JP2014102202A5 - - Google Patents

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Publication number
JP2014102202A5
JP2014102202A5 JP2012255455A JP2012255455A JP2014102202A5 JP 2014102202 A5 JP2014102202 A5 JP 2014102202A5 JP 2012255455 A JP2012255455 A JP 2012255455A JP 2012255455 A JP2012255455 A JP 2012255455A JP 2014102202 A5 JP2014102202 A5 JP 2014102202A5
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JP
Japan
Prior art keywords
inspection
density
fluoroscopic image
density profile
specific direction
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Application number
JP2012255455A
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English (en)
Japanese (ja)
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JP2014102202A (ja
JP6031339B2 (ja
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Priority claimed from JP2012255455A external-priority patent/JP6031339B2/ja
Priority to JP2012255455A priority Critical patent/JP6031339B2/ja
Application filed filed Critical
Priority to PCT/JP2013/079965 priority patent/WO2014080762A1/ja
Priority to EP13856082.6A priority patent/EP2924420A4/en
Publication of JP2014102202A publication Critical patent/JP2014102202A/ja
Priority to US14/705,939 priority patent/US9524546B2/en
Publication of JP2014102202A5 publication Critical patent/JP2014102202A5/ja
Priority to US15/348,922 priority patent/US9805461B2/en
Publication of JP6031339B2 publication Critical patent/JP6031339B2/ja
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JP2012255455A 2012-11-21 2012-11-21 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置 Active JP6031339B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2012255455A JP6031339B2 (ja) 2012-11-21 2012-11-21 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置
PCT/JP2013/079965 WO2014080762A1 (ja) 2012-11-21 2013-11-06 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置
EP13856082.6A EP2924420A4 (en) 2012-11-21 2013-11-06 FLUOROSCOPIC IMAGE DENSITY CORRECTION METHOD, NON-DESTRUCTIVE INSPECTION METHOD, AND IMAGE PROCESSING DEVICE
US14/705,939 US9524546B2 (en) 2012-11-21 2015-05-06 Fluoroscopic image density correction method, non-destructive inspection method, and image processing device
US15/348,922 US9805461B2 (en) 2012-11-21 2016-11-10 Fluoroscopic image density correction method, and image processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012255455A JP6031339B2 (ja) 2012-11-21 2012-11-21 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016207710A Division JP6220033B2 (ja) 2016-10-24 2016-10-24 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置

Publications (3)

Publication Number Publication Date
JP2014102202A JP2014102202A (ja) 2014-06-05
JP2014102202A5 true JP2014102202A5 (enExample) 2015-05-28
JP6031339B2 JP6031339B2 (ja) 2016-11-24

Family

ID=50775947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012255455A Active JP6031339B2 (ja) 2012-11-21 2012-11-21 透視画像濃度補正方法、非破壊検査方法、及び画像処理装置

Country Status (4)

Country Link
US (2) US9524546B2 (enExample)
EP (1) EP2924420A4 (enExample)
JP (1) JP6031339B2 (enExample)
WO (1) WO2014080762A1 (enExample)

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JP2015099400A (ja) * 2015-02-23 2015-05-28 富士フイルム株式会社 イメージングプレートユニット及びその応用
US10168288B2 (en) * 2015-09-21 2019-01-01 General Electric Company System for radiography imaging and method of operating such system
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CN105931227B (zh) * 2016-04-14 2018-11-02 北京工业大学 一种基于图像灰度b扫曲线的焊缝表面缺陷特征提取方法
CN105976352B (zh) * 2016-04-14 2019-01-11 北京工业大学 一种基于灰度图像形态学的焊缝表面缺陷特征提取方法
HUP1600469A2 (en) * 2016-07-27 2018-01-29 Peter Teleki Method for determining the geometric parameters and/or material state of a specimen based on in-situ radiographic imaging
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JP6825469B2 (ja) * 2017-04-18 2021-02-03 日本製鉄株式会社 周溶接部の検査方法
WO2020175108A1 (ja) * 2019-02-28 2020-09-03 富士フイルム株式会社 補正方法、補正装置、放射線画像撮影システム、及び補正プログラム
WO2020183778A1 (ja) 2019-03-13 2020-09-17 富士フイルム株式会社 放射線画像撮影装置
WO2020202617A1 (ja) 2019-03-29 2020-10-08 富士フイルム株式会社 画像処理装置、放射線画像撮影システム、画像処理方法、及び画像処理プログラム
US10598610B1 (en) * 2019-04-30 2020-03-24 KUB Technologies, Inc Methods and systems for imaging and analyzing wood blanks and billets
US11448604B2 (en) * 2019-07-08 2022-09-20 Worldwide Nondestructive Testing, Inc. System and method for inspecting fused plastic pipes
US12203873B2 (en) * 2019-07-08 2025-01-21 Worldwide Nondestructive Testing, Inc. System and method for inspecting fused plastic pipes
CN112683913B (zh) * 2020-12-02 2023-05-30 成都龙之泉科技股份有限公司 一种密度探测的城市管网检测方法
WO2022211197A1 (ko) * 2021-03-30 2022-10-06 주식회사 디지레이 튜브 용접부 엑스선 검사장치
KR102303838B1 (ko) * 2021-03-30 2021-09-17 주식회사 디지레이 튜브 용접부 엑스선 검사장치
GB202114070D0 (en) * 2021-10-01 2021-11-17 Johnson Matthey Plc Scanning system and method for scanning vessels
JP7449439B1 (ja) 2023-09-28 2024-03-13 三菱重工パワー検査株式会社 超音波探傷データ処理プログラム、及び超音波探傷データ処理方法

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JPS61274210A (ja) * 1985-05-30 1986-12-04 Hitachi Zosen Hihakai Kensa Kk 管中の堆積物測定方法
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