JP2013029496A - 3次元シーンの要素の奥行きを評価する装置 - Google Patents

3次元シーンの要素の奥行きを評価する装置 Download PDF

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Publication number
JP2013029496A
JP2013029496A JP2012134226A JP2012134226A JP2013029496A JP 2013029496 A JP2013029496 A JP 2013029496A JP 2012134226 A JP2012134226 A JP 2012134226A JP 2012134226 A JP2012134226 A JP 2012134226A JP 2013029496 A JP2013029496 A JP 2013029496A
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pixels
depth
pixel
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group
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JP2012134226A
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Japanese (ja)
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JP2013029496A5 (https=
Inventor
Drazic Valter
ドラジ ヴァルテル
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Thomson Licensing SAS
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Thomson Licensing SAS
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/22Telecentric objectives or lens systems
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00Three-dimensional [3D] image rendering
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/271Image signal generators wherein the generated image signals comprise depth maps or disparity maps

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Graphics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Studio Devices (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2012134226A 2011-06-17 2012-06-13 3次元シーンの要素の奥行きを評価する装置 Ceased JP2013029496A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1155330 2011-06-17
FR1155330 2011-06-17

Publications (2)

Publication Number Publication Date
JP2013029496A true JP2013029496A (ja) 2013-02-07
JP2013029496A5 JP2013029496A5 (https=) 2015-07-16

Family

ID=46172747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012134226A Ceased JP2013029496A (ja) 2011-06-17 2012-06-13 3次元シーンの要素の奥行きを評価する装置

Country Status (5)

Country Link
US (1) US20120320160A1 (https=)
EP (1) EP2535681B1 (https=)
JP (1) JP2013029496A (https=)
KR (1) KR20120139587A (https=)
CN (1) CN102833569B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016537638A (ja) * 2013-08-19 2016-12-01 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 光学検出器

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3008485A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting at least one object
WO2015137635A1 (en) * 2014-03-13 2015-09-17 Samsung Electronics Co., Ltd. Image pickup apparatus and method for generating image having depth information
CN106662636B (zh) 2014-07-08 2020-12-25 巴斯夫欧洲公司 用于确定至少一个对象的位置的检测器
WO2016092452A1 (en) * 2014-12-09 2016-06-16 Basf Se Optical detector
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の物体を光学的に検出する検出器
KR102311688B1 (ko) 2015-06-17 2021-10-12 엘지전자 주식회사 이동단말기 및 그 제어방법
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
EP3532864B1 (en) 2016-10-25 2024-08-28 trinamiX GmbH Detector for an optical detection of at least one object
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN106454318B (zh) * 2016-11-18 2020-03-13 成都微晶景泰科技有限公司 立体成像方法及立体成像装置
CN110770555A (zh) 2017-04-20 2020-02-07 特里纳米克斯股份有限公司 光学检测器
EP3645965B1 (en) 2017-06-26 2022-04-27 trinamiX GmbH Detector for determining a position of at least one object

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257440A (ja) * 1996-03-26 1997-10-03 Takaoka Electric Mfg Co Ltd 2次元配列型共焦点光学装置
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5737084A (en) * 1995-09-29 1998-04-07 Takaoka Electric Mtg. Co., Ltd. Three-dimensional shape measuring apparatus
EP1207414B1 (en) * 1997-10-29 2016-05-04 Motic China Group Co., Ltd. Apparatus and methods relating to spatially light modulated microscopy
JP4199000B2 (ja) * 2001-03-15 2008-12-17 エイエムオー・ウェーブフロント・サイエンシーズ・リミテッド・ライアビリティ・カンパニー 光学システムをマッピングするための断層撮影波面分析システム及び方法
JP2006208407A (ja) * 2005-01-24 2006-08-10 Olympus Medical Systems Corp 立体画像観察用顕微鏡システム
EP1941314A4 (en) * 2005-10-07 2010-04-14 Univ Leland Stanford Junior ARRANGEMENTS AND APPROACHES FOR MICROSCOPY
US7932993B2 (en) * 2006-09-16 2011-04-26 Wenhui Mei Divided sub-image array scanning and exposing system
US7792423B2 (en) * 2007-02-06 2010-09-07 Mitsubishi Electric Research Laboratories, Inc. 4D light field cameras
US20090262182A1 (en) * 2007-10-15 2009-10-22 The University Of Connecticut Three-dimensional imaging apparatus
ES2372515B2 (es) * 2008-01-15 2012-10-16 Universidad De La Laguna Cámara para la adquisición en tiempo real de la información visual de escenas tridimensionales.
KR101483714B1 (ko) * 2008-06-18 2015-01-16 삼성전자 주식회사 디지털 촬상 장치 및 방법
US8199248B2 (en) * 2009-01-30 2012-06-12 Sony Corporation Two-dimensional polynomial model for depth estimation based on two-picture matching
US8351031B2 (en) * 2009-06-05 2013-01-08 Spectral Sciences, Inc. Single-shot spectral imager
US8345144B1 (en) * 2009-07-15 2013-01-01 Adobe Systems Incorporated Methods and apparatus for rich image capture with focused plenoptic cameras
WO2011066275A2 (en) * 2009-11-25 2011-06-03 Massachusetts Institute Of Technology Actively addressable aperture light field camera
US8400555B1 (en) * 2009-12-01 2013-03-19 Adobe Systems Incorporated Focused plenoptic camera employing microlenses with different focal lengths
US8860835B2 (en) * 2010-08-11 2014-10-14 Inview Technology Corporation Decreasing image acquisition time for compressive imaging devices
US8649024B2 (en) * 2010-12-03 2014-02-11 Zygo Corporation Non-contact surface characterization using modulated illumination
US8237835B1 (en) * 2011-05-19 2012-08-07 Aeon Imaging, LLC Confocal imaging device using spatially modulated illumination with electronic rolling shutter detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257440A (ja) * 1996-03-26 1997-10-03 Takaoka Electric Mfg Co Ltd 2次元配列型共焦点光学装置
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016537638A (ja) * 2013-08-19 2016-12-01 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 光学検出器

Also Published As

Publication number Publication date
EP2535681A1 (en) 2012-12-19
KR20120139587A (ko) 2012-12-27
US20120320160A1 (en) 2012-12-20
CN102833569B (zh) 2016-05-11
CN102833569A (zh) 2012-12-19
EP2535681B1 (en) 2016-01-06

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