JP2015513758A - 多目的動作及び高効率rf電力結合用のリボンアンテナ - Google Patents
多目的動作及び高効率rf電力結合用のリボンアンテナ Download PDFInfo
- Publication number
- JP2015513758A JP2015513758A JP2014554727A JP2014554727A JP2015513758A JP 2015513758 A JP2015513758 A JP 2015513758A JP 2014554727 A JP2014554727 A JP 2014554727A JP 2014554727 A JP2014554727 A JP 2014554727A JP 2015513758 A JP2015513758 A JP 2015513758A
- Authority
- JP
- Japan
- Prior art keywords
- antenna
- plasma
- leg
- switch
- generating apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000008878 coupling Effects 0.000 title abstract description 14
- 238000010168 coupling process Methods 0.000 title abstract description 14
- 238000005859 coupling reaction Methods 0.000 title abstract description 14
- 239000000463 material Substances 0.000 claims abstract description 21
- 229910000859 α-Fe Inorganic materials 0.000 claims abstract description 10
- 238000004382 potting Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 abstract description 11
- 238000000034 method Methods 0.000 abstract description 9
- 230000000694 effects Effects 0.000 abstract description 5
- 230000008901 benefit Effects 0.000 abstract description 2
- 230000002500 effect on skin Effects 0.000 abstract description 2
- 150000002500 ions Chemical class 0.000 description 16
- 238000000605 extraction Methods 0.000 description 13
- 239000007789 gas Substances 0.000 description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 9
- 229910052802 copper Inorganic materials 0.000 description 9
- 239000010949 copper Substances 0.000 description 9
- 238000010884 ion-beam technique Methods 0.000 description 7
- 230000001629 suppression Effects 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- 239000004020 conductor Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 230000009286 beneficial effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 230000001939 inductive effect Effects 0.000 description 4
- 238000009616 inductively coupled plasma Methods 0.000 description 4
- 238000004088 simulation Methods 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000005520 electrodynamics Effects 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 238000000752 ionisation method Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 208000028659 discharge Diseases 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 235000012771 pancakes Nutrition 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Physical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
は、アンテナが発生する磁界
の時間的変化に比例し、この磁界は、アンテナを通って流れる電流に比例する。従って、非常に低い抵抗を有するアンテナを持つことが好ましいことがある、というのは、アンテナ全体の抵抗が小さくなるからである。通常、RFアンテナは銅管から構成される。銅は、非常に良好な導電性及び熱伝導性を有する。さらに、管の使用は、水冷の可能性をもたらす。管壁を厚さ2、3mmにして、屈曲を可能にし、かつ電気抵抗を減少させる。しかし、よく見落とされることは、DCとは異なり、RF周波数範囲では、電流が導体の断面全体を通って流れず、深さ
Claims (12)
- 誘電体窓を有するチャンバと;
前記誘電体窓に接するアンテナと;
ある周波数で動作し、前記アンテナと通信する電源とを具え、
前記アンテナは、ある材料で構成され、厚さ、幅、及び前記厚さと前記幅との積として定義される断面積を有し、
前記材料、及び前記周波数が表皮深さを定め、この表皮深さにおいて、前記アンテナ内の電流の大部分が搬送され、
前記表皮深さと前記幅との積が、0.001に前記アンテナの前記断面積を乗じた値よりも大きいことを特徴とするプラズマ発生装置。 - 前記積が、0.01に前記断面積を乗じた値よりも大きいことを特徴とする請求項1に記載のプラズマ発生装置。
- 前記積が、0.05に前記断面積を乗じた値よりも大きいことを特徴とする請求項1に記載のプラズマ発生装置。
- 前記アンテナを包囲するフェライト材料をさらに具えていることを特徴とする請求項1に記載のプラズマ発生装置。
- 前記アンテナと前記フェライト材料との間に配置されたポッティング材料をさらに具えていることを特徴とする請求項4に記載のプラズマ発生装置。
- 前記アンテナが、略平行な2つの部分、及び2つの半円形端部を具えていることを特徴とする請求項1に記載のプラズマ発生装置。
- 前記半円形端部の一方が不連続部分を具え、これにより、前記アンテナの2つの脚部を構成することを特徴とする請求項6に記載のプラズマ発生装置。
- 前記脚部のうち第1の脚部が、前記電源と通信し、前記脚部のうち第2の脚部が、スイッチと通信し、前記スイッチの第1位置において、前記第1の脚部と前記第2の脚部とが電気接続され、前記スイッチの第2位置において、前記第2の脚部が前記第1の脚部とは異なる電位に電気接続されることを特徴とする請求項7に記載のプラズマ発生装置。
- プラズマを発生している間に、前記スイッチを、前記第1位置と前記第2位置との間で作動させることができることを特徴とする請求項8に記載のプラズマ発生装置。
- 前記アンテナがリボン形状のアンテナから成ることを特徴とする請求項1に記載のプラズマ発生装置。
- 誘電体窓を有するチャンバと;
第1端部及び第2端部を有するアンテナと;
ある周波数で動作し、前記アンテナの前記第1端部と通信する電源と;
前記アンテナの前記第2端部と通信する出力端子を有するスイッチとを具え、
前記スイッチが第1位置及び第2位置を有し、前記第1位置において、前記出力端子が前記電源に接続され、前記第2位置において、前記出力端子が前記電源の接地端子に接続されることを特徴とするプラズマ発生装置。 - プラズマを発生させている間に、前記スイッチを、前記第1位置と前記第2位置との間で作動させることができることを特徴とする請求項11に記載のプラズマ発生装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/362,052 | 2012-01-31 | ||
US13/362,052 US8901820B2 (en) | 2012-01-31 | 2012-01-31 | Ribbon antenna for versatile operation and efficient RF power coupling |
PCT/US2013/020645 WO2013115945A1 (en) | 2012-01-31 | 2013-01-08 | Ribbon antenna for versatile operation and efficient rf power coupling |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2015513758A true JP2015513758A (ja) | 2015-05-14 |
JP2015513758A5 JP2015513758A5 (ja) | 2016-02-25 |
JP6309899B2 JP6309899B2 (ja) | 2018-04-11 |
Family
ID=47631713
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014554727A Active JP6309899B2 (ja) | 2012-01-31 | 2013-01-08 | プラズマ発生装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8901820B2 (ja) |
JP (1) | JP6309899B2 (ja) |
KR (1) | KR102013333B1 (ja) |
CN (1) | CN104081492B (ja) |
TW (1) | TWI516176B (ja) |
WO (1) | WO2013115945A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10727089B2 (en) * | 2016-02-12 | 2020-07-28 | Lam Research Corporation | Systems and methods for selectively etching film |
US10206273B2 (en) | 2017-01-18 | 2019-02-12 | Phoenix Llc | High power ion beam generator systems and methods |
US20210020405A1 (en) * | 2019-07-18 | 2021-01-21 | Tokyo Electron Limited | Equipment and methods for plasma processing |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08203695A (ja) * | 1995-01-24 | 1996-08-09 | Aneruba Kk | プラズマ処理装置 |
JPH09245993A (ja) * | 1996-03-04 | 1997-09-19 | Anelva Corp | プラズマ処理装置及びアンテナの製造方法 |
WO1999003313A1 (en) * | 1997-07-09 | 1999-01-21 | Surface Technology Systems Limited | Plasma processing apparatus |
US20040060517A1 (en) * | 2002-09-26 | 2004-04-01 | Tokyo Electron Limited Of Tbs Broadcast Center | Process apparatus and method for improving plasma production of an inductively coupled plasma |
US20070251451A1 (en) * | 2001-09-10 | 2007-11-01 | Tegal Corporation | Nanolayer Thick Film Processing System |
WO2011022612A2 (en) * | 2009-08-21 | 2011-02-24 | Mattson Technology, Inc. | Inductive plasma source |
WO2011058608A1 (ja) * | 2009-11-13 | 2011-05-19 | 日新電機株式会社 | プラズマ処理装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6036878A (en) * | 1996-02-02 | 2000-03-14 | Applied Materials, Inc. | Low density high frequency process for a parallel-plate electrode plasma reactor having an inductive antenna |
US6534922B2 (en) * | 1996-09-27 | 2003-03-18 | Surface Technology Systems, Plc | Plasma processing apparatus |
KR100505176B1 (ko) * | 1996-09-27 | 2005-10-10 | 서페이스 테크놀로지 시스템스 피엘씨 | 플라즈마가공장치 |
JP2929275B2 (ja) * | 1996-10-16 | 1999-08-03 | 株式会社アドテック | 透磁コアを有する誘導結合型−平面状プラズマの発生装置 |
JP4441038B2 (ja) * | 2000-02-07 | 2010-03-31 | 東京エレクトロン株式会社 | マイクロ波プラズマ処理装置 |
KR20030041217A (ko) * | 2001-11-19 | 2003-05-27 | 주성엔지니어링(주) | Icp 발생 장치의 안테나 전극 |
KR101038204B1 (ko) | 2004-02-25 | 2011-05-31 | 주성엔지니어링(주) | 플라즈마 발생용 안테나 |
CN101395973B (zh) * | 2006-03-07 | 2013-03-13 | 国立大学法人琉球大学 | 等离子体发生装置以及使用它的等离子体产生方法 |
JP5108489B2 (ja) * | 2007-01-16 | 2012-12-26 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法 |
EP2299789A4 (en) * | 2008-05-22 | 2013-11-06 | Emd Corp | PLASMA GENERATING APPARATUS AND PLASMA PROCESSING APPARATUS |
US8142607B2 (en) * | 2008-08-28 | 2012-03-27 | Varian Semiconductor Equipment Associates, Inc. | High density helicon plasma source for wide ribbon ion beam generation |
US8438990B2 (en) * | 2008-09-30 | 2013-05-14 | Applied Materials, Inc. | Multi-electrode PECVD source |
JP5554099B2 (ja) * | 2010-03-18 | 2014-07-23 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
US8590485B2 (en) * | 2010-04-26 | 2013-11-26 | Varian Semiconductor Equipment Associates, Inc. | Small form factor plasma source for high density wide ribbon ion beam generation |
JP5800547B2 (ja) * | 2011-03-29 | 2015-10-28 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
-
2012
- 2012-01-31 US US13/362,052 patent/US8901820B2/en active Active
-
2013
- 2013-01-08 CN CN201380006416.8A patent/CN104081492B/zh active Active
- 2013-01-08 JP JP2014554727A patent/JP6309899B2/ja active Active
- 2013-01-08 WO PCT/US2013/020645 patent/WO2013115945A1/en active Application Filing
- 2013-01-08 KR KR1020147024205A patent/KR102013333B1/ko active IP Right Grant
- 2013-01-29 TW TW102103356A patent/TWI516176B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08203695A (ja) * | 1995-01-24 | 1996-08-09 | Aneruba Kk | プラズマ処理装置 |
JPH09245993A (ja) * | 1996-03-04 | 1997-09-19 | Anelva Corp | プラズマ処理装置及びアンテナの製造方法 |
WO1999003313A1 (en) * | 1997-07-09 | 1999-01-21 | Surface Technology Systems Limited | Plasma processing apparatus |
US20070251451A1 (en) * | 2001-09-10 | 2007-11-01 | Tegal Corporation | Nanolayer Thick Film Processing System |
US20040060517A1 (en) * | 2002-09-26 | 2004-04-01 | Tokyo Electron Limited Of Tbs Broadcast Center | Process apparatus and method for improving plasma production of an inductively coupled plasma |
WO2011022612A2 (en) * | 2009-08-21 | 2011-02-24 | Mattson Technology, Inc. | Inductive plasma source |
WO2011058608A1 (ja) * | 2009-11-13 | 2011-05-19 | 日新電機株式会社 | プラズマ処理装置 |
Also Published As
Publication number | Publication date |
---|---|
KR102013333B1 (ko) | 2019-08-22 |
CN104081492B (zh) | 2016-05-25 |
KR20140126351A (ko) | 2014-10-30 |
JP6309899B2 (ja) | 2018-04-11 |
US20130193848A1 (en) | 2013-08-01 |
WO2013115945A1 (en) | 2013-08-08 |
TW201336357A (zh) | 2013-09-01 |
TWI516176B (zh) | 2016-01-01 |
US8901820B2 (en) | 2014-12-02 |
CN104081492A (zh) | 2014-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5645178B2 (ja) | 高密度ワイドリボンイオンビーム生成のための小型プラズマソース | |
US7673583B2 (en) | Locally-efficient inductive plasma coupling for plasma processing system | |
JP5747231B2 (ja) | プラズマ生成装置およびプラズマ処理装置 | |
KR101826843B1 (ko) | B-필드 집중기를 사용하는 금속성 샤워헤드를 구비한 유도 플라즈마 소오스 | |
US20090189083A1 (en) | Ion-beam source | |
US9984857B2 (en) | Plasma generation device | |
KR102031578B1 (ko) | 자기 한정 및 패러데이 차폐를 갖는 유도 결합형 rf 플라즈마 소스 | |
EP2103197A2 (en) | Plasma reactor with inductive excitation of plasma and efficient removal of heat from the excitation coil | |
TW201113923A (en) | Conjugated ICP and ECR plasma sources for wide ribbon ion beam generation and control | |
KR101720373B1 (ko) | 플라즈마 처리 장치, 플라즈마 생성 장치, 안테나 구조체, 및 플라즈마 생성 방법 | |
JP6309899B2 (ja) | プラズマ発生装置 | |
KR20090037343A (ko) | 자화된 유도결합형 플라즈마 처리장치 및 플라즈마 발생방법 | |
US7667208B2 (en) | Technique for confining secondary electrons in plasma-based ion implantation | |
JP2013020871A (ja) | プラズマ処理装置 | |
JP2015513758A5 (ja) | プラズマ発生装置 | |
KR20110006070U (ko) | 자화된 유도결합형 플라즈마 처리장치 | |
WO2009048294A2 (en) | Magnetized inductively coupled plasma processing apparatus and generating method | |
KR100731994B1 (ko) | 매설된 외부 페라이트 코어를 구비하는 플라즈마 처리 챔버 | |
KR101446554B1 (ko) | 다중 방전관 어셈블리를 갖는 플라즈마 챔버 | |
KR102584240B1 (ko) | 집속 유도 결합 플라즈마용 페라이트 쉴드를 포함하는 플라즈마 발생장치 | |
KR101446185B1 (ko) | 고효율 유도 결합 플라즈마 반응기 | |
JP2023506867A (ja) | プラズマの生成に使用するための方法および装置 | |
JP2023506866A (ja) | プラズマの生成に使用するための方法および装置 | |
TW202145291A (zh) | 電漿處理裝置及其導磁組件與方法 | |
KR20000005015A (ko) | 유도 결합식 플라즈마 소스를 포함하는 플라즈마 발생 방법 및장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160105 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20160105 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20161026 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20161108 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170202 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20170801 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20171016 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20180213 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20180315 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6309899 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |