JP2014512547A5 - - Google Patents

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Publication number
JP2014512547A5
JP2014512547A5 JP2014508147A JP2014508147A JP2014512547A5 JP 2014512547 A5 JP2014512547 A5 JP 2014512547A5 JP 2014508147 A JP2014508147 A JP 2014508147A JP 2014508147 A JP2014508147 A JP 2014508147A JP 2014512547 A5 JP2014512547 A5 JP 2014512547A5
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JP
Japan
Prior art keywords
scanner
head
free end
sensor
probe
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JP2014508147A
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English (en)
Japanese (ja)
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JP5944982B2 (ja
JP2014512547A (ja
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Priority claimed from US13/068,052 external-priority patent/US8474060B2/en
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Publication of JP2014512547A5 publication Critical patent/JP2014512547A5/ja
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Publication of JP5944982B2 publication Critical patent/JP5944982B2/ja
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JP2014508147A 2011-04-29 2012-04-27 小型スキャナを備える走査型プローブ顕微鏡 Active JP5944982B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/068,052 2011-04-29
US13/068,052 US8474060B2 (en) 2011-04-29 2011-04-29 Scanning probe microscope with compact scanner
PCT/US2012/035628 WO2012149453A2 (en) 2011-04-29 2012-04-27 Scanning probe microscope with compact scanner

Publications (3)

Publication Number Publication Date
JP2014512547A JP2014512547A (ja) 2014-05-22
JP2014512547A5 true JP2014512547A5 (https=) 2014-09-25
JP5944982B2 JP5944982B2 (ja) 2016-07-05

Family

ID=47069078

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JP2014508147A Active JP5944982B2 (ja) 2011-04-29 2012-04-27 小型スキャナを備える走査型プローブ顕微鏡

Country Status (7)

Country Link
US (1) US8474060B2 (https=)
EP (1) EP2702416B1 (https=)
JP (1) JP5944982B2 (https=)
KR (1) KR101626193B1 (https=)
CN (1) CN103562732B (https=)
RU (1) RU2571449C2 (https=)
WO (1) WO2012149453A2 (https=)

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Publication number Priority date Publication date Assignee Title
WO2012149449A2 (en) 2011-04-29 2012-11-01 Bruker Nano, Inc. Cleaning station for atomic force microscope
US10307167B2 (en) 2012-12-14 2019-06-04 Corquest Medical, Inc. Assembly and method for left atrial appendage occlusion
US10813630B2 (en) 2011-08-09 2020-10-27 Corquest Medical, Inc. Closure system for atrial wall
US10314594B2 (en) 2012-12-14 2019-06-11 Corquest Medical, Inc. Assembly and method for left atrial appendage occlusion
EP2781925B1 (en) * 2011-11-15 2019-09-18 National University Corporation Kanazawa University Sealed-type afm cell
US9081028B2 (en) * 2012-03-19 2015-07-14 Bruker Nano, Inc. Scanning probe microscope with improved feature location capabilities
JP5909020B2 (ja) * 2012-03-27 2016-04-26 ハイジトロン, インク.Hysitron, Inc. 顕微鏡対物レンズ機械検査機器
US20140142689A1 (en) 2012-11-21 2014-05-22 Didier De Canniere Device and method of treating heart valve malfunction
US9566443B2 (en) 2013-11-26 2017-02-14 Corquest Medical, Inc. System for treating heart valve malfunction including mitral regurgitation
CN107076779B (zh) * 2014-10-24 2019-11-01 株式会社岛津制作所 扫描型探针显微镜
US10842626B2 (en) 2014-12-09 2020-11-24 Didier De Canniere Intracardiac device to correct mitral regurgitation
SG10201914103PA (en) * 2016-02-01 2020-03-30 Marco Martin Dental imager and method for recording photographic impressions
CN107192854B (zh) * 2017-04-18 2020-12-04 天津大学 原子力显微镜的z扫描器和探针装置及探针装置安装器
RU2695517C2 (ru) * 2017-08-14 2019-07-23 Общество с ограниченной ответственностью "НТ-МДТ" Сканирующий зондовый микроскоп с устройством для функционирования многозондового датчика
WO2020172444A1 (en) * 2019-02-20 2020-08-27 Omniome, Inc. Scanning apparatus and methods for detecting chemical and biological analytes
JP6631739B1 (ja) * 2019-04-04 2020-01-15 株式会社島津製作所 表面分析装置
US11119118B2 (en) * 2019-05-03 2021-09-14 Bruker Nano, Inc. Torsion wing probe assembly
CN112730897B (zh) * 2020-12-26 2022-02-18 厦门大学 一种隔离式扫描隧道显微镜的针尖扫描头装置
JP2025537475A (ja) * 2022-10-21 2025-11-18 カメカ インストゥルメンツ，インコーポレイテッド 真空チャンバー内の分析機器用の位置決め装置
WO2025068314A1 (en) * 2023-09-25 2025-04-03 Artidis Ag Holder for a cantilever for atomic force microscopy and atomic force microscope

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6138503A (en) 1997-10-16 2000-10-31 Raymax Technology, Inc. Scanning probe microscope system including removable probe sensor assembly
JP2001188035A (ja) * 1999-03-17 2001-07-10 Seiko Instruments Inc 走査型プローブ顕微鏡
US6677567B2 (en) * 2002-02-15 2004-01-13 Psia Corporation Scanning probe microscope with improved scan accuracy, scan speed, and optical vision
DE102004012740A1 (de) * 2004-03-15 2005-10-06 Suss Microtec Test Systems Gmbh Anordnung zur Abtastung der Oberfläche oder physikalischer Reaktionssignale von Substraten
US7249494B2 (en) 2005-06-06 2007-07-31 Academia Sinica Beam tracking system for scanning-probe type atomic force microscope
US8166567B2 (en) 2007-03-16 2012-04-24 Bruker Nano, Inc. Fast-scanning SPM scanner and method of operating same
US8393834B2 (en) 2007-06-05 2013-03-12 Airbus Operations Gmbh Machining apparatus and method for machining a laminate
US8136389B2 (en) * 2007-10-31 2012-03-20 Agilent Technologies, Inc. Probe tip assembly for scanning probe microscopes
WO2011016256A1 (ja) * 2009-08-06 2011-02-10 国立大学法人 金沢大学 カンチレバー励振装置及び走査型プローブ顕微鏡
CN102640007B (zh) 2009-10-29 2015-05-13 布鲁克纳米公司 具有包括运动挠性装置的支撑工作台的扫描探针显微镜

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