WO2018028032A1 - Semi-manufactured touch screen testing machine - Google Patents

Semi-manufactured touch screen testing machine Download PDF

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Publication number
WO2018028032A1
WO2018028032A1 PCT/CN2016/101027 CN2016101027W WO2018028032A1 WO 2018028032 A1 WO2018028032 A1 WO 2018028032A1 CN 2016101027 W CN2016101027 W CN 2016101027W WO 2018028032 A1 WO2018028032 A1 WO 2018028032A1
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Prior art keywords
test
semi
touch screen
electrically connected
testing machine
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PCT/CN2016/101027
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French (fr)
Chinese (zh)
Inventor
李世林
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意力(广州)电子科技有限公司
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Publication of WO2018028032A1 publication Critical patent/WO2018028032A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Definitions

  • the present invention relates to the field of touch screen technologies, and in particular, to a semi-finished touch screen test machine.
  • a capacitive touch screen is an important component for various smart terminal electronic devices that enables direct and natural interaction between the user and the electronic device.
  • the semi-finished touch screen is a touch screen that has formed a touch electrode for sensing the position of the touch point, but the touch electrode is not connected to the IC.
  • Such semi-finished products need to be tested before being processed into finished products. In good condition to improve the yield of the finished touch screen.
  • the object of the present invention is to provide a novel semi-finished touch screen testing machine to solve the problem that the existing semi-finished touch screen testing machine is difficult to effectively detect all short-circuit materials, and the testing machine is difficult to be used for different types and sizes of touch screens.
  • the invention provides a semi-finished touch screen testing machine, comprising a working chassis, a test board and a test platform located on the working chassis, wherein the working chassis is internally provided with a short circuit test module and a capacitance test module, the test board and the test board
  • the short circuit test module is electrically connected or the test board is electrically connected to the capacitance test module
  • the test platform is configured to place a product to be tested, and the test platform is docked with the test board, so that the test is to be tested.
  • the product is electrically connected to the test board.
  • the short circuit test module and/or the capacitor test module are provided with an IC
  • the IC is an IC of Atmel Corporation.
  • the IC is an Atmel MXT1664 series IC.
  • the semi-finished touch screen testing machine further includes a connection switch disposed on the test board, the connection switch includes a first connection end as a common end, a second connection end as a normally open end, and a third as a normally closed end a connection end, wherein the first connection end is electrically connected to the test board, the second connection end is electrically connected to the short circuit test module, and the third connection end is electrically connected to the capacitance test module connection.
  • the semi-finished touch screen testing machine further includes a first lifting frame disposed above the working chassis and a first lifting device moving up and down relative to the first supporting frame, the first lifting device is in the a vertical projection on the working chassis is located at the interface between the test platform and the test board, and when the first lifting device is lowered to the interface between the test platform and the test board, the first test device is placed on the test platform
  • the product to be tested is electrically connected to the test board.
  • the first lifting device includes a first cylinder fixed on the first support frame and a first pressure plate connected to the first cylinder, and the first pressure plate is located on the first support frame Lower and moving relative to the first support frame, the first cylinder pushes the first pressure plate down to the docking point of the test platform and the test board, so that the first test panel is placed on the test platform
  • the test product is electrically connected to the test board.
  • the first lifting device further includes a first guiding post, the first guiding column vertically passes through the first supporting frame and the first guiding post is fixedly connected with the first pressing plate, so that The first pressure plate moves up and down in a vertical direction.
  • the semi-finished touch screen testing machine further includes a second lifting device disposed above the working chassis and a second lifting device moving up and down relative to the second supporting frame, the second lifting device being a vertical projection on the working chassis is located at the connection switch, and when the second lifting device is lowered to the connection switch, electrically connecting the test board and the short-circuit test module, the second lifting device The test board is electrically connected to the capacitance test module when rising away from the connection switch.
  • the second lifting device includes a second cylinder fixed to the second support frame and a second pressure plate connected to the second cylinder, and the second pressure plate is located at the second support frame Lower and opposite to the second support frame, the first connection end of the connection switch is connected to the second connection when the second cylinder pushes the second pressure plate down to the connection switch The end is turned on, and the first connecting end is disconnected from the third connecting end to make the test board and the The short-circuit test module is electrically connected, and when the second lifting device rises away from the connection switch, the first connection end of the connection switch is electrically connected to the third connection end, and the first connection is The end is disconnected from the second connection end to electrically connect the test board to the capacitance test module.
  • the second lifting device further includes a second guiding post, the second guiding post vertically passes through the second supporting frame and the second guiding post is fixedly connected with the second pressing plate, so that The second pressure plate moves up and down in a vertical direction.
  • the first support frame is further provided with a CCD alignment device, and the CCD alignment device is configured to enlarge and align the electrical connection position of the product to be tested and the test board.
  • an adjustment knob is further disposed on the test platform, and the adjustment knob is used to adjust an electrical connection position between the product to be tested and the test board.
  • the semi-finished touch screen testing machine further includes a display screen disposed above the working cabinet, the display screen is electrically connected to the CCD aligning device, and the display screen is used for displaying the CCD alignment
  • the electrically connected position of the product to be tested and the test board is enlarged, so that the adjustment knob adjusts the electrical connection position of the product to be tested and the test board.
  • the semi-finished touch screen tester is used to test that the size of the semi-finished touch screen is less than or equal to 7 inches.
  • the semi-finished touch screen tester is used to test the size of a semi-finished touch screen of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches or 3.5 inches.
  • the semi-finished touch screen tester is used to test a semi-finished touch screen of GFF, GF1 or GF2 structure.
  • the present invention has the following beneficial effects:
  • a short-circuit test module and a capacitance test module are respectively disposed inside the working chassis, and the semi-finished touch screen placed in the test platform is electrically connected with the test board to finally realize the connection with the short-circuit test module or the capacitance test module. Therefore, the short-circuit value of the ITO layer in the semi-finished touch screen can be tested, and the capacitance value of the ITO layer can be measured, so that the short-circuit material of the semi-finished touch screen can be effectively detected.
  • Atmel's IC can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction, it is compatible with the semi-finished touch screens of various ICs, and can also test different structures. Semi-finished touch screen.
  • FIG. 1 is a schematic structural view of a semi-finished touch screen testing machine according to a second embodiment of the present invention
  • FIG. 2 is a schematic structural view of a semi-finished touch screen testing machine according to a second embodiment of the present invention (the first support frame, the first lifting device, and the CCD alignment device are omitted);
  • FIG. 3 is a schematic structural view of a first support frame, a first lifting device, and a CCD alignment device according to Embodiment 2 of the present invention.
  • the embodiment provides a semi-finished touch screen testing machine, including a working chassis, a test board and a test platform located on the working chassis, and the working chassis is internally provided with a short circuit test module and a capacitance test module, and the test board and the test board Determining that the short circuit test module is electrically connected or the test board is electrically connected to the capacitance test module, the test platform is configured to place a product to be tested, and the test platform is docked with the test board to make the The test product is electrically connected to the test board.
  • the present embodiment provides a semi-finished touch screen testing machine, including a working chassis 1 and test boards 2 , a test platform 3 , and a first support frame 41 respectively disposed at different positions on the working chassis 1 .
  • the inside of the working case 1 is provided with a short-circuit test module and a capacitance test module, and the short-circuit test module and/or the capacitance test module are provided with an Atmel IC, such as an MXT1664 series IC, which is used to drive a short circuit.
  • the test module performs a short-circuit test on the semi-finished touch screen
  • the drive capacitance test module performs a capacitance test on the semi-finished touch screen.
  • Atmel's highly compatible IC it can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction. It is compatible with the semi-finished touch screens of various ICs. Testing different structures Semi-finished touch screen.
  • the test board 2 is a PCB circuit board, and the test platform 3 is used for placing a product to be tested (ie, a semi-finished touch screen to be tested), and the test platform 3 is docked with the test board 2 to enable the product to be tested placed in the test platform 3. (not shown) is electrically connected to the test board 2, specifically, the electrode lead of the product to be tested is electrically connected to the gold finger in the test board 2.
  • the semi-finished touch screen testing machine of this embodiment further includes a connection switch 6 provided on the test board 2, the connection switch 6 including a first connection end as a common end, a second connection end as a normally open end, and a third connection as a normally closed end
  • the first connection end is electrically connected to the test board 2
  • the second connection end is electrically connected to the short-circuit test module
  • the third connection end is electrically connected to the capacitance test module.
  • the first support frame 41 is disposed above the work case 1 , and the first lifting device 51 is movably connected to the first support frame 41 and moves up and down relative to the first support frame 41 .
  • the first lifting device 51 includes a first cylinder 511, a first pressure plate 512, and a first guide post 513.
  • the first cylinder 511 is fixed to the first support frame 41 for providing the first pressure plate 512 with power for moving up and down.
  • the first pressure plate 512 is connected to the first cylinder 511, and the first pressure plate 512 is disposed below the first support frame 41 and moves up and down relative to the first support frame 41.
  • the first pressure plate 512 is vertical on the working chassis 1.
  • the projection is located at the docking of the test platform 3 and the test board 2.
  • the first guide post 513 vertically passes through the first support frame 41 and is fixedly coupled to the first pressure plate 512 for positioning and guiding the vertical movement of the first pressure plate from the vertical direction.
  • the second support frame 42 is located behind the first support frame 41 and the second support frame 42 is disposed above the work case 1.
  • the second lifting device 52 is movably connected with the second support frame 42 and opposite to the second support frame.
  • the frame 42 moves up and down.
  • the second lifting device 52 includes a second cylinder 521, a second pressure plate 522, and a second guide post 523.
  • the second cylinder 521 is fixed to the second support frame 42 for providing the second pressure plate 522 with power for moving up and down.
  • the second pressure plate 522 is dynamically connected to the second cylinder 521 , and the second pressure plate 522 is disposed below the second support frame 42 and moves up and down relative to the second support frame 42 .
  • the second pressure plate 522 is vertical on the working chassis 1 .
  • the projection is located near the connection switch 6, in particular at the second connection end and the third connection end of the connection switch 6.
  • the second guiding post 523 vertically passes through the second supporting frame 42 and is fixedly connected with the second pressing plate 522 for positioning and guiding the vertical movement of the second pressing plate 522 from the vertical direction. .
  • connection switch 6 In order to electrically connect the test board 2 to the short-circuit test module; when the second cylinder 521 pulls the second pressure plate 522 to rise away from the connection switch 6, the first connection end of the connection switch 6 is electrically connected to the third connection end, and the first connection is The end is disconnected from the second connection end to electrically connect the test board 2 to the capacitance test module.
  • the semi-finished touch screen testing machine of this embodiment further includes a CCD alignment device 7 disposed on the first support frame 41, and the CCD alignment device 7 is used for amplifying and aligning the electrical connection position of the product to be tested and the test board 2. To ensure that the electrical connection position of the two is accurate.
  • the semi-finished touch screen testing machine of this embodiment further includes an adjustment knob 31 disposed on the test platform 3, and the adjustment knob is used for fine-tuning the electrical connection position of the product to be tested and the test board 2.
  • the semi-finished touch screen testing machine of the embodiment further includes a display screen (not shown) disposed above the working chassis 1 , and the display screen is electrically connected to the CCD alignment device 7 for displaying after being enlarged by the CCD alignment device.
  • the electrical connection position of the product to be tested and the test board (specifically, the connection position of the electrode lead of the product to be tested and the gold finger in the test board 2), so that the adjustment knob can be conveniently according to the image on the display screen.
  • the position of the electrode lead of the product to be tested and the gold finger of the test board 2 are adjusted to ensure that the electrode lead and the gold finger reliably overlap.
  • the semi-finished touch screen tester is used to test that the size of the semi-finished touch screen is less than or equal to 7 inches.
  • a semi-finished touch screen tester is used to test the size of a semi-finished touch screen of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches or 3.5 inches.
  • the semi-finished touch screen tester of the present embodiment is used to test a semi-finished touch screen of GFF, GF1 or GF2 structure.
  • the product to be tested is first placed on the test platform 3, and the electrode lead of the product to be tested is docked with the gold finger of the test board 2; then the first lifting device 51 is used.
  • the pressure plate 512 is lowered to the interface between the product to be tested and the test board 2 to be electrically connected, so that the product to be tested is electrically connected to the test board 2, and one end of the connection switch 6 is electrically connected to the test board 2;
  • the second lifting device 52 lowers the second pressure plate 522 to a position close to the connection switch 6 so that the other end of the connection switch 6 is electrically connected to the short-circuit test module, thereby electrically connecting the product to be tested and the short-circuit test module.
  • connection is made to realize the short-circuit test of the product to be tested; finally, the second pressure plate 522 is raised by the second lifting device 52, and the second pressure plate 522 is moved away from the connection switch 6 so that the other end of the connection switch 6 and the capacitance test module are electrically connected.
  • the connection is made, thereby electrically connecting the product to be tested and the capacitance test module to realize the capacitance test of the product to be tested.
  • the semi-finished touch screen testing machine of this embodiment is further provided with an indicator light for reacting the test result and a reset button for restoring the test state of the semi-finished touch screen tester.
  • the first indicator light such as the green LED light
  • the second indicator light such as the red LED light
  • the semi-finished touch screen testing machine of the embodiment is electrically connected to the computer, so that the test data of the semi-finished touch screen testing machine can be transmitted and saved to the computer, and the test result and data are displayed through the display of the computer.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Provided is a semi-manufactured touch screen testing machine, comprising a working case (1), and a test board (2) and a test platform (3) provided on the working case (1). An open-short-circuit test module and a capacitance test module are provided inside the working case (1). The test board (2) is electrically connected to the open-short-circuit module or the capacitance test module. The test platform (3) is used for placing a product to be tested thereon, and the test platform (3) is connected to the test board (2), such that the product to be tested is electrically connected to the test board (2). The semi-manufactured touch screen testing machine can test an open-short-circuit value of an ITO layer in a semi-manufactured touch screen, as well as measure a capacitance of the ITO layer. Since ICs of Atmel Company support at most 32 electrodes in the X direction and 52 electrodes in the Y direction in a semi-manufactured touch screen, the invention is compatible with and can be used for testing semi-manufactured touch screen materials corresponding to various types of ICs, and can also test semi-manufactured touch screen materials having different structures.

Description

一种半成品触摸屏测试机Semi-finished touch screen test machine 技术领域Technical field
本发明涉及触摸屏技术领域,尤其涉及一种半成品触摸屏测试机。The present invention relates to the field of touch screen technologies, and in particular, to a semi-finished touch screen test machine.
背景技术Background technique
电容式触摸屏是一种用于各种智能终端电子设备的重要部件,其能够实现用户与电子设备之间直接地、自然地交互。在触摸屏的制造过程中,半成品触摸屏是已经形成有用于感应触控点位置的触控电极、但触控电极并没有与IC连接的触摸屏,此类半成品需要在加工为成品之前先测试其功能是否完好,以提高成品触摸屏的良率。A capacitive touch screen is an important component for various smart terminal electronic devices that enables direct and natural interaction between the user and the electronic device. In the manufacturing process of the touch screen, the semi-finished touch screen is a touch screen that has formed a touch electrode for sensing the position of the touch point, but the touch electrode is not connected to the IC. Such semi-finished products need to be tested before being processed into finished products. In good condition to improve the yield of the finished touch screen.
在现有技术中,由于半成品触摸屏上并未连接有IC,因此对半成品触摸屏进行测试时,需要先将其与IC连接,再进行半成品功能测试,以判断半成品是否合格。但是,目前能够支持触摸屏产业的IC品牌非常多,且每种IC都有其独立的测试方法,但这些测试方法无法保证断短路材料能够有效检出,且方法之间并不通用。这一方面会导致检测后的半成品触摸屏仍存在性能上的缺陷问题;另一方面会导致采用不同IC的半成品触摸屏需要使用不同的IC及其测试方法,相应地,用于不同半成品触摸屏的测试板也需要及时开发更换。当触摸屏生产企业的触摸屏种类较多时,需要开发多种半成品触摸屏的测试板,这既增加测试成本,又会耗费大量人力物力。In the prior art, since the IC is not connected to the touch screen of the semi-finished product, when testing the semi-finished touch screen, it is necessary to connect it to the IC first, and then perform semi-finished function test to determine whether the semi-finished product is qualified. However, there are many IC brands that can support the touch screen industry, and each IC has its own independent testing method. However, these test methods cannot guarantee that the short-circuit material can be effectively detected, and the methods are not universal. This aspect will lead to the performance defect of the semi-finished touch screen after the detection; on the other hand, the semi-finished touch screen with different ICs will need to use different ICs and their testing methods, and correspondingly, the test boards for different semi-finished touch screens. It also needs to be developed and replaced in time. When there are many types of touch screens in touch screen manufacturers, it is necessary to develop a variety of semi-finished touch screen test boards, which increases the test cost and consumes a lot of manpower and material resources.
发明内容Summary of the invention
本发明的目的在于提供一种新型半成品触摸屏测试机,以解决现有半成品触摸屏测试机难以有效检出全部短路材料、且测试机难以通用于不同类型、不同尺寸触摸屏的问题。The object of the present invention is to provide a novel semi-finished touch screen testing machine to solve the problem that the existing semi-finished touch screen testing machine is difficult to effectively detect all short-circuit materials, and the testing machine is difficult to be used for different types and sizes of touch screens.
本发明的技术方案如下:The technical solution of the present invention is as follows:
本发明提供一种半成品触摸屏测试机,包括工作机箱、位于所述工作机箱上的测试板和测试平台,所述工作机箱内部设有断短路测试模块和电容测试模块,所述测试板与所述断短路测试模块电性连接或者所述测试板与所述电容测试模块电性连接,所述测试平台用于放置待测产品,所述测试平台与所述测试板对接,以使所述待测产品与所述测试板电性连接。The invention provides a semi-finished touch screen testing machine, comprising a working chassis, a test board and a test platform located on the working chassis, wherein the working chassis is internally provided with a short circuit test module and a capacitance test module, the test board and the test board The short circuit test module is electrically connected or the test board is electrically connected to the capacitance test module, the test platform is configured to place a product to be tested, and the test platform is docked with the test board, so that the test is to be tested. The product is electrically connected to the test board.
进一步地,所述断短路测试模块和/或所述电容测试模块中设有IC,所 述IC为Atmel公司的IC。优选地,所述IC为Atmel MXT1664系列IC。Further, the short circuit test module and/or the capacitor test module are provided with an IC, The IC is an IC of Atmel Corporation. Preferably, the IC is an Atmel MXT1664 series IC.
进一步地,所述半成品触摸屏测试机还包括设于所述测试板上的连接开关,所述连接开关包括作为公共端的第一连接端、作为常开端的第二连接端和作为常闭端的第三连接端,其中所述第一连接端与所述测试板电性连接,所述第二连接端与所述断短路测试模块电性连接,所述第三连接端与所述电容测试模块电性连接。Further, the semi-finished touch screen testing machine further includes a connection switch disposed on the test board, the connection switch includes a first connection end as a common end, a second connection end as a normally open end, and a third as a normally closed end a connection end, wherein the first connection end is electrically connected to the test board, the second connection end is electrically connected to the short circuit test module, and the third connection end is electrically connected to the capacitance test module connection.
进一步地,所述半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置,所述第一升降装置在所述工作机箱上的垂直投影位于所述测试平台与所述测试板对接处,所述第一升降装置下降至所述测试平台与所述测试板的对接处时,使放置于所述测试平台上的待测产品与所述测试板电性连接。Further, the semi-finished touch screen testing machine further includes a first lifting frame disposed above the working chassis and a first lifting device moving up and down relative to the first supporting frame, the first lifting device is in the a vertical projection on the working chassis is located at the interface between the test platform and the test board, and when the first lifting device is lowered to the interface between the test platform and the test board, the first test device is placed on the test platform The product to be tested is electrically connected to the test board.
进一步地,所述第一升降装置包括固设于所述第一支撑架上的第一气缸以及与所述第一气缸动力连接的第一压板,所述第一压板位于所述第一支撑架下方且相对于所述第一支撑架上下移动,所述第一气缸推动所述第一压板下降至所述测试平台与所述测试板的对接处时,使放置于所述测试平台上的待测产品与所述测试板电性连接。Further, the first lifting device includes a first cylinder fixed on the first support frame and a first pressure plate connected to the first cylinder, and the first pressure plate is located on the first support frame Lower and moving relative to the first support frame, the first cylinder pushes the first pressure plate down to the docking point of the test platform and the test board, so that the first test panel is placed on the test platform The test product is electrically connected to the test board.
进一步地,所述第一升降装置还包括第一导柱,所述第一导柱竖向穿过所述第一支撑架且所述第一导柱与所述第一压板固定连接,以使所述第一压板沿竖直方向上下移动。Further, the first lifting device further includes a first guiding post, the first guiding column vertically passes through the first supporting frame and the first guiding post is fixedly connected with the first pressing plate, so that The first pressure plate moves up and down in a vertical direction.
进一步地,所述半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第二支撑架和相对所述第二支撑架上下移动的第二升降装置,所述第二升降装置在所述工作机箱上的垂直投影位于所述连接开关处,所述第二升降装置下降至所述连接开关处时,使所述测试板与所述断短路测试模块电性连接,所述第二升降装置上升至远离所述连接开关时,使所述测试板与所述电容测试模块电性连接。Further, the semi-finished touch screen testing machine further includes a second lifting device disposed above the working chassis and a second lifting device moving up and down relative to the second supporting frame, the second lifting device being a vertical projection on the working chassis is located at the connection switch, and when the second lifting device is lowered to the connection switch, electrically connecting the test board and the short-circuit test module, the second lifting device The test board is electrically connected to the capacitance test module when rising away from the connection switch.
进一步地,所述第二升降装置包括固设于所述第二支撑架上的第二气缸以及与所述第二气缸动力连接的第二压板,所述第二压板位于所述第二支撑架下方且相对于所述第二支撑架上下移动,所述第二气缸推动所述第二压板下降至所述连接开关处时,所述连接开关的所述第一连接端与所述第二连接端导通、且所述第一连接端与所述第三连接端断开,以使所述测试板与所述 断短路测试模块电性连接,所述第二升降装置上升至远离所述连接开关时,所述连接开关的所述第一连接端与所述第三连接端导通、且所述第一连接端与所述第二连接端断开,以使所述测试板电性与所述电容测试模块电性连接。Further, the second lifting device includes a second cylinder fixed to the second support frame and a second pressure plate connected to the second cylinder, and the second pressure plate is located at the second support frame Lower and opposite to the second support frame, the first connection end of the connection switch is connected to the second connection when the second cylinder pushes the second pressure plate down to the connection switch The end is turned on, and the first connecting end is disconnected from the third connecting end to make the test board and the The short-circuit test module is electrically connected, and when the second lifting device rises away from the connection switch, the first connection end of the connection switch is electrically connected to the third connection end, and the first connection is The end is disconnected from the second connection end to electrically connect the test board to the capacitance test module.
进一步地,所述第二升降装置还包括第二导柱,所述第二导柱竖向穿过所述第二支撑架且所述第二导柱与所述第二压板固定连接,以使所述第二压板沿竖直方向上下移动。Further, the second lifting device further includes a second guiding post, the second guiding post vertically passes through the second supporting frame and the second guiding post is fixedly connected with the second pressing plate, so that The second pressure plate moves up and down in a vertical direction.
进一步地,所述第一支撑架上还设有CCD对位装置,所述CCD对位装置用于对所述待测产品与所述测试板的电性连接位置进行放大和对位。Further, the first support frame is further provided with a CCD alignment device, and the CCD alignment device is configured to enlarge and align the electrical connection position of the product to be tested and the test board.
进一步地,所述测试平台上还设有调节旋钮,所述调节旋钮用于调节所述待测产品与与所述测试板的电性连接位置。Further, an adjustment knob is further disposed on the test platform, and the adjustment knob is used to adjust an electrical connection position between the product to be tested and the test board.
进一步地,所述半成品触摸屏测试机还包括设于所述工作机箱上方的显示屏,所述显示屏与所述CCD对位装置电性连接,所述显示屏用于显示经过所述CCD对位装置放大后的待测产品与所述测试板的电性连接位置,以使所述调节旋钮调节待测产品与所述测试板的电性连接位置重合。Further, the semi-finished touch screen testing machine further includes a display screen disposed above the working cabinet, the display screen is electrically connected to the CCD aligning device, and the display screen is used for displaying the CCD alignment The electrically connected position of the product to be tested and the test board is enlarged, so that the adjustment knob adjusts the electrical connection position of the product to be tested and the test board.
可选地,所述半成品触摸屏测试机用于测试半成品触摸屏的尺寸小于或者等于7寸。例如,所述半成品触摸屏测试机用于测试半成品触摸屏的尺寸为7寸、6寸、5.5寸、5寸、4.5寸、4寸、3.8寸或3.5寸。Optionally, the semi-finished touch screen tester is used to test that the size of the semi-finished touch screen is less than or equal to 7 inches. For example, the semi-finished touch screen tester is used to test the size of a semi-finished touch screen of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches or 3.5 inches.
可选地,所述半成品触摸屏测试机用于测试GFF、GF1或GF2结构的半成品触摸屏。Optionally, the semi-finished touch screen tester is used to test a semi-finished touch screen of GFF, GF1 or GF2 structure.
与现有技术相比,本发明具有以下有益效果:Compared with the prior art, the present invention has the following beneficial effects:
在本发明中,在工作机箱内部分别设有断短路测试模块和电容测试模块,放置于测试平台中的半成品触摸屏通过与测试板电性连接,最终实现与断短路测试模块或者电容测试模块的连接,由此既能够测试半成品触摸屏中ITO层的断短路值、又能测出ITO层的电容值,故能够保证将半成品触摸屏的短路材料有效检出。另外,由于Atmel公司的IC最多能够支持半成品触摸屏在X方向上电极多达32条、Y方向上电极多达52条,因此能够兼容测试各类IC对应的半成品触摸屏,并且也能够测试不同结构的半成品触摸屏。In the present invention, a short-circuit test module and a capacitance test module are respectively disposed inside the working chassis, and the semi-finished touch screen placed in the test platform is electrically connected with the test board to finally realize the connection with the short-circuit test module or the capacitance test module. Therefore, the short-circuit value of the ITO layer in the semi-finished touch screen can be tested, and the capacitance value of the ITO layer can be measured, so that the short-circuit material of the semi-finished touch screen can be effectively detected. In addition, because Atmel's IC can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction, it is compatible with the semi-finished touch screens of various ICs, and can also test different structures. Semi-finished touch screen.
附图说明DRAWINGS
为了更清楚地说明本发明实施例中的技术方案,下面将对实施例中所需 要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solution in the embodiment of the present invention, the following will be required in the embodiment. The drawings to be used are briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and those skilled in the art can also use these without any creative work. The drawings obtain other figures.
图1是本发明实施例二的半成品触摸屏测试机的结构示意图;1 is a schematic structural view of a semi-finished touch screen testing machine according to a second embodiment of the present invention;
图2是本发明实施例二的半成品触摸屏测试机的结构示意图(省略第一支撑架、第一升降装置和CCD对位装置);2 is a schematic structural view of a semi-finished touch screen testing machine according to a second embodiment of the present invention (the first support frame, the first lifting device, and the CCD alignment device are omitted);
图3是本发明实施例二中第一支撑架、第一升降装置和CCD对位装置的结构示意图。3 is a schematic structural view of a first support frame, a first lifting device, and a CCD alignment device according to Embodiment 2 of the present invention.
具体实施方式detailed description
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention are clearly and completely described in the following with reference to the accompanying drawings in the embodiments of the present invention. It is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention.
实施例一Embodiment 1
本实施例提供一种半成品触摸屏测试机,包括工作机箱、位于所述工作机箱上的测试板和测试平台,所述工作机箱内部设有断短路测试模块和电容测试模块,所述测试板与所述断短路测试模块电性连接或者所述测试板与所述电容测试模块电性连接,所述测试平台用于放置待测产品,所述测试平台与所述测试板对接,以使所述待测产品与所述测试板电性连接。The embodiment provides a semi-finished touch screen testing machine, including a working chassis, a test board and a test platform located on the working chassis, and the working chassis is internally provided with a short circuit test module and a capacitance test module, and the test board and the test board Determining that the short circuit test module is electrically connected or the test board is electrically connected to the capacitance test module, the test platform is configured to place a product to be tested, and the test platform is docked with the test board to make the The test product is electrically connected to the test board.
实施例二 Embodiment 2
结合图1至图3所示,本实施例提供一种半成品触摸屏测试机,包括工作机箱1以及分别设于工作机箱1上不同位置处的测试板2、测试平台3、第一支撑架41、第一升降装置51、第二支撑架42以及第二升降装置52。As shown in FIG. 1 to FIG. 3 , the present embodiment provides a semi-finished touch screen testing machine, including a working chassis 1 and test boards 2 , a test platform 3 , and a first support frame 41 respectively disposed at different positions on the working chassis 1 . The first lifting device 51, the second support frame 42, and the second lifting device 52.
其中,工作机箱1的内部设有断短路测试模块和电容测试模块,且断短路测试模块和/或电容测试模块中设有Atmel公司的IC,例如为MXT1664系列IC,该IC用于驱动断短路测试模块对半成品触摸屏进行断短路测试、驱动电容测试模块对半成品触摸屏进行电容测试。采用Atmel公司中具有较高兼容性的IC,能够支持半成品触摸屏在X方向上电极多达32条、Y方向上电极多达52条,因此能够兼容测试各类IC对应的半成品触摸屏,并且也能够测试不同结构的 半成品触摸屏。The inside of the working case 1 is provided with a short-circuit test module and a capacitance test module, and the short-circuit test module and/or the capacitance test module are provided with an Atmel IC, such as an MXT1664 series IC, which is used to drive a short circuit. The test module performs a short-circuit test on the semi-finished touch screen, and the drive capacitance test module performs a capacitance test on the semi-finished touch screen. Using Atmel's highly compatible IC, it can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction. It is compatible with the semi-finished touch screens of various ICs. Testing different structures Semi-finished touch screen.
其中,测试板2为PCB电路板,测试平台3用于放置待测产品(即待测试的半成品触摸屏),测试平台3与测试板2对接设置,以使放置于测试平台3中的待测产品(图未示)与测试板2电性连接,具体是待测产品的电极引线与测试板2中的金手指电性连接。本实施例的半成品触摸屏测试机还包括设于测试板2上的连接开关6,该连接开关6包括作为公共端的第一连接端、作为常开端的第二连接端和作为常闭端的第三连接端,且第一连接端与测试板2电性连接,第二连接端与断短路测试模块电性连接,第三连接端与电容测试模块电性连接。The test board 2 is a PCB circuit board, and the test platform 3 is used for placing a product to be tested (ie, a semi-finished touch screen to be tested), and the test platform 3 is docked with the test board 2 to enable the product to be tested placed in the test platform 3. (not shown) is electrically connected to the test board 2, specifically, the electrode lead of the product to be tested is electrically connected to the gold finger in the test board 2. The semi-finished touch screen testing machine of this embodiment further includes a connection switch 6 provided on the test board 2, the connection switch 6 including a first connection end as a common end, a second connection end as a normally open end, and a third connection as a normally closed end The first connection end is electrically connected to the test board 2, the second connection end is electrically connected to the short-circuit test module, and the third connection end is electrically connected to the capacitance test module.
其中,第一支撑架41横跨设于工作机箱1的上方,第一升降装置51与第一支撑架41活动连接且相对于第一支撑架41上下移动。具体地,第一升降装置51包括第一气缸511、第一压板512和第一导柱513。第一气缸511固设于第一支撑架41上,用于为第一压板512提供上下移动的动力。第一压板512与第一气缸511动力连接,且第一压板512设于第一支撑架41的下方,并相对于第一支撑架41上下移动,该第一压板512在工作机箱1上的垂直投影位于测试平台3与测试板2对接处。第一导柱513竖向穿过第一支撑架41且与第一压板512固定连接,该第一导柱513用于从竖直方向上对第一压板的上下移动起定位和导向的作用。第一气缸511推动第一压板512下降至测试平台3与测试板2的对接处时,使放置于测试平台3上的待测产品与测试板2电性连接。The first support frame 41 is disposed above the work case 1 , and the first lifting device 51 is movably connected to the first support frame 41 and moves up and down relative to the first support frame 41 . Specifically, the first lifting device 51 includes a first cylinder 511, a first pressure plate 512, and a first guide post 513. The first cylinder 511 is fixed to the first support frame 41 for providing the first pressure plate 512 with power for moving up and down. The first pressure plate 512 is connected to the first cylinder 511, and the first pressure plate 512 is disposed below the first support frame 41 and moves up and down relative to the first support frame 41. The first pressure plate 512 is vertical on the working chassis 1. The projection is located at the docking of the test platform 3 and the test board 2. The first guide post 513 vertically passes through the first support frame 41 and is fixedly coupled to the first pressure plate 512 for positioning and guiding the vertical movement of the first pressure plate from the vertical direction. When the first cylinder 511 pushes the first pressure plate 512 down to the interface between the test platform 3 and the test board 2, the product to be tested placed on the test platform 3 is electrically connected to the test board 2.
其中,第二支撑架42位于第一支撑架41的后方且第二支撑架42横跨设于工作机箱1的上方,第二升降装置52与第二支撑架42活动连接且相对于第二支撑架42上下移动。具体地,第二升降装置52包括第二气缸521、第二压板522和第二导柱523。第二气缸521固设于第二支撑架42上,用于为第二压板522提供上下移动的动力。第二压板522与第二气缸521动力连接,且第二压板522设于第二支撑架42的下方,并相对于第二支撑架42上下移动,该第二压板522在工作机箱1上的垂直投影位于连接开关6附近,具体是位于连接开关6的第二连接端和第三连接端处。第二导柱523竖向穿过第二支撑架42且与第二压板522固定连接,该第二导柱523用于从竖直方向上对第二压板522的上下移动起定位和导向的作用。第二气缸521推动第二压板522下降至靠近连接开关6时,,连接开关6的第一连接端与第二连接端导通、第一连接端与第三连接端断开, 以使测试板2与断短路测试模块电性连接;第二气缸521拉动第二压板522上升至远离连接开关6时,连接开关6的第一连接端与第三连接端导通、第一连接端与第二连接端断开,以使测试板2与电容测试模块电性连接。The second support frame 42 is located behind the first support frame 41 and the second support frame 42 is disposed above the work case 1. The second lifting device 52 is movably connected with the second support frame 42 and opposite to the second support frame. The frame 42 moves up and down. Specifically, the second lifting device 52 includes a second cylinder 521, a second pressure plate 522, and a second guide post 523. The second cylinder 521 is fixed to the second support frame 42 for providing the second pressure plate 522 with power for moving up and down. The second pressure plate 522 is dynamically connected to the second cylinder 521 , and the second pressure plate 522 is disposed below the second support frame 42 and moves up and down relative to the second support frame 42 . The second pressure plate 522 is vertical on the working chassis 1 . The projection is located near the connection switch 6, in particular at the second connection end and the third connection end of the connection switch 6. The second guiding post 523 vertically passes through the second supporting frame 42 and is fixedly connected with the second pressing plate 522 for positioning and guiding the vertical movement of the second pressing plate 522 from the vertical direction. . When the second cylinder 521 pushes the second pressure plate 522 down to the connection switch 6, the first connection end of the connection switch 6 is electrically connected to the second connection end, and the first connection end is disconnected from the third connection end. In order to electrically connect the test board 2 to the short-circuit test module; when the second cylinder 521 pulls the second pressure plate 522 to rise away from the connection switch 6, the first connection end of the connection switch 6 is electrically connected to the third connection end, and the first connection is The end is disconnected from the second connection end to electrically connect the test board 2 to the capacitance test module.
本实施例的半成品触摸屏测试机还包括设置在第一支撑架41上的CCD对位装置7,该CCD对位装置7用于对待测产品与测试板2的电性连接位置进行放大和对位,以确保二者的电性连接位置准确。The semi-finished touch screen testing machine of this embodiment further includes a CCD alignment device 7 disposed on the first support frame 41, and the CCD alignment device 7 is used for amplifying and aligning the electrical connection position of the product to be tested and the test board 2. To ensure that the electrical connection position of the two is accurate.
本实施例的半成品触摸屏测试机还包括设置在测试平台3上的调节旋钮31,该调节旋钮用于微调待测产品与与测试板2的电性连接位置。The semi-finished touch screen testing machine of this embodiment further includes an adjustment knob 31 disposed on the test platform 3, and the adjustment knob is used for fine-tuning the electrical connection position of the product to be tested and the test board 2.
另外,本实施例的半成品触摸屏测试机还包括设于工作机箱1上方的显示屏(图未示),该显示屏与CCD对位装置7电性连接,用于显示经过CCD对位装置放大后的待测产品与测试板的电性连接位置(具体是待测产品的待测产品的电极引线与测试板2中的金手指的连接位置),以使调节旋钮能够根据显示屏上的图像方便地调节待测产品的电极引线与测试板2中金手指的连接位置,使电极引线与金手指可靠重合。In addition, the semi-finished touch screen testing machine of the embodiment further includes a display screen (not shown) disposed above the working chassis 1 , and the display screen is electrically connected to the CCD alignment device 7 for displaying after being enlarged by the CCD alignment device. The electrical connection position of the product to be tested and the test board (specifically, the connection position of the electrode lead of the product to be tested and the gold finger in the test board 2), so that the adjustment knob can be conveniently according to the image on the display screen. The position of the electrode lead of the product to be tested and the gold finger of the test board 2 are adjusted to ensure that the electrode lead and the gold finger reliably overlap.
在本实施例中,半成品触摸屏测试机用于测试半成品触摸屏的尺寸小于或者等于7寸。例如,半成品触摸屏测试机用于测试半成品触摸屏的尺寸为7寸、6寸、5.5寸、5寸、4.5寸、4寸、3.8寸或3.5寸。分此外,本实施例的半成品触摸屏测试机用于测试GFF、GF1或GF2结构的半成品触摸屏。In this embodiment, the semi-finished touch screen tester is used to test that the size of the semi-finished touch screen is less than or equal to 7 inches. For example, a semi-finished touch screen tester is used to test the size of a semi-finished touch screen of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches or 3.5 inches. In addition, the semi-finished touch screen tester of the present embodiment is used to test a semi-finished touch screen of GFF, GF1 or GF2 structure.
本实施例的半成品触摸屏测试机在工作时,首先将待测产品放置于测试平台3上,并将待测产品的电极引线与测试板2的金手指对接;然后通过第一升降装置51将第一压板512下降至待测产品与测试板2的对接处进行压合,以使待测产品与测试板2电性连接,此时连接开关6的一端与测试板2电性连接;接着通过第二升降装置52将第二压板522下降至靠近连接开关6的位置处,以使连接开关6的另一端与断短路测试模块电性连接,由此使待测产品与断短路测试模块之间电性连接,以实现对待测产品的断短路测试;最后通过第二升降装置52将第二压板522上升、使第二压板522远离连接开关6,以使连接开关6的另一端与电容测试模块电性连接,由此使待测产品与电容测试模块之间电性连接,以实现对待测产品的电容测试。When the semi-finished touch screen tester of the embodiment is in operation, the product to be tested is first placed on the test platform 3, and the electrode lead of the product to be tested is docked with the gold finger of the test board 2; then the first lifting device 51 is used. The pressure plate 512 is lowered to the interface between the product to be tested and the test board 2 to be electrically connected, so that the product to be tested is electrically connected to the test board 2, and one end of the connection switch 6 is electrically connected to the test board 2; The second lifting device 52 lowers the second pressure plate 522 to a position close to the connection switch 6 so that the other end of the connection switch 6 is electrically connected to the short-circuit test module, thereby electrically connecting the product to be tested and the short-circuit test module. The connection is made to realize the short-circuit test of the product to be tested; finally, the second pressure plate 522 is raised by the second lifting device 52, and the second pressure plate 522 is moved away from the connection switch 6 so that the other end of the connection switch 6 and the capacitance test module are electrically connected. The connection is made, thereby electrically connecting the product to be tested and the capacitance test module to realize the capacitance test of the product to be tested.
此外,本实施例的半成品触摸屏测试机还设有用于反应测试结果的指示灯以及用于恢复半成品触摸屏测试机测试状态的复位按钮。当待测产品的测 试结果为合格时,位于工作机箱上的第一指示灯(例如绿色LED灯)亮起;当待测产品的测试结果为不合格时,位于工作机箱上的第二指示灯(例如红色LED灯)亮起,此时第一压板512不会自动抬起,需要操作复位按钮将第一压板抬起,以继续进行测试工作。In addition, the semi-finished touch screen testing machine of this embodiment is further provided with an indicator light for reacting the test result and a reset button for restoring the test state of the semi-finished touch screen tester. When testing the product to be tested When the test result is acceptable, the first indicator light (such as the green LED light) on the working chassis lights up; when the test result of the product to be tested is unqualified, the second indicator light (such as the red LED light) is located on the working chassis. ) Lights up, at this time the first pressure plate 512 does not automatically lift, and the reset button needs to be operated to lift the first pressure plate to continue the test work.
本实施例的半成品触摸屏测试机与电脑电性连接,以使所述半成品触摸屏测试机的测试数据能够传输、保存至电脑中,并通过电脑的显示器显示测试结果及数据。The semi-finished touch screen testing machine of the embodiment is electrically connected to the computer, so that the test data of the semi-finished touch screen testing machine can be transmitted and saved to the computer, and the test result and data are displayed through the display of the computer.
以上实施例的说明只是用于帮助理解本发明的方法及其核心思想;同时,对于本领域的一般技术人员,依据本发明的思想,在具体实施方式及应用范围上均会有改变之处,综上所述,本说明书内容不应理解为对本发明的限制。 The description of the above embodiments is only for helping to understand the method and the core idea of the present invention; at the same time, for those skilled in the art, according to the idea of the present invention, there are some changes in the specific embodiments and application scopes. In summary, the content of the specification should not be construed as limiting the invention.

Claims (10)

  1. 一种半成品触摸屏测试机,其特征在于,包括工作机箱、位于所述工作机箱上的测试板和测试平台,所述工作机箱内部设有断短路测试模块和电容测试模块,所述测试板与所述断短路测试模块电性连接或者所述测试板与所述电容测试模块电性连接,所述测试平台用于放置待测产品,所述测试平台与所述测试板对接,以使所述待测产品与所述测试板电性连接。A semi-finished touch screen testing machine, comprising: a working chassis, a test board and a test platform on the working chassis, wherein the working chassis is provided with a short circuit test module and a capacitance test module, and the test board and the test board Determining that the short circuit test module is electrically connected or the test board is electrically connected to the capacitance test module, the test platform is configured to place a product to be tested, and the test platform is docked with the test board to make the The test product is electrically connected to the test board.
  2. 根据权利要求1所述的半成品触摸屏测试机,其特征在于,所述断短路测试模块和/或所述电容测试模块中设有IC,所述IC为Atmel公司的IC。The semi-finished touch screen testing machine according to claim 1, wherein the short circuit test module and/or the capacitance test module are provided with an IC, and the IC is an IC of Atmel Corporation.
  3. 根据权利要求1所述的半成品触摸屏测试机,其特征在于,所述半成品触摸屏测试机还包括设于所述测试板上的连接开关,所述连接开关包括作为公共端的第一连接端、作为常开端的第二连接端和作为常闭端的第三连接端,其中所述第一连接端与所述测试板电性连接,所述第二连接端与所述断短路测试模块电性连接,所述第三连接端与所述电容测试模块电性连接。The semi-finished touch screen testing machine according to claim 1, wherein the semi-finished touch screen testing machine further comprises a connection switch disposed on the test board, the connection switch comprising a first connection end as a common end, as a common a second connecting end that is open at the beginning and a third connecting end that is a normally closed end, wherein the first connecting end is electrically connected to the test board, and the second connecting end is electrically connected to the short-circuit test module. The third connection end is electrically connected to the capacitance test module.
  4. 根据权利要求1至3任一项所述的半成品触摸屏测试机,其特征在于,所述半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置,所述第一升降装置在所述工作机箱上的垂直投影位于所述测试平台与所述测试板对接处,所述第一升降装置下降至所述测试平台与所述测试板的对接处时,使放置于所述测试平台上的待测产品与所述测试板电性连接。The semi-finished touch screen testing machine according to any one of claims 1 to 3, wherein the semi-finished touch screen testing machine further comprises a first support frame disposed above the work case and opposite to the first support a first lifting device that moves up and down, a vertical projection of the first lifting device on the working chassis is located at abutment between the test platform and the test board, and the first lifting device is lowered to the testing platform When the test board is docked, the product to be tested placed on the test platform is electrically connected to the test board.
  5. 根据权利要求4所述的半成品触摸屏测试机,其特征在于,所述第一升降装置包括固设于所述第一支撑架上的第一气缸以及与所述第一气缸动力连接的第一压板,所述第一压板位于所述第一支撑架下方且相对于所述第一支撑架上下移动,所述第一气缸推动所述第一压板下降至所述测试平台与所述测试板的对接处时,使放置于所述测试平台上的待测产品与所述测试板电性连接。The semi-finished touch screen testing machine according to claim 4, wherein the first lifting device comprises a first cylinder fixed to the first support frame and a first pressure plate connected to the first cylinder The first pressure plate is located below the first support frame and moves up and down relative to the first support frame, and the first cylinder pushes the first pressure plate down to the docking of the test platform and the test board. At the time, the product to be tested placed on the test platform is electrically connected to the test board.
  6. 根据权利要求5所述的半成品触摸屏测试机,其特征在于,所述第一升降装置还包括第一导柱,所述第一导柱竖向穿过所述第一支撑架且所述第一导柱与所述第一压板固定连接,以使所述第一压板沿竖直方向上下移动。The semi-finished touch screen testing machine according to claim 5, wherein the first lifting device further comprises a first guiding post, the first guiding column vertically passes through the first supporting frame and the first The guide post is fixedly coupled to the first pressure plate to move the first pressure plate up and down in a vertical direction.
  7. 根据权利要求4所述的半成品触摸屏测试机,其特征在于,所述半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第二支撑架和相对所述 第二支撑架上下移动的第二升降装置,所述第二升降装置在所述工作机箱上的垂直投影位于所述连接开关处,所述第二升降装置下降至所述连接开关处时,使所述测试板与所述断短路测试模块电性连接,所述第二升降装置上升至远离所述连接开关时,使所述测试板与所述电容测试模块电性连接。The semi-finished touch screen testing machine according to claim 4, wherein the semi-finished touch screen testing machine further comprises a second support frame disposed above the work case and opposite to a second lifting device that moves up and down the second support frame, a vertical projection of the second lifting device on the working chassis is located at the connection switch, and when the second lifting device is lowered to the connection switch, The test board is electrically connected to the short-circuit test module, and when the second lifting device rises away from the connection switch, the test board is electrically connected to the capacitance test module.
  8. 根据权利要求7所述的半成品触摸屏测试机,其特征在于,所述第二升降装置包括固设于所述第二支撑架上的第二气缸以及与所述第二气缸动力连接的第二压板,所述第二压板位于所述第二支撑架下方且相对于所述第二支撑架上下移动,所述第二气缸推动所述第二压板下降至所述连接开关处时,所述连接开关的所述第一连接端与所述第二连接端导通、且所述第一连接端与所述第三连接端断开,使所述测试板与所述断短路测试模块电性连接,所述第二气缸拉动所述第二压板上升至远离所述连接开关时,所述连接开关的所述第一连接端与所述第三连接端导通、且所述第一连接端与所述第二连接端断开,使所述测试板与所述电容测试模块电性连接。The semi-finished touch screen testing machine according to claim 7, wherein the second lifting device comprises a second cylinder fixed to the second support frame and a second pressure plate connected to the second cylinder The second pressure plate is located below the second support frame and moves up and down relative to the second support frame, and when the second cylinder pushes the second pressure plate down to the connection switch, the connection switch The first connection end is electrically connected to the second connection end, and the first connection end is disconnected from the third connection end, so that the test board is electrically connected to the short-circuit test module. When the second cylinder pulls the second pressure plate to rise away from the connection switch, the first connection end of the connection switch is electrically connected to the third connection end, and the first connection end is The second connection end is disconnected, and the test board is electrically connected to the capacitance test module.
  9. 根据权利要求1所述的半成品触摸屏测试机,其特征在于,所述半成品触摸屏测试机用于测试半成品触摸屏的尺寸小于或者等于7寸。The semi-finished touch screen testing machine according to claim 1, wherein the semi-finished touch screen testing machine is used to test that the size of the semi-finished touch screen is less than or equal to 7 inches.
  10. 根据权利要求1所述的半成品触摸屏测试机,其特征在于,所述半成品触摸屏测试机用于测试GFF、GF1或GF2结构的半成品触摸屏。 The semi-finished touch screen testing machine according to claim 1, wherein the semi-finished touch screen testing machine is used for testing a semi-finished touch screen of a GFF, GF1 or GF2 structure.
PCT/CN2016/101027 2016-08-08 2016-09-30 Semi-manufactured touch screen testing machine WO2018028032A1 (en)

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