JP2015111673A5 - - Google Patents
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- JP2015111673A5 JP2015111673A5 JP2014236390A JP2014236390A JP2015111673A5 JP 2015111673 A5 JP2015111673 A5 JP 2015111673A5 JP 2014236390 A JP2014236390 A JP 2014236390A JP 2014236390 A JP2014236390 A JP 2014236390A JP 2015111673 A5 JP2015111673 A5 JP 2015111673A5
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- 230000003287 optical Effects 0.000 description 1
Description
矩形物体区域110が正方形光入射ファセット75上に結像されることになる場合に、対物系58はアナモフィックのものでなければならない。より具体的には、倍率Mの絶対値は、走査方向Yに沿ってよりも交差走査方向Xに沿って小さく、すなわち、|MX|<|MY|である必要がある。これを図23に例示しており、この図では、単一矩形物体区域110と光学ラスター要素74の光入射ファセット75との間に対物系58の2つの円柱レンズ124、126が配置されている。交差走査方向Xに沿った物体区域110の長さがLXであり、走査方向Yに沿った長さがLYである場合に、|M X /M Y |は、LY/LXに等しくなければならない。 If the rectangular object area 110 is to be imaged on the square light entrance facet 75, the objective 58 must be anamorphic. More specifically, the absolute value of the magnification M needs to be smaller along the cross scanning direction X than along the scanning direction Y, that is, | M X | <| M Y |. This is illustrated in FIG. 23 where two cylindrical lenses 124, 126 of the objective 58 are arranged between a single rectangular object area 110 and the light entrance facet 75 of the optical raster element 74. . When the length of the object area 110 along the cross scanning direction X is L X and the length along the scanning direction Y is L Y , | M X / M Y | becomes L Y / L X Must be equal.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP13194135.3 | 2013-11-22 | ||
EP13194135 | 2013-11-22 | ||
EP14155685.2A EP2876498B1 (en) | 2013-11-22 | 2014-02-19 | Illumination system of a microlithographic projection exposure apparatus |
EP14155685.2 | 2014-02-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015111673A JP2015111673A (en) | 2015-06-18 |
JP2015111673A5 true JP2015111673A5 (en) | 2016-05-19 |
Family
ID=49626852
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
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JP2016533545A Active JP6343344B2 (en) | 2013-11-22 | 2014-11-13 | Illumination system of microlithographic projection exposure apparatus |
JP2014236389A Active JP6034845B2 (en) | 2013-11-22 | 2014-11-21 | Illumination system of microlithographic projection exposure apparatus |
JP2014236390A Pending JP2015111673A (en) | 2013-11-22 | 2014-11-21 | Illumination system of micro lithography projection exposure device |
JP2016210859A Active JP6434473B2 (en) | 2013-11-22 | 2016-10-27 | Illumination system of microlithographic projection exposure apparatus |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
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JP2016533545A Active JP6343344B2 (en) | 2013-11-22 | 2014-11-13 | Illumination system of microlithographic projection exposure apparatus |
JP2014236389A Active JP6034845B2 (en) | 2013-11-22 | 2014-11-21 | Illumination system of microlithographic projection exposure apparatus |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
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JP2016210859A Active JP6434473B2 (en) | 2013-11-22 | 2016-10-27 | Illumination system of microlithographic projection exposure apparatus |
Country Status (7)
Country | Link |
---|---|
US (3) | US9500954B2 (en) |
EP (2) | EP2876498B1 (en) |
JP (4) | JP6343344B2 (en) |
KR (3) | KR101922314B1 (en) |
CN (3) | CN105745580B (en) |
TW (1) | TWI638238B (en) |
WO (1) | WO2015074746A1 (en) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014203041A1 (en) | 2014-02-19 | 2015-08-20 | Carl Zeiss Smt Gmbh | Illumination system of a microlithographic projection exposure apparatus and method for operating such |
DE102014203040A1 (en) | 2014-02-19 | 2015-08-20 | Carl Zeiss Smt Gmbh | Illumination system of a microlithographic projection exposure apparatus and method for operating such |
KR20180010242A (en) * | 2015-05-21 | 2018-01-30 | 칼 짜이스 에스엠티 게엠베하 | Method of operating a microlithographic projection apparatus |
CN105068381A (en) * | 2015-07-27 | 2015-11-18 | 江苏影速光电技术有限公司 | Diaphragm carrying structure of exposure machine and diaphragm replacing method of exposure machine |
TWI575300B (en) | 2015-08-31 | 2017-03-21 | 中強光電股份有限公司 | Projection apparatus and illumination system |
JP6643466B2 (en) * | 2015-09-23 | 2020-02-12 | カール・ツァイス・エスエムティー・ゲーエムベーハー | Method of operating a microlithographic projection apparatus and an illumination system for such an apparatus |
DE102015221991A1 (en) * | 2015-11-09 | 2017-05-11 | Carl Zeiss Microscopy Gmbh | Microscopy method for determining a contrast image and microscope |
DE102015224522B4 (en) | 2015-12-08 | 2018-06-21 | Carl Zeiss Smt Gmbh | Illumination system of a microlithographic projection system and method for operating such a system |
DE102015224521B4 (en) | 2015-12-08 | 2018-06-21 | Carl Zeiss Smt Gmbh | Microlithographic projection system and method for operating such a system |
WO2017108448A1 (en) * | 2015-12-22 | 2017-06-29 | Carl Zeiss Smt Gmbh | Illumination system of a microlithographic apparatus |
CN106933049B (en) * | 2015-12-30 | 2020-06-16 | 上海微电子装备(集团)股份有限公司 | Exposure system and exposure method for semiconductor photoetching |
US10061201B2 (en) | 2016-10-24 | 2018-08-28 | Hrl Laboratories, Llc | Bottom up apparatus design for formation of self-propagating photopolymer waveguides |
CA3046827A1 (en) | 2016-12-12 | 2018-06-21 | xCella Biosciences, Inc. | Methods and systems for screening using microcapillary arrays |
US11460777B2 (en) * | 2016-12-20 | 2022-10-04 | Ev Group E. Thallner Gmbh | Method and device for exposure of photosensitive layer |
US10852528B2 (en) | 2016-12-20 | 2020-12-01 | Ev Group E. Thallner Gmbh | Method and device for exposure of photosensitive layer |
AU2017388058B2 (en) * | 2016-12-30 | 2023-02-02 | xCella Biosciences, Inc. | Multi-stage sample recovery system |
CN109654393B (en) * | 2017-01-11 | 2020-06-19 | 哈尔滨理工大学 | Nostril illuminating device with second shielding plate |
US11099007B2 (en) * | 2017-02-16 | 2021-08-24 | Nikon Corporation | Test of operational status of a digital scanner during lithographic exposure process |
CN107421439B (en) * | 2017-04-21 | 2019-05-14 | 上海交通大学 | A kind of no imageable target conspicuousness detection and coordinate tracking system and method |
US10539770B2 (en) * | 2017-06-19 | 2020-01-21 | Suss Microtec Photonic Systems Inc. | Magnification compensation and/or beam steering in optical systems |
US11175487B2 (en) | 2017-06-19 | 2021-11-16 | Suss Microtec Photonic Systems Inc. | Optical distortion reduction in projection systems |
WO2019064502A1 (en) * | 2017-09-29 | 2019-04-04 | 株式会社ニコン | Electron beam device and device manufacturing method |
WO2019064503A1 (en) * | 2017-09-29 | 2019-04-04 | 株式会社ニコン | Electron beam device, illumination optical system, and method for manufacturing device |
JP7020859B2 (en) | 2017-10-24 | 2022-02-16 | キヤノン株式会社 | Manufacturing method of illumination optical system, exposure equipment and articles |
WO2019180960A1 (en) * | 2018-03-23 | 2019-09-26 | Primetals Technologies Japan株式会社 | Laser machining head and laser machining apparatus, and laser machining head adjustment method |
US11681228B2 (en) * | 2018-06-19 | 2023-06-20 | Ev Group E. Thallner Gmbh | Method and apparatus for illuminating image points |
US10503076B1 (en) * | 2018-08-29 | 2019-12-10 | Applied Materials, Inc. | Reserving spatial light modulator sections to address field non-uniformities |
CN109116554B (en) * | 2018-10-11 | 2020-12-04 | 北京环境特性研究所 | Design method of optical integrator |
EP3640735A1 (en) * | 2018-10-18 | 2020-04-22 | ASML Netherlands B.V. | Methods and apparatus for inspection of a structure and associated apparatuses |
KR102651647B1 (en) * | 2019-03-12 | 2024-03-26 | 루머스 리미티드 | image projector |
CN111856745B (en) * | 2019-04-30 | 2023-03-17 | 上海微电子装备(集团)股份有限公司 | Light irradiation device |
EP3736550A1 (en) * | 2019-05-10 | 2020-11-11 | X-Rite Switzerland GmbH | Illumination device for a spectrophotometer having integrated mixing optics, and method for illuminating a sample |
US11366307B2 (en) * | 2020-08-27 | 2022-06-21 | Kla Corporation | Programmable and reconfigurable mask with MEMS micro-mirror array for defect detection |
CN113189848B (en) * | 2021-04-21 | 2024-02-13 | 之江实验室 | Multichannel parallel super-resolution direct-writing type photoetching system based on optical fiber array |
CN115390362A (en) * | 2021-05-25 | 2022-11-25 | 赫智科技(苏州)有限公司 | 4K photoetching method |
CN115128809B (en) * | 2022-05-17 | 2023-11-28 | 南京工业职业技术大学 | Grating efficiency distribution characterization and optimization method for realizing uniform imaging of holographic waveguide display system |
Family Cites Families (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5517279A (en) | 1993-08-30 | 1996-05-14 | Hugle; William B. | Lens array photolithography |
JP2674579B2 (en) * | 1995-08-29 | 1997-11-12 | 株式会社ニコン | Scanning exposure apparatus and scanning exposure method |
JP2674578B2 (en) * | 1995-08-29 | 1997-11-12 | 株式会社ニコン | Scanning exposure apparatus and exposure method |
US6404499B1 (en) | 1998-04-21 | 2002-06-11 | Asml Netherlands B.V. | Lithography apparatus with filters for optimizing uniformity of an image |
EP1107064A3 (en) | 1999-12-06 | 2004-12-29 | Olympus Optical Co., Ltd. | Exposure apparatus |
GB9930529D0 (en) * | 1999-12-23 | 2000-02-16 | Screen Tech Ltd | Optical arrangement for flat-panel displays |
JP4838430B2 (en) * | 2001-01-26 | 2011-12-14 | キヤノン株式会社 | Exposure apparatus and device manufacturing method |
GB0107076D0 (en) * | 2001-03-21 | 2001-05-09 | Screen Technology Ltd | Liquid-crystal display using emissive elements |
EP1262836B1 (en) | 2001-06-01 | 2018-09-12 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR100480620B1 (en) | 2002-09-19 | 2005-03-31 | 삼성전자주식회사 | Exposing equipment including a Micro Mirror Array and exposing method using the exposing equipment |
DE10343333A1 (en) * | 2003-09-12 | 2005-04-14 | Carl Zeiss Smt Ag | Illumination system for microlithography projection exposure system, has mirror arrangement with array of individual mirrors that is controlled individually by changing angular distribution of light incident on mirror arrangement |
WO2005026843A2 (en) | 2003-09-12 | 2005-03-24 | Carl Zeiss Smt Ag | Illumination system for a microlithography projection exposure installation |
WO2005040927A2 (en) | 2003-10-18 | 2005-05-06 | Carl Zeiss Smt Ag | Device and method for illumination dose adjustments in microlithography |
US20060087634A1 (en) | 2004-10-25 | 2006-04-27 | Brown Jay M | Dynamic illumination uniformity and shape control for lithography |
US7706072B2 (en) * | 2004-12-27 | 2010-04-27 | Nikon Corporation | Optical integrator, illumination optical device, photolithograph, photolithography, and method for fabricating device |
TWI456267B (en) * | 2006-02-17 | 2014-10-11 | Zeiss Carl Smt Gmbh | Illumination system for a microlithographic projection exposure apparatus |
JP2007279113A (en) * | 2006-04-03 | 2007-10-25 | Nikon Corp | Scanning exposure apparatus and method for manufacturing device |
US7932993B2 (en) | 2006-09-16 | 2011-04-26 | Wenhui Mei | Divided sub-image array scanning and exposing system |
WO2008076114A1 (en) | 2006-12-19 | 2008-06-26 | Thomson Licensing | High resolution dmd projection system |
JP2010537414A (en) | 2007-08-30 | 2010-12-02 | カール・ツァイス・エスエムティー・アーゲー | Illumination system for illuminating a mask in a microlithographic projection exposure apparatus |
US8451427B2 (en) * | 2007-09-14 | 2013-05-28 | Nikon Corporation | Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method |
US20090091730A1 (en) * | 2007-10-03 | 2009-04-09 | Nikon Corporation | Spatial light modulation unit, illumination apparatus, exposure apparatus, and device manufacturing method |
CN101681123B (en) * | 2007-10-16 | 2013-06-12 | 株式会社尼康 | Illumination optical system, exposure apparatus, and device manufacturing method |
SG185313A1 (en) * | 2007-10-16 | 2012-11-29 | Nikon Corp | Illumination optical system, exposure apparatus, and device manufacturing method |
US8379187B2 (en) * | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
WO2009060745A1 (en) * | 2007-11-06 | 2009-05-14 | Nikon Corporation | Control device, exposure method, and exposure device |
KR20180072841A (en) | 2007-11-06 | 2018-06-29 | 가부시키가이샤 니콘 | Illumination optical system, exposure device and exposure method |
US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
JP5326259B2 (en) * | 2007-11-08 | 2013-10-30 | 株式会社ニコン | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
NL1036108A1 (en) * | 2007-11-09 | 2009-05-12 | Asml Netherlands Bv | Device Manufacturing Method and Lithographic Device, and Computer Program Product. |
CN101946190B (en) * | 2008-02-15 | 2013-06-19 | 卡尔蔡司Smt有限责任公司 | Facet mirror for use in a projection exposure apparatus for microlithography |
DE102008001511A1 (en) | 2008-04-30 | 2009-11-05 | Carl Zeiss Smt Ag | Illumination optics for EUV microlithography and illumination system and projection exposure apparatus with such illumination optics |
WO2009142440A2 (en) * | 2008-05-20 | 2009-11-26 | Jung Jin Ho | Optical component for maskless exposure apparatus |
DE102008002749A1 (en) | 2008-06-27 | 2009-12-31 | Carl Zeiss Smt Ag | Illumination optics for microlithography |
EP2146248B1 (en) | 2008-07-16 | 2012-08-29 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
JPWO2010024106A1 (en) * | 2008-08-28 | 2012-01-26 | 株式会社ニコン | Illumination optical system, exposure apparatus, and device manufacturing method |
JP5403244B2 (en) * | 2009-07-16 | 2014-01-29 | 株式会社ニコン | Spatial light modulation unit, illumination optical system, exposure apparatus, and device manufacturing method |
WO2011012148A1 (en) * | 2009-07-31 | 2011-02-03 | Carl Zeiss Smt Gmbh | Optical beam deflecting element and method of adjustment |
JP2011108851A (en) * | 2009-11-17 | 2011-06-02 | Canon Inc | Exposure apparatus and device fabrication method |
JP5809637B2 (en) | 2009-11-18 | 2015-11-11 | エーエスエムエル ネザーランズ ビー.ブイ. | Lithographic apparatus and device manufacturing method |
DE102009054540B4 (en) | 2009-12-11 | 2011-11-10 | Carl Zeiss Smt Gmbh | Illumination optics for EUV microlithography |
JP2012004561A (en) | 2010-06-16 | 2012-01-05 | Nikon Corp | Illumination method, illumination optical apparatus, and exposure equipment |
EP2649493A1 (en) * | 2010-08-30 | 2013-10-16 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
JP2012069656A (en) | 2010-09-22 | 2012-04-05 | Nikon Corp | Spatial light modulator, luminaire and exposure device, and manufacturing method of device |
JP2012099686A (en) | 2010-11-04 | 2012-05-24 | Nikon Corp | Light source forming method, exposure method, and device manufacturing method |
WO2012100791A1 (en) | 2011-01-29 | 2012-08-02 | Carl Zeiss Smt Gmbh | Illumination system of a microlithographic projection exposure apparatus |
US8823921B2 (en) | 2011-08-19 | 2014-09-02 | Ultratech, Inc. | Programmable illuminator for a photolithography system |
US8390917B1 (en) | 2011-08-24 | 2013-03-05 | Palo Alto Research Center Incorporated | Multiple line single-pass imaging using spatial light modulator and anamorphic projection optics |
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2014
- 2014-02-19 EP EP14155685.2A patent/EP2876498B1/en active Active
- 2014-02-19 EP EP14155686.0A patent/EP2876499B1/en active Active
- 2014-11-13 WO PCT/EP2014/003049 patent/WO2015074746A1/en active Application Filing
- 2014-11-13 JP JP2016533545A patent/JP6343344B2/en active Active
- 2014-11-13 CN CN201480063069.7A patent/CN105745580B/en active Active
- 2014-11-13 KR KR1020167016113A patent/KR101922314B1/en active IP Right Grant
- 2014-11-17 US US14/543,079 patent/US9500954B2/en active Active
- 2014-11-17 US US14/543,110 patent/US9310690B2/en active Active
- 2014-11-19 TW TW103140015A patent/TWI638238B/en active
- 2014-11-20 KR KR1020140162782A patent/KR101736549B1/en active IP Right Grant
- 2014-11-21 KR KR1020140163298A patent/KR101751581B1/en active IP Right Grant
- 2014-11-21 JP JP2014236389A patent/JP6034845B2/en active Active
- 2014-11-21 JP JP2014236390A patent/JP2015111673A/en active Pending
- 2014-11-24 CN CN201410858448.7A patent/CN104656379B/en active Active
- 2014-11-24 CN CN201410858447.2A patent/CN104656378B/en active Active
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2016
- 2016-03-31 US US15/086,475 patent/US9910359B2/en active Active
- 2016-10-27 JP JP2016210859A patent/JP6434473B2/en active Active
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