JP2013029496A5 - - Google Patents

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Publication number
JP2013029496A5
JP2013029496A5 JP2012134226A JP2012134226A JP2013029496A5 JP 2013029496 A5 JP2013029496 A5 JP 2013029496A5 JP 2012134226 A JP2012134226 A JP 2012134226A JP 2012134226 A JP2012134226 A JP 2012134226A JP 2013029496 A5 JP2013029496 A5 JP 2013029496A5
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JP
Japan
Prior art keywords
pixels
optical
depth
pixelated
group
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Ceased
Application number
JP2012134226A
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English (en)
Japanese (ja)
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JP2013029496A (ja
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Publication of JP2013029496A publication Critical patent/JP2013029496A/ja
Publication of JP2013029496A5 publication Critical patent/JP2013029496A5/ja
Ceased legal-status Critical Current

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JP2012134226A 2011-06-17 2012-06-13 ３次元シーンの要素の奥行きを評価する装置 Ceased JP2013029496A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1155330 2011-06-17
FR1155330 2011-06-17

Publications (2)

Publication Number Publication Date
JP2013029496A JP2013029496A (ja) 2013-02-07
JP2013029496A5 true JP2013029496A5 (https=) 2015-07-16

Family

ID=46172747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012134226A Ceased JP2013029496A (ja) 2011-06-17 2012-06-13 ３次元シーンの要素の奥行きを評価する装置

Country Status (5)

Country Link
US (1) US20120320160A1 (https=)
EP (1) EP2535681B1 (https=)
JP (1) JP2013029496A (https=)
KR (1) KR20120139587A (https=)
CN (1) CN102833569B (https=)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3008485A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting at least one object
EP3036503B1 (en) * 2013-08-19 2019-08-07 Basf Se Optical detector
WO2015137635A1 (en) * 2014-03-13 2015-09-17 Samsung Electronics Co., Ltd. Image pickup apparatus and method for generating image having depth information
CN106662636B (zh) 2014-07-08 2020-12-25 巴斯夫欧洲公司 用于确定至少一个对象的位置的检测器
WO2016092452A1 (en) * 2014-12-09 2016-06-16 Basf Se Optical detector
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
KR102311688B1 (ko) 2015-06-17 2021-10-12 엘지전자 주식회사 이동단말기 및 그 제어방법
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
EP3532864B1 (en) 2016-10-25 2024-08-28 trinamiX GmbH Detector for an optical detection of at least one object
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN106454318B (zh) * 2016-11-18 2020-03-13 成都微晶景泰科技有限公司 立体成像方法及立体成像装置
CN110770555A (zh) 2017-04-20 2020-02-07 特里纳米克斯股份有限公司 光学检测器
EP3645965B1 (en) 2017-06-26 2022-04-27 trinamiX GmbH Detector for determining a position of at least one object

Family Cites Families (20)

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JP3350918B2 (ja) * 1996-03-26 2002-11-25 株式会社高岳製作所 ２次元配列型共焦点光学装置
US5737084A (en) * 1995-09-29 1998-04-07 Takaoka Electric Mtg. Co., Ltd. Three-dimensional shape measuring apparatus
EP1207414B1 (en) * 1997-10-29 2016-05-04 Motic China Group Co., Ltd. Apparatus and methods relating to spatially light modulated microscopy
JP4199000B2 (ja) * 2001-03-15 2008-12-17 エイエムオー・ウェーブフロント・サイエンシーズ・リミテッド・ライアビリティ・カンパニー 光学システムをマッピングするための断層撮影波面分析システム及び方法
JP2006208407A (ja) * 2005-01-24 2006-08-10 Olympus Medical Systems Corp 立体画像観察用顕微鏡システム
EP1941314A4 (en) * 2005-10-07 2010-04-14 Univ Leland Stanford Junior ARRANGEMENTS AND APPROACHES FOR MICROSCOPY
US7932993B2 (en) * 2006-09-16 2011-04-26 Wenhui Mei Divided sub-image array scanning and exposing system
US7792423B2 (en) * 2007-02-06 2010-09-07 Mitsubishi Electric Research Laboratories, Inc. 4D light field cameras
US20090262182A1 (en) * 2007-10-15 2009-10-22 The University Of Connecticut Three-dimensional imaging apparatus
ES2372515B2 (es) * 2008-01-15 2012-10-16 Universidad De La Laguna Cámara para la adquisición en tiempo real de la información visual de escenas tridimensionales.
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法
KR101483714B1 (ko) * 2008-06-18 2015-01-16 삼성전자 주식회사 디지털 촬상 장치 및 방법
US8199248B2 (en) * 2009-01-30 2012-06-12 Sony Corporation Two-dimensional polynomial model for depth estimation based on two-picture matching
US8351031B2 (en) * 2009-06-05 2013-01-08 Spectral Sciences, Inc. Single-shot spectral imager
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US8400555B1 (en) * 2009-12-01 2013-03-19 Adobe Systems Incorporated Focused plenoptic camera employing microlenses with different focal lengths
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US8649024B2 (en) * 2010-12-03 2014-02-11 Zygo Corporation Non-contact surface characterization using modulated illumination
US8237835B1 (en) * 2011-05-19 2012-08-07 Aeon Imaging, LLC Confocal imaging device using spatially modulated illumination with electronic rolling shutter detection

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