JP2016040520A - 物体検出装置 - Google Patents

物体検出装置 Download PDF

Info

Publication number
JP2016040520A
JP2016040520A JP2013002979A JP2013002979A JP2016040520A JP 2016040520 A JP2016040520 A JP 2016040520A JP 2013002979 A JP2013002979 A JP 2013002979A JP 2013002979 A JP2013002979 A JP 2013002979A JP 2016040520 A JP2016040520 A JP 2016040520A
Authority
JP
Japan
Prior art keywords
distance
region
object detection
pixel
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013002979A
Other languages
English (en)
Japanese (ja)
Inventor
岸田　孝範
Takanori Kishida
孝範 岸田
夫馬　正人
Masato Fuma
正人 夫馬
山口　光隆
Mitsutaka Yamaguchi
光隆 山口
直史 生田
Tadashi Ikuta
直史 生田
潤 江頭
Jun Egashira
潤 江頭
眞梶　康彦
Yasuhiko Makaji
康彦 眞梶
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PUX CORP
Sanyo Electric Co Ltd
Original Assignee
PUX CORP
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PUX CORP, Sanyo Electric Co Ltd filed Critical PUX CORP
Priority to JP2013002979A priority Critical patent/JP2016040520A/ja
Priority to PCT/JP2013/007621 priority patent/WO2014108976A1/fr
Publication of JP2016040520A publication Critical patent/JP2016040520A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/017—Gesture based interaction, e.g. based on a set of recognized hand gestures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/0304—Detection arrangements using opto-electronic means
    • G06F3/0317—Detection arrangements using opto-electronic means in co-operation with a patterned surface, e.g. absolute position or relative movement detection for an optical mouse or pen positioned with respect to a coded surface
    • G06F3/0321—Detection arrangements using opto-electronic means in co-operation with a patterned surface, e.g. absolute position or relative movement detection for an optical mouse or pen positioned with respect to a coded surface by optically sensing the absolute position with respect to a regularly patterned surface forming a passive digitiser, e.g. pen optically detecting position indicative tags printed on a paper sheet
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
JP2013002979A 2013-01-10 2013-01-10 物体検出装置 Pending JP2016040520A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013002979A JP2016040520A (ja) 2013-01-10 2013-01-10 物体検出装置
PCT/JP2013/007621 WO2014108976A1 (fr) 2013-01-10 2013-12-26 Dispositif de détection d'objet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013002979A JP2016040520A (ja) 2013-01-10 2013-01-10 物体検出装置

Publications (1)

Publication Number Publication Date
JP2016040520A true JP2016040520A (ja) 2016-03-24

Family

ID=51166654

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013002979A Pending JP2016040520A (ja) 2013-01-10 2013-01-10 物体検出装置

Country Status (2)

Country Link
JP (1) JP2016040520A (fr)
WO (1) WO2014108976A1 (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018077839A (ja) * 2016-11-10 2018-05-17 メタル インダストリーズ リサーチ アンド ディベロップメント センター 深度値に基づいたジェスチャ操作方法および深度値に基づいたジェスチャ操作システム
JPWO2017183114A1 (ja) * 2016-04-19 2019-02-28 株式会社日立エルジーデータストレージ 距離画像生成装置および距離画像生成方法
KR20190029901A (ko) * 2017-09-13 2019-03-21 네이버랩스 주식회사 영상센서 방식 라이다의 측정거리 향상을 위한 광 집속 시스템
CN113597534A (zh) * 2019-03-26 2021-11-02 松下知识产权经营株式会社 测距成像系统、测距成像方法和程序
US11415827B2 (en) 2018-12-28 2022-08-16 Japan Display Inc. Display device and electronic apparatus incorporating display device
JP7439073B2 (ja) 2018-10-12 2024-02-27 テラダイン、 インコーポレイテッド 溶接パス生成のためのシステム及び方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2021060397A1 (fr) * 2019-09-26 2021-04-01

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5594469A (en) * 1995-02-21 1997-01-14 Mitsubishi Electric Information Technology Center America Inc. Hand gesture machine control system
JP3868621B2 (ja) * 1998-03-17 2007-01-17 株式会社東芝 画像取得装置、画像取得方法、及び記録媒体
JP3625390B2 (ja) * 1999-02-01 2005-03-02 株式会社東芝 画像取得装置および方法
JP3637226B2 (ja) * 1999-02-01 2005-04-13 株式会社東芝 動き検出方法、動き検出装置及び記録媒体
JP2004317126A (ja) * 2003-04-10 2004-11-11 Renesas Technology Corp はんだ印刷装置
JP4422580B2 (ja) * 2004-08-24 2010-02-24 住友大阪セメント株式会社 動き検出装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2017183114A1 (ja) * 2016-04-19 2019-02-28 株式会社日立エルジーデータストレージ 距離画像生成装置および距離画像生成方法
US10928518B2 (en) 2016-04-19 2021-02-23 Hitachi-Lg Data Storage, Inc. Range image generation apparatus and range image generation method
JP2018077839A (ja) * 2016-11-10 2018-05-17 メタル インダストリーズ リサーチ アンド ディベロップメント センター 深度値に基づいたジェスチャ操作方法および深度値に基づいたジェスチャ操作システム
US10824240B2 (en) 2016-11-10 2020-11-03 Metal Industries Research & Development Centre Gesture operation method based on depth values and system thereof
KR20190029901A (ko) * 2017-09-13 2019-03-21 네이버랩스 주식회사 영상센서 방식 라이다의 측정거리 향상을 위한 광 집속 시스템
KR102087081B1 (ko) * 2017-09-13 2020-03-10 네이버랩스 주식회사 영상센서 방식 라이다의 측정거리 향상을 위한 광 집속 시스템
JP7439073B2 (ja) 2018-10-12 2024-02-27 テラダイン、 インコーポレイテッド 溶接パス生成のためのシステム及び方法
US11415827B2 (en) 2018-12-28 2022-08-16 Japan Display Inc. Display device and electronic apparatus incorporating display device
CN113597534A (zh) * 2019-03-26 2021-11-02 松下知识产权经营株式会社 测距成像系统、测距成像方法和程序
CN113597534B (zh) * 2019-03-26 2023-07-25 松下知识产权经营株式会社 测距成像系统、测距成像方法和程序

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Publication number Publication date
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