JP2016085126A - Inspection device for electronic assembly - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection device of an electronic assembly for improving the accuracy of, especially, operation value inspection, and to provide the inspection device of an electronic assembly for improving the accuracy of appearance inspection.SOLUTION: An inspection device of an electronic assembly includes: a work table 110; a work holder 120 for holding an electronic assembly 10 to be inspected on a work table 110; a coil part 130 for allowing a lead switch 4 integrated into the electronic assembly 10 held by the work holder 120 to operate; and a measurement control device 200 for allowing the lead switch 4 to operate, and for measuring an operation value including the working value and/or release value. The measurement control device 200 includes: a condition setting part 206 for arbitrarily setting the specification and measurement condition of the operation value in the lead switch 4; an operation control part 207 for allowing the lead switch 4 of the electronic assembly 10 held by the work holder 120 to operate; an operation value measurement part 208 for measuring the operation value of the lead switch 4; and a success/failure determination part 211 for determining success/failure from the measured operation value.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inspection apparatus for electronic assembly parts including a reed switch.

FIG. 10 shows an example of an electronic assembly component. An electronic assembly component 10 shown in FIG. 10 is an electronic component used for a gas detector, and is generally assembled / inspected and shipped through the following steps. An example of the assembly process is shown below.
(1) Assembly: The LED 3 and the reed switch 4 are assembled between the upper case 1 and the lower case 2. As shown in FIG. 10A, the terminal 3a of the LED 3 is inserted into the hole 2a of the lower case 2, the terminal 4a of the reed switch 4 is inserted into the hole in the groove 2b of the lower case 2, and finally the upper case 1 The latching piece 1a is elastically deformed outward to engage the claw 2c of the lower case 2 in the recess on the inner surface, and the reed switch 4 is held in the groove 2b of the lower case 2 with the holding piece 1b of the upper case 1 and assembled. . FIG. 10B shows a state after assembly.
(2) Operation value inspection: An operation value inspection is performed using a measuring instrument to determine whether or not the reed switch 4 after the assembly of the components normally operates.
(3) Appearance inspection: The appearance of the assembled electronic assembly part 10 is visually inspected.

  As an electronic component inspection apparatus, for example, a two-dimensional image of an electronic component having a lead is picked up by an image pickup device, and an inspection for determining the quality of the electronic component based on a pattern corresponding to the contour of the electronic component is performed. An apparatus is known (see Patent Document 1).

JP-A-5-256788

  However, since the conventional operation value inspection is a simple inspection whether or not the reed switch is operated by passing a constant current through the coil, the inspection accuracy is very low. In addition, when there is a problem in assembly (for example, when the upper case floats due to LED terminal deformation), a large number of assembly parts are visually inspected, and non-standard assembly parts that have passed the inspection are shipped. There was also a risk.

  The present invention has been made in view of the above problems, and in particular, provides an inspection device for an electronic assembly component that can improve the accuracy of an operation value inspection, and an inspection device for an electronic assembly component that can improve the accuracy of an appearance inspection. The purpose is to provide.

In order to solve the above problems, an inspection apparatus for electronic assembly parts according to the present invention includes:
An electronic assembly inspection device in which a reed switch is incorporated in a case,
A work table, a work holder for holding an electronic assembly part to be inspected on the work table, a coil unit for operating a reed switch incorporated in the electronic assembly part held by the work holder, and operating the reed switch A measurement control means for measuring an actuation value including the moving value and / or the opening value.
The measurement control means includes a condition setting unit that can arbitrarily set a standard and measurement condition of an operation value in the reed switch, an operation control unit that operates a reed switch of an electronic assembly component held in a work holder, and the reed switch. An operating value measuring unit that measures the operating value of the test, and a pass / fail determining unit that determines pass / fail from the measured operating value,
This is the main feature.

  A second feature of the electronic assembly component inspection apparatus according to the present invention is that it includes a height measuring unit that measures the assembly height of the electronic assembly component held by the work holder.

  A third feature of the electronic assembly component inspection device according to the present invention is that the acceptance / rejection determination unit determines acceptance / rejection based on the measured operation value and assembly height.

  As described above, according to the inspection apparatus for electronic assembly parts according to the present invention, the operation values of the electronic assembly parts to be inspected are measured and the pass / fail determination is made based on the measured operation values. Can be improved. Further, by measuring not only the operation value but also the individual assembly height, there is an excellent effect that the inspection accuracy can be further improved.

  Furthermore, according to the inspection apparatus for electronic assembly parts according to the present invention, the standard of the operation value and the measurement conditions can be arbitrarily set. For example, the standard for general-purpose products is relaxed and the standard for dedicated products is strict. Alternatively, the measurement conditions can be changed to shorten the inspection time for a general-purpose product and to increase the inspection time for a dedicated product.

The perspective view which shows 1st Embodiment and shows the inspection apparatus of the electronic assembly component which concerns on this invention, FIG. 1 is a side view of the inspection apparatus shown in FIG. FIG. 1 is a front view of a measurement control device included in the inspection device shown in FIG. The block diagram of the measurement control apparatus shown in FIG. The figure which shows the input screen in the measurement control apparatus shown in FIG. The figure which shows the condition setting screen of the input screen in FIG. Wiring explanatory diagram in the inspection apparatus of FIG. The figure which shows the output screen of the measurement control apparatus shown in FIG. The figure which shows the output screen of the measurement control apparatus shown in FIG. (A) is a figure which shows the state before the assembly of the electronic assembly component which is a test object, (B) is a figure which shows the electronic assembly component after an assembly.

  A first embodiment for carrying out the present invention will be described with reference to FIGS. 1 and 2, reference numeral 100 denotes an electronic assembly component inspection apparatus.

  As shown in FIGS. 1 and 2, an electronic assembly component inspection apparatus (hereinafter referred to as “inspection apparatus”) 100 is placed horizontally on an upper surface of a base 101 supported on a floor surface F via an auxiliary frame 102. A work table 110 is supported.

  In the center of the work table 110, a work holder 120 for holding the electronic assembly part 10 to be inspected at the inspection position is arranged. The work holder 120 is provided with a set portion 121 (see FIG. 7) of the electronic assembly component 10. The LED 3 of the electronic assembly component 10 set in the set unit 121 and the terminals 3 a and 4 a of the reed switch 4 are connected to a measurement control device 200 (to be described later) by wiring 150.

  A coil unit 130 is disposed in front of the work holder 120. The coil unit 130 includes a coil 131 that generates a magnetic force for operating the reed switch 4 incorporated in the electronic assembly component 10 held by the work holder 120, and a micro that adjusts the distance of the coil 131 with respect to the reed switch 4. Meters 132 are respectively provided. The coil unit 130 is supported on the upper surface of the base 101 via the auxiliary frame 103. The coil 131 of the coil unit 130 is connected to a measurement control device 200, which will be described later, by a wiring 150.

  Above the work holder 120, a height measuring unit 140 that measures the assembly height of the electronic assembly component 10 held by the work holder 120 is disposed. The height measuring unit 140 descends a plurality of detection contact switches 141 that can be brought into contact with the upper surface of the electronic assembly component 10 and the distance of the contact switch 141 with respect to the upper surface of the electronic assembly component 10 held by the work holder 120. A micrometer 142 to be adjusted is provided. The height measuring unit 140 is supported on the rear part of the work table 110 via the auxiliary frame 104 and the lifting unit 143. Note that the contact switch 141 of the height measuring unit 140 is connected to the measurement control device 200 described later by a wiring 150.

  In the vicinity of the work table 110, a measurement control device 200 shown in FIG. The measurement control device 200 is used for measuring the operation value and assembly height of the electronic assembly part 10 held by the work holder 120, determining whether it is acceptable, and controlling them. An automatic / manual switch 201 is provided on the front of the box, A power switch 202, a start switch 203, and a touch panel unit (input / output device) 204 are provided.

  FIG. 4 shows the structure of the measurement control device 200. As shown in FIG. 4, the measurement control device 200 includes an input / output unit 205, a condition setting unit 206, an operation control unit 207, and an operation value measurement unit 208. A height measurement unit 209, an arithmetic processing unit 210, a pass / fail determination unit 211, and a data storage unit 212.

  The input / output unit 205 serves to input / output signals between the external touch panel unit 204, the start switch 203, the set unit 121, the coil 131, the contact switch 141, and the like.

  The condition setting unit 206 sets an operation value, an assembly height standard, and measurement conditions for the reed switch 4 incorporated in the electronic assembly component 10 to be inspected, and can be arbitrarily set from the touch panel unit 204. FIG. 5 shows an input screen of the touch panel unit 204. The input screen of the touch panel unit 204 is provided with buttons for [condition setting] [manual] [adjustment].

  When the [condition setting] button on the touch panel unit 204 in FIG. 5 is touched, the screen shifts to the condition setting screen in FIG. On the condition setting screen, buttons of [coil specification] [application pattern] [standard PI / DO] [standard RC] [standard height] are provided.

  When the [Coil Specifications] button is touched, the maximum voltage value (for example, 10000 mV), the maximum standard current value (for example, 1000 mA), and the number of turns (for example, 150 volumes) are displayed as the specifications of the coil 131 used for inspection. Any numerical value correlated with the measured value of the reference device is input and set.

  When the [Apply Pattern] button is touched, the pattern of the current applied to the coil 131 used for inspection can be arbitrarily set. Specifically, the start value (for example, 40 mA) and end value (for example, 100 mA) of current applied at the time of moving impression measurement, the start value (for example, 100 mA) and end value (for example, 10 mA) of current applied at the time of open value measurement, application It is possible to input a current increase / decrease rate (for example, 1 mA / second).

  When the [Standard PI / DO] button is touched, the standards (lower limit value and upper limit value) when the reed switch 4 to be inspected is operated (contact opening / closing operation) can be arbitrarily set. Specifically, the lower limit value (for example, 50 mA) and upper limit value (for example, 90 mA) of the impression value (PI: current value when the contact is closed), and the upper limit value (DO: current value when the contact is opened) ( For example, 25 mA) and a lower limit (for example, 10 mA) can be input.

  When the [Standard RC] button is touched, the standard (lower limit value and upper limit value) of the contact resistance value in the reed switch 4 of the electronic assembly part 10 to be inspected can be set arbitrarily. Specifically, a lower limit value (for example, 70 mΩ) and an upper limit value (for example, 75 mΩ) of the resistance value of the contact can be input.

  When the [Standard Height] button is touched, the assembly height of the electronic assembly part 10 to be inspected, that is, the standard (upper limit) of the height H from the lower surface of the lower case 2 to the upper surface of the upper case 1 is arbitrarily set. be able to.

  Each data input from [Coil specification] [Applied pattern] [Standard PI / DO] [Standard RC] [Standard height] in the condition setting screen of FIG. 6 is stored in the data storage unit 212. Yes.

  Based on the operation of the power switch 202 and the start switch 203, the operation control unit 207 causes a current to flow through the coil 131 in the coil unit 130 to generate a magnetic force, and operates the reed switch 4 in the electronic assembly component 10 to be inspected. At the same time, the height measuring unit 140 operates the lifting / lowering unit 143 to lower the contact switch 141 from the reference position until it contacts the upper surface of the electronic assembly part 10 (the upper surface of the upper case 1). Operate and control them.

  Based on the operation control unit 207, the operation value measuring unit 208 measures an operation value (an emotional value and an open value) when the reed switch 4 in the electronic assembly part 10 to be inspected is operated. The impression value and the release value are stored in the data storage unit 212 and output and displayed on the monitor screen of the touch panel unit 204 via the input / output unit 205.

  Based on the operation control unit 207, the height measuring unit 209 descends from the reference position and based on the detection signal from the contact switch 141 that contacts the upper surface of the electronic assembly component 10 (the upper surface of the upper case 1). The measured value is stored in the data storage unit 212.

  The pass / fail determination unit 211 is based on the operating value / assembly height standard set by the setting condition unit 206 and the measured values measured by the operating value measuring unit 208 and the height measuring unit 209. This is used to determine pass / fail of the component 10, and the determination result is stored in the data storage unit 212 and output and displayed on the monitor screen of the touch panel unit 204 via the input / output unit 205. Yes.

  Specifically, the acceptance / rejection determination unit 211 is accepted if the value of the assembly height measured by the height measurement unit 209 is equal to or less than the standard set by the condition setting unit 205, and rejected when exceeding the standard. judge. Further, if the impression value / open value measured by the operating value measuring unit 208 is within the standard, it is determined to be acceptable, and if it is out of the standard, it is determined to be unacceptable. And if all pass, it will determine with a pass (OK) as a whole, and if any one fails, it will determine with a rejection (NG) as a whole.

  Note that touching the [Manual] button on the touch panel unit 204 in FIG. 5 makes it possible to perform individual operations on the machine side and measurement for each inspection item. When the [Adjustment] button is touched, for example, voltage and current can be continuously applied to each other or simultaneously.

  In FIG. 1, reference numeral 160 denotes an auxiliary table supported behind the work table 110, and an amplification amplifier or the like is placed on the upper surface of the auxiliary table 160. Reference numeral 170 denotes a start button provided on the upper surface of the auxiliary frame 105 installed on the upper surface of the base 101, and the inspection can be started by pressing either the start button 170 or the start switch 203.

  Next, a procedure for performing an operation value inspection and an assembly inspection (appearance inspection) of the electronic assembly component 10 using the inspection apparatus 100 configured as described above will be described below.

  As a preparation process, first, the power switch 202 of the measurement control device 200 is turned on to switch the automatic / manual switch 201 to manual. Thereby, an inspection standard and measurement conditions can be set arbitrarily. Touching the [Condition setting] button on the touch panel unit 204 shown in FIG. 5, [Coil specification] [Applied pattern] [Standard PI] from the condition setting screen of FIG. 6 according to the required specifications of the electronic assembly part 10 to be inspected. / DO] [Standard RC] [Standard Height] buttons can be set by touching each button. The input set value is stored in the data storage unit 211. When the automatic / manual changeover switch 201 in FIG. 3 is automatically switched at the next inspection, the inspection can be performed with the stored setting value.

  Next, the electronic assembly component 10 to be inspected is set on the set portion 121 of the work holder 120. When either the start button 170 or the start switch 203 is pressed, the inspection starts. Here, at the start of inspection, an inspection standard product is set in the setting unit 121, the measured value is confirmed, and the inspection standard and measurement conditions are checked.

  After the inspection is started, the contact switch 141 of the height measuring unit 140 is lowered to contact the upper surface of the electronic assembly part 10 in the work holder 120, and the assembly height is measured. If the measured assembly height is equal to or less than the standard (upper limit value), a pass (OK) display is made on the monitor screen of the touch panel unit 204. If the measured assembly height exceeds the standard (upper limit value), a failure (NG) is displayed on the monitor screen of the touch panel unit 204. Each display example is shown in FIGS.

  In parallel, the reed switch 4 in the electronic assembly part 10 in the work holder 120 is actuated by the magnetic force generated from the coil part 130 in which current is passed through the coil 131, and the moving value and the open value are measured. If the measured impression value / open value is within the standard (lower limit value to upper limit value), the monitor screen of the touch panel unit 204 is passed (OK). If the measured impression value / open value is outside the standard (lower limit value to upper limit value), the monitor screen of the touch panel unit 204 is rejected (NG). Each display example is shown in FIGS.

  As shown in FIG. 8, if the measured assembly height and the measured impression value / open value are all acceptable (OK), the entire monitor screen displays acceptable (OK). Further, as shown in FIG. 9, if any one of the measured assembly height and the measured impression value / open value is rejected (NG) (in the example of FIG. 9, all are rejected). ) Is displayed as a whole on the monitor screen.

  The electronic assembly part 10 displayed as a pass (OK) as a whole is accommodated in a box dedicated to a pass product, and the electronic assembly part 10 displayed as a reject (NG) as a whole is stored in a box dedicated to a reject product, Thereby, the acceptable product and the rejected product are separated.

  Thus, according to the inspection apparatus for electronic assembly parts according to the present invention, the operating value (the moving value / open value) is measured for all of the electronic assembly parts 10 to be inspected, and the pass / fail determination is made based on the measured value. The inspection accuracy could be improved. Moreover, by measuring not only the operating value but also the individual assembly height, it was possible to further improve the inspection accuracy of the electronic assembly parts.

  Furthermore, according to the inspection apparatus for electronic assembly parts according to the present invention, the standard of the operation value and the measurement conditions can be arbitrarily set. For example, the standard for general-purpose products is relaxed and the standard for dedicated products is strict. Or, by changing the measurement conditions, for example, the applied pattern, the inspection time can be shortened for general-purpose products, and the inspection time can be extended for dedicated products. .

  The electronic assembly part inspection apparatus according to the present invention can be widely used as an electronic assembly part inspection apparatus in which a reed switch is incorporated.

1 Upper case 2 Lower case 3 LED
4 Reed switch 10 Electronic assembly part 100 Electronic assembly part inspection device (inspection device)
DESCRIPTION OF SYMBOLS 101 Base 102,103,104,105 Auxiliary frame 110 Work table 120 Work holder 130 Coil part 131 Coil 132,142 Micrometer 140 Height measurement part 141 Contact switch 143 Lifting part 150 Wiring 160 Auxiliary table 170 Start button 200 Measurement control device 201 Automatic / manual switch 202 Power switch 203 Start switch 204 Touch panel (input / output device)
205 Input / Output Unit 206 Condition Setting Unit 207 Operation Control Unit 208 Operation Value Measurement Unit 209 Height Measurement Unit 210 Operation Processing Unit 211 Pass / Fail Judgment Unit 212 Data Storage Unit F Floor

Claims (3)

An electronic assembly inspection device in which a reed switch is incorporated in a case,
A work table, a work holder for holding an electronic assembly part to be inspected on the work table, a coil unit for operating a reed switch incorporated in the electronic assembly part held by the work holder, and operating the reed switch A measurement control means for measuring an actuation value including the moving value and / or the opening value.
The measurement control means includes a condition setting unit that can arbitrarily set a standard and measurement condition of an operation value in the reed switch, an operation control unit that operates a reed switch of an electronic assembly component held in a work holder, and the reed switch. An operating value measuring unit that measures the operating value of the test, and a pass / fail determining unit that determines pass / fail from the measured operating value,
An inspection apparatus for electronic assembly parts.   2. The inspection apparatus for an electronic assembly part according to claim 1, further comprising a height measuring unit for measuring an assembly height of the electronic assembly part held by the work holder. The electronic assembly component inspection apparatus according to claim 1, wherein the acceptance / rejection determination unit determines acceptance / rejection based on the measured operation value and assembly height.

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