JP2013092508A5 - - Google Patents
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- Publication number
- JP2013092508A5 JP2013092508A5 JP2011236314A JP2011236314A JP2013092508A5 JP 2013092508 A5 JP2013092508 A5 JP 2013092508A5 JP 2011236314 A JP2011236314 A JP 2011236314A JP 2011236314 A JP2011236314 A JP 2011236314A JP 2013092508 A5 JP2013092508 A5 JP 2013092508A5
- Authority
- JP
- Japan
- Prior art keywords
- wiring board
- light beam
- irradiation
- inspection apparatus
- visual inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 8
- 238000003384 imaging method Methods 0.000 claims description 7
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000011179 visual inspection Methods 0.000 claims 6
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011236314A JP5427222B2 (ja) | 2011-10-27 | 2011-10-27 | 外観検査装置 |
| CN201280038252.2A CN103718027B (zh) | 2011-10-27 | 2012-10-22 | 外观检查装置 |
| PCT/JP2012/077245 WO2013061927A1 (ja) | 2011-10-27 | 2012-10-22 | 外観検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011236314A JP5427222B2 (ja) | 2011-10-27 | 2011-10-27 | 外観検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013092508A JP2013092508A (ja) | 2013-05-16 |
| JP2013092508A5 true JP2013092508A5 (enrdf_load_stackoverflow) | 2013-06-27 |
| JP5427222B2 JP5427222B2 (ja) | 2014-02-26 |
Family
ID=48167758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011236314A Expired - Fee Related JP5427222B2 (ja) | 2011-10-27 | 2011-10-27 | 外観検査装置 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5427222B2 (enrdf_load_stackoverflow) |
| CN (1) | CN103718027B (enrdf_load_stackoverflow) |
| WO (1) | WO2013061927A1 (enrdf_load_stackoverflow) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101893831B1 (ko) * | 2016-10-20 | 2018-08-31 | 주식회사 고영테크놀러지 | 기판 검사장치 및 이를 이용한 기판 검사방법 |
| CN108801921A (zh) * | 2018-08-02 | 2018-11-13 | 佛山市坦斯盯科技有限公司 | 一种用于线路板的cis相机和光源模组 |
| DE112020007435T5 (de) * | 2020-10-05 | 2023-05-17 | Yamaha Hatsudoki Kabushiki Kaisha | Leiterplattenarbeitsvorrichtung |
| JP2025043962A (ja) * | 2023-09-19 | 2025-04-01 | 株式会社東芝 | 光学装置、光学検査システム、および、物体の撮像方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4240750A (en) * | 1978-10-02 | 1980-12-23 | Hurd William A | Automatic circuit board tester |
| JPH0739996B2 (ja) * | 1988-09-02 | 1995-05-01 | 日本電気株式会社 | 半田付検査装置 |
| JPH06331563A (ja) * | 1993-05-19 | 1994-12-02 | Matsushita Electric Ind Co Ltd | ビジュアルチェッカー |
| JP2002312766A (ja) * | 2001-04-17 | 2002-10-25 | Mitsubishi Electric Corp | 半田付け状態検査装置 |
| US7492449B2 (en) * | 2004-04-12 | 2009-02-17 | Georgia Tech Research Corporation | Inspection systems and methods |
| US7486274B2 (en) * | 2005-08-18 | 2009-02-03 | Mitsubishi Electric Research Laboratories, Inc. | Method for stabilizing and precisely locating pointers generated by handheld direct pointing devices |
| JP2009153119A (ja) * | 2007-11-30 | 2009-07-09 | Sanyo Electric Co Ltd | 撮像／映像補助装置およびそれを備える撮像／映像装置 |
| JP2010139461A (ja) * | 2008-12-15 | 2010-06-24 | Toppan Printing Co Ltd | 目視検査システム |
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2011
- 2011-10-27 JP JP2011236314A patent/JP5427222B2/ja not_active Expired - Fee Related
-
2012
- 2012-10-22 CN CN201280038252.2A patent/CN103718027B/zh not_active Expired - Fee Related
- 2012-10-22 WO PCT/JP2012/077245 patent/WO2013061927A1/ja active Application Filing