 60 is irradiated onto the film-like circuit connection material 100. On the other hand, the film-like circuit connecting material 100 is heated by the heating and pressing member 82 and further pressurized in the direction A.

光照射に用いる光の種類は、特に制限されないが、樹脂成分を硬化させ易いことから、紫外線であってよい。紫外線の波長は、特に制限されないが、200nm〜400nm又は300nm〜400nmであってよい。光照射の光源は、特に制限されないが、LEDランプ、YAGレーザー、キセノンランプ、ハロゲンランプ、高圧水銀灯等を目的の波長に合わせて適宜選択することができる。   The type of light used for light irradiation is not particularly limited, but may be ultraviolet rays because the resin component is easily cured. The wavelength of the ultraviolet light is not particularly limited, but may be 200 nm to 400 nm or 300 nm to 400 nm. The light source for light irradiation is not particularly limited, and an LED lamp, a YAG laser, a xenon lamp, a halogen lamp, a high-pressure mercury lamp, and the like can be appropriately selected according to the target wavelength.

フィルム状回路接続材料100に光を照射すること及びフィルム状回路接続材料100を加熱することは、どちらを先に行ってもよいが、光照射する前に加熱してよい。また、加熱と同時に加圧してもよい。先に加熱又は加圧を行うことにより、フィルム状回路接続材料100を充分に流動させた後に、硬化させることができるため、導通を迅速かつ良好に確保した回路部材の接続構造体を得ることができる。   Either the irradiation of the film-like circuit connection material 100 with light or the heating of the film-like circuit connection material 100 may be performed first, but the film-like circuit connection material 100 may be heated before the light irradiation. Moreover, you may pressurize simultaneously with a heating. By first heating or pressurizing, the film-like circuit connecting material 100 can be cured after sufficiently flowing, so that it is possible to obtain a circuit member connection structure that secures conduction quickly and satisfactorily. it can.

加熱及び加圧は、加熱押圧部材82を用いて行うことができる。加熱押圧部材82としては、例えば、ヒートツール等が挙げられる。加熱温度は、特に制限されないが、30℃〜120℃又は50℃〜100℃であってよい。加圧する際の圧力は、特に制限はされないが、0.1MPa〜100MPaであってよい。また、加熱及び加圧の際の時間は、特に制限されないが、0.5秒〜100秒であってよい。   Heating and pressurization can be performed using the heating pressing member 82. Examples of the heating and pressing member 82 include a heat tool. The heating temperature is not particularly limited, but may be 30 ° C to 120 ° C or 50 ° C to 100 ° C. The pressure at the time of pressurization is not particularly limited, but may be 0.1 MPa to 100 MPa. The time for heating and pressurization is not particularly limited, but may be 0.5 seconds to 100 seconds.

また、加熱又は加圧から0.5秒以上又は1.0秒以上経過した後に、フィルム状回路接続材料100を光照射してよい。   Alternatively, the film-like circuit connecting material 100 may be irradiated with light after 0.5 seconds or more or 1.0 seconds or more have passed since heating or pressurization.

また、加熱及び加圧するに際して、支持ステージ90を予め加熱してもよい。加熱温度は、特に制限されないが、25〜120℃であってよい。光透過部92は、光透過性を有するのであれば特に制限されないが、例えば、ポリカーボネート、石英、石英ガラス、セラミック等が挙げられる。耐熱性及び透明性の観点から、石英ガラスであってよい。   Further, the support stage 90 may be preheated when heating and pressurizing. The heating temperature is not particularly limited, but may be 25 to 120 ° C. The light transmitting portion 92 is not particularly limited as long as it has light transparency, and examples thereof include polycarbonate, quartz, quartz glass, and ceramic. From the viewpoint of heat resistance and transparency, quartz glass may be used.

このような回路部材の接続構造体の製造方法によって、第一の回路部材50と、第二の回路部材60と、フィルム状回路接続材料の硬化物70とを、備える、第一の回路電極52と第二の回路電極62とが電気的に接続されるように接着された回路部材の接続構造体200を得ることができる(図2(c)を参照)。   The first circuit electrode 52 includes the first circuit member 50, the second circuit member 60, and the cured product 70 of the film-like circuit connection material by the method for manufacturing the circuit member connection structure. Thus, a circuit member connection structure 200 can be obtained that is bonded so that the second circuit electrode 62 and the second circuit electrode 62 are electrically connected (see FIG. 2C).

以下、本発明の内容を実施例及び比較例を用いてより詳細に説明する。ただし、本発明は以下の実施例に制限されるものではない。   Hereinafter, the contents of the present invention will be described in more detail using examples and comparative examples. However, the present invention is not limited to the following examples.

実施例1
エポキシ化合物として脂環式エポキシ樹脂1.0g(株式会社ダイセル製、セロキサイド2021P、製品名)及びビスフェノールA型エポキシ樹脂0.5g(三菱化学株式会社製、jER1010、商品名)、光カチオン発生剤としてスルホニウム塩0.06g(BASF社製、Irgacure290)、フィルム形成用樹脂としてフェノキシ樹脂1.5g、無機フィラーとしてシリカ粒子0.3g(アドマテックス社製、フェニル基含有シラン表面処理球状シリカ、平均粒子径0.050μm)を用い、これらを溶剤中に溶解又は分散させて、ワニスを作製した。次いで、導電粒子として、PMMA(ポリメチルメタクリレート)を核とする粒子の表面にニッケル層を設けた導電粒子を作製した。導電粒子のニッケル層の表面には、予め突起を形成させておいた。この導電粒子を、上記ワニスの溶剤以外の発分を100体積部としたとき、50体積部となるように、上記ワニスに配合分散させ、混合ワニスを作製した。混合ワニスを厚み50μmのフッ素樹脂フィルムに塗工装置を用いて塗布し、70℃、5分の熱風乾燥によって厚みが5μmの導電粒子を含む導電粒子層を得た。なお、導電粒子層には、光反射性粒子を配合しなかった。
Example 1
As an epoxy compound, 1.0 g of an alicyclic epoxy resin (manufactured by Daicel Corporation, Celoxide 2021P, product name) and 0.5 g of a bisphenol A type epoxy resin (manufactured by Mitsubishi Chemical Corporation, jER1010, trade name), as a photocation generator 0.06 g of sulfonium salt (manufactured by BASF, Irgacure 290), 1.5 g of phenoxy resin as a film-forming resin, 0.3 g of silica particles as an inorganic filler (manufactured by Admatechs, phenyl group-containing silane surface-treated spherical silica, average particle diameter These were dissolved or dispersed in a solvent to prepare a varnish. Next, conductive particles having a nickel layer on the surface of particles having PMMA (polymethyl methacrylate) as a core were prepared as conductive particles. A protrusion was previously formed on the surface of the nickel layer of the conductive particles. The conductive particles were mixed and dispersed in the varnish so that the volume other than the solvent of the varnish was 100 parts by volume, and a mixed varnish was prepared. The mixed varnish was applied to a fluororesin film having a thickness of 50 μm using a coating apparatus, and a conductive particle layer containing conductive particles having a thickness of 5 μm was obtained by drying with hot air at 70 ° C. for 5 minutes. The conductive particle layer did not contain light reflective particles.

エポキシ化合物として脂環式エポキシ樹脂1.5g(株式会社ダイセル製、セロキサイド2021P、製品名)、光カチオン発生剤としてスルホニウム塩0.06g(BASF社製、Irgacure290)、フィルム形成用樹脂としてフェノキシ樹脂1.5g、無機フィラーとしてシリカ粒子0.7g(アドマテックス社製、フェニル基含有シラン表面処理球状シリカ、平均粒子径0.050μm)を用い、これらを溶剤中に溶解又は分散させて、混合ワニスを作製した。混合ワニスを厚み50μmのフッ素樹脂フィルムに塗工装置を用いて塗布し、70℃、5分の熱風乾燥によって厚みが14μmの導電粒子を含まない非導電粒子層を得た。なお、非導電粒子層には、光反射性粒子を配合しなかった。   Epoxy compound as an alicyclic epoxy resin 1.5 g (manufactured by Daicel Corporation, Celoxide 2021P, product name), photocation cation generator 0.06 g as a cation generator (BASF Corp., Irgacure 290), and phenoxy resin 1 as a film-forming resin 0.5 g, 0.7 g of silica particles (manufactured by Admatechs, phenyl group-containing silane surface-treated spherical silica, average particle size 0.050 μm) as an inorganic filler, and these are dissolved or dispersed in a solvent to obtain a mixed varnish. Produced. The mixed varnish was applied to a fluororesin film having a thickness of 50 μm using a coating apparatus, and a nonconductive particle layer containing no conductive particles having a thickness of 14 μm was obtained by hot air drying at 70 ° C. for 5 minutes. In addition, the light-reflective particle was not mix | blended with the nonelectroconductive particle layer.

導電粒子層と同様のワニスを作製した。上記ワニスに、導電粒子を配合分散せずに、光反射性粒子として酸化チタン(石原産業株式会社製CR−50、平均粒子径0.25μm)を40体積%となるように配合分散させて混合ワニスを作製した。厚み50μmのフッ素樹脂フィルムに塗工装置を用いて塗布し、70℃、5分の熱風乾燥によって光反射性粒子を含む厚みが1μmの光反射層を得た。   A varnish similar to the conductive particle layer was produced. Without mixing and dispersing conductive particles in the above varnish, titanium oxide (Ishihara Sangyo Co., Ltd. CR-50, average particle diameter of 0.25 μm) is mixed and dispersed so as to be 40% by volume as light reflecting particles. A varnish was prepared. The film was applied to a fluororesin film having a thickness of 50 μm using a coating apparatus, and a light reflecting layer having a thickness of 1 μm including light reflecting particles was obtained by hot air drying at 70 ° C. for 5 minutes.

得られた導電粒子層、非導電粒子層、及び光反射層を、この順に積層し、50℃に加温しながらラミネーターを通して貼り合わせた。これをフッ素樹脂フィルムで挟むことで、導電粒子層/非導電粒子層/光反射層の三層構成のフィルム状回路接続材料(i)を得た。フィルム状回路接続材料(i)において、導電粒子層、非導電粒子層及び光反射層の厚みから、光反射性粒子(酸化チタン)は、一方の主面側からフィルム状回路接続材料の厚みの5%以内の範囲に偏って分布していることが分かる。   The obtained conductive particle layer, non-conductive particle layer, and light reflection layer were laminated in this order, and bonded together through a laminator while heating to 50 ° C. By sandwiching this with a fluororesin film, a film-like circuit connecting material (i) having a three-layer structure of conductive particle layer / non-conductive particle layer / light reflecting layer was obtained. In the film-like circuit connecting material (i), from the thickness of the conductive particle layer, the non-conductive particle layer, and the light reflecting layer, the light reflecting particles (titanium oxide) have the thickness of the film-like circuit connecting material from one main surface side. It can be seen that the distribution is biased within a range of 5% or less.

実施例2
実施例1の非導電粒子層、導電粒子層及び光反射層を、この順に積層し、50℃に加温しながらラミネーターを通して貼り合わせた。これをフッ素樹脂フィルムで挟むことで、非導電粒子層/導電粒子層/光反射層の三層構成のフィルム状回路接続材料(ii)を得た。フィルム状回路接続材料(ii)において、導電粒子層、非導電粒子層及び光反射層の厚みから、光反射性粒子(酸化チタン)は、一方の主面側からフィルム状回路接続材料の厚みの5%以内の範囲に偏って分布していることが分かった。
Example 2
The nonconductive particle layer, the conductive particle layer, and the light reflection layer of Example 1 were laminated in this order, and were bonded together through a laminator while heating to 50 ° C. By sandwiching this with a fluororesin film, a film-like circuit connecting material (ii) having a three-layer structure of non-conductive particle layer / conductive particle layer / light reflecting layer was obtained. In the film-like circuit connecting material (ii), from the thickness of the conductive particle layer, the non-conductive particle layer, and the light reflecting layer, the light reflecting particles (titanium oxide) have the thickness of the film-like circuit connecting material from one main surface side. It was found that the distribution was unevenly distributed within a range of 5% or less.

実施例3
光反射層を貼り合わせずに、実施例1の非導電粒子層と同様の組成に光反射性粒子を更に加えて分散させ、厚みが14μmの光反射層を作製した。これと実施例1と同様の導電粒子層を、実施例1と同様の方法で貼り合わせ、光反射層/導電粒子層の二層構成のフィルム状回路接続材料(iii)を準備した。フィルム状回路接続材料(iii)において、光反射層及び導電粒子層の厚みから、光反射性粒子(酸化チタン)は、一方の主面側からフィルム状回路接続材料の厚みの74%以内の範囲に偏って分布していることが分かる。
Example 3
Without attaching the light reflecting layer, light reflecting particles were further added and dispersed in the same composition as the non-conductive particle layer of Example 1 to produce a light reflecting layer having a thickness of 14 μm. This and the same conductive particle layer as in Example 1 were bonded together in the same manner as in Example 1 to prepare a film-like circuit connecting material (iii) having a two-layer structure of light reflecting layer / conductive particle layer. In the film-like circuit connecting material (iii), the thickness of the light-reflecting particle (titanium oxide) is within 74% of the thickness of the film-like circuit connecting material from one main surface side, based on the thickness of the light reflecting layer and the conductive particle layer. It can be seen that the distribution is biased.

比較例1
光反射層を貼り合せなかったこと以外は、実施例1と同様にし、フッ素樹脂フィルムで挟むことで、導電粒子層/非導電粒子層の二層構成のフィルム状回路接続材料(iv)を得た。
Comparative Example 1
A film-like circuit connecting material (iv) having a two-layer structure of conductive particle layer / non-conductive particle layer is obtained by sandwiching between fluororesin films in the same manner as in Example 1 except that the light reflecting layer is not bonded. It was.

(評価方法)
図4は、評価用基板を示す模式図である。評価用基板は、第二の回路基板64上に第二の回路電極62を有する第二の回路部材60に相当する。図4の評価用基板は、第二の回路基板64としてのガラス基板と、2×3mmの大きさの金属パッドと金属パッドにつながる幅0.5mmの金属配線が繰り返し並ぶパターン(第二の回路電極)とを有している。
(Evaluation method)
FIG. 4 is a schematic view showing an evaluation substrate. The evaluation board corresponds to the second circuit member 60 having the second circuit electrode 62 on the second circuit board 64. 4 is a pattern in which a glass substrate as the second circuit board 64, a metal pad having a size of 2 × 3 mm, and a metal wiring having a width of 0.5 mm connected to the metal pad are repeatedly arranged (second circuit). Electrode).

フィルム状回路接続材料(i)〜(iv)を、図4(a)のaに示すように、5×25mmの大きさで切り出して貼り付けた。評価用基板(1)は、フィルム状回路接続材料(i)を用い、導電粒子層側を基板の配線(回路)面に貼り付けたものである。評価用基板(2)は、フィルム状回路接続材料(ii)を用い、非導電粒子層側を基板の配線(回路)面に貼り付けたものである。評価用基板(3)は、フィルム状回路接続材料(iii)を用い、光反射層側を基板の配線(回路)面に貼り付けたものである。評価用基板(4)は、フィルム状回路接続材料(iv)を用い、導電粒子層側を基板の配線(回路)面に貼り付けたものである。   The film-like circuit connection materials (i) to (iv) were cut out and pasted in a size of 5 × 25 mm as shown in a of FIG. The evaluation substrate (1) is obtained by using a film-like circuit connecting material (i) and attaching the conductive particle layer side to the wiring (circuit) surface of the substrate. The evaluation substrate (2) is obtained by using the film-like circuit connecting material (ii) and attaching the nonconductive particle layer side to the wiring (circuit) surface of the substrate. The evaluation substrate (3) is obtained by using a film-like circuit connecting material (iii) and attaching the light reflection layer side to the wiring (circuit) surface of the substrate. The evaluation substrate (4) is obtained by using the film-like circuit connecting material (iv) and attaching the conductive particle layer side to the wiring (circuit) surface of the substrate.

評価用基板(1)〜(4)を、熱圧着装置(芝浦メカトロニクス株式会社製)を用いてフッ素樹脂フィルムの上から100℃で5秒間の加熱加圧を行い、それと同時にガラス基板側から500mJ(125mW×4s)の紫外線照射を行った。   The evaluation substrates (1) to (4) were heated and pressurized at 100 ° C. for 5 seconds from the top of the fluororesin film using a thermocompression bonding apparatus (manufactured by Shibaura Mechatronics Co., Ltd.), and at the same time, 500 mJ from the glass substrate side. Irradiation with ultraviolet rays (125 mW × 4 s) was performed.

評価用基板(1)〜(4)の金属パッド及び金属配線上のフィルム状回路接続材料(i)〜(iv)は、ガラス基板側から照射された光が直接当たらない(遮光)状態となる。そのため、金属パッドの中央部の硬化物の反応率(エポキシの転化率)を測定することで、遮光部分の反応性が向上しているかどうかを確認した。   The metal pads of the evaluation substrates (1) to (4) and the film-like circuit connecting materials (i) to (iv) on the metal wirings are in a state where light irradiated from the glass substrate side is not directly applied (light shielding). . Therefore, it was confirmed whether the reactivity of the light-shielding portion was improved by measuring the reaction rate of the cured product (epoxy conversion rate) at the center of the metal pad.

遮光部の反応性は、フィルム状回路接続材料(i)〜(iv)の硬化物の図4(a)のbにおける遮光部分中央部(図4(b)のc)を、FT−IR(BIO−RAD社製)を用いて測定することによってエポキシ転化率を求めた。エポキシ転化率は、3回測定を行い、その平均値を示す。表1にエポキシ転化率を示す。   The reactivity of the light-shielding part is determined by FT-IR (the center part of the light-shielding part (c in FIG. 4B) in b of FIG. 4A of the cured product of the film-like circuit connecting materials (i) to (iv). Epoxy conversion was determined by measurement using BIO-RAD. The epoxy conversion rate is measured three times and shows the average value. Table 1 shows the epoxy conversion.

Figure 2016171133
Figure 2016171133

FT−IRの測定結果より、評価用基板(4)の平均エポキシ転化率は8.9%であったのに対して、評価用基板(1)の平均エポキシ転化率は35.5%、評価用基板(2)の平均エポキシ転化率は46.7%、評価用基板(3)の平均エポキシ転化率は17.9%であった。   From the measurement result of FT-IR, the average epoxy conversion of the evaluation substrate (4) was 8.9%, whereas the average epoxy conversion of the evaluation substrate (1) was 35.5%. The average epoxy conversion of the substrate (2) for use was 46.7%, and the average epoxy conversion of the substrate for evaluation (3) was 17.9%.

2…光反射性粒子、4…導電粒子、10…光反射層、20、10a、30a、40a…接着剤、30…導電粒子層、40…非導電粒子層、50…第一の回路部材、52…第一の回路電極、54…第一の回路基板、60…第二の回路部材、62…第二の回路電極、64…第二の回路基板、70…フィルム状回路接続材料の硬化物、80…光照射部材、82…加熱押圧部材、90…支持ステージ、92…光透過部、100…フィルム状回路接続材料、100a…主面、200…回路部材の接続構造体。   2 ... light reflective particles, 4 ... conductive particles, 10 ... light reflective layer, 20, 10a, 30a, 40a ... adhesive, 30 ... conductive particle layer, 40 ... non-conductive particle layer, 50 ... first circuit member, 52 ... 1st circuit electrode, 54 ... 1st circuit board, 60 ... 2nd circuit member, 62 ... 2nd circuit electrode, 64 ... 2nd circuit board, 70 ... Hardened | cured material of film-form circuit connection material DESCRIPTION OF SYMBOLS 80 ... Light irradiation member, 82 ... Heat press member, 90 ... Support stage, 92 ... Light transmission part, 100 ... Film-like circuit connection material, 100a ... Main surface, 200 ... Connection structure of circuit member.

Claims (7)

第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、前記第一の回路電極と前記第二の回路電極とが電気的に接続されるように接着するための光硬化型のフィルム状回路接続材料であって、
当該フィルム状回路接続材料が、接着剤と、該接着剤中に分散している光反射性粒子とを含み、
前記光反射性粒子が、当該フィルム状回路接続材料の厚み方向において、当該フィルム状回路接続材料の一方の主面側に偏って分布している、フィルム状回路接続材料。
A first circuit member having a first circuit board and a first circuit electrode provided on the first circuit board; a second circuit board and a second circuit board provided on the second circuit board; A photo-curing type film-like circuit connection material for adhering a second circuit member having the circuit electrode to the first circuit electrode and the second circuit electrode so as to be electrically connected to each other. There,
The film-like circuit connecting material includes an adhesive and light-reflective particles dispersed in the adhesive,
The film-like circuit connection material in which the light-reflecting particles are distributed in a biased manner toward one main surface of the film-like circuit connection material in the thickness direction of the film-like circuit connection material.
当該フィルム状回路接続材料が、前記一方の主面側に設けられた前記光反射性粒子を含有する光反射層と、導電粒子を含有する導電粒子層と、を備え、これらがこの順に積層されている、請求項1に記載のフィルム状回路接続材料。   The film-like circuit connecting material includes a light reflecting layer containing the light reflecting particles provided on the one main surface side, and a conductive particle layer containing conductive particles, and these are laminated in this order. The film-like circuit connecting material according to claim 1. 当該フィルム状回路接続材料が、導電粒子を実質的に含有しない非導電粒子層を更に備え、該非導電粒子層が前記光反射性粒子と前記導電粒子層との間に積層されている、請求項2に記載のフィルム状回路接続材料。   The film-like circuit connecting material further comprises a non-conductive particle layer substantially free of conductive particles, and the non-conductive particle layer is laminated between the light-reflecting particles and the conductive particle layer. 2. The film-like circuit connecting material according to 2. 当該フィルム状回路接続材料が、導電粒子を実質的に含有しない非導電粒子層を更に備え、前記光反射層、前記導電粒子層及び前記非導電粒子層がこの順に積層されている、請求項2に記載のフィルム状回路接続材料。   The film-like circuit connecting material further includes a non-conductive particle layer substantially free of conductive particles, and the light reflecting layer, the conductive particle layer, and the non-conductive particle layer are laminated in this order. The film-like circuit connecting material according to 1. 第一の回路基板及び該第一の回路基板上に設けられた第一の回路電極を有する第一の回路部材と、第二の回路基板及び該第二の回路基板上に設けられた第二の回路電極を有する第二の回路部材とを、これらの間に請求項1〜4のいずれか一項に記載のフィルム状回路接続材料を介在させながら、前記第一の回路電極及び前記第二の回路電極が対向するように配置する工程と、
前記フィルム状回路接続材料に光を照射すること及び前記フィルム状回路接続材料を加熱することを含む方法により前記フィルム状回路接続材料を硬化して、前記第一の回路電極と前記第二の回路電極とが電気的に接続されるように接着された接続構造体を得る工程と、を備える、回路部材の接続構造体の製造方法。
A first circuit member having a first circuit board and a first circuit electrode provided on the first circuit board; a second circuit board and a second circuit board provided on the second circuit board; The first circuit electrode and the second circuit member with the second circuit member having the circuit electrode of the first circuit electrode and the second circuit member interposed therebetween with the film-like circuit connecting material according to any one of claims 1 to 4 interposed therebetween. Arranging the circuit electrodes so that they face each other,
Curing the film-like circuit connecting material by a method comprising irradiating the film-like circuit connecting material with light and heating the film-like circuit connecting material, and the first circuit electrode and the second circuit And a step of obtaining a connection structure bonded so that the electrodes are electrically connected to each other.
前記フィルム状回路接続材料が、前記一方の主面が前記第一の回路部材側になる向きで配置され、
前記第二の回路基板側から前記フィルム状回路接続材料に前記光が照射される、請求項5に記載の製造方法。
The film-like circuit connecting material is arranged in a direction in which the one main surface is on the first circuit member side,
The manufacturing method according to claim 5, wherein the film-like circuit connection material is irradiated with the light from the second circuit board side.
前記第一の回路部材が半導体チップで、前記第二の回路基板が光透過性基板である、請求項5又は6に記載の製造方法。   The manufacturing method according to claim 5 or 6, wherein the first circuit member is a semiconductor chip and the second circuit board is a light-transmitting substrate.
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