JP2015521784A5 - - Google Patents

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JP2015521784A5
JP2015521784A5 JP2015517583A JP2015517583A JP2015521784A5 JP 2015521784 A5 JP2015521784 A5 JP 2015521784A5 JP 2015517583 A JP2015517583 A JP 2015517583A JP 2015517583 A JP2015517583 A JP 2015517583A JP 2015521784 A5 JP2015521784 A5 JP 2015521784A5
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Japan
Prior art keywords
annular electrode
central axis
ion guide
along
annular
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JP2015517583A
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Japanese (ja)
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JP6160692B2 (ja
JP2015521784A (ja
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Priority claimed from CN201210203634.8A external-priority patent/CN103515183B/zh
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JP2015517583A 2012-06-20 2013-05-28 イオンガイド装置及びイオンガイド方法 Active JP6160692B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201210203634.8A CN103515183B (zh) 2012-06-20 2012-06-20 离子导引装置和离子导引方法
CN201210203634.8 2012-06-20
PCT/CN2013/000627 WO2013189170A1 (zh) 2012-06-20 2013-05-28 离子导引装置和离子导引方法

Publications (3)

Publication Number Publication Date
JP2015521784A JP2015521784A (ja) 2015-07-30
JP2015521784A5 true JP2015521784A5 (enExample) 2016-02-18
JP6160692B2 JP6160692B2 (ja) 2017-07-12

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JP2015517583A Active JP6160692B2 (ja) 2012-06-20 2013-05-28 イオンガイド装置及びイオンガイド方法

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US (1) US9620347B2 (enExample)
EP (1) EP2866247B1 (enExample)
JP (1) JP6160692B2 (enExample)
CN (1) CN103515183B (enExample)
WO (1) WO2013189170A1 (enExample)

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CN112114067A (zh) * 2020-09-16 2020-12-22 上海裕达实业有限公司 涂层析气成分检测质谱系统及方法
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