JP2013019760A - Film thickness measuring tool and method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a coating film thickness measuring tool, etc. capable of accurately measuring the coating film thickness of a corner part of an object to be inspected.SOLUTION: A coating film thickness measuring tool 1 includes a first member 2 having two abutting parts 2a, 2b, respectively abutting on two faces holding a corner part to be an inspection target portion of the object to be inspected and a second member 3 allowed to be rotated around a center 2d of the corner part which is an inspection target portion of the object to be inspected and having a hole connected to an intersection part 2d of the two abutting parts 2a, 2b, into which a probe P of an electromagnetic film thickness meter is inserted.

Description

  The present invention relates to a film thickness measuring jig and method for measuring a film thickness.

  Conventionally, an electromagnetic film thickness meter has been used for coating film thickness measurement after completion of bridge coating. The electromagnetic film thickness meter is capable of measuring the coating film thickness on the flat part of the bridge. However, it has been pointed out that the weak point of the coating is a corner where the coating film thickness becomes thin. Therefore, when considering the durability of the bridge, it is considered that the coating film thickness management at the corners is important. However, Non-Patent Document 1 below describes that the film thickness cannot be measured at positions such as corners, holes, and protrusions. This is presumably because it is difficult to stabilize the relative position between the object to be measured and the probe of the electromagnetic film thickness meter at a position such as a corner.

  The electromagnetic film thickness meter has an electromagnetic induction probe used when the object to be inspected is magnetic metal (iron, steel, etc.) and an eddy current type that is used when the object to be inspected is nonmagnetic (nonferrous) metal A probe is selected, and the probe is selected according to the material of the inspection object, and the coating film thickness is measured. As a related technique, the following Patent Document 1 describes a film thickness measurement assisting tool that assists in measuring the film thickness of the entire flat coating film.

JP 2004-12167 A “Steel Road Bridge Painting and Anticorrosion Handbook”, Japan Road Association, December 2005, p. II-77

  The present invention has been made in view of the above, and an object thereof is to make it possible to accurately measure the film thickness of the corner portion of an inspection object.

  In order to solve the above-described problems and achieve the object, the film thickness measurement jig according to the present invention includes two contact portions that respectively contact two surfaces sandwiching a corner portion that is an inspection target portion of the inspection target. And a hole through which the probe of the electromagnetic film thickness meter is inserted, and the corner and the axis of the probe are at a predetermined relative position. Further, the corner portion and the probe are brought into contact with each other.

  With the above configuration, the film thickness measurement jig according to the present invention can stably hold the relative position of the probe with respect to the corner portion of the inspection object. Thereby, the film thickness of the corner | angular part of a test target object can be measured correctly.

  As a preferred aspect of the present invention, the first member having the two contact portions and the axis of the inspection target portion of the inspection object or the intersection of the two contact portions can be rotated. And a second member having the hole into which the probe is inserted.

  With the above configuration, the angle formed between the corner of the inspection object and the axis of the probe can be easily changed. Thereby, the coating film thickness of a corner | angular part can be measured at various angles.

  In addition, the film thickness measurement jig according to the present invention is characterized by including a fixing means for fixing itself to the inspection object.

  With the above configuration, the film thickness measurement jig according to the present invention can more stably hold the relative position of the probe with respect to the corner portion of the inspection object. Thereby, it becomes possible to measure the film thickness of the corner of the inspection object more accurately.

  In the film thickness measurement jig according to the present invention, the adhering means is a magnet, a suction cup, or an engaging portion that engages with the inspection object.

  Moreover, the film thickness measuring method which concerns on this invention is a calibration member which has a site | part of the same shape as the corner | angular part which is the said test object site | part for the film thickness measuring jig of any one of Claims 1-4. A second step of calibrating the electromagnetic film thickness meter, a third step of bringing the film thickness measuring jig into contact with the inspection object site, and the electromagnetic film thickness meter And a fourth step of measuring the film thickness of the inspection target site using the method.

  With the above configuration, the film thickness measuring method according to the present invention can stabilize the relative position of the probe with respect to the corner of the inspection object. This makes it possible to accurately measure the film thickness at the corners of the inspection object.

  The present invention can make it possible to accurately measure the coating film thickness at the corners of an inspection object.

FIG. 1-1 is a schematic configuration diagram of a coating film thickness measuring jig according to the first embodiment of the present invention. FIG. 1-2 is a schematic configuration diagram of a coating film thickness measurement jig according to the first embodiment of the present invention. FIG. 2 is a schematic configuration diagram of the coating film thickness measurement jig according to the first embodiment of the present invention. FIG. 3A is a diagram illustrating magnetic lines of force when the inspection target portion of the inspection target is convex. 3-2 is a figure which shows a magnetic force line in case the test object site | part of a test object is concave. Fig. 4-1 shows the measurement of film thickness at each part using an electromagnetic film thickness meter calibrated at each part of the plane part (F), corner part (3R), and corner part (2R). It is a figure which shows the value which remove | divided the measured value of this by the true value. FIG. 4B is a graph showing the values of FIG. FIG. 5A is a diagram illustrating the frequency of the film thickness measurement result. FIG. 5B is a diagram illustrating basic statistics of film thickness measurement results. FIG. 5C is a diagram illustrating a histogram of the film thickness measurement result of the plane portion (F). FIG. 5-4 is a diagram illustrating a histogram of the film thickness measurement result of the corner (3R). FIG. 5-5 is a diagram illustrating a histogram of the film thickness measurement result of the corner (2R). FIG. 6A is a diagram illustrating a film thickness measurement result by macro photographing of a side cross section of a test piece and a film thickness measurement result by an electromagnetic film thickness meter. FIG. 6B is a graph illustrating measured values at the cut surface of the corner (2R). FIG. 6-3 is a graph illustrating measured values at the cut surface of the corner (3R). FIG. 7-1 is a schematic configuration diagram of a coating film thickness measurement jig according to the second embodiment of the present invention. FIG. 7-2 is a schematic configuration diagram of a modified example of the coating film thickness measuring jig according to the second embodiment of the present invention. FIG. 7-3 is a schematic configuration diagram of a modified example of the coating film thickness measurement jig according to the second embodiment of the present invention. FIG. 7-4 is a schematic configuration diagram of a coating film pressure measuring jig according to the third embodiment of the present invention. FIG. 8-1 is a schematic configuration diagram of a coating film thickness measurement jig according to the fourth embodiment of the present invention. FIG. 8-2 is a schematic configuration diagram of a modified example of the coating film thickness measurement jig according to the fourth embodiment of the present invention.

  Hereinafter, the present invention will be described in detail with reference to the drawings. It should be noted that the present invention is not limited by the modes for carrying out the invention (hereinafter referred to as embodiments). In addition, constituent elements in the following embodiments include those that can be easily assumed by those skilled in the art, those that are substantially the same, and those in a so-called equivalent range.

  1-1 is a side view of the coating film thickness measuring jig according to the first embodiment of the present invention, and FIG. 1-2 is a coating film thickness measuring jig from the direction II in FIG. 1-1. FIG. The coating film thickness measuring jig 1 includes a first member 2 and a second member 3 as shown in FIGS. 1-1 and 1-2.

  As shown in FIG. 1A, the first member 2 has a generally U-shaped side view shape. The first member 2 has contact portions 2a and 2b on the inner peripheral side thereof. The contact portion 2a and the contact portion 2b are orthogonal to each other, and are disposed so as to contact the surfaces 20b and 20c that are orthogonal to each other with the corner portion 20a that is the inspection target portion of the inspection target 20 interposed therebetween. The abutting portions 2a and 2b have a form that abuts on the surfaces 20b and 20c by a surface or a form that abuts at a plurality of points or lines. The abutting portions 2a and 2b that abut against the surfaces 20b and 20c at a plurality of points and lines, when the points and lines that abut against the surfaces 20b and 20c are placed on a virtual surface, Are orthogonal to each other. When the surfaces 20b and 20c are orthogonal (when the angle of the corner 20a is 90 degrees), the contact portions 2a and 2b are formed to be orthogonal, but the surfaces 20b and 20c are not orthogonal. In this case, the contact portions 2a and 2b are formed to have the same angle as the angle of the corner portion 20a formed by the surfaces 20b and 20c. That is, the 1st member 2 is installed with respect to the test object 20 so that the intersection part of contact part 2a and 2b may become in parallel with the ridgeline of the corner | angular part 20a.

  The outer peripheral surface 2c of the first member 2 has an arcuate side view shape with the center 2d of the corner 20a of the inspection object 20 as an axis (center). Further, the first member 2 has two grooves 2e and 2f with the center 2d of the corner 20a of the inspection object 20 as an axis (center) on the outer peripheral surface 2c. In the grooves 2e and 2f, nuts 10 and 11 are provided so as to be movable along the grooves 2e and 2f in the direction AB in the drawing with the center 2d of the corner 20a of the inspection object 20 as an axis (center). It has been. The first member 2 is formed between the two grooves 2e and 2f so as to communicate from the outer peripheral surface 2c to the contact portions 2a and 2b and along the arc shape of the outer peripheral surface 2c. The communication groove 2g thus formed is formed.

  The second member 3 is attached to the outer peripheral surface 2 c of the first member 2. The second member 3 is formed in an arc shape in which a surface that contacts the outer peripheral surface 2c of the first member 2 is recessed so as to follow the arc shape of the surface 2c. Holes 3 a and 3 b are formed in the second member 3. Bolts 12 and 13 are inserted into the holes 3a and 3b, respectively, and screwed into the nuts 10 and 11, respectively. For this reason, the second member 3 is attached to the outer peripheral surface 2c of the first member 2 by screwing the bolts 12 and 13 and the nuts 10 and 11 together. Further, the second member 3 has the nuts 10 and 11 moved along the grooves 2e and 2f of the first member 2 about the center 2d of the corner 20a of the inspection target 20 on the axis (center). As the nuts 10 and 11 move, the center 2d of the corner 20a of the inspection object 20 moves in the direction AB in the drawing with the axis (center) as the axis (center). In FIG. 1-1, the second member 3 is shown in the figure along the arc shape of the surface 2c of the first member 2 with the center 2d of the corner 20a of the inspection object 20 as the axis (center). It can be rotated in the B direction (clockwise and counterclockwise). The second member 3 penetrates in a direction orthogonal to the axis of the center 2d of the corner 20a of the inspection object 20, and intersects the contact portions 2a and 2b via the communication groove 2g of the first member 2. A hole 3c communicating with the portion is formed. In this hole 3c, a probe P of an electromagnetic film thickness meter is inserted. In a state where the probe P is inserted into the hole 3c, the axis X that is a measurement reference of the probe P is arranged to be orthogonal to the axis of the center 2d of the corner portion 20a of the inspection target 20. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20a of the inspection target 20. As shown in FIG. 1-1, in a state where the probe P is inserted into the hole 3c, the surface 20c of the inspection object 20 and the axis X of the probe P are in a parallel relationship. It is said that the angle formed by is 0 °. And when measuring a coating film thickness, the probe P is urged | biased to the direction of the axis X toward the corner | angular part 20a, and the front-end | tip part of the probe P is given to the corner | angular part 20a of the test object 20. It is brought into contact with a coating film (not shown).

  FIG. 2 is a view showing a state in which the second member 3 shown in FIG. 1-1 is rotated in the direction A (clockwise in the drawing) along the arc shape of the surface 2c of the first member 2. It is. In FIG. 2, the surface 20 c of the inspection object 20 and the axis X of the probe P have a 45 ° relationship, and this relationship is referred to as a state where the angle formed by the probe P is 45 °. When measuring the coating film thickness, the probe P is urged in the direction of the axis X toward the corner 20a, and the corner 20a is applied to the coating film (not shown) provided with the tip of the probe P. Abut.

  In the state shown in FIG. 2, the second member 3 has a center 2d of the corner portion 20a of the inspection object 20 as an axis (center) and is along the surface 2c of the first member 2 in the direction AB ( (Clockwise and counterclockwise). The second member 3 may be continuously rotatable along the surface 2c of the first member 2, or a notch or the like is provided between the first member 2 and the second member 3. As a result, even if the angle formed by the surface 20c of the inspection object 20 and the axis X of the probe P becomes a predetermined angle (for example, 0 °, 22.5 °, 45 °, etc.), it can be rotated in stages. good.

  As described above, according to the coating film thickness measurement jig 1, the axis X that is the measurement reference of the probe P is held in an arrangement perpendicular to the ridgeline of the corner 20 a of the inspection target 20. Thus, the relative position of the probe with respect to the corner 20a of the inspection object 20 can be stably held. For this reason, the film thickness of the corner | angular part 20a of the test target object 20 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure. Moreover, according to the coating film thickness measuring jig 1, the angle formed by the surface 20c of the inspection object 20 and the axis X of the probe P can be easily changed, and the coating film of the corner portion 20a can be changed at various angles. Thickness can be measured.

  Inside the first member 2 and in the vicinity of the surface 2a, a rod-like permanent magnet 4 is disposed along the surface 2a. Magnetic metal pieces 5 and 6 are in contact with both poles of the permanent magnet 4, and one side of the metal pieces 5 and 6 is exposed on the surface 2a. Similarly, rod-shaped permanent magnets 7 are arranged along the surface 2b in the vicinity of the surface 2b inside the first member 2, and magnetic metal pieces 8 and 8 are disposed on both poles of the permanent magnet 7. 9 contacts, and one side of the metal pieces 8 and 9 is exposed to the surface 2b. The coating film thickness measuring jig 1 is stably fixed to the inspection object 20 by the magnetic flux that comes out of the metal piece 5 and enters the metal piece 6 and the magnetic flux that comes out of the metal piece 8 and enters the metal piece 9. With the arrangement of the permanent magnets 4 and 7 and the metal pieces 5, 6, 8, and 9, the magnetic flux emitted from the permanent magnets 4 and 7 can be prevented from entering a probe described later. When the inspection object 20 is a non-magnetic material, the first member 2 is replaced with a suction cup or the like that is attracted to the inspection object 20 instead of the permanent magnets 4 and 7 and the metal pieces 5, 6, 8, and 9. By providing in, the coating film thickness measuring jig 1 can be stably fixed to the inspection object 20.

  Next, a method for measuring the coating film thickness using the coating film thickness measuring jig 1 will be described. First, the contact portions 2a and 2b of the first member 2 are brought into contact with the calibration member having the same shape as the object to be inspected (fixed if there is a fixing means) (first step). Next, the tip of the probe P is brought into contact with the calibration member to calibrate the electromagnetic film thickness meter (second step). Note that the first step and the second step may be repeated a plurality of times as necessary. Next, the coating film thickness measuring jig 1 is removed from the calibration member, and the contact portions 2a and 2b of the first member 2 are brought into contact with the object to be inspected (fixed when there is a fixing means) (third) Process). And the front-end | tip part of the probe P is made to contact | abut to the test object site | part of a test object, and the coating film thickness of a test object site | part is measured (4th process).

  Next, the verification result of the film thickness measurement using this embodiment will be described. The electromagnetic film thickness meter measures the distance between the base metal of the inspection object and the probe based on the change in the magnetic reaction. The magnetic reaction differs depending on the material, plate thickness, shape, etc. of the inspection object, and in particular, the difference in shape greatly affects the magnetic reaction. 3A is a diagram illustrating magnetic lines of force when the inspection target part of the inspection target 21 is convex, and FIG. 3-2 is a diagram illustrating magnetic lines of force when the inspection target part of the inspection target 22 is concave. It is. As shown in FIGS. 3A and 3B, when the inspection target part is convex, the magnetic field lines are sparser and the film thickness is measured thicker than when the inspection target part is concave. Therefore, when the inspection part of the inspection object is a corner, it is necessary to incorporate the influence of the shape of the inspection part when the electromagnetic film thickness meter is calibrated.

  FIG. 4A is a plan view of the flat part (F), the corner part (3R) using an electromagnetic film thickness meter calibrated at each of the flat part (F), corner part (3R), and corner part (2R). ), A value obtained by dividing the measured value when the film thickness is measured at each part of the corner (2R) by a true value. FIG. 4-2 is a graph showing the value of FIG. FIG. Thicknesses to be calibrated and measured are 125 μm, 201 μm of the standard plate, and 326 μm including the two sheets. When the film thickness at the corner was measured with an electromagnetic film thickness meter calibrated at the flat surface, the film thickness at the corner was measured to be about 20% to 30% thicker than the actual film thickness.

  Next, the thickness of the vinyl sheet having a thickness of 250 μm was measured for the flat portion (F), corner portion (3R), and corner portion (2R) of the standard plate. The measurement was carried out 100 times at 20 locations as 5 measurements at one location. Calibration of the electromagnetic film thickness meter was performed at 125 μm, 201 μm of the standard plate, and 326 μm, which is a combination of two sheets, at each target site. 5A is a diagram illustrating the frequency of measurement results, FIG. 5B is a diagram illustrating basic statistics of the measurement results, and FIG. 5C is a histogram of the measurement results of the plane portion (F). FIG. 5-4 is a diagram illustrating a histogram of the measurement result of the corner (3R), and FIG. 5-5 is a diagram illustrating a histogram of the measurement result of the corner (2R).

  The average value at the corner (3R) and the corner (2R) was an error of about 2% as compared with the flat surface (F). In addition, the standard deviation at the corner (3R) and the corner (2R) is larger than that of the flat surface (F), and increases in the order of the corner (3R) and the corner (2R). This is considered to be because the contact between the probe and the corner becomes unstable due to an increase in the curvature of the corner, but is about 2% of the measured film thickness at the maximum, and is considered to be a range in which there is no problem.

  Next, a comparison was made between a film thickness measurement result by macro photography of a side cross section of the test piece and a film thickness measurement result by an electromagnetic film thickness meter. The measurement was performed at a location 10 mm away from the corner, the corner, and the edge surface (thickness direction cross section). FIG. 6A is a diagram illustrating the measurement result, FIG. 6B is a graph illustrating the measurement value at the cut surface (4) of the corner (2R), and FIG. It is a graph which shows the measured value in the cut surface (7) of).

  When the film thickness measurement result by macro photography of the side cross section of the test piece was compared with the film thickness measurement result by the electromagnetic film thickness meter, they were not completely coincident, but the error was generally within 10%. It is considered that this error includes deformation of the coating film due to cutting of the test piece, measurement error with a microscope, and calibration error of the electromagnetic film thickness meter. Conceivable. In addition, the film thickness measurement result by the electromagnetic film thickness meter was generally smaller than the measurement result in macro photography, and was a safe value.

  As described above, according to the present embodiment, it is possible to accurately measure the coating film thickness at the corners of the inspection object by calibrating with the calibration member.

  Next, a second embodiment of the present invention will be described. FIG. 7-1 is a side view of the coating film thickness measurement jig according to the second embodiment of the present invention. The coating film thickness measuring jig 31 has a generally U-shaped side view. The coating film thickness measuring jig 31 has contact portions 31a and 31b on the inner peripheral side thereof. The contact portion 31a and the contact portion 31b are orthogonal to each other, and are disposed so as to contact the surfaces 20b and 20c that are orthogonal to each other with the corner portion 20a that is the inspection target portion of the inspection target 20 interposed therebetween. The abutting portions 31a and 31b may be in contact with the surfaces 20b and 20c with a surface or with a plurality of points or lines. The abutting portions 31a and 31b configured to abut on the surfaces 20b and 20c at a plurality of points and lines are the surfaces when the points and lines that abut against the surfaces 20b and 20c are placed on a virtual surface. Are orthogonal to each other. In addition, when the surfaces 20b and 20c are orthogonal (when the angle of the corner 20a is 90 degrees), the contact portions 31a and 31b are formed to be orthogonal, but the surfaces 20b and 20c are not orthogonal. In this case, the contact portions 31a and 31b are formed to have the same angle as the angle of the corner portion 20a formed by the surfaces 20b and 20c. That is, the coating film thickness measurement jig 31 is installed on the inspection object 20 so that the intersection of the contact portions 31a and 31b is parallel to the ridgeline of the corner portion 20a.

  A hole 31d is formed so as to communicate with a crossing portion of the contact portion 31a and the contact portion 31b from a surface 31c on the outer peripheral side of the coating film thickness measuring jig 31 facing the contact portion 31a. Yes. A probe P of an electromagnetic film thickness meter is inserted into the hole 31d. In a state where the probe P is inserted into the hole 31d, the axis X that is the measurement reference of the probe P is arranged to be orthogonal to the center 31e of the corner portion 20a of the inspection target 20. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20a of the inspection target 20. As shown in FIG. 7A, in a state where the probe P is inserted into the hole 31d, the surface 20c of the inspection target 20 and the axis X of the probe P are in a parallel relationship. It is said that the angle formed by is 0 °. And when measuring a coating film thickness, the probe P is urged | biased to the direction of the axis X toward the corner | angular part 20a, and the front-end | tip part of the probe P is given to the corner | angular part 20a of the test object 20. It is brought into contact with a coating film (not shown).

  According to the coating film thickness measurement jig 31, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20 a of the inspection target 20. In this way, the relative position of the probe P with respect to the corner 20a of the inspection target 20 can be stably held. For this reason, the film thickness of the corner | angular part 20a of the test target object 20 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure.

  Next, a modification of the coating film thickness measuring jig according to the second embodiment of the present invention will be described. FIG. 7-2 is a side view of a modified example of the coating film thickness measuring jig according to the second embodiment of the present invention. The coating film thickness measuring jig 32 has a generally square-shaped side view shape. The coating film thickness measuring jig 32 has contact portions 32a and 32b on the inner peripheral side thereof. The contact portion 32a and the contact portion 32b are orthogonal to each other, and are disposed so as to contact the surfaces 20b and 20c that are orthogonal to each other with the corner portion 20a that is the inspection target portion of the inspection target 20 interposed therebetween. The abutting portions 32a and 32b have a form that abuts on the surfaces 20b and 20c by a surface or a form that abuts at a plurality of points or lines. The contact portions 32a and 32b configured to contact the surfaces 20b and 20c at a plurality of points and lines are the surfaces when the points and lines that contact the surfaces 20b and 20c are placed on a virtual surface. Are orthogonal to each other. When the surfaces 20b and 20c are orthogonal (when the angle of the corner 20a is 90 degrees), the contact portions 32a and 32b are formed to be orthogonal, but the surfaces 20b and 20c are not orthogonal. In this case, the contact portions 32a and 32b are formed to have the same angle as the angle of the corner portion 20a formed by the surfaces 20b and 20c. That is, the coating film thickness measurement jig 32 is installed on the inspection object 20 so that the center 32e of the corner 20a of the inspection object 20 is parallel to the ridge line of the corner 20a.

  A hole 32d is formed so as to communicate with a crossing portion of the contact portion 32a and the contact portion 32b from a surface 32c facing the contact portion 32a on the outer peripheral surface of the coating film thickness measuring jig 32. Yes. A probe P of an electromagnetic film thickness meter is inserted into the hole 32d. In a state in which the probe P is inserted into the hole 32d, the axis X that is the measurement reference of the probe P is arranged to be orthogonal to the axis of the center 32e of the corner portion 20a of the inspection target 20. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20a of the inspection target 20. As shown in FIG. 7-2, in a state where the probe P is inserted into the hole 32d, the angle formed between the surface 20c of the inspection target 20 and the axis X of the probe P is 22.5 °. This relationship is called a state where the angle formed by the probe P is 22.5 °. And when measuring a coating film thickness, the probe P is urged | biased to the direction of the axis X toward the corner | angular part 20a, and the front-end | tip part of the probe P is given to the corner | angular part 20a of the test object 20. It is brought into contact with a coating film (not shown).

  According to the coating film thickness measurement jig 32, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20 a of the inspection target 20. In this way, the relative position of the probe P with respect to the corner 20a of the inspection target 20 can be stably held. For this reason, the film thickness of the corner | angular part 20a of the test target object 20 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure.

  Next, another modified example of the coating film thickness measuring jig according to the second embodiment of the present invention will be described. FIG. 7-3 is a side view of another modified example of the coating film thickness measurement jig according to the second embodiment of the present invention. The coating film thickness measuring jig 33 has a generally U-shaped side view. The coating film thickness measuring jig 33 has contact portions 33a and 33b on the inner peripheral side thereof. The contact portion 33a and the contact portion 33b are orthogonal to each other, and are disposed so as to contact the surfaces 20b and 20c that are orthogonal to each other with the corner portion 20a that is the inspection target portion of the inspection target 20 interposed therebetween. The contact portions 33a and 33b have a form of contacting the surfaces 20b and 20c by a surface or a form of contacting by a plurality of points or lines. The contact portions 33a and 33b that are in contact with the surfaces 20b and 20c at a plurality of points and lines are the surfaces when the points and lines that contact the surfaces 20b and 20c are placed on a virtual surface. Are orthogonal to each other. When the surfaces 20b and 20c are orthogonal (when the angle of the corner 20a is 90 degrees), the contact portions 33a and 33b are formed to be orthogonal, but the surfaces 20b and 20c are not orthogonal. In this case, the contact portions 33a and 33b are formed to have the same angle as the angle of the corner portion 20a formed by the surfaces 20b and 20c. That is, the coating film thickness measurement jig 33 is installed on the inspection object 20 so that the intersecting portion 33e of the contact portions 33a and 33b is parallel to the ridge line of the corner portion 20a.

  A hole 33d is formed so as to communicate with a crossing portion of the contact portion 33a and the contact portion 33b from a surface 33c on the outer peripheral side of the coating film thickness measuring jig 33 and facing the contact portions 33a and 33b. Has been. A probe P of an electromagnetic film thickness meter is inserted into the hole 33d. In a state in which the probe P is inserted into the hole 33d, the axis X that is a measurement reference of the probe P is arranged to be orthogonal to the center 33e of the corner 20a of the inspection target 20. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20a of the inspection target 20. As shown in FIG. 7C, in the state where the probe P is inserted into the hole 33d, the angle formed between the surface 20c of the inspection target 20 and the axis X of the probe P is 45 °. The relationship is called a state where the angle formed by the probe P is 45 °. And when measuring a coating film thickness, the probe P is urged | biased to the direction of the axis X toward the corner | angular part 20a, and the front-end | tip part of the probe P is given to the corner | angular part 20a of the test object 20. It is brought into contact with a coating film (not shown).

  According to the coating film thickness measurement jig 33, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 20 a of the inspection target 20. Thus, the relative position of the probe with respect to the corner 20a of the inspection object 20 can be stably held. For this reason, the film thickness of the corner | angular part 20a of the test target object 20 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure.

  Further, the contact portions 31a and 31b of the coating film thickness measurement jig 31, the contact portions 32a and 32b of the coating film thickness measurement jig 32, and the contact portions 33a and 33b of the coating film thickness measurement jig 33 are firstly connected. You may provide the adhering means of the coating-film-thickness measuring jig 1 which concerns on 1st Embodiment demonstrated. Thereby, the effect similar to the adhering means of the coating film thickness measuring jig 1 according to the first embodiment is obtained.

  In addition, when measuring the coating film thickness of a test object using the coating film thickness measurement jigs 31-33, the coating film thickness using the coating film thickness measurement jig 1 according to the first embodiment described above. Measurement can be performed in the same procedure as the measurement method.

  Next, a method for measuring the coating film thickness using the coating film thickness measuring jig 31 will be described. First, the abutting portions 31a and 31b are brought into contact with a calibration member having the same shape as the object to be inspected (fixed if there is a fixing means) (first step). Next, the tip of the probe P is brought into contact with the calibration member to calibrate the electromagnetic film thickness meter (second step). Note that the first step and the second step may be repeated a plurality of times as necessary. Next, the coating film thickness measuring jig 31 is removed from the calibration member, and the contact portions 31a and 31b are brought into contact with the object to be inspected (fixed when there is a fixing means) (third step). And the front-end | tip part of the probe P is made to contact | abut to the test object site | part of a test object, and the coating film thickness of a test object site | part is measured (4th process). Thereby, the same effect as the coating film thickness measuring method using the coating film thickness measuring jig 1 according to the first embodiment can be obtained. The coating film thickness measurement method using the coating thickness measurement jigs 32 and 33 is the same.

  Here, the coating film thickness measuring jig 31 (see FIG. 7-1) in which a hole 31d having an angle of 0 ° with the contact portion 31b is formed, and a hole having an angle of 22.5 ° with the contact portion 32b. The coating film thickness measurement jig 32 (see FIG. 7-2) in which 32d is formed, and the coating film thickness measurement jig 33 (see FIG. 7-3) in which a hole 33d having an angle of 45 ° with the contact portion 33b is formed. However, it may be a coating film thickness measurement jig in which a plurality of holes having different angles with respect to one member are formed. Thereby, it is possible to measure the coating film thickness from a plurality of angles at the corners of the inspection object with a single coating film thickness measurement jig.

  Next, a third embodiment of the present invention will be described. FIG. 7-4 is a side view of the coating film thickness measurement jig according to the third embodiment of the present invention. The coating film thickness measuring jig 34 has a generally square-shaped side view shape. The coating film thickness measuring jig 34 has contact portions 34a and 34b on its inner peripheral side. In the present embodiment, the corner portion 23a, which is the inspection target portion of the inspection target object 23, is subjected to cut processing such as 2C, and has a chamfered surface. The contact portion 34a and the contact portion 34b are orthogonal to each other, and are disposed so as to contact the surfaces 23b and 23c orthogonal to each other with the corner portion 23a that is the inspection target portion of the inspection object 23 interposed therebetween. The contact portions 34a and 34b have a form of contacting the surfaces 23b and 23c by a surface or a form of contacting by a plurality of points or lines. The contact portions 34a and 34b that are in contact with the surfaces 23b and 23c at a plurality of points or lines, when the points or lines that contact the surfaces 23b and 23c are placed on a virtual surface, Are orthogonal to each other. When the surfaces 23b and 23c are orthogonal, the contact portions 34a and 34b are formed to be orthogonal, but when the surfaces 23b and 23c are not orthogonal, the contact portions 34a and 34b are the surfaces 23b and 23b. It is formed to make the same angle as the angle 23c. That is, the coating film thickness measurement jig 34 is installed on the inspection object 23 so that the intersection of the contact portions 34a and 34b is perpendicular to the chamfered surface of the corner portion 23a.

  A hole 34d is formed so as to communicate with a crossing portion of the contact portion 34a and the contact portion 34b from a surface 34c on the outer peripheral side of the coating film thickness measuring jig 34 and facing the contact portion 34a. Yes. A probe P of an electromagnetic film thickness meter is inserted into the hole 34d. In a state where the probe P is inserted into the hole 34d, the axis X, which is the measurement reference of the probe P, is arranged perpendicular to the chamfered surface 23a of the corner 23a of the inspection object 23. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the chamfered surface of the corner 23 a of the inspection object 23. As shown in FIG. 7-4, in a state where the probe P is inserted into the hole 34d, the surface 23c of the inspection object 23 and the axis X of the probe P are in a 45 ° relationship. It is said that the angle formed by P is 45 °. When measuring the coating film thickness, the probe P is urged in the direction of the axis X toward the corner 23a, and the tip of the probe P is applied to the corner 23a of the inspection object 23. It is brought into contact with a coating film (not shown).

  According to the coating film thickness measurement jig 34, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the chamfered surface of the corner 23 a of the inspection object 23. In this way, the relative position of the probe P with respect to the corner 23a of the inspection object 23 can be stably held. For this reason, the film thickness of the corner 23a of the inspection object 23 can be accurately measured. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure.

  Further, the abutting portions 34a and 34b of the coating film thickness measuring jig 34 may be provided with the fixing means for the coating film thickness measuring jig 1 according to the first embodiment described above. Thereby, the effect similar to the adhering means of the coating film thickness measuring jig 1 according to the first embodiment is obtained.

  In addition, when measuring the coating film thickness of a test object using the coating film thickness measurement jig 34, the coating film thickness measurement method using the coating film thickness measurement jig 1 which concerns on 1st Embodiment demonstrated previously. The measurement can be performed in the same procedure as.

  Next, a method for measuring the coating film thickness using the coating film thickness measuring jig 34 will be described. First, the abutting portions 34a and 34b are abutted (fixed if there is a fixing means) on a calibration member having the same shape as the object to be inspected (first step). Next, the tip of the probe P is brought into contact with the calibration member to calibrate the electromagnetic film thickness meter (second step). Note that the first step and the second step may be repeated a plurality of times as necessary. Next, the coating film thickness measuring jig 34 is removed from the calibration member, and the contact portions 34a and 34b are contacted (fixed if there is a fixing means) (third step). And the front-end | tip part of the probe P is made to contact | abut to the test object site | part of a test object, and the coating film thickness of a test object site | part is measured (4th process). Thereby, the same effect as the coating film thickness measuring method using the coating film thickness measuring jig 1 according to the first embodiment can be obtained.

  Next, a fourth embodiment of the present invention will be described. FIG. 8-1 is a plan view of a coating film thickness measuring jig according to the fourth embodiment of the present invention. In the present embodiment, the present invention is applied to a film thickness measuring jig at a corner of a bolt head. As shown in FIG. 8A, the coating film thickness measuring jig 41 includes a first member 42 and a second member 43.

  The first member 42 has a generally U-shaped plan view shape. The first member 42 has contact portions 42a and 42b on the inner peripheral side thereof. The abutting portion 42a and the abutting portion 42b intersect at an angle of approximately 120 °, and the coating film thickness measuring jig 41 is an inspection target portion of the bolt 61 whose abutting portions 42a and 42b are inspection objects. Are arranged so as to abut on surfaces 61b and 61c that intersect at an angle of about 120 ° with the corner portion 61a therebetween. The abutting portions 42a and 42b have a form of abutting on the surfaces 61b and 61c with a surface, or abutting with a plurality of points or lines. The contact portions 42a and 42b configured to contact the surfaces 61b and 61c at a plurality of points or lines are arranged in such a manner that the points or lines that contact the surfaces 61b and 61c are placed on virtual surfaces. Will intersect at an angle of 120 °.

  The outer peripheral surface 42 c of the first member 42 has an arcuate plan view shape with the center 42 d of the corner 61 a of the bolt 61 as the axis (center). The second member 43 is attached to the outer peripheral surface 42 c of the first member 42. The second member 43 is formed in an arc shape in which a surface that contacts the outer peripheral surface 42c of the first member 42 is recessed so as to follow the arc shape of the surface 42c. The second member 43 has a configuration similar to that of the coating film thickness measuring jig 1 according to the first embodiment described above with respect to the first member 42, and the center 42 d of the corner 61 a of the bolt 61 is pivoted. It moves in the CD direction in the figure as (center). Thus, the second member 43 can be rotated clockwise and counterclockwise in the drawing along the surface 42c of the first member 42 with the center 42d of the corner 61a of the bolt 61 as the axis (center). It is. The second member 43 penetrates in a direction perpendicular to the axis of the center 42d of the corner 61a of the bolt 61, and is formed with a hole 43c communicating with the intersection of the contact portions 42a and 42b. In this hole 43c, a probe P of an electromagnetic film thickness meter is inserted. In a state in which the probe P is inserted into the hole 43c, the axis X that is a measurement reference of the probe P is arranged to be orthogonal to the axis of the center 42d of the corner portion 61a of the bolt 61. That is, the axis X that is the measurement reference of the probe P is held in an arrangement perpendicular to the ridgeline of the corner 61 a of the bolt 61. As shown in FIG. 8A, in a state where the probe P is inserted into the hole 43c, the surface 61c of the bolt 61 and the axis X of the probe P are in a relationship of 60 °. It is said that the angle formed is 60 °. Then, when measuring the coating film thickness, the probe P is urged in the direction of the axis X toward the corner portion 61 a, and the tip portion of the probe P is applied to the corner portion 61 a of the bolt 61. (Not shown). The second member 43 may be continuously rotatable along the surface 42c of the first member 42, or by providing a notch or the like between the first member 42 and the second member 43. The angle between the surface 61c of the bolt 61 and the axis X of the probe P may be rotatable in a stepwise manner so as to be a predetermined angle (for example, 0 °, 30 °, 60 °, etc.).

  Engaging portions 42e and 42f extend at the ends of the surfaces 42a and 42b of the first member 42, respectively. The distal end portions of the engaging portions 42e and 42f are engaged with surfaces 61e and 61f that sandwich the corner portion 61d facing the inspection target region 61a, respectively. The coating thickness measurement jig 41 is stably fixed to the bolt 61 by the engaging portions 42e and 42f.

  Thus, according to the coating film thickness measurement jig 41, the axis X, which is the measurement reference of the probe P, is held in an arrangement orthogonal to the ridgeline of the corner 61a of the bolt 61. Thus, the relative position of the probe P with respect to the corner portion 61a of the bolt 61 can be stably held. For this reason, the film thickness of the corner | angular part 61a of the volt | bolt 61 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure. Moreover, according to the coating film thickness measuring jig 41, the angle formed by the surface 61c of the bolt 61 and the axis X of the probe P can be easily changed, and the coating film thickness of the corner portion 61a can be changed at various angles. It can be measured. In the present embodiment, the case where the inspection object is a bolt has been described, but the inspection object may be a nut. The coating film thickness measuring jig 41 may be configured not to have the second member 43, that is, the axis X that is the measurement reference of the probe P is the bolt 61 with respect to the first member 42. A hole for inserting the probe P may be provided so as to be orthogonal to the ridge line of the corner 61a.

  In addition, when measuring the coating film thickness of a test object using the coating film thickness measurement jig 41, the coating film thickness measurement method using the coating film thickness measurement jig 1 according to the first embodiment described above. The measurement can be performed in the same procedure as.

  Next, a method for measuring the coating film thickness using the coating film thickness measuring jig 41 will be described. First, the abutting portions 42a and 42b of the first member 42 are brought into contact with the calibration member having the same shape as the object to be inspected (fixed if there is a fixing means) (first step). Next, the tip of the probe P is brought into contact with the calibration member to calibrate the electromagnetic film thickness meter (second step). Note that the first step and the second step may be repeated a plurality of times as necessary. Next, the coating film thickness measuring jig 41 is removed from the calibration member, and the contact portions 42a and 42b of the first member 42 are brought into contact with the object to be inspected (fixed when there is a fixing means) (third). Process). And the front-end | tip part of the probe P is made to contact | abut to the test object site | part of a test object, and the coating film thickness of a test object site | part is measured (4th process). Thereby, the same effect as the coating film thickness measuring method using the coating film thickness measuring jig 1 according to the first embodiment can be obtained.

  Further, the abutting portions 42a and 42b of the coating film thickness measuring jig 41 may be provided with the fixing means for the coating film thickness measuring jig 1 according to the first embodiment described above. Thereby, the effect similar to the adhering means of the coating film thickness measuring jig 1 according to the first embodiment is obtained.

  Next, a modification of the third embodiment of the present invention will be described. FIG. 8-2 is a plan view of a coating film thickness measurement jig according to a modification of the third embodiment of the present invention. In the present embodiment, the present invention is applied to a film thickness measuring jig at a corner of a bolt head. The coating film thickness measuring jig 71 includes a first member 72 and a second member 73 as shown in FIG. In this embodiment, the corner | angular part of the volt | bolt 81 which is a test object does not have R.

  The first member 72 has a generally U-shaped plan view shape. The first member 72 has contact portions 72a and 72b on the inner peripheral side thereof. The contact portion 72a and the contact portion 72b intersect at an angle of approximately 120 °, and the coating film thickness measuring jig 71 is the inspection target portion of the bolt 81 whose contact portions 72a and 72b are inspection targets. Are arranged so as to be in contact with surfaces 81b and 81c that intersect at an angle of approximately 120 ° with the corner portion 81a therebetween. The contact portions 72a and 72b have a form of contacting the surfaces 81b and 81c with a surface, or a form of contacting with a plurality of points or lines. The abutting portions 72a and 72b configured to abut against the surfaces 81b and 81c at a plurality of points and lines are arranged so that the points and lines that abut against the surfaces 81b and 81c are placed on virtual surfaces. Will intersect at an angle of 120 °.

  The outer peripheral surface 72c of the first member 72 has an arcuate plan view shape with the intersecting portion 72d of the contact portions 72a and 72b as an axis (center). The second member 73 is attached to the outer peripheral surface 72 c of the first member 72. The second member 73 is formed in an arc shape in which a surface that contacts the outer peripheral surface 72c of the first member 72 is recessed so as to follow the arc shape of the surface 72c. The second member 73 has an intersection 72d between the contact portions 72a and 72b with respect to the first member 72 with the same configuration as the coating film thickness measuring jig 1 according to the first embodiment described above. It moves in the CD direction in the figure as an axis (center). As described above, the second member 73 rotates clockwise and counterclockwise in the drawing along the surface 72c of the first member 72, with the intersecting portion 72d of the contact portions 72a and 72b as an axis (center). Is possible. The second member 73 penetrates in a direction perpendicular to the intersecting portion 72d of the contact portions 72a and 72b, and has a hole 73c communicating with the intersecting portion 72d of the contact portions 72a and 72b. In this hole 73c, a probe P of an electromagnetic film thickness meter is inserted. In a state where the probe P is inserted into the hole 73c, the axis X, which is a measurement reference for the probe P, is arranged perpendicular to the intersecting portion 72d of the contact portions 72a and 72b. That is, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 81 a of the bolt 81. As shown in FIG. 8B, in a state where the probe P is inserted into the hole 43c, the surface 81c of the bolt 81 and the axis X of the probe P are in a relationship of 60 °. It is said that the angle formed is 60 °. When measuring the coating film thickness, the probe P is urged in the direction of the axis X toward the corner portion 81a, and the tip portion of the probe P is applied to the corner portion 81a of the bolt 81. (Not shown). The second member 73 may be continuously rotatable along the surface 72c of the first member 72, or by providing a notch or the like between the first member 72 and the second member 73. The angle between the surface 81c of the bolt 81 and the axis X of the probe P may be rotatable stepwise so that the angle is a predetermined angle (for example, 0 °, 30 °, 60 °, etc.).

  Engaging portions 72e and 72f extend at the ends of the surfaces 72a and 72b of the first member 72, respectively. The distal ends of the engaging portions 72e and 72f are engaged with surfaces 81e and 81f that sandwich the corner portion 81d that faces the inspection target portion 81a, respectively. The coating film thickness measuring jig 71 is stably fixed to the bolt 81 by the engaging portions 72e and 72f.

  Thus, according to the coating film thickness measurement jig 71, the axis X that is the measurement reference of the probe P is held in an arrangement orthogonal to the ridgeline of the corner 81a of the bolt 81. Thus, the relative position of the probe P with respect to the corner 81a of the bolt 81 can be stably held. For this reason, the film thickness of the corner | angular part 81a of the volt | bolt 81 can be measured correctly. As a result, it is possible to easily measure the coating film thickness at the corners of the inspection object, which has conventionally been impossible to measure. In addition, according to the coating film thickness measuring jig 71, the angle formed by the surface 81c of the bolt 81 and the axis X of the probe P can be easily changed, and the coating film thickness of the corner 81a can be changed at various angles. It can be measured. In the present embodiment, the case where the inspection object is a bolt has been described, but the inspection object may be a nut. The coating film thickness measuring jig 71 may be configured not to have the second member 73, that is, the axis X that is the measurement reference of the probe P is the bolt 81 with respect to the first member 72. A hole for inserting the probe P may be provided so as to be orthogonal to the ridge line of the corner portion 81a.

  In addition, when measuring the coating film thickness of a test object using the coating film thickness measurement jig | tool 71, the coating film thickness measurement method using the coating film thickness measurement jig | tool 1 which concerns on 1st Embodiment demonstrated previously. The measurement can be performed in the same procedure as.

  Next, a method for measuring the coating film thickness using the coating film thickness measuring jig 71 will be described. First, the abutting portions 72a and 72b of the first member 72 are brought into contact with the calibration member having the same shape as the object to be inspected (fixed if there is a fixing means) (first step). Next, the tip of the probe P is brought into contact with the calibration member to calibrate the electromagnetic film thickness meter (second step). Note that the first step and the second step may be repeated a plurality of times as necessary. Next, the coating film thickness measuring jig 71 is removed from the calibration member, and the contact portions 72a and 72b of the first member 72 are brought into contact with the object to be inspected (fixed if there is a fixing means) (third). Process). And the front-end | tip part of the probe P is made to contact | abut to the test object site | part of a test object, and the coating film thickness of a test object site | part is measured (4th process). Thereby, the same effect as the coating film thickness measuring method using the coating film thickness measuring jig 1 according to the first embodiment can be obtained.

  Further, the abutting portions 72a and 72b of the coating film thickness measuring jig 71 may be provided with the fixing means for the coating film thickness measuring jig 1 according to the first embodiment described above. Thereby, the effect similar to the adhering means of the coating film thickness measuring jig 1 according to the first embodiment is obtained.

1, 31-33, 41, 71 Paint film thickness measuring jig 2, 42 First member 3, 43 Second member 4, 7, Permanent magnet 5, 6, 8, 9 Metal piece 20-22 Inspection object P Probe 61, 81 bolt

Claims (5)

Two abutting portions that respectively abut against two surfaces sandwiching a corner that is an inspection target portion of the inspection object;
Communicating with the intersection of the two abutting portions, a hole into which the probe of the electromagnetic film thickness meter is inserted,
Have
A film thickness measuring jig, wherein the corner and the probe are brought into contact with each other so that the corner and the axis of the probe are in a predetermined relative position. A first member having the two contact portions;
A second member having the hole into which the probe can be inserted, which is rotatable about the axis of the inspection target portion of the inspection target or the intersection of the two contact portions;
The film thickness measuring jig according to claim 1, comprising:   The film thickness measuring jig according to claim 1, further comprising a fixing unit that fixes itself to the inspection object.   The film thickness measuring jig according to claim 3, wherein the fixing means is a magnet, a suction cup, or an engaging portion that engages with the inspection object. A first step of bringing the film thickness measurement jig according to any one of claims 1 to 4 into contact with a calibration member having a portion having substantially the same shape as the inspection target portion;
A second step of calibrating the electromagnetic film thickness meter;
A third step of bringing the film thickness measuring jig into contact with the inspection target site;
A fourth step of measuring the film thickness of the site to be inspected using the electromagnetic film thickness meter;
A film thickness measuring method comprising:

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