JP2013108833A5 - - Google Patents
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- JP2013108833A5 JP2013108833A5 JP2011253736A JP2011253736A JP2013108833A5 JP 2013108833 A5 JP2013108833 A5 JP 2013108833A5 JP 2011253736 A JP2011253736 A JP 2011253736A JP 2011253736 A JP2011253736 A JP 2011253736A JP 2013108833 A5 JP2013108833 A5 JP 2013108833A5
- Authority
- JP
- Japan
- Prior art keywords
- light
- unit
- gas cell
- irradiation
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011253736A JP5849640B2 (ja) | 2011-11-21 | 2011-11-21 | 磁場測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011253736A JP5849640B2 (ja) | 2011-11-21 | 2011-11-21 | 磁場測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013108833A JP2013108833A (ja) | 2013-06-06 |
| JP2013108833A5 true JP2013108833A5 (enExample) | 2014-12-25 |
| JP5849640B2 JP5849640B2 (ja) | 2016-01-27 |
Family
ID=48705734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011253736A Expired - Fee Related JP5849640B2 (ja) | 2011-11-21 | 2011-11-21 | 磁場測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5849640B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6459167B2 (ja) * | 2013-11-27 | 2019-01-30 | セイコーエプソン株式会社 | 磁場測定装置および磁場測定方法 |
| US9964604B2 (en) | 2014-11-12 | 2018-05-08 | Seiko Epson Corporation | Magnetic field measurement method and magnetic field measurement device for measuring and offsetting original magnetic field |
| JP6550925B2 (ja) * | 2014-11-12 | 2019-07-31 | セイコーエプソン株式会社 | 磁場計測方法及び磁場計測装置 |
| US10254356B2 (en) | 2014-12-02 | 2019-04-09 | Seiko Epson Corporation | Magnetic field measurement method and magnetic field measurement apparatus |
| JP6597034B2 (ja) * | 2014-12-02 | 2019-10-30 | セイコーエプソン株式会社 | 磁場計測方法及び磁場計測装置 |
| US10024931B2 (en) | 2014-12-02 | 2018-07-17 | Seiko Epson Corporation | Magnetic field measurement method and magnetic field measurement apparatus |
| JP6825241B2 (ja) | 2016-06-21 | 2021-02-03 | セイコーエプソン株式会社 | 磁場計測装置、磁場計測装置の製造方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5005256B2 (ja) * | 2005-11-28 | 2012-08-22 | 株式会社日立ハイテクノロジーズ | 磁場計測システム及び光ポンピング磁束計 |
| JP5707021B2 (ja) * | 2008-09-30 | 2015-04-22 | 株式会社日立ハイテクノロジーズ | 磁場計測装置 |
| JP5640335B2 (ja) * | 2009-06-26 | 2014-12-17 | セイコーエプソン株式会社 | 磁気センサー |
-
2011
- 2011-11-21 JP JP2011253736A patent/JP5849640B2/ja not_active Expired - Fee Related
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