JP2013024719A - 放射状照明と曲面鏡を有する検査装置。 - Google Patents
放射状照明と曲面鏡を有する検査装置。 Download PDFInfo
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- JP2013024719A JP2013024719A JP2011159578A JP2011159578A JP2013024719A JP 2013024719 A JP2013024719 A JP 2013024719A JP 2011159578 A JP2011159578 A JP 2011159578A JP 2011159578 A JP2011159578 A JP 2011159578A JP 2013024719 A JP2013024719 A JP 2013024719A
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- 238000007689 inspection Methods 0.000 title claims abstract description 59
- 238000005286 illumination Methods 0.000 title claims abstract description 32
- 230000002093 peripheral effect Effects 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 9
- 238000003384 imaging method Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 239000002184 metal Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011159578A JP2013024719A (ja) | 2011-07-21 | 2011-07-21 | 放射状照明と曲面鏡を有する検査装置。 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011159578A JP2013024719A (ja) | 2011-07-21 | 2011-07-21 | 放射状照明と曲面鏡を有する検査装置。 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013024719A true JP2013024719A (ja) | 2013-02-04 |
| JP2013024719A5 JP2013024719A5 (https=) | 2014-09-04 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2011159578A Pending JP2013024719A (ja) | 2011-07-21 | 2011-07-21 | 放射状照明と曲面鏡を有する検査装置。 |
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| JP (1) | JP2013024719A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018091759A (ja) * | 2016-12-05 | 2018-06-14 | リコーエレメックス株式会社 | 光切断検査装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7636204B1 (en) * | 2007-10-30 | 2009-12-22 | LumenFlow Corp. | 360 degree view imaging system |
| JP2010261950A (ja) * | 2009-05-04 | 2010-11-18 | Hommel-Etamic Gmbh | 工作物の空所の内面を模写する装置 |
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2011
- 2011-07-21 JP JP2011159578A patent/JP2013024719A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7636204B1 (en) * | 2007-10-30 | 2009-12-22 | LumenFlow Corp. | 360 degree view imaging system |
| JP2010261950A (ja) * | 2009-05-04 | 2010-11-18 | Hommel-Etamic Gmbh | 工作物の空所の内面を模写する装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018091759A (ja) * | 2016-12-05 | 2018-06-14 | リコーエレメックス株式会社 | 光切断検査装置 |
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