JP2015528616A5 - - Google Patents

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Publication number
JP2015528616A5
JP2015528616A5 JP2015532069A JP2015532069A JP2015528616A5 JP 2015528616 A5 JP2015528616 A5 JP 2015528616A5 JP 2015532069 A JP2015532069 A JP 2015532069A JP 2015532069 A JP2015532069 A JP 2015532069A JP 2015528616 A5 JP2015528616 A5 JP 2015528616A5
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JP
Japan
Prior art keywords
noise
delays
sampling waveform
item
measurement
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JP2015532069A
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English (en)
Japanese (ja)
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JP6219959B2 (ja
JP2015528616A (ja
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Priority claimed from US14/025,143 external-priority patent/US9568526B2/en
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Publication of JP2015528616A publication Critical patent/JP2015528616A/ja
Publication of JP2015528616A5 publication Critical patent/JP2015528616A5/ja
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Publication of JP6219959B2 publication Critical patent/JP6219959B2/ja
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JP2015532069A 2012-09-13 2013-09-13 雑音検出および補正ルーチン Active JP6219959B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261700399P 2012-09-13 2012-09-13
US61/700,399 2012-09-13
US14/025,143 2013-09-12
US14/025,143 US9568526B2 (en) 2012-09-13 2013-09-12 Noise detection and correction routines
PCT/US2013/059630 WO2014043453A1 (en) 2012-09-13 2013-09-13 Noise detection and correction routines

Publications (3)

Publication Number Publication Date
JP2015528616A JP2015528616A (ja) 2015-09-28
JP2015528616A5 true JP2015528616A5 (https=) 2016-10-27
JP6219959B2 JP6219959B2 (ja) 2017-10-25

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ID=50234181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015532069A Active JP6219959B2 (ja) 2012-09-13 2013-09-13 雑音検出および補正ルーチン

Country Status (7)

Country Link
US (1) US9568526B2 (https=)
EP (1) EP2895943B1 (https=)
JP (1) JP6219959B2 (https=)
KR (1) KR102151672B1 (https=)
CN (1) CN104685457B (https=)
TW (1) TWI616796B (https=)
WO (1) WO2014043453A1 (https=)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI484396B (zh) * 2013-04-16 2015-05-11 Ene Technology Inc A method for filtering an interference source and a touch sensing device
KR102098878B1 (ko) * 2013-09-03 2020-04-08 엘지디스플레이 주식회사 터치 센서를 갖는 전자장치와 이의 구동 방법
US9600121B2 (en) * 2014-04-25 2017-03-21 Synaptics Incorporated Driving sensor electrodes for noise measurement
CN105409126B (zh) * 2014-06-02 2018-03-23 三菱电机株式会社 噪声解析装置、电子装置以及噪声源确定系统
US9772725B2 (en) * 2014-09-24 2017-09-26 Synaptics Incorporated Hybrid sensing to reduce latency
CN106249970B (zh) * 2015-06-05 2020-11-27 恩智浦美国有限公司 具有噪声抑制的电容传感器
US10444892B2 (en) * 2015-10-07 2019-10-15 Microchip Technology Incorporated Capacitance measurement device with reduced noise
US9904412B2 (en) * 2015-12-30 2018-02-27 Synaptics Incorporated Display noise subtraction via substantially orthogonal noise templates
US10466839B2 (en) * 2016-03-30 2019-11-05 Synaptics Incorporated Dynamic differential algorithm for side touch signals
TWI588714B (zh) * 2016-09-01 2017-06-21 友達光電股份有限公司 時序控制器及觸控面板的雜訊抑制方法
US20190137549A1 (en) * 2017-11-03 2019-05-09 Velodyne Lidar, Inc. Systems and methods for multi-tier centroid calculation
WO2021100348A1 (ja) * 2019-11-19 2021-05-27 アルプスアルパイン株式会社 静電容量式センサ、静電容量検出方法、及び、静電容量検出プログラム
TWI758978B (zh) * 2020-11-30 2022-03-21 創意電子股份有限公司 時脈樹的修正裝置及其修正方法
JP7752983B2 (ja) * 2021-07-16 2025-10-14 アルプスアルパイン株式会社 接触判定装置
WO2025188353A1 (en) * 2024-03-05 2025-09-12 Microchip Technology Incorporated Electronic device including a touch detection system and a noise detection system
CN120595959A (zh) 2024-03-05 2025-09-05 微芯片技术股份有限公司 包括触摸检测系统和噪声检测系统的电子设备
CN119935305B (zh) * 2025-04-03 2025-06-27 青岛智腾微电子有限公司 基于多元数据融合处理的噪声传感器运行监测系统及方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04371916A (ja) * 1991-06-20 1992-12-24 Alps Electric Co Ltd 液晶表示装置
US5789689A (en) 1997-01-17 1998-08-04 Doidic; Michel Tube modeling programmable digital guitar amplification system
JP2006079405A (ja) 2004-09-10 2006-03-23 Oki Electric Ind Co Ltd 情報処理装置、及び情報処理装置の制御方法
KR20060133330A (ko) * 2005-06-20 2006-12-26 삼성전자주식회사 터치 스크린이 내장된 액정 표시 장치 및 터치 스크린의신호 처리 방법
JP2007208682A (ja) * 2006-02-02 2007-08-16 Matsushita Electric Ind Co Ltd タッチパネル
US8279180B2 (en) * 2006-05-02 2012-10-02 Apple Inc. Multipoint touch surface controller
US7825672B2 (en) * 2006-06-19 2010-11-02 Mrl Industries, Inc. High accuracy in-situ resistance measurements methods
US8125441B2 (en) 2006-11-20 2012-02-28 Cypress Semiconductor Corporation Discriminating among activation of multiple buttons
JP2009130730A (ja) * 2007-11-26 2009-06-11 Fujitsu Microelectronics Ltd ２次元固体撮像素子、そのノイズ検出方法、補正方法およびプログラム
JP2010015262A (ja) * 2008-07-01 2010-01-21 Seiko Instruments Inc 静電検出装置及び静電検出方法
US20110134076A1 (en) * 2009-06-29 2011-06-09 Sony Corporation Capacitive touch panel and display device with touch detection function
TWI431520B (zh) * 2009-08-14 2014-03-21 Elan Microelectronics Corp Front - end signal detectors and methods for improving the anti - noise capability of capacitive touch panels
CN201590059U (zh) * 2009-09-27 2010-09-22 智点科技（深圳）有限公司 一种触控电路
CN102725715B (zh) * 2009-10-20 2016-11-09 谱瑞科技股份有限公司 减少触控屏幕控制器中的耦合噪声影响的方法和设备
US9140750B2 (en) * 2009-10-21 2015-09-22 Advantest Corporation Apparatus comprising a recursive delayer and method for measuring a phase noise
KR20110091380A (ko) * 2010-02-05 2011-08-11 삼성전자주식회사 터치 패널의 노이즈 보상 방법 및 장치
US9391607B2 (en) * 2010-04-22 2016-07-12 Qualcomm Technologies, Inc. Use of random sampling technique to reduce finger-coupled noise
CN102844669B (zh) 2010-08-24 2016-06-15 赛普拉斯半导体公司 用于电容感测系统的噪声抑制电路和方法
US20130268229A1 (en) * 2012-04-04 2013-10-10 Ridgetop Group, Inc. Method for finding fault-to-failure signatures using ordered health states

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