JP2015507737A - 多重チャンネル用低雑音増幅器 - Google Patents
多重チャンネル用低雑音増幅器 Download PDFInfo
- Publication number
- JP2015507737A JP2015507737A JP2014546198A JP2014546198A JP2015507737A JP 2015507737 A JP2015507737 A JP 2015507737A JP 2014546198 A JP2014546198 A JP 2014546198A JP 2014546198 A JP2014546198 A JP 2014546198A JP 2015507737 A JP2015507737 A JP 2015507737A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- channel
- amplifier
- noise
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims description 21
- 238000005070 sampling Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 2
- 238000001914 filtration Methods 0.000 claims 5
- 230000000116 mitigating effect Effects 0.000 claims 2
- 230000001133 acceleration Effects 0.000 description 27
- 239000003990 capacitor Substances 0.000 description 21
- 230000008569 process Effects 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/26—Modifications of amplifiers to reduce influence of noise generated by amplifying elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/68—Combinations of amplifiers, e.g. multi-channel amplifiers for stereophonics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
- G01P2015/082—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for two degrees of freedom of movement of a single mass
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/129—Indexing scheme relating to amplifiers there being a feedback over the complete amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/171—A filter circuit coupled to the output of an amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/333—A frequency modulator or demodulator being used in the amplifier circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45512—Indexing scheme relating to differential amplifiers the FBC comprising one or more capacitors, not being switched capacitors, and being coupled between the LC and the IC
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45544—Indexing scheme relating to differential amplifiers the IC comprising one or more capacitors, e.g. coupling capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
- Gyroscopes (AREA)
Abstract
Description
本出願は、参照によりその開示の全体が本明細書に援用されるHoward R.Samuelsを発明者とする、「LOW NOISE AMPLIFIER FOR MULTIPLE CHANNELS(多重チャンネル用低雑音増幅器)」と題する、2011年12月16日出願の米国特許仮出願番号第61/576,521号の優先権を主張する。
本出願は、参照によりその開示の全体が本明細書に援用されるSrinivasan Venkatramanを発明者とする、「SYSTEM AND METHOD OF REDUCING NOISE IN A MEMS DEVICE(MEMSデバイスにおける雑音を低減するシステムおよび方法)」と題する、2011年12月16日出願の米国特許出願番号第13/328,177号に関連する。
Claims (21)
- 複数の異なるチャンネルからの複数の入力信号を増幅させるための増幅器と、
前記増幅器からの前記複数のチャンネルの増幅された入力信号を受信するための前記増幅器に動作可能に結合された複数の復調器であって、各復調器は前記複数の異なるチャンネルの単一チャンネルからの単一の増幅された入力チャンネル信号を復調するよう構成され、それぞれが前記単一チャンネル以外の前記チャンネルの少なくとも1つに関連する雑音を生成する複数の復調器と、
前記復調器に結合された複数のフィルターであって、前記雑音を緩和する複数のフィルターとを備える増幅器システム。 - 前記雑音は、クロック周波数雑音を有する請求項1に記載の増幅器システム。
- 前記雑音は、高周波雑音を有し、前記フィルターは、前記高周波雑音を緩和するカットオフを備えるローパスフィルターを備える請求項1に記載の増幅器システム。
- 前記入力信号は、直角位相であるクロックを有する請求項1に記載の増幅器システム。
- 前記入力信号は、実質的に同一の周波数を有するクロックを有する請求項4に記載の増幅器システム。
- 前記入力信号は、コインシデントエッジおよび2の倍数または0.5の倍数に関する周波数を有するクロックを有する請求項1に記載の増幅器システム。
- 各復調器は、他の復調器によって復調された信号以外のチャンネルの信号を復調する請求項1に記載の増幅器システム。
- 前記複数の信号は、MEMSデバイスから生成された慣性信号を含む請求項1に記載の増幅器システム。
- 第1のチャンネルにおいて第1の信号、および第2のチャンネルにおいて第2の信号を生成するMEMSデバイスと、
前記第1および前記第2の信号を受信し、異なるチャンネルに第1および第2の出力信号を生成する増幅器とを備えるシステム。 - 前記第1のチャンネルは、第1の軸に関連し、前記第2のチャンネルは第2の軸に関連する請求項9に記載のシステム。
- 前記第1および前記第2の信号は直角位相のクロックを有する請求項9に記載のシステム。
- 前記第1および前記第2の信号の前記クロックは異なる周波数を有する請求項11に記載のシステム。
- 前記第1および前記第2の信号の前記クロックは同一の周波数を有する請求項11に記載のシステム。
- 前記増幅器は、複数の異なるチャンネルを有し、さらに前記システムは前記増幅器の異なるチャンネルをそれぞれフィルタリングする複数のフィルターを備える請求項9に記載のシステム。
- 複数の異なるチャンネルを有する入力信号を増幅し、前記複数の異なるチャンネルを有する増幅された入力信号を生成するステップと、
前記増幅された入力信号を復調し、少なくとも1つの復調された信号を各チャンネルに生成し、それぞれの復調された信号が少なくとも1つの他のチャンネルと関連する雑音を有するように復調するステップと、
それぞれの復調された信号をフィルタリングし、前記雑音を緩和してベースバンド信号を前記複数のチャンネルのそれぞれに生成するステップと、
を備える増幅器をコントロールするステップと、
少なくとも1つの出力ノードからの各ベースバンド信号をフォワードするステップとを備える信号を処理する方法 - 前記入力信号において各チャンネルは関連するクロックを有し、各チャンネルの前記クロックの全ては、コインシデントエッジおよび2の倍数または0.5の倍数に関連する周波数を有する請求項15に記載の方法。
- 前記雑音は、高周波雑音を有し、フィルタリングするステップは、カットオフを用い前記高周波雑音を緩和するローパスフィルタリングステップを有する請求項15に記載の方法。
- 前記入力信号において各チャンネルは、関連するクロックを有し、前記入力クロックは直角位相である請求項15に記載の方法。
- さらに、MEMSデバイスから前記入力信号を受信するステップを有し、前記複数の異なるチャンネルはデカルト座標系において少なくとも2つの直交する軸に関連する請求項15に記載の方法。
- 前記増幅器は、前記入力信号を増幅させるための増幅器と、前記増幅された入力信号を復調するための複数の復調器と、前記復調された信号をフィルタリングするための複数のフィルターとを備え、各チャンネルは少なくとも1つの復調器および少なくとも1つのフィルターをその独占的な使用のために有する請求項15に記載の方法。
- 増幅するステップと、復調するステップと、フィルタリングするステップは、サンプリングすることなく継続的に実行される請求項15に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161576521P | 2011-12-16 | 2011-12-16 | |
US61/576,521 | 2011-12-16 | ||
PCT/US2012/070057 WO2013090890A1 (en) | 2011-12-16 | 2012-12-17 | Low noise amplifier for multiple channels |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015507737A true JP2015507737A (ja) | 2015-03-12 |
JP5827419B2 JP5827419B2 (ja) | 2015-12-02 |
Family
ID=47501488
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014546198A Active JP5827419B2 (ja) | 2011-12-16 | 2012-12-17 | 多重チャンネル用低雑音増幅器 |
Country Status (5)
Country | Link |
---|---|
US (2) | US9041463B2 (ja) |
EP (1) | EP2792069B1 (ja) |
JP (1) | JP5827419B2 (ja) |
CN (2) | CN103999364B (ja) |
WO (1) | WO2013090890A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI616656B (zh) * | 2014-12-01 | 2018-03-01 | 村田製作所股份有限公司 | 微機電系統感測器和半導體封裝 |
DE102021201148A1 (de) | 2021-02-08 | 2022-08-11 | Robert Bosch Gesellschaft mit beschränkter Haftung | Mikromechanischer kapazitiver Sensor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1703287A1 (en) * | 2005-03-16 | 2006-09-20 | Delphi Technologies, Inc. | Multiple-axis linear accelerometer |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5224380A (en) | 1990-05-21 | 1993-07-06 | The University Of Maryland | Superconducting six-axis accelerometer |
US5894090A (en) | 1996-05-31 | 1999-04-13 | California Institute Of Technology | Silicon bulk micromachined, symmetric, degenerate vibratorygyroscope, accelerometer and sensor and method for using the same |
US6229856B1 (en) * | 1997-04-14 | 2001-05-08 | Masimo Corporation | Method and apparatus for demodulating signals in a pulse oximetry system |
US5939633A (en) | 1997-06-18 | 1999-08-17 | Analog Devices, Inc. | Apparatus and method for multi-axis capacitive sensing |
US6334060B1 (en) | 1997-10-28 | 2001-12-25 | Acumen, Inc. | Multi-channel or split-frequency, low frequency, telemetry circuit and method between transmitters and receivers |
US6386032B1 (en) | 1999-08-26 | 2002-05-14 | Analog Devices Imi, Inc. | Micro-machined accelerometer with improved transfer characteristics |
US6530275B1 (en) * | 1999-08-31 | 2003-03-11 | Analog Devices, Inc. | Feedback circuit for micromachined accelerometer |
US7252001B2 (en) | 2002-09-02 | 2007-08-07 | Ecole Polytechnique Federale De Lausanne (Epfl) | Three axis active magnetic levitation for inertial sensing systems |
US6848304B2 (en) * | 2003-04-28 | 2005-02-01 | Analog Devices, Inc. | Six degree-of-freedom micro-machined multi-sensor |
US7336357B2 (en) | 2004-08-13 | 2008-02-26 | University Of Pittsburgh | Multi-channel dual phase lock-in optical spectrometer |
US7318349B2 (en) * | 2005-06-04 | 2008-01-15 | Vladimir Vaganov | Three-axis integrated MEMS accelerometer |
CA2595755C (en) * | 2005-11-22 | 2012-02-07 | Kionix, Inc. | A tri-axis accelerometer |
EP1793497B1 (en) * | 2005-12-02 | 2011-04-27 | STMicroelectronics Srl | Device and method for reading a capacitive sensor, in particular of a micro-electromechanical type |
US7549334B2 (en) * | 2006-04-24 | 2009-06-23 | Milli Sensor Systems + Actuators | Small angle bias measurement mechanism for MEMS instruments |
WO2008112635A1 (en) | 2007-03-09 | 2008-09-18 | Dxtech, Llc | Multi-channel lock-in amplifier system and method |
JP4577434B2 (ja) | 2008-09-03 | 2010-11-10 | 株式会社デンソー | 周波数分割多重伝送方法及び物理量検出装置 |
ITTO20090489A1 (it) * | 2008-11-26 | 2010-12-27 | St Microelectronics Srl | Circuito di lettura per un giroscopio mems multi-asse avente direzioni di rilevamento inclinate rispetto agli assi di riferimento, e corrispondente giroscopio mems multi-asse |
CN102265644A (zh) * | 2008-12-24 | 2011-11-30 | 松下电器产业株式会社 | 平衡信号输出型传感器 |
US8205497B1 (en) | 2009-03-05 | 2012-06-26 | Sandia Corporation | Microelectromechanical inertial sensor |
IT1394898B1 (it) * | 2009-06-03 | 2012-07-20 | St Microelectronics Rousset | Giroscopio microelettromeccanico con attuazione a controllo di posizione e metodo per il controllo di un giroscopio microelettromeccanico |
JP2011047732A (ja) * | 2009-08-26 | 2011-03-10 | Seiko Epson Corp | Memsセンサー、memsセンサーの製造方法および電子機器 |
CN101738495B (zh) * | 2009-12-18 | 2011-06-08 | 浙江大学 | 基于cordic算法的电容式微加速度计信号检测装置 |
US8539834B2 (en) * | 2010-02-15 | 2013-09-24 | Stmicroelectronics S.R.L. | Microelectromechanical gyroscope with calibrated synchronization of actuation and method for actuating a microelectromechanical gyroscope |
CN102062662B (zh) * | 2010-11-05 | 2012-10-10 | 北京大学 | 一种单片集成SiC MEMS压力传感器及其制备方法 |
-
2012
- 2012-12-17 CN CN201280062016.4A patent/CN103999364B/zh active Active
- 2012-12-17 EP EP12809960.3A patent/EP2792069B1/en active Active
- 2012-12-17 WO PCT/US2012/070057 patent/WO2013090890A1/en active Application Filing
- 2012-12-17 JP JP2014546198A patent/JP5827419B2/ja active Active
- 2012-12-17 US US13/716,258 patent/US9041463B2/en active Active
- 2012-12-17 CN CN201711336268.2A patent/CN108075738B/zh active Active
-
2015
- 2015-05-21 US US14/718,328 patent/US9531330B2/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1703287A1 (en) * | 2005-03-16 | 2006-09-20 | Delphi Technologies, Inc. | Multiple-axis linear accelerometer |
Also Published As
Publication number | Publication date |
---|---|
US20150256133A1 (en) | 2015-09-10 |
CN103999364B (zh) | 2018-01-19 |
EP2792069A1 (en) | 2014-10-22 |
WO2013090890A1 (en) | 2013-06-20 |
JP5827419B2 (ja) | 2015-12-02 |
CN103999364A (zh) | 2014-08-20 |
CN108075738B (zh) | 2021-10-01 |
US9041463B2 (en) | 2015-05-26 |
US9531330B2 (en) | 2016-12-27 |
EP2792069B1 (en) | 2016-11-02 |
CN108075738A (zh) | 2018-05-25 |
US20130154742A1 (en) | 2013-06-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5117716B2 (ja) | 力学量センサ | |
US7444870B2 (en) | Angular velocity sensor having one amplifying circuit for amplifying plural detection signals | |
US20130152686A1 (en) | System and Method of Reducing Noise in a MEMS Device | |
US8863575B2 (en) | Microelectromechanical three-axis capacitive accelerometer | |
US7281406B2 (en) | Sensor system | |
US7293460B2 (en) | Multiple-axis linear accelerometer | |
US10459003B2 (en) | Signal detection method for capacitance detection type sensor, MEMS sensor, and system | |
KR100444235B1 (ko) | 자기 및 가속도 동시 검출 방법 및 장치 | |
JP6089035B2 (ja) | 慣性センサの電磁干渉に対するロバスト性を得るためのスキーム | |
EP1591793A1 (en) | Dual-axis accelerometer | |
JP5827419B2 (ja) | 多重チャンネル用低雑音増幅器 | |
JP5872687B2 (ja) | アナログデータ処理ユニットを備えるアセンブリ及び当該アセンブリを使用する方法 | |
EP1591794A1 (en) | Circuit and method of processing multiple-axis sensor output signals | |
KR20180067543A (ko) | 스케일링된 소음 및 진동 감지 | |
JP3780673B2 (ja) | 角速度センサ | |
JP6259317B2 (ja) | 高度の電磁干渉除去を伴う擬似差動加速度計 | |
CN117805437B (zh) | 一种交直混合降低读出电路1/f噪声的静电加速度计 | |
CN117825748B (zh) | 基于环内双调制降低读出电路1/f噪声的静电加速度计 | |
JP4393782B2 (ja) | 静電浮上型ジャイロ装置 | |
Forke et al. | Low Power High Bandwidth Acceleration Sensors | |
JP2004012471A (ja) | 外力検知センサ装置 | |
JPH0954112A (ja) | 加速度センサ装置 | |
JPH04132966A (ja) | 加速度検出装置 | |
JPH06130084A (ja) | 容量式半導体加速度センサ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20150601 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20150804 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150824 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20150918 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20151015 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5827419 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |