JP2013101101A5 - - Google Patents
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- Publication number
- JP2013101101A5 JP2013101101A5 JP2012202877A JP2012202877A JP2013101101A5 JP 2013101101 A5 JP2013101101 A5 JP 2013101101A5 JP 2012202877 A JP2012202877 A JP 2012202877A JP 2012202877 A JP2012202877 A JP 2012202877A JP 2013101101 A5 JP2013101101 A5 JP 2013101101A5
- Authority
- JP
- Japan
- Prior art keywords
- mass distribution
- image
- ions
- irradiating
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 150000002500 ions Chemical class 0.000 claims 19
- 230000001678 irradiating effect Effects 0.000 claims 12
- 239000002131 composite material Substances 0.000 claims 7
- 238000000691 measurement method Methods 0.000 claims 7
- 238000001514 detection method Methods 0.000 claims 6
- 238000000034 method Methods 0.000 claims 4
- 239000000758 substrate Substances 0.000 claims 4
- 230000002194 synthesizing effect Effects 0.000 claims 4
- 230000009466 transformation Effects 0.000 claims 2
- 239000000203 mixture Substances 0.000 claims 1
- 230000001131 transforming effect Effects 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012202877A JP2013101101A (ja) | 2011-10-12 | 2012-09-14 | 質量分布計測方法及び質量分布計測装置 |
| US13/632,615 US8637808B2 (en) | 2011-10-12 | 2012-10-01 | Mass distribution measuring method and mass distribution measuring apparatus |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011225019 | 2011-10-12 | ||
| JP2011225019 | 2011-10-12 | ||
| JP2012202877A JP2013101101A (ja) | 2011-10-12 | 2012-09-14 | 質量分布計測方法及び質量分布計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013101101A JP2013101101A (ja) | 2013-05-23 |
| JP2013101101A5 true JP2013101101A5 (enExample) | 2015-11-05 |
Family
ID=48085361
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012202877A Pending JP2013101101A (ja) | 2011-10-12 | 2012-09-14 | 質量分布計測方法及び質量分布計測装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8637808B2 (enExample) |
| JP (1) | JP2013101101A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5885474B2 (ja) * | 2011-11-17 | 2016-03-15 | キヤノン株式会社 | 質量分布分析方法及び質量分布分析装置 |
| JP2017511571A (ja) * | 2014-04-02 | 2017-04-20 | ザ ボード オブ トラスティーズ オブ ザ レランド スタンフォード ジュニア ユニバーシティー | 質量分析法によるサブミクロン元素画像解析の装置及び方法 |
| KR102257901B1 (ko) | 2014-09-19 | 2021-05-31 | 삼성전자주식회사 | 반도체 검사 장비 및 이를 이용한 반도체 소자의 검사 방법 |
| US10304657B2 (en) | 2015-02-09 | 2019-05-28 | Hitachi, Ltd. | Mirror ion microscope and ion beam control method |
| EP3290913B1 (de) * | 2016-09-02 | 2022-07-27 | ION-TOF Technologies GmbH | Sekundärionenmassenspektrokopisches verfahren, system und verwendungen hiervon |
| US20230420234A1 (en) * | 2020-11-17 | 2023-12-28 | MOBILion Systems, Inc. | Systems and Method for Image and/or Video Processing of Mass Spectrometry Data |
| CN118396134B (zh) * | 2024-04-03 | 2025-02-11 | 北京中科弧光量子软件技术有限公司 | 一种用于量子计算的离子阱的自动维护方法、系统和设备 |
| CN119223916B (zh) * | 2024-11-29 | 2025-03-21 | 双胞胎（集团）股份有限公司 | 一种检测范围的动态调整方法和饲料成分的检测方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3471882B2 (ja) | 1994-03-08 | 2003-12-02 | キヤノン株式会社 | 走査型原子間力顕微鏡 |
| US7064318B2 (en) * | 2003-08-26 | 2006-06-20 | Thermo Finnigan Llc | Methods and apparatus for aligning ion optics in a mass spectrometer |
| JP2007086610A (ja) | 2005-09-26 | 2007-04-05 | Lasertec Corp | 微分干渉顕微鏡及び欠陥検査装置 |
| JP2007157353A (ja) * | 2005-11-30 | 2007-06-21 | Osaka Univ | イメージング質量分析装置 |
| JP4614000B2 (ja) * | 2006-04-07 | 2011-01-19 | 株式会社島津製作所 | 質量分析装置 |
| US7728287B2 (en) * | 2007-03-01 | 2010-06-01 | Lawrence Livermore National Security, Llc | Imaging mass spectrometer with mass tags |
| JP4973360B2 (ja) * | 2007-07-24 | 2012-07-11 | 株式会社島津製作所 | 質量分析装置 |
| JP5141816B2 (ja) * | 2009-03-31 | 2013-02-13 | 株式会社島津製作所 | 質量分析装置 |
| US8754363B2 (en) | 2010-02-08 | 2014-06-17 | Canon Kabushiki Kaisha | Method and apparatus for reducing noise in mass signal |
-
2012
- 2012-09-14 JP JP2012202877A patent/JP2013101101A/ja active Pending
- 2012-10-01 US US13/632,615 patent/US8637808B2/en not_active Expired - Fee Related
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