JP2015519542A - 熱センサ補正 - Google Patents

熱センサ補正 Download PDF

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Publication number
JP2015519542A
JP2015519542A JP2015501815A JP2015501815A JP2015519542A JP 2015519542 A JP2015519542 A JP 2015519542A JP 2015501815 A JP2015501815 A JP 2015501815A JP 2015501815 A JP2015501815 A JP 2015501815A JP 2015519542 A JP2015519542 A JP 2015519542A
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JP
Japan
Prior art keywords
temperature
cold junction
thermal sensor
over time
change
Prior art date
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Pending
Application number
JP2015501815A
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English (en)
Japanese (ja)
Other versions
JP2015519542A5 (enExample
Inventor
サミ カラキ ハビブ
サミ カラキ ハビブ
Original Assignee
日本テキサス・インスツルメンツ株式会社
テキサス インスツルメンツ インコーポレイテッド
テキサス インスツルメンツ インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本テキサス・インスツルメンツ株式会社, テキサス インスツルメンツ インコーポレイテッド, テキサス インスツルメンツ インコーポレイテッド filed Critical 日本テキサス・インスツルメンツ株式会社
Publication of JP2015519542A publication Critical patent/JP2015519542A/ja
Publication of JP2015519542A5 publication Critical patent/JP2015519542A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14Electrical features thereof
    • G01J5/16Arrangements with respect to the cold junction; Compensating influence of ambient temperature or other variables

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
JP2015501815A 2012-03-22 2013-03-15 熱センサ補正 Pending JP2015519542A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/427,521 US8899828B2 (en) 2012-03-22 2012-03-22 Heat sensor correction
US13/427,521 2012-03-22
PCT/US2013/032304 WO2013142360A1 (en) 2012-03-22 2013-03-15 Heat sensor correction

Publications (2)

Publication Number Publication Date
JP2015519542A true JP2015519542A (ja) 2015-07-09
JP2015519542A5 JP2015519542A5 (enExample) 2016-05-12

Family

ID=49211784

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015501815A Pending JP2015519542A (ja) 2012-03-22 2013-03-15 熱センサ補正

Country Status (4)

Country Link
US (1) US8899828B2 (enExample)
JP (1) JP2015519542A (enExample)
CN (1) CN104204748B (enExample)
WO (1) WO2013142360A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10830171B2 (en) * 2016-02-23 2020-11-10 Ford Global Technologies, Llc Vehicle sensor output processing
JP6777428B2 (ja) * 2016-06-02 2020-10-28 アズビル株式会社 温度測定装置
CN117804639B (zh) * 2024-02-29 2024-05-17 潍坊盛品印刷设备有限公司 一种胶装机温控传感器的温度校准方法及系统

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666639A (ja) * 1992-08-20 1994-03-11 Toyota Central Res & Dev Lab Inc 赤外線温度計
JPH0783761A (ja) * 1993-09-20 1995-03-31 Matsushita Electric Ind Co Ltd 放射温度検出装置
JP2003501113A (ja) * 1998-09-15 2003-01-14 ガーリッツ、ジョナサン 赤外線利用の耳式体温計
JP2004037139A (ja) * 2002-07-01 2004-02-05 Omron Corp 温度計測装置および温度調節器
DE10341142A1 (de) * 2003-09-06 2005-03-31 Braun Gmbh Verfahren und Vorrichtung zur Kompensation des thermischen Einflusses eines Temperaturgradienten im Sensorgehäuse eines Strahlungssensors auf die Meßgenauigkeit
JP2007198745A (ja) * 2006-01-23 2007-08-09 Seiko Npc Corp 温度検出装置及び温度検出方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992229A (en) * 1968-02-16 1976-11-16 Hall Jr Bertie F Thermoelectric device
JPS57113332A (en) * 1980-12-30 1982-07-14 Horiba Ltd Compensating thermopile detector
US4456390A (en) * 1981-10-26 1984-06-26 Wahl Instruments, Inc. Noncontact temperature measuring device
US4722612A (en) * 1985-09-04 1988-02-02 Wahl Instruments, Inc. Infrared thermometers for minimizing errors associated with ambient temperature transients
JPH06129914A (ja) 1992-10-16 1994-05-13 Nippon Avionics Co Ltd 温度測定装置
US5645349A (en) * 1994-01-10 1997-07-08 Thermoscan Inc. Noncontact active temperature sensor
US7891767B2 (en) * 1997-07-15 2011-02-22 Silverbrook Research Pty Ltd Modular self-capping wide format print assembly
US6545334B2 (en) * 1997-12-19 2003-04-08 Imec Vzw Device and a method for thermal sensing
CN2368020Y (zh) * 1998-10-21 2000-03-08 陈朝旺 红外线温度测量装置
KR100314438B1 (ko) * 1998-10-31 2002-04-24 구자홍 써모파일센서를이용한온도측정회로
JP2001349787A (ja) * 2000-06-06 2001-12-21 Seiko Epson Corp 赤外線検出素子および測温計
JP2004191075A (ja) * 2002-12-06 2004-07-08 Matsushita Electric Ind Co Ltd 温度測定装置、温度補正方法、及び画像形成装置
US20050034749A1 (en) * 2003-08-12 2005-02-17 Chung-Nan Chen Structure of thermopile sensor
US20050081905A1 (en) * 2003-10-17 2005-04-21 Lan Alex H. Thermopile IR detector package structure
JP2006053024A (ja) * 2004-08-11 2006-02-23 Sanyo Electric Co Ltd 温度補正処理装置
US7447607B2 (en) 2004-08-31 2008-11-04 Watow Electric Manufacturing System and method of compensation for device mounting and thermal transfer error
JP4555148B2 (ja) * 2005-01-07 2010-09-29 株式会社キーエンス 放射温度計
JP4214124B2 (ja) * 2005-03-14 2009-01-28 株式会社バイオエコーネット 耳式体温計
JP4864338B2 (ja) * 2005-03-31 2012-02-01 株式会社東芝 半導体集積回路
JP4888861B2 (ja) * 2005-11-17 2012-02-29 光照 木村 電流検出型熱電対等の校正方法および電流検出型熱電対
KR100942130B1 (ko) 2007-12-28 2010-02-16 엘에스산전 주식회사 열전대 센서를 이용한 온도계측장치
JP5793679B2 (ja) 2009-12-18 2015-10-14 パナソニックIpマネジメント株式会社 赤外線センサモジュール

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666639A (ja) * 1992-08-20 1994-03-11 Toyota Central Res & Dev Lab Inc 赤外線温度計
JPH0783761A (ja) * 1993-09-20 1995-03-31 Matsushita Electric Ind Co Ltd 放射温度検出装置
JP2003501113A (ja) * 1998-09-15 2003-01-14 ガーリッツ、ジョナサン 赤外線利用の耳式体温計
JP2004037139A (ja) * 2002-07-01 2004-02-05 Omron Corp 温度計測装置および温度調節器
DE10341142A1 (de) * 2003-09-06 2005-03-31 Braun Gmbh Verfahren und Vorrichtung zur Kompensation des thermischen Einflusses eines Temperaturgradienten im Sensorgehäuse eines Strahlungssensors auf die Meßgenauigkeit
JP2007198745A (ja) * 2006-01-23 2007-08-09 Seiko Npc Corp 温度検出装置及び温度検出方法

Also Published As

Publication number Publication date
US8899828B2 (en) 2014-12-02
US20130250998A1 (en) 2013-09-26
WO2013142360A1 (en) 2013-09-26
CN104204748A (zh) 2014-12-10
CN104204748B (zh) 2017-03-08

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