JP2016170083A - Component inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a component inspection device capable of stably inspecting stepped through-holes.SOLUTION: An inspection device 1 inspects a stepped through-hole (internally stepped through-hole comprising a large-diameter hole section with a larger inner diameter and a penetrating section with a smaller inner diameter formed at a bottom thereof) by inserting a pin to detect defects through physical contact for the large-diameter hole section with a larger inner diameter, and by checking passage of light to optically detect defects for the penetrating section with a small diameter. Inspecting the penetrating section with a smaller inner diameter by inserting a pin tends to cause pin breakage. Since the inspection device 1 uses the pin insertion method only for the large-diameter section with a larger inner diameter and contactlessly inspects the penetrating section with a smaller inner diameter by means of an optical method, chances of having troubles caused by pin breakage during an inspection is effectively suppressed.SELECTED DRAWING: Figure 4

Description

  The present invention relates to a component inspection apparatus, for example, a device that inspects a hole processed into a component and a through-hole formed in the bottom surface of the hole.

Conventionally, when inspecting a stepped through-hole formed in a workpiece (a through-hole in which a small-diameter through-hole is formed at the bottom of a large-diameter hole), the step is confirmed to be normally formed in the workpiece. A pin was inserted for inspection.
As a technique for inspecting a hole portion by inserting a pin in this way, there is a “board hole inspection apparatus for printed circuit board” of Patent Document 1. This technique inspects a reference hole formed in a printed circuit board, and inserts a gauge pin into the reference hole to inspect the presence / absence and size of the hole.

  However, in this technique, since the pin is inserted to the thickness of the workpiece, there is a problem that the occurrence rate of pin breakage is high at the through portion having a small diameter.

Japanese Patent Laid-Open No. 7-30225

  An object of this invention is to test | inspect a stepped through-hole stably.

(1) In order to achieve the above object, according to the first aspect of the present invention, in the first aspect of the present invention, a predetermined protrusion is inserted into a hole formed in a component to detect a defect in the hole. And a second detection unit configured to detect a defect in a through portion having an inner diameter smaller than the inner diameter of the hole portion based on light passing through the through portion. A determination unit that determines whether the component is acceptable based on the detection result of the first detection unit and the detection result of the second detection unit; and an output unit that outputs the determined determination result. A component inspection apparatus is provided.
(2) In the invention according to claim 2, when the defect is not detected by the first detection unit and the second detection unit, the determination unit determines that the part is acceptable, and the first 2. The component inspection apparatus according to claim 1, wherein if a defect is detected in at least one of the first detection unit and the second detection unit, the component is determined to be rejected. 3. To do.
(3) In the invention according to claim 3, a plurality of holes are formed in the component, and the first detection means includes a plurality of protrusions corresponding to the positions of the plurality of holes. 3. The device according to claim 1, wherein the plurality of protrusions are inserted into the plurality of holes by the same operation to detect a defect in each of the holes. 4. A component inspection apparatus is provided.
(4) In the invention according to claim 4, the first detection means has a plurality of positioning pins, and before inserting the plurality of protrusions into the plurality of holes by the same operation, The component inspection apparatus according to claim 3, wherein the component is positioned by inserting the plurality of positioning pins into a plurality of reference holes formed in the component.
(5) In the invention according to claim 5, the second detection means simultaneously detects defects in a plurality of through portions formed on the bottom surfaces of the plurality of holes. Or a component inspection apparatus according to claim 4.
(6) In the invention according to claim 6, the first detection means and the second detection means support and detect the component so that the penetration direction of the penetration portion is different from gravity. A component inspection apparatus according to any one of claims 1 to 5 is provided.
(7) In the invention according to claim 7, an inclined path that is lowered by its own weight while maintaining the direction of the component is provided, and the first detection unit and the second detection unit include the component to be lowered. The component inspection apparatus according to claim 6, wherein the component is supported by being brought into contact with a predetermined member and stopped.

  According to the present invention, a stepped through hole can be stably inspected by combining physical inspection and optical inspection.

It is a figure for demonstrating an inspection jig etc. FIG. It is a figure for demonstrating the structure of a large diameter hole inspection unit. It is a figure for demonstrating the structure of a penetration part test | inspection unit. It is a figure for demonstrating an inspection apparatus. And FIG. 17 is a diagram for explaining a configuration of a computer. It is a flowchart for demonstrating a test | inspection procedure.

(1) Outline of Embodiment The inspection apparatus 1 (FIG. 4) includes a stepped through hole (a large-diameter hole portion having a large inner diameter and a through-hole portion having a small inner diameter formed on the bottom surface thereof, For a large-diameter hole part with a large inner diameter, a pin is inserted and a defect is detected by physical contact. For a through-hole part with a small inner diameter, the optical defect is confirmed by confirming the passage of light. Is detected.
When a through-hole with a small inner diameter is inspected by inserting a pin, pin breakage is likely to occur. However, the inspection apparatus 1 uses a large-diameter hole with a large inner diameter that does not easily cause pin breakage, and a small-diameter through-hole. Since the part is inspected in a non-contact manner by an optical method, it is possible to effectively suppress the occurrence of defects due to pin breakage during the inspection.

(2) Details of Embodiment A method for inspecting a stepped hole will be described with reference to FIGS.
A stepped through hole (stepped hole) is a large-diameter hole part formed from the surface of a part (workpiece) to the middle and a bottom part of the large-diameter hole part, and a through-part (smaller inside diameter than the large-diameter hole) (Through hole).
In the present embodiment, the large diameter hole portion is inspected by the large diameter hole portion inspection unit, and the penetration portion is inspected by the penetration portion inspection unit.

First, the large-diameter hole inspection unit 30 will be described with reference to FIGS. 1 and 2.
FIG. 1A shows an example of a component 10 to be inspected. The upper figure is a top view and the lower figure is a cross-sectional view.
For example, the component 10 is a plate-like mechanical component having a rectangular outer shape, and a plurality of through holes are formed in the thickness direction.

Among these through-holes, reference through-holes 11 and 12 formed in regions close to both end sides of the component 10 are holes for positioning the component 10 at the time of inspection.
In the present embodiment, the reference through-holes 11 and 12 are formed by through-holes. However, as long as positioning is possible, holes that do not penetrate may be used.

The through holes 13, 14, 15 formed in the central region of the component 10 are used for manufacturing a product using the component 10, such as a shaft hole of a gear or a punched pilot hole. , 14 and 15 are inspection target regions 16.
In the present embodiment, the through holes 13, 14, 15 are round holes, but may be square holes.

The through hole 13 is a simple through hole having a constant inner diameter, and the through holes 14 and 15 are stepped through holes whose inner diameter changes midway.
For example, the through-hole 14 has a large-diameter hole portion 141 formed from one end face of the component 10 to a predetermined depth, and a bottom surface of the large-diameter hole portion 141. The through-hole 14 has a smaller inner diameter than the large-diameter hole portion 141. It is comprised from the penetration part 142 formed concentrically with the part 141. FIG.

Similarly, the through hole 15 similarly includes a large diameter hole portion 151 and a through portion 152.
Here, as an example, the depth of the large-diameter hole 151 is formed deeper than the large-diameter hole 141.
Hereinafter, the end surface on the side where the large-diameter hole portions 141 and 151 are formed is referred to as the upper end surface, and the end surface on the other side is referred to as the lower end surface.
Note that the vertical direction used in the following description is for convenience, and the inspection apparatus 1 to be described later inspects the component 10 in an upright state (that is, in a state where the vertical direction is the horizontal direction).

FIG. 1B is a view for explaining an inspection jig 31 for inspecting the large-diameter holes 141 and 151.
The inspection jig 31 is formed of a plate member 20 having the same size as the component 10 and a plurality of protrusions formed on the lower end surface (surface facing the component 10).

The protrusions have reference pins 21 and 22 corresponding to the reference through holes 11 and 12, respectively, and inspection pins 24 and 25 corresponding to the large-diameter holes 141 and 151, respectively. These pins are erected on the lower end surface of the plate member 20 like a sword mountain (having protrusions on a metal stand).
In this way, by designing the inspection jig 31 formed in a sword shape to be inserted toward the component 10, a plurality of large-diameter holes can be inspected simultaneously.
Moreover, the inspection jig 31 has a function of dropping residual chips as well as inspection.

The reference pins 21 and 22 are respectively erected at positions corresponding to the reference through holes 11 and 12, and the outer diameters of the reference pins 21 and 22 are set so as to be inserted into the reference through holes 11 and 12 with a clearance fit. Formed with fit tolerance.
The reference pins 21 and 22 are formed longer than the pins 24 and 25, and their tips are formed in a tapered shape so as to be easily guided by the reference through holes 11 and 12.

For this reason, when the inspection jig 31 is moved toward the component 10, first, the reference pins 21 and 22 are inserted into the reference through holes 11 and 12 to draw the component 10 to the inspection position.
In this way, the positioning accuracy of the component 10 with respect to the inspection jig 31 can be increased using the reference pins 21 and 22.
After the component 10 is positioned by the reference pins 21 and 22, the pins 24 and 25 are subsequently inserted into the large-diameter holes 141 and 151, as shown in FIG.
The pins 24 and 25 are also inserted into the large-diameter holes 141 and 151 with a clearance fit.

In the present embodiment, the inspection of the large diameter holes 141 and 151 is to confirm that the large diameter holes 141 and 151 are formed, and the lengths of the pins 24 and 25 require inspection. The minimum required depth up to a predetermined depth is used to make it easier for the pins 24 and 25 to enter and exit.
By detecting the contact state of the pins 24, 25 and the large-diameter hole portions 141, 151 in the cross-sectional direction and the end surface direction, it is possible to determine whether the large-diameter hole portions 141, 151 are appropriately formed. .
In the present embodiment, the pins 24 and 25 are formed in a cylindrical shape in accordance with the large-diameter holes 141 and 151. However, the large-diameter holes 141 are smaller than the inner diameters of the large-diameter holes 141 and 151. 151, any shape such as a prismatic shape can be used.

Each drawing of FIG. 2 is a diagram for explaining the configuration of the large-diameter hole inspection unit.
The large-diameter hole inspection unit 30 is an assembly that detects defects in the large-diameter holes 141 and 151 using the inspection jig 31.

FIG. 2A is a diagram showing a configuration of the large-diameter hole inspection unit 30.
The lower end of the bar member 33 is fixed to the upper end surface of the plate member 20 so that the axial direction is vertically upward with respect to the upper end surface.
The upper end of the bar member 33 is fixed to the lower end surface of the plate member 32, and the plate member 20 and the plate member 32 are coupled by the bar member 33 so that the end surfaces are parallel to each other.
A contact sensor 34 that detects contact with a plate member 37 (described later) is installed on the lower end surface of the plate member 32.

A through hole through which the bar member 33 is slidably inserted is formed in the center of the plate member 37, and can be moved up and down along the bar member 33 between the plate member 20 and the plate member 32.
Between the plate member 37 and the plate member 20, a coil spring 35 that urges the plate member 37 toward the plate member 32 is disposed concentrically with the rod member 33.
The plate member 37 is pressed by the contact sensor 34 due to the elastic force of the coil spring 35 to be stationary, thereby being held at a certain distance from the plate member 32.

A vertical movement mechanism 36 that moves the plate member 37 up and down is installed on a side surface of the plate member 37 to hold the plate member 37 at a predetermined height.
Thus, the inspection jig 31 is held in the air, and a space for installing the component 10 to be inspected is secured in the lower region.

The large-diameter hole inspection unit 30 is configured as described above, and the inspection of the component 10 using the large-diameter hole inspection unit 30 is performed as follows.
First, the component 10 is installed in the space below the inspection jig 31.
In this state, the vertical movement mechanism 36 is driven to lower the inspection jig 31 and insert each pin of the inspection jig 31 into the corresponding hole of the component 10.

If there is no defect in the hole of the component 10, first, the reference pins 21 and 22 are inserted into the reference through holes 11 and 12 to position the component 10, and then, as shown in FIG. 25 are inserted into the large-diameter holes 141 and 151, respectively.
The movable range of the vertical movement mechanism 36 is set so as to stop when the pins 24 and 25 are inserted as much as necessary for the inspection of the large-diameter holes 141 and 151.

When there is no defect in the large diameter holes 141 and 151, the pins 24 and 25 do not contact the large diameter holes 141 and 151, so the inspection jig 31 does not receive a force from the component 10.
Therefore, the plate member 32 does not move with respect to the plate member 37, and the contact sensor 34 remains in contact with the upper end surface of the plate member 37. The large-diameter hole inspection unit 30 detects that there is no defect by not detecting that the contact sensor 34 is separated from the plate member 37 in this way.

On the other hand, when at least one of the large-diameter holes 141 and 151 is defective and the large-diameter hole is not formed, foreign matter is clogged, or the inner diameter is insufficient, FIG. ), The pins 24 and 25 are brought into contact with the defective portion, and the inspection jig 31 is pushed up with respect to the plate member 37.
In the illustrated example, since the large-diameter hole 151 is not formed, the lower end of the pin 25 comes into contact with the upper end surface of the component 10 and the inspection jig 31 is pushed upward.
As a result, the contact sensor 34 is separated from the upper end surface of the plate member 37, and this is detected from the output of the contact sensor 34, and it is detected that at least one of the large-diameter holes 141 and 151 is defective.

As described above, the large-diameter hole inspection unit 30 functions as a first detection unit that inserts a predetermined protrusion into a hole (large-diameter hole) formed in a component and detects a defect in the hole. doing.
The large-diameter hole inspection unit 30 has a plurality of protrusions corresponding to the positions of the plurality of holes, and the plurality of protrusions are inserted into the plurality of holes by the same operation, so that the individual holes The defect of the part is detected.
Furthermore, the large-diameter hole inspection unit 30 has reference pins 21 and 22 that function as positioning pins. The positioning of the component is performed by inserting a plurality of positioning pins into a plurality of reference holes formed in the component. Is going.

As described above, with respect to the large-diameter hole portion, it is possible to insert a thick and short pin that is difficult to break, so the large-diameter hole inspection unit 30 performs an inspection by inserting the pin.
In the inspection jig 31, the displacement of the inspection jig 31 with respect to the plate member 37 is detected by the contact sensor 34. However, any sensor that can detect the displacement may be used, and a proximity sensor, a current sensor, a displacement meter, or the like may be used. it can.

FIG. 3A is a diagram for explaining the configuration of the penetrating portion inspection unit 40.
The penetrating part inspection unit 40 is configured using a camera 6 that captures one end face of the component 10, an illumination 5 that illuminates the other end face, and a computer (not shown) that analyzes an image captured by the camera 6.
When the end face of the component 10 is illuminated with the illumination 5 and the end face facing the part 10 is photographed by the camera 6, the light passing through the through hole 13 and the through portions 142 and 152 is photographed.

FIG. 3B shows an example of an image taken in this way.
In the image 41, light passing through each hole is photographed.
In the image 41, the computer calculates the areas of the bright areas 53, 54, and 55 shown in the areas 43, 44, and 45 corresponding to the through hole 13 and the through portions 142 and 152, and if the area is equal to or greater than a predetermined threshold value. These through portions are formed normally and are judged to pass the inspection.

On the other hand, if the area of the bright region is less than the threshold value, it is determined that the inspection is unacceptable because the through hole 13 and the through portions 142 and 152 are not vacant or are clogged with chips.
As described above, the penetration portion inspection unit 40 inspects a thin penetration portion that is likely to cause pin breakage by light passage (transmission).

The areas 51 and 52 corresponding to the reference through-holes 11 and 12 also appear bright because light passes through them, but the computer corrects the position of the image 41 based on the positions of the bright areas of the areas 51 and 52, and based on this. Area 43, 44, 45 is set.
Further, in the penetration portion inspection unit 40, a light emitting element can be used instead of the illumination 5 and a light receiving element can be used instead of the camera 6.

The penetration part inspection unit 40 functions as a second detection unit that detects a defect in the penetration part formed on the bottom surface of the hole part and having an inner diameter smaller than the inner diameter of the hole part based on light passing through the penetration part. doing.
And the penetration part inspection unit 40 is detecting simultaneously the defect of the some penetration part formed in the bottom face of a some hole part by imaging | photography the light which passes a some penetration part simultaneously.

FIG. 4 is a diagram for explaining the inspection apparatus for the component 10.
The inspection device 1 includes a transport rail 2, a large-diameter hole inspection unit 30, a penetration inspection unit 40, a computer 7, and the like.
The transport rail 2 is a member in which a transport path for transporting the component 10 is formed in the inside longitudinal direction, and the longitudinal direction is installed with a predetermined angle with respect to a horizontal plane.
Further, the posture of the component 10 is defined by the conveyance path, and the component 10 maintains the posture in which the penetrating direction of the penetrating portion is horizontal (that is, with the end face of the component 10 upright), and the conveyance rail. The transport path in 2 is lowered by its own weight from the high side to the low side.
Thus, the conveyance path of the conveyance rail 2 functions as an inclined path that is lowered by its own weight while maintaining the direction of the parts.

In the middle of the transport path, positioning pins 3 and 4 can be inserted from through holes formed at the bottom of the transport path in a direction blocking the transport path. A pin driving device (not shown) for individually inserting and withdrawing 4 into the transport path is attached.
The positioning pin 3 is provided on the upstream side of the transport rail 2, and the positioning pin 4 is provided on the downstream side.

When the positioning pins 3 and 4 are inserted by the pin driving device, the component 10 descending the transport rail 2 comes into contact with the positioning pins 3 and 4 and a predetermined inspection position (large diameter) defined by the positioning pins 3 and 4 is reached. When the positioning pins 3 and 4 are pulled out by the pin driving device, the component 10 further descends the transport rail 2.
As described above, the inspection means by the large-diameter hole inspection unit 30 and the through-hole inspection unit 40 of the inspection apparatus 1 supports the component by bringing the descending component into contact with a predetermined member and stopping it.

In the inspection position defined by the positioning pin 3, a hollow window 63 that is an opening for inspection is formed on both side surfaces of the transport rail 2, and a large-diameter hole inspection unit 30 is provided outside the hollow window 63. is set up.
The large-diameter hole inspection unit 30 is configured such that the inspection jig 31 can be inserted into the conveyance rail 2 from the cut-out window 63, and the component 10 supported at the inspection position in the middle of the conveyance rail 2 by the positioning pin 3. The inspection jig 31 is inserted into the large-diameter hole portions 141 and 151.

Further, at the inspection position defined by the positioning pin 4, a hollow window 64 that is an opening for inspection is formed on both sides of the transport rail 2, and the part 10 is photographed on one side of the hollow window 64. A camera 6 is installed, and an illumination 5 for irradiating the component 10 with light is installed on the opposite side.
Since the penetration direction of the through-hole of the component 10, the irradiation direction of the light of the illumination 5, and the shooting direction of the camera 6 are all on the same straight line, the light emitted from the illumination 5 passes through the through-hole, Photographed by the camera 6.
As described above, since the large-diameter hole inspection unit 30 and the through-hole inspection unit 40 inspect with the end face of the component 10 upright, the component is supported so that the penetration direction of the through-portion is different from gravity. And inspected.

The computer 7 controls the inspection operation of the large-diameter hole inspection unit 30 and the inspection operation of the through-hole inspection unit 40 and determines the inspection result.
Regarding the inspection by the large-diameter hole inspection unit 30, the computer 7 inserts the positioning pin 3 and stops the component 10 descending the transport rail 2 at the inspection position of the large-diameter hole inspection unit 30.

Then, the computer 7 drives the inspection jig 31 and inserts it into the component 10, confirms the signal from the contact sensor 34, and determines the presence or absence of defects in the large-diameter holes 141 and 151.
When the inspection is completed, the computer 7 pulls out the positioning pin 3 and lowers the component 10 by its own weight and sends it to the penetrating portion inspection unit 40.

On the other hand, regarding the inspection in the penetration part inspection unit 40, the positioning pin 4 is inserted to stop the component 10 descending the transport rail 2 at the inspection position of the penetration part inspection unit 40.
Then, the computer 7 photographs the part 10 illuminated by the illumination 5 with the camera 6 and analyzes the image 41 to determine the presence or absence of defects in the through hole 13 and the through portions 142 and 152.
When the inspection is completed, the computer 7 pulls out the positioning pin 4 and lowers the component 10 by its own weight and sends it out.

The computer 7 determines that the component 10 is an acceptable product when no defect is detected by both the inspection by the large-diameter hole inspection unit 30 and the inspection by the through-hole inspection unit 40, and at least one of them is determined. If a defect is detected in, it is determined as a rejected product.
Although not shown in the drawing, an acceptable product conveyance path for conveying acceptable products and an unacceptable product conveyance path for conveying unacceptable products are formed on the lower end side of the conveyance rail 2, and the computer 7 drives the path switching device. Then, the acceptable product is sent to the accepted product conveyance path, and the unacceptable product is sent to the unacceptable product conveyance path.

As described above, the inspection apparatus 1 selects a determination unit that determines the pass / fail of the parts based on the detection results of the large-diameter hole inspection unit 30 and the through-hole inspection unit 40, and an acceptable product conveyance path or an unacceptable product conveyance path. Thus, output means for outputting the determination result is provided.
Then, when the defect is not detected by the large-diameter hole inspection unit 30 and the defect is not detected by the through-hole inspection unit 40, the determination means determines that the part is acceptable and at least one of the defects is defective. If it is detected, the part is determined to be rejected.

FIG. 5 is a diagram illustrating a hardware configuration of the computer 7.
The computer 7 includes a CPU (Central Processing Unit) 71, a ROM (Read Only Memory) 72, a RAM (Random Access Memory) 73, an interface 74, an input device 75, an output device 76, a storage device 77, and the like connected by a bus line. It is configured.

The CPU 71 is a central processing unit that performs various types of information processing and control in accordance with programs stored in a storage device or the like.
In the present embodiment, the control of the input device that inputs the component 10 to the transport rail 2, the control of the pin driving device, the operation control of the inspection jig 31, the capture of the image data from the camera 6, the position correction of the image data, and the penetration The pass / fail judgment of the holes 13 to 15 and the sorting control of the accepted product and the rejected product are performed.

The ROM 72 is a read-only memory, and stores basic programs and parameters when the computer 7 operates.
The RAM 73 is a readable / writable memory and provides a working memory when the CPU 71 operates.
More specifically, the CPU 71 develops on the RAM 73 the reference value of the area through which the image data taken by the camera 6 and the light used for the determination of the through hole 13 and the through portions 142 and 152 have passed, that is, the reference area. The presence or absence of a defect is determined by comparing the area of the portion where light on the image has passed with the reference area.

The storage device 77 is configured using a storage medium such as a hard disk or an EEPROM (Electrically Erasable Programmable Read-Only Memory), and an inspection program for operating the computer 7, reference area data used for inspection, and inspection results (not shown). I remember.
The reference area data defines the positions of the through holes 13 and the through portions 142 and 152 formed in the component 10 and the reference areas of these determination criteria.
The CPU 71 executes an inspection operation by executing an inspection program, and determines the presence or absence of a defect using the reference area data.

The interface 74 is an interface for connecting the computer 7 to a pin driving device, a large-diameter hole inspection unit 30, a penetration inspection unit 40, a path switching device, and the like.
The computer 7 communicates via the interface 74 to individually insert and remove the positioning pins 3 and 4, drive the inspection jig 31 to receive a signal from the contact sensor 34, and receive image data from the camera 6. And control the pin driving device and the path switching device.

The input device 75 is an input device for an operator to operate the inspection device 1 such as a keyboard and a mouse.
The output device 76 is an output device for providing the worker with various information such as a monitor screen for displaying an inspection screen, a speaker for outputting a warning sound, a printer for printing the inspection result, and the like.

FIG. 6 is a flowchart for explaining a procedure in which the inspection apparatus 1 inspects the component 10.
The following processing is performed by the CPU 71 of the inspection apparatus 1 according to the inspection program.
First, the CPU 71 drives the pin driving device to insert the positioning pins 3 and 4 into the path of the transport rail 2 (step 5).

Next, the CPU 71 drives the input device to input the component 10 onto the transport rail 2 (step 10).
The component 10 descends the transport rail 2 and comes into contact with the positioning pin 3 and stops at the inspection position of the large-diameter hole inspection unit 30.
Next, the CPU 71 drives the large-diameter hole inspection unit 30 to insert the inspection jig 31 into the large-diameter holes 141 and 151 of the component 10 (step 15). Is determined (step 20).

When there is no defect (step 20; N), the CPU 71 drives the large-diameter hole inspection unit 30 to release the inspection jig 31 inserted into the large-diameter holes 141 and 151 of the component 10 (step 23). .
Thereafter, the CPU 71 releases the positioning pin 3 by the pin driving device (step 25).
The component 10 descends the transport rail 2 and comes into contact with the positioning pin 4 and stops at the inspection position of the penetrating portion inspection unit 40.

Next, the CPU 71 images the part 10 with the camera 6 (step 30), and determines the presence or absence of defects in the through hole 13 and the through portions 142 and 152 based on the image 41 (step 35).
The determination of the presence / absence of the defect is based on the correction of the shift amount of the image 41 and the defect determination based on the area of the passing light.
The correction of the shift amount of the image 41 refers to correcting the coordinate system of the reference area data according to the shift amount in the conveyance path direction of the component 10 and the shift amount in the rotation direction in the image 41 taken by the camera 6. When determining the defect in step 20, the component 10 is inserted into the reference through-holes 11 and 12 by the reference pins 21 and 22 of the inspection jig 31. However, when the inspection jig 31 inserted in step 23 is subsequently released, the component 10 may be displaced, so that this displacement amount is corrected. However, when the deviation due to the release of the inspection jig does not occur due to the shape of the component 10 or the like, the deviation amount correction is unnecessary.

The shift amount correction will be described. First, the CPU 71 refers to the reference area data and specifies the reference through holes 11 and 12 from the captured image 41 by, for example, a known pattern matching process.
Since this pattern matching process is a known technique, a detailed description thereof will be omitted. However, based on the characteristics such as the shape and arrangement of the reference through holes 11 and 12, the reference area data and the object indicated in the photographed image data are used. The process which specifies the reference | standard through-holes 11 and 12 is said.
Next, the CPU 71 compares the coordinate values defined in the image 41 of the identified reference through holes 11 and 12 with the coordinate values of the reference through holes 11 and 12 acquired based on the reference area data, and is photographed. The inclination of the component 10 is detected.
Specifically, the CPU 71 calculates from the straight line calculated from the coordinate values of the reference through holes 11 and 12 shown in the image data and the coordinate value of the reference through holes 11 and 12 acquired based on the reference area data. The inclination is calculated by comparing the straight line and the part 10 indicated in the image data with respect to the part 10 indicated in the image reference area data.
Then, the CPU 71 corrects the shift amount by rotating the reference area data according to the calculated inclination.

  That is, the CPU 71 performs, for each through hole, the area of the portion where the light has passed in the region where the through hole is formed in the image 41 after the correction of the deviation amount, and the calculated area and the corresponding reference area. It is determined whether or not the threshold value is equal to or greater than a predetermined threshold corresponding to the reference area recorded in the data. The CPU 71 determines that the area of the through-hole is normal if the area is equal to or greater than a predetermined threshold value, and if the area is less than the predetermined threshold value, it is not normal because there may be a cause such as the absence of a through portion or clogging of chips. Judge.

In the determination of the presence / absence of defects (step 35), if it is determined that there is no defect (step 35; N), the computer 7 determines that the component 10 is acceptable (step 40), and pulls out the positioning pin 4 to release it. (Step 45).
The component 10 descends the transport rail 2, and the CPU 71 drives the path switching device to guide the descending component 10 to the transport path of the acceptable product, thereby processing the acceptable product (step 50).

  Next, the CPU 71 determines whether or not there is an uninspected part 10 (step 55). If there is an uninspected part 10 (step 55; Y), the CPU 71 returns to step 5 to return to the uninspected part 10 If there is no (step 55; N), the inspection is terminated.

On the other hand, if it is determined in step 20 that there is a defect (step 20; Y), the CPU 71 determines that the component 10 is rejected (step 60), and drives the large-diameter hole inspection unit 30 to detect the component 10. The inspection jig 31 inserted into the large-diameter holes 141 and 151 is released (step 63).
Thereafter, the CPU 71 releases the positioning pins 3 and 4 (step 65).
The component 10 descends the conveyance rail 2, and the CPU 71 drives the path switching device to guide the component 10 descending to the conveyance path of the rejected product, thereby processing the rejected product (step 80). ), And proceeds to step 55.

If it is determined in step 35 that there is a defect (step 35; Y), the CPU 71 determines that the component 10 is rejected (step 70) and releases the positioning pin 4 (step 75).
The component 10 descends the conveyance rail 2, and the CPU 71 drives the path switching device to guide the component 10 descending to the conveyance path of the rejected product, thereby processing the rejected product (step 80). ), And proceeds to step 55.
Through the above processing, the component 10 is sorted into a pass product and a reject product.

According to the embodiment described above, the following effects can be obtained.
(1) In a stepped hole having a large inner diameter and a small inner diameter (stepped through-hole), a portion having a large inner diameter is inspected by inserting a protrusion, and a portion having a small inner diameter is inspected by the passage of light. It can be confirmed that the holes are appropriately formed.
(2) Since the pin is not inserted into the portion having a small inner diameter, it is possible to prevent the pin from being broken, and thus it is possible to prevent problems such as damage to the apparatus due to foreign matters in the next process.
(3) When inspecting the penetration of a portion having a small inner diameter by inserting a pin, if the sensor for confirming the penetration is not provided, misjudgment is likely to occur, but the inspection apparatus 1 can inspect by passing light. There is no need to provide such a sensor.
(4) Since a thick and short pin can be used as an inspection pin, the rate of occurrence of pin breakage can be significantly reduced.

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 2 Transport rail 3, 4 Positioning pin 5 Illumination 6 Camera 7 Computer 10 Parts 11, 12 Reference through-hole 13-15 Through-hole 16 Inspection object area 20 Plate member 21, 22 Reference pin 24, 25 Pin 30 Large diameter hole Inspection unit 31 Inspection jig 32 Plate member 33 Bar member 34 Contact sensor 35 Coil spring 36 Vertical movement mechanism 37 Plate member 40 Penetration inspection unit 41 Image 43-45, 51-55 Region 63, 64 Cut-out window 71 CPU
72 ROM
73 RAM
74 Interface 75 Input device 76 Output device 77 Storage device 141, 151 Large diameter hole 142, 152 Through portion

Claims (7)

First detection means for detecting a defect in the hole by inserting a predetermined protrusion into the hole formed in the component;
A second detection unit configured to detect a defect in a through portion having an inner diameter smaller than an inner diameter of the hole portion formed on a bottom surface of the hole portion based on light passing through the through portion;
A determination unit that determines pass / fail of the component based on a detection result of the first detection unit and a detection result of the second detection unit;
Output means for outputting the determined determination result;
An apparatus for inspecting parts. The determination means determines that the part is acceptable when no defect is detected by the first detection means and the second detection means, and the first detection means and the second detection means If a defect is detected on at least one of them, the part is determined to be rejected.
The component inspection apparatus according to claim 1. A plurality of holes are formed in the component,
The first detection means has a plurality of protrusions corresponding to the positions of the plurality of hole portions, and the plurality of protrusions are inserted into the plurality of hole portions by the same operation, so that the individual Detect hole defects,
The component inspection apparatus according to claim 1, wherein: The first detection means has a plurality of positioning pins, and is inserted into the plurality of reference holes formed in the component before the plurality of protrusions are inserted into the plurality of holes by the same operation. Inserting the plurality of positioning pins to position the component;
The component inspection apparatus according to claim 3. The second detection means simultaneously detects defects in a plurality of through portions formed on the bottom surfaces of the plurality of holes.
The component inspection apparatus according to claim 3, wherein the component inspection apparatus is a component inspection apparatus. The first detection means and the second detection means support and detect the component such that the penetration direction of the penetration portion is different from gravity.
The component inspection apparatus according to any one of claims 1 to 5, wherein the component inspection apparatus according to any one of claims 1 to 5 is provided. With an inclined path that is lowered by its own weight while maintaining the direction of the part,
The first detection unit and the second detection unit support the component by bringing the descending component into contact with a predetermined member and stopping the component.
The component inspection apparatus according to claim 6.

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