JP2014529740A5 - - Google Patents

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Publication number
JP2014529740A5
JP2014529740A5 JP2014527159A JP2014527159A JP2014529740A5 JP 2014529740 A5 JP2014529740 A5 JP 2014529740A5 JP 2014527159 A JP2014527159 A JP 2014527159A JP 2014527159 A JP2014527159 A JP 2014527159A JP 2014529740 A5 JP2014529740 A5 JP 2014529740A5
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JP
Japan
Prior art keywords
peak intensity
distance
detecting
reference curve
intensity
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JP2014527159A
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English (en)
Japanese (ja)
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JP2014529740A (ja
JP5808493B2 (ja
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Priority claimed from US13/218,777 external-priority patent/US8826188B2/en
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Publication of JP2014529740A publication Critical patent/JP2014529740A/ja
Publication of JP2014529740A5 publication Critical patent/JP2014529740A5/ja
Application granted granted Critical
Publication of JP5808493B2 publication Critical patent/JP5808493B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2014527159A 2011-08-26 2012-08-06 近接センサの較正 Expired - Fee Related JP5808493B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/218,777 2011-08-26
US13/218,777 US8826188B2 (en) 2011-08-26 2011-08-26 Proximity sensor calibration
PCT/US2012/049722 WO2013032635A1 (en) 2011-08-26 2012-08-06 Proximity sensor calibration

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015140321A Division JP6084259B2 (ja) 2011-08-26 2015-07-14 近接センサの較正

Publications (3)

Publication Number Publication Date
JP2014529740A JP2014529740A (ja) 2014-11-13
JP2014529740A5 true JP2014529740A5 (enExample) 2014-12-25
JP5808493B2 JP5808493B2 (ja) 2015-11-10

Family

ID=46785783

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2014527159A Expired - Fee Related JP5808493B2 (ja) 2011-08-26 2012-08-06 近接センサの較正
JP2015140321A Expired - Fee Related JP6084259B2 (ja) 2011-08-26 2015-07-14 近接センサの較正

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2015140321A Expired - Fee Related JP6084259B2 (ja) 2011-08-26 2015-07-14 近接センサの較正

Country Status (6)

Country Link
US (1) US8826188B2 (enExample)
EP (1) EP2748632A1 (enExample)
JP (2) JP5808493B2 (enExample)
KR (1) KR101558114B1 (enExample)
CN (1) CN103782194B (enExample)
WO (1) WO2013032635A1 (enExample)

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WO2015188146A2 (en) 2014-06-05 2015-12-10 Edward Hartley Sargent Sensors and systems for the capture of scenes and events in space and time
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US10408926B2 (en) 2015-09-18 2019-09-10 Qualcomm Incorporated Implementation of the focal plane 2D APD array for hyperion lidar system
JP6876925B2 (ja) 2016-01-15 2021-05-26 ソニーグループ株式会社 半導体回路、駆動方法、および電子機器
DE102016103144A1 (de) * 2016-02-23 2017-08-24 Vishay Semiconductor Gmbh Optoelektronische Vorrichtung
KR20180014627A (ko) * 2016-08-01 2018-02-09 삼성전자주식회사 홍채 센서의 동작을 제어하는 방법 및 이를 위한 전자 장치
KR102786948B1 (ko) * 2016-11-14 2025-03-31 삼성전자주식회사 전자 장치에 있어서 근접 검출 장치 및 방법
KR102506438B1 (ko) * 2017-07-06 2023-03-06 삼성전자주식회사 거리 측정 장치 및 그 방법
CN107943345B (zh) * 2017-11-22 2020-10-02 Oppo广东移动通信有限公司 接近传感器的校准方法、装置、存储介质和电子设备
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JP7363415B2 (ja) * 2019-11-27 2023-10-18 株式会社リコー カラーホイールユニット及び画像投影装置
US12135395B2 (en) * 2019-12-12 2024-11-05 Aurora Operations, Inc. Multi-beam lidar intensity calibration by interpolating learned response curve
KR102247883B1 (ko) 2020-02-03 2021-05-06 주식회사 한영넉스 검출 거리 자동 세팅 가능한 고주파 발진형 근접센서
US12105225B2 (en) * 2020-04-17 2024-10-01 Velodyne Lidar Usa, Inc. Systems and methods for calibrating a LiDAR device

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