JP2013032995A - Checking program, recording medium having the same stored therein and checking device - Google Patents

Checking program, recording medium having the same stored therein and checking device Download PDF

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JP2013032995A
JP2013032995A JP2011169728A JP2011169728A JP2013032995A JP 2013032995 A JP2013032995 A JP 2013032995A JP 2011169728 A JP2011169728 A JP 2011169728A JP 2011169728 A JP2011169728 A JP 2011169728A JP 2013032995 A JP2013032995 A JP 2013032995A
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Hirokazu Yamada
宏和 山田
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OOBITTO KK
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PROBLEM TO BE SOLVED: To provide a checking program which has no need of selecting a nondefective beforehand in order to objectively set tolerance as a statistically meaningful value, and is independent of the ability of an operator.SOLUTION: A computer is made to execute: a first statistic step of calculating a statistic of characteristics for each pixel having the same coordinates and preparing a provisional good pixel range for a digital image group individually acquired from the prescribed number of a plurality of objects of the same specification; a storage step of storing the digital image group in a memory; a temporary determination step of determining whether or not the characteristics of each pixel belong to the provisional good pixel range for each image in the stored digital image group; a second statistic step of calculating the statistic of the characteristics for each pixel determined as belonging to the provisional good pixel range, and preparing a set good pixel range; and a main determination step of determining whether or not the characteristics for each pixel belong to the set good pixel range for a digital image acquired from the object.

Description

この発明は、対象物を撮像して得られた画像から、対象物の傷や欠陥などの不良の有無を検査するプログラム、同プログラムを格納した記録媒体及び検査装置に関する。   The present invention relates to a program for inspecting the presence or absence of defects such as scratches and defects on an object from an image obtained by imaging the object, a recording medium storing the program, and an inspection apparatus.

検査対象物を撮像して得られたデジタル画像を用いて当該対象物の良否判定を行う場合、予め良品と判っている物から取得される画像と検査対象物から取得される画像とを比較する方法がある。この方法では、良品自体がもつばらつきを許容するため、大きい公差を設定するか、または画素毎に異なる公差を設定する必要がある。また、画素毎に重要度を設定して、重要度の低い部位における基準画像との相違を欠陥と認識しないようにする方法も提案されている(特許文献1)。   When the quality of an object is determined using a digital image obtained by imaging the inspection object, an image acquired from an object that is known as a good product in advance is compared with an image acquired from the inspection object. There is a way. In this method, it is necessary to set a large tolerance or to set a different tolerance for each pixel in order to allow variation of the non-defective product itself. Also, a method has been proposed in which importance is set for each pixel so that a difference from a reference image in a less important part is not recognized as a defect (Patent Document 1).

いずれにしても公差や重要度は、作業者の主観に基づいて設定されるので、作業者に全ての欠陥を理解できる高度な知識と経験が要請され、設定可能な作業者が限られる。また、検査媒体として各画素毎の輝度などの光学的特性を用いる場合、照明器の照度変動に伴って良否判定の信頼性が低下する。   In any case, since tolerance and importance are set based on the subjectivity of the worker, the worker is required to have advanced knowledge and experience that can understand all defects, and the number of workers that can be set is limited. In addition, when optical characteristics such as luminance for each pixel are used as the inspection medium, the reliability of the pass / fail judgment is reduced with the illuminance fluctuation of the illuminator.

そこで、発明者は、予め選別された複数の良品から取得されたデジタル画像群について、同一座標をもつ画素毎に輝度の平均と標準偏差を算出して、これらから評価式を作成しておき、検査対象物から取得された画像について同一座標をもつ画素毎に、その輝度と前記評価式に基づいて良否判定を行う方法を提案した(特許文献2)。この方法によれば、公差は作業者の能力に依存することなく統計学的に意味を持つ値として客観的に設定される。   Therefore, the inventor calculates the average and standard deviation of the brightness for each pixel having the same coordinates for the digital image group acquired from a plurality of non-defective products selected in advance, and creates an evaluation formula from these, A method for determining pass / fail based on the luminance and the evaluation formula for each pixel having the same coordinates in an image acquired from an inspection object has been proposed (Patent Document 2). According to this method, the tolerance is objectively set as a statistically meaningful value without depending on the ability of the worker.

特開2001−175865JP 2001-175865 A 特開2005−265661JP 2005-265661 A

特許文献2に記載の方法においては、公差が統計学的に意味を持つ値とするためには多くの良品を登録する必要があるが、登録のためには予め作業者の主観により良品を選別しておく必要があり、登録作業に手間がかかる。
それ故、この発明は、特許文献2に記載の方法を改良し、公差を統計学的に意味を持つ値として客観的に設定するために、予め良品を選別しておく必要が無く、作業者の能力に依存しない検査プログラム及び検査装置を提供することを課題とする。
In the method described in Patent Document 2, it is necessary to register many non-defective products in order for the tolerance to have a statistically meaningful value. It takes a lot of time to register.
Therefore, the present invention improves the method described in Patent Document 2, and it is not necessary to select a good product in advance in order to objectively set the tolerance as a statistically meaningful value. It is an object of the present invention to provide an inspection program and an inspection apparatus that do not depend on the ability of the system.

その課題を解決するために、この発明の検査プログラムは、
同一仕様の複数の対象物の良否を判別するためにコンピュータに、以下の第一のステップ、記憶ステップ、仮判定ステップ、第二の統計ステップ及び本判定ステップを実行させることを特徴とする。
In order to solve the problem, the inspection program of the present invention is:
In order to determine the quality of a plurality of objects having the same specification, the computer is caused to execute the following first step, storage step, provisional determination step, second statistical step, and main determination step.

第一の統計ステップでは、同一仕様の複数の対象物のうち所定数から個別に取得されたデジタル画像群について、同一座標をもつ画素毎に特性の統計量を算出して暫定良画素範囲を作成する。前記特性は、対象物の撮像データから得られる特性、例えば輝度、色度などの光学的特性または温度などの熱的特性である。記憶ステップでは、前記デジタル画像群をメモリに記憶する。1画像ごとに統計量を算出しても良いし、メモリ上の画像群から一括して統計量を算出してもよい。前記統計量を算出するための対象物の個数は統計学的に信頼できるサンプル数(経験的に50程度)を超える量を確保する。   In the first statistical step, a provisional good pixel range is created by calculating characteristic statistics for each pixel having the same coordinates for a group of digital images individually acquired from a predetermined number of objects of the same specification. To do. The characteristic is a characteristic obtained from imaging data of an object, for example, an optical characteristic such as luminance and chromaticity, or a thermal characteristic such as temperature. In the storing step, the digital image group is stored in a memory. Statistics may be calculated for each image, or statistics may be calculated collectively from a group of images on the memory. The number of objects for calculating the statistic is ensured to exceed the number of statistically reliable samples (empirically about 50).

仮判定ステップでは、記憶された前記デジタル画像群における各画像に対して画素毎に前記特性が前記暫定良画素範囲に属するか否かを判定する。第二の統計ステップでは、前記暫定良画素範囲に属すると判定された画素毎に前記特性の統計量を算出して設定良画素範囲を作成する。設定良画素範囲は、暫定良画素範囲に属すると判定された画素のみを用いて算出された統計量、すなわち各対象物のうち著しく質の劣る部位を除いて算出された統計量に基づいて作成されているので、真の良画素範囲に近い。   In the temporary determination step, it is determined whether or not the characteristic belongs to the temporary good pixel range for each pixel with respect to each image in the stored digital image group. In a second statistical step, a set good pixel range is created by calculating a statistic of the characteristic for each pixel determined to belong to the provisional good pixel range. The set good pixel range is created based on the statistic calculated using only the pixels determined to belong to the provisional good pixel range, that is, the statistic calculated excluding the part of each object that is significantly inferior in quality. Therefore, it is close to the true good pixel range.

本判定ステップでは、検査しようとする同一仕様の対象物から取得されるデジタル画像に対して画素毎に前記特性がこの設定良画素範囲に属するか否かを判定する。通常、この後、全画素が前記設定良画素範囲に属すると判定された対象物を良品として選別する。この作業は人が行っても良いし、コンピュータに実行させてもよい。設定良画素範囲は、真の良画素範囲に近く、また作業者の主観によらず対象物の統計量から客観的に決定されるため、信頼性の高い検出結果が得られる。また、前記設定良画素範囲に属さないと判定された画素のうち、互いに隣接する複数の画素をグループ化し、グループ全体の特徴量を基準量と照合し、基準量を超えるグループを含む対象物を不良品、その他の対象物を良品として選別すると好ましい。これにより、許容されるべき小さな欠陥の存在によって良品であっても不良品と検出する過検出を防止できるからである。「グループ全体の特徴量」とは、例えばグループに属する画素の総面積(もしくは総数)、グループに外接する矩形の長辺の長さなどをいう。   In this determination step, it is determined whether or not the characteristic belongs to the set good pixel range for each pixel with respect to a digital image acquired from an object having the same specification to be inspected. Usually, after this, an object in which all the pixels are determined to belong to the set good pixel range is selected as a good product. This operation may be performed by a person or may be executed by a computer. Since the set good pixel range is close to the true good pixel range and is objectively determined from the statistics of the object regardless of the subjectivity of the operator, a highly reliable detection result can be obtained. Further, among the pixels determined not to belong to the set good pixel range, a plurality of adjacent pixels are grouped, and the feature amount of the entire group is checked with a reference amount, and an object including a group exceeding the reference amount is included. It is preferable to select defective products and other objects as non-defective products. This is because it is possible to prevent over-detection of detecting a defective product even if it is a non-defective product due to the presence of a small defect that should be allowed. “The characteristic amount of the entire group” means, for example, the total area (or total number) of pixels belonging to the group, the length of the long side of the rectangle circumscribing the group, and the like.

前記メモリとしてはリングバッファを用いるのが好ましい。そして、前記本判定ステップ実行中、対象物のデジタル画像が取得される度に当該デジタル画像をリングバッファに記憶するとともに、本判定ステップにおいて良品として選別された対象物の割合を閾値と照合する監視ステップを前記コンピュータに更に実行させるとよい。これにより、良品として選別された対象物の割合が前記閾値よりも低下したとき、リングバッファに記憶されたデジタル画像群に対して第一の統計ステップ、仮判定ステップ及び第二の統計ステップを再度実行させて前記設定良画素範囲を更新し、高い検出能力と歩留まりを維持することができる。   A ring buffer is preferably used as the memory. During execution of the main determination step, each time a digital image of an object is acquired, the digital image is stored in a ring buffer, and the ratio of the objects selected as non-defective products in the main determination step is checked against a threshold value. The steps may be further executed by the computer. Thereby, when the ratio of the target object selected as a non-defective product falls below the threshold value, the first statistical step, the temporary determination step, and the second statistical step are performed again on the digital image group stored in the ring buffer. It can be executed to update the set good pixel range and maintain high detection capability and yield.

この発明の課題を解決するために、この発明の検査装置は、
同一仕様の複数の対象物の良否を判別する装置であって、
同一仕様の複数の対象物のうち所定数から個別に取得されたデジタル画像群について、同一座標をもつ画素毎に特性の統計量を算出して暫定良画素範囲を作成する第一の統計手段と、
前記デジタル画像群を記憶可能なメモリと、
前記デジタル画像群における各画像に対して画素毎に前記特性が前記暫定良画素範囲に属するか否かを判定する仮判定手段と、
前記デジタル画像群における各画素のうち、前記暫定良画素範囲に属する画素毎に前記特性の統計量を算出して設定良画素範囲を作成する第二の統計手段と、
対象物から取得されるデジタル画像に対して画素毎に前記特性が前記設定良画素範囲に属するか否かを判定する本判定手段と
を備えることを特徴とする。
In order to solve the problems of the present invention, an inspection apparatus according to the present invention comprises:
A device for determining the quality of a plurality of objects of the same specification,
A first statistical means for calculating a provisional good pixel range by calculating a statistical quantity of characteristics for each pixel having the same coordinates for a group of digital images individually acquired from a predetermined number of objects of the same specification; ,
A memory capable of storing the digital image group;
Provisional determination means for determining whether the characteristic belongs to the provisional good pixel range for each pixel for each image in the digital image group;
A second statistical unit that calculates a statistical amount of the characteristic for each pixel belonging to the provisional good pixel range among the pixels in the digital image group, and creates a set good pixel range;
And a main judging unit for judging whether or not the characteristic belongs to the set good pixel range for each pixel with respect to the digital image acquired from the object.

この検査装置は、各手段を実行する回路素子や機械要素を組み合わせたものでもよいし、一部がソフトウェアプログラムと協働する態様であってもよい。また、全画素が前記設定良画素範囲に属すると判定された対象物を良品として選別する選別手段を備えると好ましい。選別手段は、これに代えて、前記設定良画素範囲に属さないと判定された画素のうち、互いに隣接する複数の画素をグループ化し、グループ全体の特徴量を基準量と照合し、基準量を超えるグループを含む対象物を不良品、その他の対象物を良品として選別するものであると特に好ましい。   This inspection apparatus may be a combination of circuit elements and mechanical elements that execute the respective means, or may be a mode in which a part of the inspection apparatus cooperates with a software program. In addition, it is preferable that the image forming apparatus further includes a sorting unit that sorts an object for which all pixels are determined to belong to the set good pixel range as a good product. Instead of this, the selection unit groups a plurality of adjacent pixels among the pixels determined not to belong to the set good pixel range, collates the feature amount of the entire group with the reference amount, and determines the reference amount. It is particularly preferable that the object including the exceeding group is selected as a defective product and the other objects are selected as non-defective products.

以上の通り、この発明によれば、公差が作業者の能力に依存することなく統計学的に意味を持つ値として客観的に設定されるので、検査精度及び信頼性に優れる。また、予め良品を選別しておく必要が無いので、運用効率にも優れる。   As described above, according to the present invention, the tolerance is objectively set as a statistically meaningful value without depending on the ability of the operator, and thus the inspection accuracy and reliability are excellent. In addition, since it is not necessary to select good products in advance, it is excellent in operational efficiency.

第一の実施形態の検査装置のハードウェア構成を示すブロック図である。It is a block diagram which shows the hardware constitutions of the test | inspection apparatus of 1st embodiment. 同実施形態の検査装置に用いられるコンピュータのシステム構成を示すブロック図である。It is a block diagram which shows the system configuration | structure of the computer used for the inspection apparatus of the embodiment. 同実施形態の検査装置の検査設定時前半における動作を示す流れ図である。It is a flowchart which shows operation | movement in the first half at the time of the test | inspection setting of the test | inspection apparatus of the embodiment. 同実施形態の検査装置の検査設定時前半における統計量計算動作の詳細を示す流れ図である。It is a flowchart which shows the detail of the statistics calculation operation | movement in the first half at the time of the inspection setting of the inspection apparatus of the embodiment. 同装置の判定情報の設定方法を説明する図である。It is a figure explaining the setting method of the determination information of the same apparatus. 各範囲の関係を示す度数分布図である。It is a frequency distribution diagram which shows the relationship of each range. 同装置の検査設定時前半における動作を示す流れ図である。It is a flowchart which shows operation | movement in the first half at the time of the test | inspection setting of the same apparatus. 同装置の検査時における動作を示す流れ図である。It is a flowchart which shows the operation | movement at the time of the test | inspection of the same apparatus. 第二の実施形態の検査装置に適用される不良画素の定義を説明する図である。It is a figure explaining the definition of the defective pixel applied to the inspection apparatus of 2nd embodiment.

−実施形態1−
この発明の第一の実施形態を図面とともに説明する。図1において検査装置100は、検査対象物Wの画像を撮るCCDカメラ20、カメラ20と接続されたコンピュータ30、位置決めコントローラ40、及びXYθテーブル50を備える。位置決めコントローラ40は、コンピュータ30と接続され、図略の位置センサなどにより検出される位置情報に基づいて対象物Wの空間姿勢を一意の座標値に変換する。
Embodiment 1
A first embodiment of the present invention will be described with reference to the drawings. In FIG. 1, the inspection apparatus 100 includes a CCD camera 20 that takes an image of an inspection object W, a computer 30 connected to the camera 20, a positioning controller 40, and an XYθ table 50. The positioning controller 40 is connected to the computer 30 and converts the spatial orientation of the object W into a unique coordinate value based on position information detected by a position sensor (not shown) or the like.

コンピュータ30は、図2にブロック図として示すように、カメラ20との接続を可能にするインターフェイスを有する画像入力部1、位置決めコントローラ40や図略のキーボード、マウスなどの入力装置とのインターフェイスを有する操作部2、中央演算処理装置3、ハードディスク4及びRAM5を備える。ハードディスク4には、画像入力部1や操作部2から命令やデータが送られたときに中央演算処理装置3に所定の演算処理を実行させる検査プログラムが記録されている。RAM5は、画像入力部1から送られる画像データや位置決めコントローラ4から送られる位置情報を一時的に記録する。   As shown in a block diagram in FIG. 2, the computer 30 has an interface with an image input unit 1 having an interface that enables connection with the camera 20, an input device such as a positioning controller 40, a keyboard (not shown), and a mouse. An operation unit 2, a central processing unit 3, a hard disk 4 and a RAM 5 are provided. The hard disk 4 stores an inspection program that causes the central processing unit 3 to execute predetermined arithmetic processing when an instruction or data is sent from the image input unit 1 or the operation unit 2. The RAM 5 temporarily records image data sent from the image input unit 1 and position information sent from the positioning controller 4.

詳しくは、RAM5の一部は最大n枚(nは整数)の画像データを記録可能なFIFO方式のリングバッファ6に設定され、先頭アドレスから順送りに画像データの記録がなされ、最終アドレスに達すれば先頭アドレスに戻って新たな画像データが既に記録された画像データに上書きされる。RAM5の残部には、中央演算処理装置3で処理されたデータが段階毎に格納されるように、基準画像記憶部7、位置決め情報記憶部8、判定情報記憶部9、第一統計量記憶部13、第二統計量記憶部15及び輝度値記憶部22が設けられている。また、ハードディスク4には、中央演算処理装置3を位置決め処理部11、第一統計処理部12、仮判定部14、第二統計処理部16、本判定部17、選別部18及び監視部19として機能させるファイルがそれぞれ記録されている。   Specifically, a part of the RAM 5 is set in a FIFO ring buffer 6 capable of recording a maximum of n pieces of image data (n is an integer), and image data is recorded sequentially from the top address, and the final address is reached. Returning to the top address, new image data is overwritten on the already recorded image data. In the remaining part of the RAM 5, a reference image storage unit 7, a positioning information storage unit 8, a determination information storage unit 9, and a first statistics storage unit are stored so that the data processed by the central processing unit 3 is stored for each stage. 13, a second statistic storage unit 15 and a luminance value storage unit 22 are provided. The hard disk 4 includes a central processing unit 3 as a positioning processing unit 11, a first statistical processing unit 12, a temporary determination unit 14, a second statistical processing unit 16, a main determination unit 17, a selection unit 18, and a monitoring unit 19. Each function file is recorded.

検査設定時の前半では、図3及び図4に流れ図で示すように任意の対象物Wをカメラ20で撮像し、画像入力部1より画像を取得し、その画像をRAM5に格納する(S1)。次に、RAM5に格納した画像を、基準画像記憶部7に基準画像として格納する(S2)。そして、基準画像に対して位置決め情報、たとえば図5に示すように基準画像における輪郭線、および探索範囲aなどを設定し、位置決め情報記憶部8に格納する(S3)。また、基準画像に対して検査判定情報、たとえば、検査範囲bなどを設定し、判定情報記憶部9に格納する(S4)。   In the first half of the examination setting, as shown in the flowcharts of FIGS. 3 and 4, an arbitrary object W is imaged by the camera 20, an image is acquired from the image input unit 1, and the image is stored in the RAM 5 (S1). . Next, the image stored in the RAM 5 is stored as a reference image in the reference image storage unit 7 (S2). Then, positioning information such as a contour line in the reference image and a search range a as shown in FIG. 5 is set for the reference image and stored in the positioning information storage unit 8 (S3). Also, inspection determination information, for example, inspection range b, etc. is set for the reference image and stored in the determination information storage unit 9 (S4).

次に、同一仕様の別の対象物Wについて同様に画像を取得し、その画像をリングバッファ6に格納する(S9)。S9にてリングバッファ6に格納された画像に対し、位置決め情報記憶部8を参照して、位置決め処理部11にて位置を検出する。そして、基準画像記憶部7に格納した基準画像の位置と同一部位が同一座標(x,y)をもつように変換した位置決め画像を取得するとともに、画素ごとの輝度値g(x,y)を輝度値記憶部22に格納する(S10)。続いて、第一統計処理部12において、S10で取得した位置決め画像の画素ごとの輝度値g(x,y)について、数式1に従って輝度値の和S(x,y)と平方和SS(x,y)とサンプル数N(x,y)を算出する(S12)。   Next, an image is similarly acquired for another object W having the same specification, and the image is stored in the ring buffer 6 (S9). The positioning processing unit 11 detects the position of the image stored in the ring buffer 6 in S9 with reference to the positioning information storage unit 8. Then, a positioning image converted so that the same part as the position of the reference image stored in the reference image storage unit 7 has the same coordinates (x, y) is acquired, and the luminance value g (x, y) for each pixel is obtained. Stored in the luminance value storage unit 22 (S10). Subsequently, in the first statistical processing unit 12, the luminance value g (x, y) for each pixel of the positioning image acquired in S <b> 10 is calculated according to Equation 1 and the sum S (x, y) and the square sum SS (x , Y) and the number of samples N (x, y) are calculated (S12).

[数式1]
S(x,y)=S(x,y)+g(x,y)
SS(x,y)=SS(x,y)+g(x,y)×g(x,y)
N(x,y)=N(x,y)+1
[Formula 1]
S (x, y) = S (x, y) + g (x, y)
SS (x, y) = SS (x, y) + g (x, y) × g (x, y)
N (x, y) = N (x, y) +1

以下、同一仕様の更に別のn−1個の対象物Wを順次送りながらS9〜S12を個別に繰り返した後(S5〜S7)、数式2により同一座標の画素ごとの輝度値の平均値E1(x,y)と標準偏差σ1(x,y)を計算し、第一統計量記憶部13に格納する(S8)。得られた値は、画素毎に図6に示すような度数分布における暫定良画素範囲を定義するものとなる。   Thereafter, S9 to S12 are individually repeated while sequentially sending yet another n-1 objects W having the same specifications (S5 to S7), and then the average value E1 of the luminance values for each pixel of the same coordinate according to Equation 2. (X, y) and standard deviation σ1 (x, y) are calculated and stored in the first statistic storage unit 13 (S8). The obtained value defines the provisional good pixel range in the frequency distribution as shown in FIG. 6 for each pixel.

[数式2]
E1(x,y)=S(x,y)/N(x,y)
V1(x,y)=(SS(x,y)−N(x,y)×E1(x,y)×E1(x,y))/(N(x,y)−1)
σ1(x,y)=sqrt(V1(x,y)) (sqrt:平方根の計算)
[Formula 2]
E1 (x, y) = S (x, y) / N (x, y)
V1 (x, y) = (SS (x, y) −N (x, y) × E1 (x, y) × E1 (x, y)) / (N (x, y) −1)
σ1 (x, y) = sqrt (V1 (x, y)) (sqrt: calculation of square root)

検査設定時の後半では、図7に流れ図で示すようにリングバッファ6に格納された画像から前記の手順で位置決め画像を取得し(S13)、位置決め画像について、第一統計量記憶部13を参照して、仮判定部14にて画素ごとの輝度値g(x,y)が数式3の条件に入るかどうかを判定し(S14)、条件に入る画素の輝度値を抽出する。なお数式3において、α1は例えば5、β1は2〜3程度でよい。   In the latter half of the inspection setting, a positioning image is obtained from the image stored in the ring buffer 6 by the above procedure as shown in the flowchart of FIG. 7 (S13), and the first statistic storage unit 13 is referred to for the positioning image. Then, the provisional determination unit 14 determines whether or not the luminance value g (x, y) for each pixel satisfies the condition of Expression 3 (S14), and extracts the luminance value of the pixel that satisfies the condition. In Equation 3, α1 may be about 5, and β1 may be about 2 to 3, for example.

[数式3]
E1(x,y)−max{α1,β1×σ1(x,y)}<g(x,y)
かつ
g(x,y)<E1(x,y)+max{α1,β1×σ1(x,y)}
[Formula 3]
E1 (x, y) -max {α1, β1 × σ1 (x, y)} <g (x, y)
And g (x, y) <E1 (x, y) + max {α1, β1 × σ1 (x, y)}

そして、抽出された輝度値について同一座標の画素毎に数式1に従って輝度値の和S(x,y)と平方和SS(x,y)とサンプル数N(x,y)を第二統計処理部16にて算出することにより(S15〜S17)、同一座標の画素毎に前記E1及びσ1のときと同様に平均値E2(x,y)と標準偏差σ2(x,y)を計算し、第二統計量記憶部15に格納する(S18)。   Then, with respect to the extracted luminance value, the second statistical processing is performed on the luminance value sum S (x, y), the sum of squares SS (x, y), and the number of samples N (x, y) according to Equation 1 for each pixel having the same coordinates. By calculating in the unit 16 (S15 to S17), the average value E2 (x, y) and the standard deviation σ2 (x, y) are calculated for each pixel of the same coordinate as in the case of E1 and σ1. It stores in the 2nd statistics storage part 15 (S18).

検査時には、同一仕様の全ての対象物について画像入力部1より取得される画像をリングバッファ6に順次格納するとともに(S19)、位置決め画像を取得し(S20)、第二統計量記憶部15を参照して本判定部17にて各画素の輝度値g(x,y)が数式4の条件(設定良画素範囲)に入るかどうかを判定する(S21)。   At the time of inspection, images acquired from the image input unit 1 for all objects having the same specifications are sequentially stored in the ring buffer 6 (S19), positioning images are acquired (S20), and the second statistic storage unit 15 is stored. With reference to this, the main determination unit 17 determines whether or not the luminance value g (x, y) of each pixel falls within the condition of Formula 4 (the set good pixel range) (S21).

[数式4]
E2(x,y)−max{α2,β2×σ2(x,y)}<g(x,y)
かつ
g(x,y)<E2(x,y)+max{α2,β2×σ2(x,y)}
[Formula 4]
E2 (x, y) -max {α2, β2 × σ2 (x, y)} <g (x, y)
And g (x, y) <E2 (x, y) + max {α2, β2 × σ2 (x, y)}

そして、全ての画素が数式4の条件を充足すると判定された対象物を良品と、あるいは少なくとも一つの画素が当該条件を満たさないと判定された対象物を不良品として選別部18にて良品フラグ及び不良品フラグをそれぞれ割り当てて選別し(S22〜S23)、モニターに表示する。監視部19は、検査開始と同時に起動し、本検査において良品と選別された対象物の枚数の割合を常時監視している(S24〜S25)。そして、割合が設定値を下回ると同時に直近にリングバッファ6に格納された画像を用いて、S18以降の処理を実行し、第二統計量記憶部15に格納された平均値E2(x,y)や標準偏差σ2(x,y)などのデータを更新する(S26)。   Then, the selection unit 18 determines that the object determined that all the pixels satisfy the condition of Equation 4 as a non-defective product or the object determined that at least one pixel does not satisfy the condition as a defective product. And a defective product flag are assigned and sorted (S22 to S23) and displayed on the monitor. The monitoring unit 19 is activated simultaneously with the start of the inspection, and constantly monitors the ratio of the number of objects selected as non-defective products in the main inspection (S24 to S25). Then, at the same time as the ratio falls below the set value, the processing after S18 is executed using the image stored in the ring buffer 6 most recently, and the average value E2 (x, y stored in the second statistic storage unit 15 is executed. ) And standard deviation σ2 (x, y) and the like are updated (S26).

−実施形態2−
第一の実施形態ではたった一つの画素が数式4の条件を充足していないだけで対象物が不良品と選別されていた(S22〜S23)。これに対して第二の実施形態では、数式4の条件を充足していないと判定された画素のうち、互いに隣接する複数の画素を選別部18がグループ化し、グループの特徴量を基準量と照合する。そして、特徴量をグループに属する画素の総面積とすると、基準面積を超えるグループを含む対象物を不良品、その他の対象物を良品として選別部18にて良品フラグ及び不良品フラグをそれぞれ割り当てて選別する。
Embodiment 2
In the first embodiment, only one pixel does not satisfy the condition of Equation 4, and the object is selected as a defective product (S22 to S23). On the other hand, in the second embodiment, the selection unit 18 groups a plurality of pixels adjacent to each other among the pixels determined not to satisfy the condition of Expression 4, and the group feature amount is set as a reference amount. Match. Then, assuming that the feature amount is the total area of the pixels belonging to the group, the selection unit 18 assigns a non-defective flag and a defective flag to the target including the group exceeding the reference area as a defective product and the other target objects as non-defective products. Sort out.

例えば基準面積を4画素に設定したとき、図9に示すグループG1及びG2は、いずれも総面積がそれぞれ4画素分及び3画素分であることから、欠陥とはみなされない。従って、このような画素がいくら点在していても対象物は不良品と判定されることはなく、過検出が防止される。一方、グループG3は、総面積が11画素分であって4画素分を超えているので、欠陥とみなされ、対象物は不良品と判定される。   For example, when the reference area is set to 4 pixels, the groups G1 and G2 shown in FIG. 9 are not regarded as defects because the total areas are 4 pixels and 3 pixels, respectively. Therefore, no matter how many such pixels are interspersed, the object is not determined to be defective, and overdetection is prevented. On the other hand, since the total area of the group G3 is 11 pixels and exceeds 4 pixels, the group G3 is regarded as a defect and the object is determined as a defective product.

特徴量は、面積に限らず、外接矩形の長辺や外接円の真円度であってもよいし、これらと面積とを組み合わせたものでも良い。例えば、特徴量をグループに外接する矩形の長辺の長さとし、基準量を2(1画素の一辺を1とする。)に設定したときは、グループG2は長辺の長さが3であることから、欠陥とみなされる。グループG3も破線で示すように外接矩形の長辺の長さが5であることから、欠陥とみなされる。従って、グループG2やG3を含む対象物は不良品と判定される。一方、グループG4は、長辺の長さが2であることから、欠陥とみなされない。   The feature amount is not limited to the area, but may be the long side of the circumscribed rectangle or the roundness of the circumscribed circle, or a combination of these and the area. For example, when the feature amount is the length of a long side of a rectangle circumscribing the group and the reference amount is set to 2 (one side of one pixel is set to 1), the length of the long side of the group G2 is 3. Therefore, it is regarded as a defect. Group G3 is also regarded as a defect because the length of the long side of the circumscribed rectangle is 5, as indicated by a broken line. Accordingly, the objects including the groups G2 and G3 are determined as defective products. On the other hand, the group G4 is not regarded as a defect because the length of the long side is 2.

20 カメラ
30 コンピュータ
40 位置決めコントローラ
50 XYθテーブル
100 検査装置
20 Camera 30 Computer 40 Positioning Controller 50 XYθ Table 100 Inspection Device

Claims (10)

同一仕様の複数の対象物の良否を判別するためにコンピュータに、
同一仕様の複数の対象物のうち所定数から個別に取得されたデジタル画像群について、 同一座標をもつ画素毎に特性の統計量を算出して暫定良画素範囲を作成する第一の統計ステップと、
前記デジタル画像群をメモリに記憶する記憶ステップと、
記憶された前記デジタル画像群における各画像に対して画素毎に前記特性が前記暫定良画素範囲に属するか否かを判定する仮判定ステップと、
前記暫定良画素範囲に属すると判定された画素毎に前記特性の統計量を算出して設定良画素範囲を作成する第二の統計ステップと、
対象物から取得されるデジタル画像に対して画素毎に前記特性が前記設定良画素範囲に属するか否かを判定する本判定ステップと
を実行させることを特徴とする検査プログラム。
To determine the quality of multiple objects of the same specification,
A first statistical step for creating a provisional good pixel range by calculating a statistical quantity of characteristics for each pixel having the same coordinates for a group of digital images individually acquired from a predetermined number of objects of the same specification; ,
Storing the digital image group in a memory;
A provisional determination step for determining whether or not the characteristic belongs to the provisional good pixel range for each pixel with respect to each image in the stored digital image group;
A second statistical step of calculating a statistic of the characteristic for each pixel determined to belong to the provisional good pixel range and creating a set good pixel range;
An inspection program for executing, on a digital image acquired from an object, a main determination step for determining whether or not the characteristic belongs to the set good pixel range for each pixel.
更に、全画素が前記設定良画素範囲に属すると判定された対象物を良品、その他の対象物を不良品として選別する選別ステップを備える、請求項1に記載の検査プログラム。   The inspection program according to claim 1, further comprising a selection step of selecting an object determined that all pixels belong to the set good pixel range as a non-defective product and other objects as defective products. 更に、前記設定良画素範囲に属さないと判定された画素のうち、互いに隣接する複数の画素をグループ化し、グループ全体の特徴量を基準量と照合し、基準量を超えるグループを含む対象物を不良品、その他の対象物を良品として選別する選別ステップを備える、請求項1に記載の検査プログラム。   Further, among the pixels determined not to belong to the set good pixel range, a plurality of adjacent pixels are grouped, the feature amount of the entire group is compared with the reference amount, and an object including a group exceeding the reference amount is obtained. The inspection program according to claim 1, further comprising a sorting step for sorting defective products and other objects as non-defective products. 前記メモリがリングバッファであって、
前記本判定ステップ実行中、対象物のデジタル画像が取得される度に当該デジタル画像をリングバッファに記憶するとともに、良品として選別された対象物の割合を閾値と照合する監視ステップ
を前記コンピュータに更に実行させる、請求項2又は3に記載の検査プログラム。
The memory is a ring buffer;
During the execution of the main determination step, each time a digital image of an object is acquired, the digital image is stored in a ring buffer, and a monitoring step of checking the ratio of the objects selected as non-defective products with a threshold value is further performed on the computer. The inspection program according to claim 2 or 3 to be executed.
良品として選別された対象物の割合が前記閾値よりも低下したとき、リングバッファに記憶されたデジタル画像群に対して第一の統計ステップ、仮判定ステップ及び第二の統計ステップを再度実行させて前記設定良画素範囲を更新する、請求項4に記載の検査プログラム。   When the ratio of objects selected as non-defective products falls below the threshold, the first statistical step, the temporary determination step, and the second statistical step are executed again on the digital image group stored in the ring buffer. The inspection program according to claim 4, wherein the set good pixel range is updated. 前記特性が光学的または熱的特性である、請求項1〜5のいずれかに記載の検査プログラム。   The inspection program according to claim 1, wherein the characteristic is an optical or thermal characteristic. 同一仕様の複数の対象物の良否を判別する装置であって、
同一仕様の複数の対象物のうち所定数から個別に取得されたデジタル画像群について、同一座標をもつ画素毎に特性の統計量を算出して暫定良画素範囲を作成する第一の統計手段と、
前記デジタル画像群を記憶可能なメモリと、
前記デジタル画像群における各画像に対して画素毎に前記特性が前記暫定良画素範囲に属するか否かを判定する仮判定手段と、
前記デジタル画像群における各画素のうち、前記暫定良画素範囲に属する画素毎に前記特性の統計量を算出して設定良画素範囲を作成する第二の統計手段と、
対象物から取得されるデジタル画像に対して画素毎に前記特性が前記設定良画素範囲に属するか否かを判定する本判定手段と
を備えることを特徴とする検査装置。
A device for determining the quality of a plurality of objects of the same specification,
A first statistical means for calculating a provisional good pixel range by calculating a statistical quantity of characteristics for each pixel having the same coordinates for a group of digital images individually acquired from a predetermined number of objects of the same specification; ,
A memory capable of storing the digital image group;
Provisional determination means for determining whether the characteristic belongs to the provisional good pixel range for each pixel for each image in the digital image group;
A second statistical unit that calculates a statistical amount of the characteristic for each pixel belonging to the provisional good pixel range among the pixels in the digital image group, and creates a set good pixel range;
An inspection apparatus comprising: a determination unit that determines, for each pixel, whether the characteristic belongs to the set good pixel range for a digital image acquired from an object.
更に、全画素が前記設定良画素範囲に属すると判定された対象物を良品として選別する選別手段を備える、請求項7に記載の検査装置。   The inspection apparatus according to claim 7, further comprising a sorting unit that sorts an object for which all pixels are determined to belong to the set good pixel range as a good product. 更に、前記設定良画素範囲に属さないと判定された画素のうち、互いに隣接する複数の画素をグループ化し、グループ全体の特徴量を基準量と照合し、基準量を超えるグループを含む対象物を不良品、その他の対象物を良品として選別する選別手段を備える、請求項7に記載の検査装置。   Further, among the pixels determined not to belong to the set good pixel range, a plurality of adjacent pixels are grouped, the feature amount of the entire group is compared with the reference amount, and an object including a group exceeding the reference amount is obtained. The inspection apparatus according to claim 7, further comprising a sorting unit that sorts defective products and other objects as non-defective products. 請求項1〜6のいずれかに記載のプログラムを格納した記録媒体。   A recording medium storing the program according to claim 1.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190065457A (en) 2016-12-06 2019-06-11 미쓰비시덴키 가부시키가이샤 Inspection device and inspection method
KR20200116532A (en) 2018-03-29 2020-10-12 미쓰비시덴키 가부시키가이샤 Abnormality inspection device and abnormality inspection method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004093338A (en) * 2002-08-30 2004-03-25 Nec Corp Appearance inspection device and appearance inspection method
JP2005061929A (en) * 2003-08-08 2005-03-10 Ricoh Co Ltd Defect inspection method
JP2011116023A (en) * 2009-12-03 2011-06-16 Seiko Epson Corp Printer, printing state determining apparatus, and printing state determining method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004093338A (en) * 2002-08-30 2004-03-25 Nec Corp Appearance inspection device and appearance inspection method
JP2005061929A (en) * 2003-08-08 2005-03-10 Ricoh Co Ltd Defect inspection method
JP2011116023A (en) * 2009-12-03 2011-06-16 Seiko Epson Corp Printer, printing state determining apparatus, and printing state determining method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190065457A (en) 2016-12-06 2019-06-11 미쓰비시덴키 가부시키가이샤 Inspection device and inspection method
CN110036279A (en) * 2016-12-06 2019-07-19 三菱电机株式会社 Check device and inspection method
DE112016007498B4 (en) * 2016-12-06 2020-11-26 Mitsubishi Electric Corporation EXAMINATION EQUIPMENT AND EXAMINATION PROCEDURES
CN110036279B (en) * 2016-12-06 2022-03-15 三菱电机株式会社 Inspection apparatus and inspection method
US11645744B2 (en) 2016-12-06 2023-05-09 Mitsubishi Electric Corporation Inspection device and inspection method
KR20200116532A (en) 2018-03-29 2020-10-12 미쓰비시덴키 가부시키가이샤 Abnormality inspection device and abnormality inspection method
US11386549B2 (en) 2018-03-29 2022-07-12 Mitsubishi Electric Corporation Abnormality inspection device and abnormality inspection method

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