JP2014103664A5 - - Google Patents

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Publication number
JP2014103664A5
JP2014103664A5 JP2013233602A JP2013233602A JP2014103664A5 JP 2014103664 A5 JP2014103664 A5 JP 2014103664A5 JP 2013233602 A JP2013233602 A JP 2013233602A JP 2013233602 A JP2013233602 A JP 2013233602A JP 2014103664 A5 JP2014103664 A5 JP 2014103664A5
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JP
Japan
Prior art keywords
time value
integrated circuit
state
controlling
determined according
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JP2013233602A
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English (en)
Japanese (ja)
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JP2014103664A (ja
JP6323938B2 (ja
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Priority claimed from US13/682,604 external-priority patent/US9438030B2/en
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Publication of JP2014103664A5 publication Critical patent/JP2014103664A5/ja
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Publication of JP6323938B2 publication Critical patent/JP6323938B2/ja
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JP2013233602A 2012-11-20 2013-11-12 過渡電磁波耐性を向上させるためのトリガ回路および方法 Active JP6323938B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/682,604 US9438030B2 (en) 2012-11-20 2012-11-20 Trigger circuit and method for improved transient immunity
US13/682,604 2012-11-20

Publications (3)

Publication Number Publication Date
JP2014103664A JP2014103664A (ja) 2014-06-05
JP2014103664A5 true JP2014103664A5 (enExample) 2016-12-22
JP6323938B2 JP6323938B2 (ja) 2018-05-16

Family

ID=50002400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013233602A Active JP6323938B2 (ja) 2012-11-20 2013-11-12 過渡電磁波耐性を向上させるためのトリガ回路および方法

Country Status (4)

Country Link
US (1) US9438030B2 (enExample)
EP (1) EP2733850B1 (enExample)
JP (1) JP6323938B2 (enExample)
CN (1) CN103840445B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9438030B2 (en) * 2012-11-20 2016-09-06 Freescale Semiconductor, Inc. Trigger circuit and method for improved transient immunity
US9025289B1 (en) * 2013-12-12 2015-05-05 Amazing Microelectronic Corp. Low-cost electrostatic discharge (ESD) protection device for high-voltage open-drain pad
FR3038131B1 (fr) * 2015-06-26 2018-03-23 Stmicroelectronics Sa Dispositif de protection ameliore contre les decharges electrostatiques.
US10312230B2 (en) * 2016-02-04 2019-06-04 Nxp Usa, Inc. ESD protection circuit having clamp control loop
US10320185B2 (en) 2016-09-22 2019-06-11 Nxp Usa, Inc. Integrated circuit with protection from transient electrical stress events and method therefor
US10074643B2 (en) 2016-09-22 2018-09-11 Nxp Usa, Inc. Integrated circuit with protection from transient electrical stress events and method therefor
US10971488B2 (en) * 2018-02-06 2021-04-06 Infineon Technologies Ag Active ESD clamp deactivation
US11004843B2 (en) * 2019-01-18 2021-05-11 Nxp Usa, Inc. Switch control circuit for a power switch with electrostatic discharge (ESD) protection
US11315919B2 (en) 2019-02-05 2022-04-26 Nxp Usa, Inc. Circuit for controlling a stacked snapback clamp
US11056879B2 (en) 2019-06-12 2021-07-06 Nxp Usa, Inc. Snapback clamps for ESD protection with voltage limited, centralized triggering scheme
KR102161796B1 (ko) * 2020-03-02 2020-10-05 주식회사 아나패스 전기적 스트레스 보호회로 및 이를 포함하는 전자 장치

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03222516A (ja) 1990-01-29 1991-10-01 Fujitsu Ltd 半導体装置
US5255146A (en) 1991-08-29 1993-10-19 National Semiconductor Corporation Electrostatic discharge detection and clamp control circuit
US5463520A (en) * 1994-05-09 1995-10-31 At&T Ipm Corp. Electrostatic discharge protection with hysteresis trigger circuit
US5508649A (en) 1994-07-21 1996-04-16 National Semiconductor Corporation Voltage level triggered ESD protection circuit
US5917689A (en) 1996-09-12 1999-06-29 Analog Devices, Inc. General purpose EOS/ESD protection circuit for bipolar-CMOS and CMOS integrated circuits
US6400546B1 (en) 1999-09-02 2002-06-04 Ati International Srl I/O pad voltage protection circuit and method
US6385021B1 (en) 2000-04-10 2002-05-07 Motorola, Inc. Electrostatic discharge (ESD) protection circuit
US6724601B2 (en) 2001-03-16 2004-04-20 Integrated Device Technology, Inc. ESD protection circuit
FR2831328A1 (fr) 2001-10-23 2003-04-25 St Microelectronics Sa Protection d'un circuit integre contre des decharges electrostatiques et autres surtensions
US6760209B1 (en) 2002-05-16 2004-07-06 Lattice Semiconductor Corporation Electrostatic discharge protection circuit
US6724603B2 (en) 2002-08-09 2004-04-20 Motorola, Inc. Electrostatic discharge protection circuitry and method of operation
US7187530B2 (en) 2002-12-27 2007-03-06 T-Ram Semiconductor, Inc. Electrostatic discharge protection circuit
US7245468B2 (en) 2005-02-04 2007-07-17 Agere Systems Inc. Electro-static discharge (ESD) power clamp with power up detection
US7522395B1 (en) 2005-02-22 2009-04-21 Integrated Device Technology, Inc. Electrostatic discharge and electrical overstress protection circuit
US20070115600A1 (en) 2005-11-22 2007-05-24 Lsi Logic Corporation Apparatus and methods for improved circuit protection from EOS conditions during both powered off and powered on states
CN101421896A (zh) * 2006-04-21 2009-04-29 沙诺夫公司 通过电源状态检测的esd箝位控制
JP2009534845A (ja) 2006-04-21 2009-09-24 サーノフ コーポレーション 電力状態の検出によるｅｓｄクランプ制御
US7660086B2 (en) 2006-06-08 2010-02-09 Cypress Semiconductor Corporation Programmable electrostatic discharge (ESD) protection device
US7570468B2 (en) 2006-07-05 2009-08-04 Atmel Corporation Noise immune RC trigger for ESD protection
US20080239599A1 (en) 2007-04-01 2008-10-02 Yehuda Yizraeli Clamping Voltage Events Such As ESD
US20090040671A1 (en) 2007-08-10 2009-02-12 Skyworks Solutions, Inc. Power clamp for on-chip ESD protection
US7777998B2 (en) 2007-09-10 2010-08-17 Freescale Semiconductor, Inc. Electrostatic discharge circuit and method therefor
US7876540B2 (en) * 2007-11-21 2011-01-25 Microchip Technology Incorporated Adaptive electrostatic discharge (ESD) protection of device interface for local interconnect network (LIN) bus and the like
US8009396B2 (en) 2008-02-13 2011-08-30 Atmel Rousset S.A.S. Method and apparatus for ESD protection
JP2009267072A (ja) 2008-04-25 2009-11-12 Hitachi Ltd 保護回路
US8649134B2 (en) 2010-03-11 2014-02-11 Silicon Laboratories Inc. Electrostatic discharge protection rail clamp with discharge interruption circuitry
US8456784B2 (en) 2010-05-03 2013-06-04 Freescale Semiconductor, Inc. Overvoltage protection circuit for an integrated circuit
AU2013290511B2 (en) * 2012-07-19 2016-03-03 Cardiac Pacemakers, Inc. Electrostatic discharge protection circuit for implantable medical device
US9438030B2 (en) * 2012-11-20 2016-09-06 Freescale Semiconductor, Inc. Trigger circuit and method for improved transient immunity

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