JP2015524727A5 - - Google Patents

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Publication number
JP2015524727A5
JP2015524727A5 JP2015527046A JP2015527046A JP2015524727A5 JP 2015524727 A5 JP2015524727 A5 JP 2015524727A5 JP 2015527046 A JP2015527046 A JP 2015527046A JP 2015527046 A JP2015527046 A JP 2015527046A JP 2015524727 A5 JP2015524727 A5 JP 2015524727A5
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JP
Japan
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ray
grating
unit
source
imaging system
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JP2015527046A
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Japanese (ja)
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JP6388587B2 (ja
JP2015524727A (ja
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Priority claimed from PCT/IB2013/056524 external-priority patent/WO2014027289A1/en
Publication of JP2015524727A publication Critical patent/JP2015524727A/ja
Publication of JP2015524727A5 publication Critical patent/JP2015524727A5/ja
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JP2015527046A 2012-08-17 2013-08-09 微分位相コントラストイメージングにおけるミスアライメントの対処 Active JP6388587B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261684199P 2012-08-17 2012-08-17
US61/684,199 2012-08-17
PCT/IB2013/056524 WO2014027289A1 (en) 2012-08-17 2013-08-09 Handling misalignment in differential phase contrast imaging

Publications (3)

Publication Number Publication Date
JP2015524727A JP2015524727A (ja) 2015-08-27
JP2015524727A5 true JP2015524727A5 (OSRAM) 2016-09-29
JP6388587B2 JP6388587B2 (ja) 2018-09-12

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JP2015527046A Active JP6388587B2 (ja) 2012-08-17 2013-08-09 微分位相コントラストイメージングにおけるミスアライメントの対処

Country Status (5)

Country Link
US (1) US9903827B2 (OSRAM)
EP (1) EP2884898B1 (OSRAM)
JP (1) JP6388587B2 (OSRAM)
CN (1) CN104582575B8 (OSRAM)
WO (1) WO2014027289A1 (OSRAM)

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WO2017212687A1 (ja) * 2016-06-10 2017-12-14 株式会社島津製作所 Ｘ線位相差撮像システム、ｘ線位相差撮像装置およびｘ線位相差撮像方法
EP3488783B1 (en) * 2016-07-20 2020-11-04 Shimadzu Corporation X-ray phase difference imaging apparatus
CN107807139B (zh) * 2016-09-05 2020-04-24 天津工业大学 一种无步进装置的双能x射线相衬成像系统及其实现方法
ES2952771T3 (es) 2016-09-15 2023-11-06 Oxos Medical Inc Sistemas de imágenes mejoradas
JP6683118B2 (ja) 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
EP3378397A1 (en) * 2017-03-24 2018-09-26 Koninklijke Philips N.V. Sensitivity optimized patient positioning system for dark-field x-ray imaging
EP3382719A1 (en) * 2017-03-27 2018-10-03 Koninklijke Philips N.V. Detector arrangement for an x-ray phase contrast system and method for x-ray contrast imaging
CN107085000B (zh) * 2017-04-17 2020-06-16 深圳先进技术研究院 X射线光栅相衬成像自动校准系统及方法
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
WO2020028704A1 (en) 2018-08-01 2020-02-06 Micro C, LLC Improved imaging systems and methods
WO2020054150A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 格子の調整方法
WO2020054151A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 Ｘ線位相イメージング装置
EP3705044A1 (en) * 2019-03-08 2020-09-09 Koninklijke Philips N.V. System for x-ray dark field; phase contrast and attenuation tomosynthesis image acquisition
WO2020186075A1 (en) 2019-03-12 2020-09-17 Micro C, LLC Method of fluoroscopic surgical registration
EP3821810A1 (en) 2019-11-13 2021-05-19 Koninklijke Philips N.V. Active gratings position tracking in gratings-based phase-contrast and dark-field imaging
EP3922179A1 (en) * 2020-06-08 2021-12-15 Koninklijke Philips N.V. Stepping strategy for defect compensation in dax imaging

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Publication number Priority date Publication date Assignee Title
US5812629A (en) 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
DE102008048683A1 (de) * 2008-09-24 2010-04-08 Siemens Aktiengesellschaft Verfahren zur Bestimmung von Phase und/oder Amplitude zwischen interferierenden benachbarten Röntgenstrahlen in einem Detektorpixel bei einem Talbot-Interferometer
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
JP2010164373A (ja) * 2009-01-14 2010-07-29 Konica Minolta Medical & Graphic Inc Ｘ線撮影装置、およびｘ線撮影方法
EP2433288B1 (en) * 2009-05-19 2016-03-16 Koninklijke Philips N.V. Grating for phase-contrast imaging
WO2010146498A1 (en) * 2009-06-16 2010-12-23 Koninklijke Philips Electronics N. V. Tilted gratings and method for production of tilted gratings
CN102651998B (zh) * 2009-12-10 2015-08-05 皇家飞利浦电子股份有限公司 用于微分相衬成像的扫描系统
JP5759474B2 (ja) * 2009-12-10 2015-08-05 コーニンクレッカ フィリップス エヌ ヴェ 移動可能ｘ線検出器要素を有する位相コントラスト画像化装置及び方法
CN102651994A (zh) * 2009-12-10 2012-08-29 皇家飞利浦电子股份有限公司 微分相位对比成像系统的校准
JP5548085B2 (ja) * 2010-03-30 2014-07-16 富士フイルム株式会社 回折格子の調整方法
JP2012130586A (ja) * 2010-12-22 2012-07-12 Fujifilm Corp 放射線画像検出装置、放射線撮影装置、及び放射線撮影システム
DE102013204604A1 (de) * 2013-03-15 2014-09-18 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping

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