JP2016080607A5 - - Google Patents

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Publication number
JP2016080607A5
JP2016080607A5 JP2014214170A JP2014214170A JP2016080607A5 JP 2016080607 A5 JP2016080607 A5 JP 2016080607A5 JP 2014214170 A JP2014214170 A JP 2014214170A JP 2014214170 A JP2014214170 A JP 2014214170A JP 2016080607 A5 JP2016080607 A5 JP 2016080607A5
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JP
Japan
Prior art keywords
ray
rays
opening
collimator
parallelism
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JP2014214170A
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English (en)
Japanese (ja)
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JP6430208B2 (ja
JP2016080607A (ja
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Priority to JP2014214170A priority Critical patent/JP6430208B2/ja
Priority claimed from JP2014214170A external-priority patent/JP6430208B2/ja
Publication of JP2016080607A publication Critical patent/JP2016080607A/ja
Publication of JP2016080607A5 publication Critical patent/JP2016080607A5/ja
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Publication of JP6430208B2 publication Critical patent/JP6430208B2/ja
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JP2014214170A 2014-10-21 2014-10-21 Ｘ線照射装置 Active JP6430208B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014214170A JP6430208B2 (ja) 2014-10-21 2014-10-21 Ｘ線照射装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014214170A JP6430208B2 (ja) 2014-10-21 2014-10-21 Ｘ線照射装置

Publications (3)

Publication Number Publication Date
JP2016080607A JP2016080607A (ja) 2016-05-16
JP2016080607A5 true JP2016080607A5 (zh) 2017-11-24
JP6430208B2 JP6430208B2 (ja) 2018-11-28

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ID=55958478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014214170A Active JP6430208B2 (ja) 2014-10-21 2014-10-21 Ｘ線照射装置

Country Status (1)

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JP (1) JP6430208B2 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3790025B1 (en) 2019-03-29 2022-03-09 Applied Science Laboratory Co., Ltd X-ray analyzer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09180661A (ja) * 1995-12-27 1997-07-11 Toyota Motor Corp Ｘ線管
JP2008268105A (ja) * 2007-04-24 2008-11-06 Toshiba Corp Ｘ線ビーム源、ｘ線ビーム照射装置、ｘ線ビーム透過撮影装置、ｘ線ビームｃｔ装置、ｘ線元素マッピング検査装置及びｘ線ビーム形成方法

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