JP2015038479A - 質量バランス構造およびそれを用いるミクロトーム - Google Patents

質量バランス構造およびそれを用いるミクロトーム Download PDF

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Publication number
JP2015038479A
JP2015038479A JP2014166371A JP2014166371A JP2015038479A JP 2015038479 A JP2015038479 A JP 2015038479A JP 2014166371 A JP2014166371 A JP 2014166371A JP 2014166371 A JP2014166371 A JP 2014166371A JP 2015038479 A JP2015038479 A JP 2015038479A
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JP
Japan
Prior art keywords
lever arm
tension member
outer peripheral
mass balance
elastic member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2014166371A
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English (en)
Japanese (ja)
Other versions
JP2015038479A5 (enExample
Inventor
ファン ズェグアン
Zheguang Fan
ファン ズェグアン
ゾウ シャオ
Xiao Zhou
ゾウ シャオ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems Ltd Shanghai
Original Assignee
Leica Microsystems Ltd Shanghai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Microsystems Ltd Shanghai filed Critical Leica Microsystems Ltd Shanghai
Publication of JP2015038479A publication Critical patent/JP2015038479A/ja
Publication of JP2015038479A5 publication Critical patent/JP2015038479A5/ja
Pending legal-status Critical Current

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    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
    • F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
    • F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
    • F16F15/04—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means
    • F16F15/043—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means acting on a cam follower
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
    • F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
    • F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
    • F16F15/04—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means
    • F16F15/06—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means with metal springs
    • F16F15/067—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means with metal springs using only wound springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06—Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06—Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • G01N2001/065—Drive details
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/647—With means to convey work relative to tool station
    • Y10T83/6492—Plural passes of diminishing work piece through tool station
    • Y10T83/6499—Work rectilinearly reciprocated through tool station
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/869—Means to drive or to guide tool
    • Y10T83/8821—With simple rectilinear reciprocating motion only
    • Y10T83/8824—With provision for dynamic balance

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Details Of Cutting Devices (AREA)
  • Food-Manufacturing Devices (AREA)
JP2014166371A 2013-08-19 2014-08-19 質量バランス構造およびそれを用いるミクロトーム Pending JP2015038479A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201310364613.9 2013-08-19
CN201310364613.9A CN104422598B (zh) 2013-08-19 2013-08-19 质量平衡装置和采用该装置的切片机

Publications (2)

Publication Number Publication Date
JP2015038479A true JP2015038479A (ja) 2015-02-26
JP2015038479A5 JP2015038479A5 (enExample) 2017-09-28

Family

ID=51214562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014166371A Pending JP2015038479A (ja) 2013-08-19 2014-08-19 質量バランス構造およびそれを用いるミクロトーム

Country Status (5)

Country Link
US (1) US10107719B2 (enExample)
JP (1) JP2015038479A (enExample)
CN (1) CN104422598B (enExample)
DE (1) DE102014215907B4 (enExample)
GB (1) GB2517545B (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020519854A (ja) * 2017-04-13 2020-07-02 ライカ マイクロシステムズ リミテッド シャンハイＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ Ｌｔｄ． Ｓｈａｎｇｈａｉ 質量バランス手段及びそれを有する回転式ミクロトーム
WO2022139235A1 (ko) * 2020-12-22 2022-06-30 한국기초과학지원연구원 3차원 이미징용 울트라 마이크로톰

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101967681B1 (ko) * 2018-11-01 2019-08-13 한국기초과학지원연구원 울트라 마이크로톰 장치

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB254943A (en) * 1925-11-06 1926-07-15 Ernst Kreissig Spring suspension
JPH09133614A (ja) * 1995-08-26 1997-05-20 Leica Instr Gmbh クランク伝動機構を有する回転ミクロトーム
JP2008501595A (ja) * 2004-05-28 2008-01-24 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 重力補償装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3272022A (en) * 1963-12-18 1966-09-13 Spinner Adolf Slide actuating mechanism for a machine tool
JPS5373194A (en) 1976-12-13 1978-06-29 Akashi Seisakusho Kk Microtome
US4363377A (en) * 1980-09-22 1982-12-14 Deere & Company Active seat suspension control system
DE3347238C1 (de) * 1983-12-28 1985-02-28 Parke, Davis & Co., Morris Plains, N.J. Rotationsmikrotom
DE3433460A1 (de) 1984-08-22 1986-03-06 Parke, Davis & Co., Morris Plains, N.J. Fuehrungseinrichtung
US5456128A (en) * 1989-07-06 1995-10-10 Heidelberger Druckmaschinen Ag Cam oscillating drive in a printing machine with kinetic/potential energy storage means for damping undesired oscillations
JP3400048B2 (ja) 1992-12-17 2003-04-28 ドゥ ラ リュ ジオリ ソシエテ アノニム シート状物品の穿孔用パンチングユニット
US5996919A (en) * 1994-08-23 1999-12-07 Daiwa Seiko, Inc. Fishing reel of double bearing type having improved balance and ergonomic properties
DE10210408B4 (de) 2002-03-09 2010-07-08 Leica Biosystems Nussloch Gmbh Mikrotom mit Vorschubeinrichtung
DE102010046498B3 (de) * 2010-09-24 2011-12-15 Hans Heid Schneidehubverstellung eines Rotationsmikrotoms

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB254943A (en) * 1925-11-06 1926-07-15 Ernst Kreissig Spring suspension
JPH09133614A (ja) * 1995-08-26 1997-05-20 Leica Instr Gmbh クランク伝動機構を有する回転ミクロトーム
JP2008501595A (ja) * 2004-05-28 2008-01-24 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 重力補償装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020519854A (ja) * 2017-04-13 2020-07-02 ライカ マイクロシステムズ リミテッド シャンハイＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ Ｌｔｄ． Ｓｈａｎｇｈａｉ 質量バランス手段及びそれを有する回転式ミクロトーム
JP7222910B2 (ja) 2017-04-13 2023-02-15 ライカ マイクロシステムズ リミテッド シャンハイ 質量バランス手段及びそれを有する回転式ミクロトーム
WO2022139235A1 (ko) * 2020-12-22 2022-06-30 한국기초과학지원연구원 3차원 이미징용 울트라 마이크로톰

Also Published As

Publication number Publication date
US10107719B2 (en) 2018-10-23
US20150047490A1 (en) 2015-02-19
DE102014215907B4 (de) 2015-04-09
DE102014215907A1 (de) 2015-02-19
GB2517545B (en) 2015-09-09
CN104422598A (zh) 2015-03-18
GB2517545A (en) 2015-02-25
GB201409742D0 (en) 2014-07-16
CN104422598B (zh) 2019-03-08

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