JP6369646B1 - Film thickness alignment tool - Google Patents

Abstract

  Provided is a film thickness meter alignment jig used together with a measurement jig mounted on a film thickness meter probe. The measurement jig includes a slide member to which the probe is fixed, and a guide member that supports the slide member so as to slide and has a flat surface on the side that approaches the measurement object. The alignment jig is in surface contact with the housing portion in which the guide member is housed, a base body having an opening surface through which the tip of the probe passes on the flat surface side, and the first outer surface of the measurement object extending from the base body. A first contact member having a first contact surface, a second contact member having a second contact surface extending from the first contact member of the opening surface and in surface contact with the third outer surface of the measurement object, and the first contact A positioning mechanism is provided for adjusting the position of the surface with respect to the base and the position of the second contact surface with respect to the base.

Description

  The present invention relates to an alignment jig for a film thickness meter.

  Patent Document 1 describes a coating film thickness measurement jig that measures the coating film thickness at the corners of an inspection object. The coating film thickness measurement jig includes a first member having two contact portions that contact two surfaces sandwiching a corner portion that is an inspection target portion of the inspection target, and a corner that is an inspection target portion of the inspection target. And a second member having a hole communicating with an intersecting portion of two contact portions into which a probe of the electromagnetic film thickness meter is inserted.

  In Patent Document 2, an electromagnetic film thickness meter is used to determine the thickness of a nonmagnetic film covering each of a plurality of strands made of a ferromagnetic material constituting a stranded wire using a film thickness measuring device. It describes the jig used when measuring. The jig has a holding portion for holding a stranded wire, and an insertion port into which a probe of an electromagnetic film thickness meter is inserted. The detection portion of the probe inserted from the insertion port is directly opposed to the surface of the strand. And a guide unit that guides the surface toward the surface while keeping the state in contact with the surface or the nonmagnetic film.

JP 2013-19760 A JP 2008-51734 A

  In measuring the film thickness with a film thickness meter (electromagnetic (electromagnetic induction type) film thickness meter, eddy current film thickness meter), in order to obtain sufficient measurement accuracy, as shown in FIG. It is necessary to press perpendicularly to the surface of the measurement object 2 (so that the central axis of the probe 52 is perpendicular to the surface of the measurement object 2), and the tip of the probe 52 is measured against the measurement object 2 It needs to be accurately applied to the site.

  Here, for example, in an electric power company, when inspecting electric power equipment, a film thickness meter is used to measure the plating film thickness applied to the surface of the electric power equipment. However, it is not always easy to press the probe perpendicularly to the surface of the measurement object. In addition, there are various types of measurement objects in the field, but depending on the form of the measurement object, it may be difficult to accurately touch the tip of the probe to the measurement target region.

  The present invention has been made to solve these problems, and it is possible to improve the working efficiency in measuring the film thickness using the film thickness meter, and to ensure the measurement accuracy, and to ensure the measurement accuracy. The purpose is to provide.

  One of the present invention for achieving the above object is an alignment jig of a film thickness meter, comprising a rod-shaped magnetic core and a coil wound around the magnetic core, and an end of the magnetic core A slide member to which a probe of a film thickness meter for measuring a film thickness is measured based on a change in magnetic flux passing through the coil when the probe is brought close to a measurement object, and the slide member to which the probe is fixed includes the magnetic core. A guide member that is supported so as to slide in the axial direction of the magnetic core, and the guide member has a flat surface perpendicular to the axis of the magnetic core on the side of the magnetic core that is close to the measurement object. An accommodation portion used together with a measuring jig and accommodating the guide member fitted therein, and an opening through which the tip of the probe passes on the flat surface side when the guide member is fitted in the accommodation portion Have face A first contact member having a first contact surface provided on one side of the opening surface and extending from the base, and a side of the opening surface on which the first contact member extends. A second contact member having a second contact surface provided extending from the base on the other side, wherein the first contact member has a plurality of continuous first contact surfaces via a ridgeline. The measurement object having an outer surface is provided so as to be in surface contact with a first outer surface which is one of the outer surfaces of the measurement object, and the opening surface is formed by the flat surface of the guide member fitted into the housing portion. The second contact member is provided on the first outer surface so as to face a second outer surface that is continuous via a ridgeline, and the second contact member has a second contact surface that is continuous with the second outer surface via a ridgeline. 3 The base of the first contact surface provided so as to be in surface contact with the outer surface Provided the position and the positioning mechanism for adjusting the position relative to the base of said second contact surface against.

  According to the present invention, when measuring the film thickness using the measuring jig, the tip of the probe can be accurately applied to the measurement point of the measurement object (bolt head, nut, etc.) with a simple operation. In addition, the alignment jig of the present invention can cope with various types of measurement objects by a positioning mechanism.

  Another aspect of the present invention is the above-described alignment jig, wherein the first contact surface and the second contact surface are symmetrical with respect to the position of the tip of the probe passing through the opening surface. Thus, an operation control mechanism for controlling the operation of the positioning mechanism is provided.

  According to the present invention, the operation of the positioning mechanism can be controlled so that the first contact surface and the second contact surface have a symmetrical relationship with the position of the tip of the probe passing through the opening surface as the center. By operation, the tip of the probe can be accurately applied to the measurement point.

  Another one of the present invention is the alignment jig, wherein the first contact member has a first bent portion that extends along a shape of an outer surface of the measurement object, and the second contact member. The contact member has a second bent portion that extends along the shape of the outer surface of the measurement object.

  Thus, the first contact member has a first bent portion that extends along the shape of the outer surface of the measurement object, and the second contact member has a second bend that extends along the shape of the outer surface of the measurement object. Since the measurement object is held securely by the alignment jig when measuring the film thickness, the tip of the probe can be accurately applied to the measurement point by preventing the alignment jig and the measurement object from being displaced. it can.

  Another aspect of the present invention is the above-described alignment jig, wherein the operation control mechanism includes a first rack provided continuously to the first contact member, and the second contact member continuous to the second contact member. A second rack provided in parallel with the first rack; and a pinion engaged so that the first rack and the second rack face each other.

  Another one of the present invention is the alignment jig, wherein the guide member is a cylindrical body, the flat surface constitutes an end surface of the cylindrical body of the guide member, and the slide member is The outer shape of the guide member is slidable in close contact with the internal space of the cylindrical body.

  Another aspect of the present invention is the above-described alignment jig, wherein the slide member is in contact with a convex portion protruding from the outer periphery of the probe when the slide member is slid in the direction of the measurement object. It has a structure that acts to contact and move the probe in the direction of the measurement object.

  Another one of the present invention is the alignment jig, wherein the first flat surface is formed by sliding the slide member in the direction of the measurement object along the axial direction of the magnetic core. It has a through hole that penetrates the tip of the probe.

  Another aspect of the present invention is the above-described measurement jig, wherein the film thickness meter is an electromagnetic induction film thickness meter or an eddy current film thickness meter.

  Another aspect of the present invention is the above-described alignment jig, wherein the measurement object is a head of a hexagon bolt or a hexagon nut.

  In addition, the subject which this application discloses, and its solution method are clarified by the column of the form for inventing, and drawing.

  ADVANTAGE OF THE INVENTION According to this invention, while improving the working efficiency in the film thickness measurement using a film thickness meter, a measurement precision can be ensured.

It is a figure explaining the measurement principle of a film thickness meter. It is a figure which shows the external appearance of a film thickness meter. It is a figure (block diagram) which shows the structure of the main body apparatus of a film thickness meter. It is a figure which shows the function with which a main body apparatus is provided, and the data which a main body apparatus memorize | stores. It is an example of calibration data (a calibration curve in this example). It is a side view of a probe. It is sectional drawing of a probe. It is a figure which shows a mode that the front-end | tip of a probe is pressed on the measuring object. It is a perspective view which shows the structure of a slide member. It is a perspective view which shows the structure of a guide member. It is a perspective view which shows the state which attached the probe to the slide member. It is a figure which shows a mode that the slide member which attached the probe is inserted in the guide member. It is a figure which shows the state which attached the guide member to the slide member. It is a figure which shows a mode that the surface of a measurement object and the outer surface of the end surface of a guide member are surface-contacted. It is a figure which shows a mode that the surface of a measurement object and the outer surface of the end surface of a guide member are surface-contacted. It is a figure (side view) which shows the other structure of a probe. It is a figure which shows a mode that the front-end | tip of the probe shown in FIG. 14 is pressed on the surface of a measuring object. It is a perspective view which shows the state which attached the probe shown in FIG. 14 to the slide member shown in FIG. It is the figure which looked at the slide member shown in FIG. 16 from -y direction. It is a perspective view of an alignment jig. It is a disassembled perspective view of an alignment jig. It is the figure which looked at the alignment jig | tool of the state which set the width adjustment knob to the position of the minimum width from upper direction (+ z direction). (A), (b) is the figure which looked at the alignment jig | tool from the front direction (+ x direction), (a) is the state which set the width adjustment knob to the position of the minimum width, (b) is width adjustment. The knob is set to the maximum width position. It is the figure which looked at the alignment jig | tool from the side surface direction (+ y direction). It is the figure which looked at the alignment jig | tool of the state which set the width adjustment knob to the position of the maximum width from upper direction (+ z direction). It is a figure which shows a mode at the time of mounting | wearing a positioning jig with a positioning jig. It is a perspective view which shows the state with which the measurement jig | tool was mounted | worn with the alignment jig | tool. It is the figure which looked at the alignment jig | tool with the measurement jig | tool mounted from the upper direction (+ z direction). It is a perspective view which shows the other structure of a guide member. It is a figure which shows a mode that the measuring jig of another structure was mounted | worn with the positioning jig of another structure. It is a figure which shows a mode that it presses so that the front-end | tip of a probe may become perpendicular | vertical with respect to the surface of a measurement object (a center axis | shaft of a probe is perpendicular | vertical with respect to the surface of a measurement object).

  Hereinafter, embodiments for carrying out the invention will be described in detail. In the following description, the same or similar components may be denoted by the same reference numerals and redundant description may be omitted.

  First, the principle and configuration of a film thickness meter to which the measurement jig of the present invention is applied will be described. Hereinafter, an electromagnetic induction type film thickness meter will be described as an example. However, the measurement jig of the present invention measures the film thickness by using electromagnetic interaction with a measurement object (substrate, coating). It can be widely applied to types of film thickness meters, such as eddy current film thickness meters (eddy current amplitude sensitive film thickness meters), eddy current phase film thickness meters (eddy current phase displacement sensitive film thickness meters), etc. it can.

<Measurement principle>
First, the measurement principle of the electromagnetic induction type film thickness meter will be described with reference to FIG. The film thickness meter is used, for example, for measuring the film thickness of the measuring object 2 in which the coating 22 is applied to the surface of the substrate 21. Here, the substrate 21 is a magnetic material such as iron, steel, or ferritic stainless steel, and the coating 22 is a nonmagnetic coating such as plating (zinc plating or the like), paint, or resin film.

  As shown in the figure, the probe 52 of the film thickness meter has a structure in which a primary coil 31 and a secondary coil 32 are coaxially wound around a rod-shaped magnetic core 520 made of a ferromagnetic material such as iron. When the end of the probe 52 (magnetic core 520) (the end of the magnetic core 520 on the secondary coil 32 side) is brought close to the surface of the measurement object 2 while an alternating current flows through the primary coil 31, the probe 52 (magnetic core 520) The number of magnetic fluxes 4 penetrating the secondary coil 32 changes according to the distance between the end and the measurement object 2, and the voltage V induced in the secondary coil 32 changes. The voltage change ΔV is acquired as, for example, a current change ΔI, and the acquired current change ΔI is compared with calibration data (conversion data between a measured value and a film thickness value) prepared in advance, thereby The thickness, that is, the film thickness can be obtained.

<Film thickness meter>
FIG. 2 shows the appearance of an electromagnetic induction film thickness meter (hereinafter referred to as film thickness meter 5). The film thickness meter 5 is portable and can be used by the user by bringing it to the site. As shown in the figure, the film thickness meter 5 includes a main body device 51, a probe 52, and a cable 53 (cord). The probe 52 is electrically connected to the main body device 51 via a cable 53 (cord).

  The main device 51 includes a user interface for the user to perform operation input, confirmation of measurement results, and the like when measuring the film thickness. The cable 53 includes, for example, wiring for supplying an alternating current from the main unit 51 to the primary coil 31 of the probe 52, and a measured value of a current flowing through the secondary coil 32 (or a voltage induced in the secondary coil 32). Wiring for transmitting a signal (hereinafter referred to as a measurement signal) to the main unit 51, wiring for transmitting a signal indicating the timing for acquiring the measurement value (hereinafter referred to as a trigger signal), and the like are included.

  FIG. 3 shows the configuration of the main device 51. As shown in the figure, the main device 51 includes a processor 511, a storage device 512, a power supply circuit 513, an input device 514, an output device 515, and an A / D converter 516.

  The processor 511 is configured using, for example, a CPU (Central Processing Unit) or an MPU (Micro Processing Unit). The storage device 512 is configured using a RAM (Random Access Memory), a ROM (Read Only Memory), an NVRAM (Non-Volatile RAM), or the like.

  The power supply circuit 513 includes a battery (primary battery, secondary battery), a DC / DC converter, a DC / AC inverter, and the like, and power necessary for operating the main body device 51 and the probe 52 (AC supplied to the primary coil 31). Including power).

  The input device 514 is a user interface that receives input of information from the user, and is a keypad, a touch panel, or the like. The output device 515 is a user interface that provides information to the user, and is an LCD (Liquid Crystal Display), a printing device, an audio output device, or the like.

  The A / D converter 516 converts a signal input as an analog value from the probe 52 into a digital value.

  FIG. 4 shows functions included in the main device 51 and data stored in the main device 51. As shown in the figure, the main device 51 includes functions of a calibration processing unit 521, a measurement processing unit 522, a film thickness calculation unit 523, and a result output unit 524. These functions are realized by the processor 511 of the main device 51 reading out and executing a program stored in the storage device 512 or by hardware provided in the main device 51. As shown in the figure, the main device 51 stores calibration data 531 and measurement values 532.

  Among the above functions, the calibration processing unit 521 is obtained by, for example, measuring the film thickness of several standard plates in which the coating 22 is applied to the same quality base material 21 with different thicknesses (≧ 0). Based on the relationship between the current change ΔI (or voltage change ΔV) of 32 and the film thickness, calibration data 531 (calibration curve) is generated.

  The measurement processing unit 522 obtains the current change ΔI (or voltage change ΔV) of the secondary coil 32 based on the measurement signal input from the probe 52, and stores the obtained value as the measurement value 532.

  FIG. 5 shows an example of calibration data 531 (calibration curve). In the figure, the vertical axis represents the measured value 532 (current change ΔI), and the horizontal axis represents the film thickness. Since the calibration data 531 varies depending on the material of the measurement object 2 (material of the substrate 21 and the coating 22), the calibration data 531 is prepared for each different material of the measurement object 2.

  Returning to FIG. 4, the film thickness calculation unit 523 obtains the film thickness of the measurement object 2 by comparing the measurement value 532 with the calibration data 531. For example, the film thickness calculation unit 523 obtains an average value of a plurality of measurement values 532 obtained by performing a plurality of measurements, and obtains a film thickness corresponding to the obtained average value from the calibration data 531. . The result output unit 524 outputs the film thickness obtained by the film thickness calculation unit 523 to the output device 515.

  In addition to the above functions, the calibration processing unit 521, the measurement processing unit 522, the film thickness calculation unit 523, and the result output unit 524 have a function of receiving settings and instructions for the main body device 51 from the user at any time via the input device 514, It has a function of providing information to the user as needed via the output device 515.

  6A is a side view of the probe 52, and FIG. 6B is a cross-sectional view of the probe 52 (a cross-sectional view taken along line X-X ′ in FIG. 6A). As shown in these drawings, the appearance of the probe 52 is substantially cylindrical. The probe 52 is knurled on at least a part of the surface thereof, and a probe main body 61 constituting a portion of a predetermined length along the longitudinal direction from the tip of the probe 52, and the probe main body 61 on the cable 53 side. A cap 62 (see FIG. 6B) provided, and a cap cover 63 made of a material such as a resin that protects the cap 62 and the ends of the cable 53. On the outer periphery of the probe main body 61, a convex portion 617 concentric with the probe main body 61 (flange shape) is formed.

  As shown in FIG. 6B, the probe main body 61 is a substantially cylindrical outer cylinder 611, and is substantially accommodated coaxially with the outer cylinder 611 (coaxial with the central axis C of the probe 52) inside the outer cylinder 611. And a cylindrical inner cylinder 612. A cylindrical coil bobbin 613 disposed coaxially with the inner cylinder 612 is accommodated near the tip of the probe main body 61 (inner cylinder 612). A second bobbin 6132 around which the secondary coil 32 is wound is provided at a position of the coil bobbin 613 near the tip of the probe main body 61. A first bobbin 6131 around which the primary coil 31 is wound is provided at a position of the coil bobbin 613 closer to the cable 53 than the second bobbin 6132. In the figure, the primary coil 31 and the secondary coil 32 are omitted.

  A through hole 6135 having a predetermined diameter is formed in the central portion of the coil bobbin 613 along the central axis of the coil bobbin 613 (coaxial with the central axis C of the probe 52). A rod-like (columnar or the like) magnetic core 520 made of a ferromagnetic material such as iron is inserted into the through-hole 6135 so that the central axis thereof is coaxial with the central axis C of the probe 52.

  A connector 615 to which the end of the wiring 631 of the cable 53 is connected is provided at a position closer to the cable 53 than the coil bobbin 613 of the inner cylinder 612. The primary coil 31 and the secondary coil 32 and the wiring 631 of the cable 53 are electrically connected through a connector 615.

  A spring mechanism 64 is provided between the inner cylinder 612 and the outer cylinder 611. The inner cylinder 612 is urged toward the tip of the probe 52 by the spring mechanism 64. Thereby, the end surface of the inner cylinder 612 and the tip of the magnetic core 520 are held in a state of slightly projecting (for example, about several mm) from the end surface 6111 of the outer cylinder 611 along the central axis C.

  A switch 65 (electrical contact) is provided on the cap 62 side of the inner cylinder 612. The switch 65 is configured such that the contact state (ON or OFF) is reversed when the inner cylinder 612 is pushed into the outer cylinder 611 against the urging force of the spring mechanism 64. The switch 65 generates the trigger signal described above. The switch 65 is electrically connected to the main body device 51 via the wiring 631 of the cable 53. The function equivalent to that of the switch 65 can be realized by using other types of elements such as a piezoelectric element.

  FIG. 7 shows a state in which the tip of the probe 52 (the tip of the magnetic core 520 protruding from the probe 52) is pressed against the surface of the measurement object 2. As shown in the figure, when the tip of the probe 52 (the end surface of the inner cylinder 612) is pressed against the surface of the measurement object 2 against the urging force of the spring mechanism 64, the contact state of the switch 65 is reversed and the trigger signal is reversed. Is generated and input to the main device 51. The main unit 51 takes in the current value of the secondary coil 32 from the probe 52 at the timing when the trigger signal is input.

<Configuration of measuring jig>
Next, the measurement jig 1 used by being attached to the probe 52 of the film thickness meter 5 will be described. The measurement jig 1 includes a slide member 11 and a guide member 12. A probe 52 is fixed to the slide member 11. The guide member 12 supports the slide member 11 to which the probe 52 is fixed so as to be slidable (slidable) in the direction of the central axis C of the probe 52 (the central axis of the magnetic core 520). The slide member 11 and the guide member 12 are made of, for example, hard resin or metal as a material. Note that the slide member 11 and the guide member 12 may be made of, for example, a transparent material in order to make it easy to visually recognize the internal state from the outside.

  FIG. 8 shows a configuration (perspective view) of the slide member 11. The entire slide member 11 has a substantially rectangular parallelepiped shape. As shown in the figure, one of the four side surfaces 111a to 111d (side surface 111a) of the rectangular parallelepiped is an opening surface. Further, the two end faces 112a and 112b of the rectangular parallelepiped are formed with notches 1121a and 1121b in a form (shape and size) that can accommodate just the outer diameter of the probe 52 on the opening face 111a side. ing. The two notches 1121a and 1121b are arranged so that the center axis C of the probe 52 (the center axis of the magnetic core 520) is parallel to the longitudinal direction of the slide member 11 by the user fitting the probe 52 firmly into them. That is, the central axis C is formed so as to be perpendicular (at right angles) to the flat outer surface (the surface on the -z side) of the end surface 112b. For this reason, the user easily fits the probe 52 into the two cutouts 1121a and 1121b, so that the center axis C of the probe 52 (the center axis of the magnetic core 520) is easily separated from the outer surface of the end face 112b (the surface on the −z side). It can be vertical (right angle). In the figure, each of the notches 1121a and 1121b is a combination of a semicircle (back side) and a rectangle (front side), but the form of the notches 1121a and 1121b is not limited to this.

  FIG. 9 shows a configuration (perspective view) of the guide member 12. The guide member 12 has a substantially rectangular parallelepiped overall shape. As shown in the figure, the internal space of the cylindrical body constituted by the four side surfaces 121a to 121d of the rectangular parallelepiped has a form (shape and size) in which the outer shape of the slide member 11 is just fit. Therefore, the slide member 11 can be slid with respect to the guide member 12 while the outer peripheral surfaces of the three side surfaces 111b to 111d are brought into close contact with the inner peripheral surface of the guide member 12.

  As shown in the figure, one of the two end faces 122a and 122b (end face 122a) of the rectangular parallelepiped is open. A through hole 1221 having a form (shape and size) through which the outer diameter of the probe 52 can pass is formed in the other end face 122b of the rectangular parallelepiped. The outer surface (the surface on the −z side) of the end surface 122b is a flat surface (hereinafter also referred to as a first flat surface), and this flat surface is perpendicular (perpendicular) to the longitudinal direction of the rectangular parallelepiped. The rectangular parallelepiped has a flat surface 124a and a flat surface 124b perpendicular (perpendicular) to the first flat surface on the + y side and the -y side (hereinafter, the flat surface 124b is also referred to as a second flat surface).

  A rectangular parallelepiped ridge 123a extending in parallel to the y-axis is formed at a predetermined position of the side surface 121a. Further, a rectangular parallelepiped ridge 123c extending in parallel to the y-axis is formed at a predetermined position of the side surface 121c facing the side surface 121c. The ridge portion 123a and the ridge portion 123c function as a user's handle when using the measurement jig 1. These also serve to regulate the position where the guide member 12 is fixed to the alignment jig 7 when the guide member 12 is fitted to the alignment jig 7 described later (the position at which the tip of the probe 52 contacts the measurement object 2). It plays the role of positioning).

  FIG. 10 shows a state in which the probe 52 is attached to the slide member 11. As shown in the figure, the probe 52 is attached to the slide member 11 by fitting into the notches 1121a and 1121b provided on the two end faces 112a and 112b of the slide member 11, respectively.

  For example, the probe 52 is fixed to the slide member 11 by tightening with a belt-like member 115 (for example, rubber, wire, binding band, etc.) fixed to the slide member 11 around one notch 1121a of the probe 52. Is done. The method for fixing the probe 52 to the slide member 11 is not necessarily limited to this method. For example, the probe 52 may be fixed to the slide member 11 by other methods such as screwing.

  The probe 52 is arranged so that the convex portion 617 protruding to the outer periphery of the probe 52 is in contact with the outer surface of the end surface 112b of the slide member 11 around the other notch 1121b, that is, the slide member 11 is above the convex portion 617. It is attached to the slide member 11 so as to be placed on the surface of the convex portion 617 on the cable 53 side. Therefore, when the user slides the slide member 11 in the direction of the measurement object 2 so as to bring the probe 52 closer to the measurement object 2, it is possible to apply a force to the probe 52 without fail. Can be easily and reliably brought close to the measurement object 2.

  As described above, the outer surface (the surface on the −z side) of the other end surface 122b of the guide member 12 is a flat surface, and the flat surface is perpendicular to the longitudinal direction of the rectangular parallelepiped of the guide member 12 ( (Right angle). Therefore, in a state where the probe 52 is fixed to the slide member 11, the central axis C of the probe 52 and the outer surface of the end surface 122 b of the guide member 12 are in a perpendicular (right angle) relationship.

<Measuring method of film thickness>
Next, a procedure for measuring the film thickness of the measurement object 2 by the film thickness meter 5 using the measurement jig 1 having the above configuration will be described.

  As shown in FIG. 11, the user first inserts the slide member 11 to which the probe 52 is fixed into the guide member 12 from the opening surface 122 a of the guide member 12, and attaches the guide member 12 to the slide member 11. As described above, the inner space of the guide member 12 has a form (shape and size) in which the slide member 11 can be accommodated. Therefore, the user slides the side surface of the slide member 11 along the guide member 12. The guide member 12 can be easily attached to the slide member 11 simply by making it.

  FIG. 12 shows a state in which the guide member 12 is attached (inserted) to the slide member 11. In this state, the through hole 1221 of the guide member 12 is located on the central axis C of the probe 52 (the central axis of the magnetic core 520). The diameter of the through hole 1221 is larger than the diameter of the probe 52. Therefore, the user can project the tip of the probe 52 from the outer surface (flat surface) of the end surface 122b to the −z side by sliding the slide member 11 in the direction of the end surface 122b of the guide member 12.

  Subsequently, as illustrated in FIG. 13A, the user brings the surface of the measurement object 2 into contact with the outer surface (flat surface) of the end surface 122 b of the guide member 12. As described above, since the center axis C of the probe 52 (center axis of the magnetic core 520) and the outer surface (flat surface) of the end surface 122b of the guide member 12 are perpendicular (at right angles), the user can The surface of the measuring object 2 and the outer surface (flat surface) of the end face 122b of the guide member 12 are brought into surface contact with each other, whereby the surface of the measuring object 2 and the central axis C of the probe 52 (the central axis of the magnetic core 520). Can be easily in a vertical (right angle) relationship.

  Subsequently, as illustrated in FIG. 13B, the user maintains the state in which the surface of the measurement object 2 and the outer surface (flat surface) of the end surface 122 b of the guide member 12 are in surface contact with each other, while the slide member 11 is maintained. Is slid in the direction of the measurement object 2 and the tip of the probe 52 is pushed in the direction of the surface of the measurement object 2. As a result, the inner cylindrical body 612 of the probe 52 is pushed into the outer cylindrical body 611 against the biasing force of the spring mechanism 64, and as a result, the contact state of the switch 65 is reversed and a trigger signal is input to the main body device 51. The

  In the case where measurement is continuously repeated on the surface of the same measurement object 2 (for example, when an average value of a plurality of measurement values is obtained), the user holds the guide member 12 with one hand. The slide member 11 is slid upward with the other hand while being pressed against the surface of the probe 52, the tip of the probe 52 is lifted about 10 mm from the surface of the measurement object 2, and the measurement is repeated by performing the above-described procedure again.

  As described above, according to the measurement jig 1 of the present embodiment, the user moves the slide member 11 while bringing the outer surface (flat surface) of the guide member 12 into surface contact with the surface of the measurement object 2. By sliding along the guide member 12, the tip of the magnetic core 520 is measured while maintaining the central axis C of the probe 52 (the central axis of the magnetic core 520) in a perpendicular (right angle) relationship with the surface of the measurement object 2. The object 2 can be approached. Therefore, the user can measure the film thickness of the surface of the measuring object 2 easily and with high accuracy by a simple operation.

  In addition, since the measurement jig 1 is configured such that the probe 52 is supported by the guide member 12 via the slide member 11, various types of probes can be obtained by preparing the slide member 11 in accordance with the form of the probe 52. 52 can be widely applied.

  Further, since the guide member 12 has a cylindrical shape, the user can easily hold the guide member 12 by hand at the time of measurement, and the measurement jig 1 of this embodiment is excellent in workability.

  Further, since the slide member 11 has a structure in which the probe 52 is fixed so as to coincide with the direction of the central axis of the magnetic core 520 of the probe 52 and the direction in which the slide member 11 slides, the user holds the probe 52 in the slide member 11. The direction of the central axis of the magnetic core 520 of the probe 52 and the direction in which the slide member 11 slides can be easily matched by simply attaching to the probe 52.

<Other configuration of probe>
FIG. 14 shows another configuration of the probe 52. As shown in the figure, the probe 52 has a plurality of concentric annular convex portions 617 on the outer cylinder 611. Among the plurality of convex portions 617, the outermost diameter of the lowermost convex portion 617a is slightly larger than that of the other convex portion 617b.

  In the figure, the line indicated by the symbol A is the end surface of the outer cylinder 611 (that is, the boundary between the outer cylinder 611 and the inner cylinder 612), and the inner cylinder is located above (+ z side) the line. The surface of 612 is exposed. Further, in the same figure, a portion protruding from the lower end surface of the outer cylindrical body 611 by a length d is continuous with the inner cylindrical body 612 inside the outer cylindrical body 611.

  FIG. 15 is a diagram illustrating a state in which the tip of the probe 52 illustrated in FIG. 14 is pressed against the surface of the measurement object 2. As shown in the figure, by pressing the tip of the probe 52 (tip of the magnetic core 520) against the surface of the measurement object 2, the tip of the probe 52 (tip of the inner cylinder 612) is brought into the outer cylinder 611. Recessed, a gap (length is d) indicated by AA ′ in FIG.

  16 and 17 are views showing a state where the probe 52 shown in FIG. 14 is attached to the slide member 11 shown in FIG. 8, FIG. 16 is a perspective view thereof, and FIG. 17 is a slide member shown in FIG. 11 is a view of 11 viewed from the −y direction.

  As shown in these drawings, the probe 52 is arranged so that the convex portion 617a protruding from the outer periphery of the probe 52 is in contact with the outer surface of the end surface 112b of the slide member 11 around the notch 1121b, that is, the slide member. 11 is attached to the slide member 11 so that 11 is mounted on the convex part 617a (surface on the cable 53 side). For this reason, when the user slides the slide member 11 in the direction of the measurement object 2 so as to bring the probe 52 closer to the measurement object 2, a force can be applied to the probe 52 without fail. Can be easily and reliably brought close to the measurement object 2.

  Further, as shown in these drawings, the lowermost convex portion 617b of the convex portion 617b protruding to the outer periphery of the probe 52 is in contact with the inner surface of the end surface 112b of the slide member 11 around the notch 1121b. That is, the projection 617b is attached to the slide member 11 so as to be placed on the slide member 11 (on the surface of the end surface 112b on the cable 53 side). For this reason, when the user slides the slide member 11 in the direction away from the measurement object 2 in an attempt to pull the probe 52 away from the measurement object 2, a force can be applied to the probe 52 without fail. It can be easily and reliably pulled away from the measuring object 2.

<Alignment jig>
By the way, in order to ensure the measurement accuracy when measuring the film thickness using the film thickness meter 5, it is necessary to accurately apply the tip of the probe 52 to the measurement target portion of the measurement object 2. Further, when the film thickness is repeatedly measured for a specific measurement target site (hereinafter also referred to as a measurement point P), the tip of the probe 52 needs to be repeatedly and accurately applied to the measurement point P.

  Here, for example, in an electric power company, when inspecting electric power equipment, the film thickness meter 5 is used to measure the film thickness such as the plating film thickness applied to the surface of various electric power equipment, and it is used in a transmission tower, etc. The head side surface of the hexagon bolt and the side surface of the hexagon nut are also subject to measurement. However, the posture and work range that an operator can take on a steel tower or in a narrow place are limited, and it is not always easy to press the probe 52 perpendicularly to the surface of the measurement object. Further, in the measurement using the measurement jig 1, it is difficult to visually recognize the vicinity of the tip of the probe 52 from the outside by the measurement jig 1, and the tip of the probe 52 cannot be applied to the measurement point P exactly as expected. Then, when measuring the film thickness of the head side surface of a hexagon bolt and the side surface of a hexagon nut using the measuring jig 1, for example, a jig having the following configuration (hereinafter referred to as an alignment jig 7). Should be used.

  18 to 22 show the configuration of the alignment jig 7. 18 is a perspective view of the alignment jig 7, FIG. 19 is an exploded perspective view of the alignment jig 7, FIG. 20 is a view of the alignment jig 7 viewed from above (+ z direction), and FIG. FIG. 22 is a view of the tool 7 viewed from the front direction (+ x direction), and FIG. 22 is a view of the alignment jig 7 viewed from the side surface direction (+ y direction).

  As shown in these drawings, the alignment jig 7 includes a base 71 and a first contact member 73A and a second contact member 73B extending from the base 71. As will be described later, when the film thickness is measured, the first contact member 73A and the second contact member 73B are arranged with respect to the measurement object 2 so that the measurement object 2 is sandwiched therebetween.

  On the lower side (−z side) of the base body 71, an internal space (hereinafter referred to as an accommodation portion 711) in which the measurement jig 1 is mounted, which is surrounded by the top plate 714, the first side plate 715 </ b> A, and the second side plate 715 </ b> B. Is formed). An opening surface 72 is formed on the + x side of the housing portion 711. A substantially rectangular parallelepiped gear box 76 whose surface on the + x side is closed by the front plate 720 is provided above the opening surface 72 (+ z side). The gear box 76 houses a mechanism (positioning mechanism) for adjusting the positions of the first contact member 73A and the second contact member 73B with respect to the base 71.

  The first contact member 73A is supported by a first arm portion 721A extending in the + x direction from a rectangular first slide groove 720A formed on the −y side of the front plate 720. The second contact member 73B is supported by a second arm portion 721B extending in the + x direction from a rectangular second slide groove 720B formed on the + y side of the front plate 720.

  The first contact member 73A includes a first contact plate 731A and a first movable plate 732A. The first contact plate 731A is formed continuously on the + x side of the first arm portion 721A, and extends from the opening surface 72 in the direction of 120 degrees on the −y side with respect to the opening surface 72. The lower end of the first contact plate 731 </ b> A reaches the vicinity of the bottom surface of the housing portion 711. However, the length of the first contact plate 731 </ b> A in the z-axis direction is not necessarily limited, and is appropriately set according to the form of the measurement object 2.

  The first movable plate 732A is provided on the first contact plate 731A so as to be slidable with respect to the first contact plate 731A so as to extend the first contact plate 731A away from the base 71. Although the structure for enabling the first movable plate 732A to slide is arbitrary, in the present embodiment, as an example, the first movable plate 732A is formed along the direction in which the first movable plate 732A slides. The first slit 735A and the first fixing screw 734A, the tip of which passes through the first slit 735A and is screwed into the first contact plate 731A.

  The first movable plate 732A has a first bent portion 733A extending to the side away from the base 71. The first bent portion 733A bends at an angle of 120 degrees in the direction (+ y side) opposite to the direction in which the first contact plate 731A bends with respect to the direction in which the first contact plate 731A extends midway. ing. The length that the first bent portion 733A extends from the first movable plate 732A is set shorter than the first movable plate 732A.

  The second contact member 73B includes a second contact plate 731B and a second movable plate 732B. The second contact plate 731B is continuously formed on the + x side of the second arm portion 721B, and is 120 degrees on the + y side (opposite to the direction in which the first contact plate 731A bends) with respect to the opening surface 72. It extends from the opening surface 72 in the direction. The lower end of the second contact plate 731 </ b> B reaches the vicinity of the bottom surface of the housing portion 711. However, the length of the second contact plate 731B in the z-axis direction is not necessarily limited, and is appropriately set according to the form of the measurement object 2.

  The second movable plate 732B is provided on the second contact plate 731B so as to be slidable with respect to the second contact plate 731B so as to extend the second contact plate 731B in a direction away from the base 71. In addition, although the structure for enabling the second movable plate 732B to be slidable is arbitrary, in the present embodiment, as an example, the second movable plate 732B is formed along the direction in which the second movable plate 732B slides. The second slit 735B and the second fixing screw 734B that passes through the second slit 735B and is screwed into the second contact plate 731B.

  The second movable plate 732 </ b> B has a second bent portion 733 </ b> B extending to the side away from the base 71. The second bent portion 733B is bent at an angle of 120 degrees in a direction (−y side) opposite to the direction in which the second contact plate 731B is bent with respect to the direction in which the second contact plate 731B extends in the middle thereof. doing. The length that the second bent portion 733B extends from the second movable plate 732B is set to be shorter than the second movable plate 732B.

  As shown in FIG. 19, a first frame 722A having a first rack 761A having a predetermined length in the y-axis direction and extending with teeth downward (−z direction) is continuous with the first arm portion 721A. Yes. A width adjustment knob 751 protruding from a slit 752 formed on the upper surface of the gear box 76 is provided on the upper portion of the first frame 722A. On the other hand, a second frame 722B having a second rack 761B extending continuously with a predetermined length in the y-axis direction and teeth facing upward (+ z direction) is continuous with the second arm portion 721B.

  A pinion 760 supported in the x-axis direction is provided at the center of the bottom surface 762 of the gear box 76. The teeth of the first rack 761A are engaged with the pinion 760 from above (+ z direction), and the teeth of the second rack 761B are engaged from below (−z direction). That is, the first rack 761 </ b> A and the second rack 761 </ b> B are engaged with the pinion 760 from the sides facing each other with respect to the central axis of the pinion 760. When the user moves the width adjustment knob 751 along the slit 752, this movement is simultaneously transmitted to the second arm portion 721B through the pinion 760, and the first arm portion 721A and the second arm portion 721B move in the y-axis direction. Move in opposite directions. Further, the first rack 761A and the second rack 761B have teeth on the pinion 760 such that the first contact member 73A and the second contact member 73B are arranged symmetrically with respect to a plane parallel to the x axis including the center of the pinion 760. Are combined. That is, the first rack 761A, the second rack 761B, and the pinion 760 have a flat surface (hereinafter referred to as a first contact surface) that faces the + y side of the first contact member 73A, and -y of the second contact member 73B. A mechanism (hereinafter also referred to as an operation control mechanism) that controls a flat surface (hereinafter referred to as a second contact surface) facing toward the side to have a symmetrical relationship with the position of the tip of the probe 52 as a center. . Therefore, the user maintains the first contact surface and the second contact surface so that the first contact surface and the second contact surface are always symmetrical with respect to the surface parallel to the x-axis including the center of the pinion 760. The distance between the contact surfaces can be adjusted.

  When measuring the film thickness, the alignment jig 7 has the first contact surface, the opening surface 72, and the second contact surface so as to face along the three side surfaces of the head of the hexagon bolt and the hexagon nut. Placed in. More specifically, as shown in FIG. 20, the alignment jig 7 is one of the measurement target parts of the measurement object 2 (the head side surface of the hexagon bolt or the side surface of the hexagon nut) (hereinafter, the first outer surface). Are also provided so as to be in surface contact with the first flat surface of the guide member 12 appearing on the opening surface 72. In this state, one of the two side surfaces (hereinafter also referred to as a second outer surface) of the measurement object 2 that continues to both sides of the first outer surface via a ridge line is the first contact plate 731A. Another one (hereinafter also referred to as a third outer surface) is brought into surface contact with the second contact surface of the second contact plate 731B on the first contact surface.

  Thus, the center line in the z-axis direction of the first outer surface of the measurement object 2 is automatically positioned so as to be included in a plane parallel to the x-axis including the center of the pinion 760, and the tip of the probe 52 is Of the positions hitting the first outer surface, the position in the y-axis direction is automatically fixed. On the other hand, the height position in the z-axis direction where the probe 52 hits the first outer surface is fixed by the configuration of the measurement jig 1 (for example, as described later, the height position is measured by the second flat surface. 2 is fixed by being placed on a plane around 2.

  With the configuration described above, the tip of the probe 52 is made to accurately contact the measurement point P simply by touching the alignment jig 7 to the measurement target portion of the measurement object 2 (the head side surface of the hexagon bolt or the side surface of the hexagon nut). be able to. Therefore, the user can easily position the tip of the probe 52 at the same measurement point P at the time of repeated measurement of the film thickness, for example.

  The alignment jig 7 can be flexibly applied to the heads and hexagon nuts of various sizes of hexagon bolts by adjusting the width adjusting knob 751, the first fixing screw 734A, and the second fixing screw 734B. Can do. For example, FIG. 20 shows a state in which the alignment jig 7 is set to the minimum size that can be handled. By adjusting the width adjustment knob 751, the first fixing screw 734A, and the second fixing screw 734B, FIG. As shown, it can also be applied to the heads and hex nuts of larger size hex bolts.

  The first bent portion 733A and the second bent portion 733B act so that the alignment jig 7 holds the measurement object 2 reliably. In other words, due to the action of the first bent portion 733A and the second bent portion 733B, the measurement object 2 becomes the first contact surface of the first contact plate 731A, the second contact surface of the second contact plate 731B, and the first contact surface of the guide member 12. 1 is held securely by the flat surface, and the measurement object 2 is less likely to be detached from the alignment jig 7. Thereby, for example, it is possible to prevent the position where the tip of the probe 52 hits the measurement object 2 from being displaced due to an external force or the like applied when measuring the film thickness.

  FIG. 24 shows a state when the measuring jig 1 is mounted on the alignment jig 7. As shown in the figure, the measuring jig 1 is attached to the accommodating portion 711 from the lower side (−z direction) of the positioning jig 7. As shown in FIG. 23, the accommodating portion 712 has a fitting groove 712a and a fitting groove 712c. When the measuring jig 1 is attached to the housing portion 712, the protruding portion 123a is fitted into the fitting groove 712a, and the protruding portion 123c is fitted into the fitting groove 712c. Thereby, the position of the end surface 122b (first flat surface) of the measuring jig 1 is automatically fixed. In this example, the position at which the ridge 123 a and the ridge 123 c are provided on the guide member 12 is the outer surface (first surface) of the end surface 122 b of the guide member 12 with the measuring jig 1 mounted on the alignment jig 7. The flat surface is set so as to be flush with the opening surface 72, whereby the first flat surface of the guide member 12 is used for measuring the film thickness of the measurement object 2 (the side surface of the head of the hexagon bolt). Or the side of the hexagon nut).

  25 and 26 show a state where the measurement jig 1 is mounted on the alignment jig 7. FIG. FIG. 25 is a perspective view showing a state in which the measurement jig 1 is mounted on the alignment jig 7, and FIG. 26 shows the alignment jig 7 with the measurement jig 1 mounted from above (+ z direction). FIG. Note that the accommodating portion 712 has a shape in which a portion having a predetermined length from the end surface 122b of the guide member 12 is just accommodated.

  As shown in FIG. 25, in the state where the measuring jig 1 is mounted on the alignment jig 7, the flat surface 124b (second flat surface) of the guide member 12 is formed on the bottom surface side (−z side) of the alignment jig 7. Surface) is exposed. Therefore, when the measuring jig 1 is mounted on the alignment jig 7 and placed on a plane with the second flat surface side facing downward (−z direction), the flat surface and the end surface 122b (first flat surface). (Surface) is a vertical (right angle) relationship. Therefore, for example, alignment in a state in which the measurement jig 1 is mounted on the flat surface portion around the measurement object 2 (the head of the hexagon bolt or the hexagon nut) with the second flat surface side facing downward. By placing the jig 7, the position at which the tip of the probe 52 hits the measurement object 2 is accurately fixed at the same height position (position in the z-axis direction). In addition, when the bottom surface (end surface on the −z side) of the first side plate 715A and the second side plate 715B is perpendicular (right angle) to the end surface 122b (first flat surface), the first side plate Even if the bottom surfaces of 715A and the second side plate 715B are brought into surface contact with the plane portion, the position where the tip of the probe 52 contacts the measurement object 2 can be accurately fixed at the same height position.

  As described above, by using the alignment jig 7, when measuring the film thickness using the measurement jig 1, the user can accurately touch the tip of the probe 52 to the measurement point with a simple operation.

  By the way, in the above, when the guide member 12 is provided with the protruding line part 123a and the protruding line part 123c, and the measurement jig 1 is attached to the housing part 712, the protruding line part 123a is used as the fitting groove 712a and the protruding line part 123c. Are fitted in the fitting grooves 712c, respectively, but the protrusions 123a and the protrusions 123c, the fitting grooves 712a and the fitting grooves 712c are not necessarily essential, and may be omitted.

  FIG. 27 is a perspective view of the guide member 12 in which the protrusions 123a and 123c are omitted, and FIG. 28 is an alignment jig 7 that does not have the fitting grooves 712a and the fitting grooves 712c in the housing part 712. FIG. 5 shows a state in which the measuring jig 1 using the guide member 12 shown in FIG. 27 is mounted. In addition, when the alignment jig 7 is configured such that the protrusions 123a and 123c, the fitting grooves 712a and the fitting grooves 712c are omitted, the measurement jig 1 is restricted in the x-axis direction. However, there is an advantage that the degree of freedom at the time of mounting is increased, for example, the measuring jig 1 can be mounted on the alignment jig 7 from the −x direction.

  As mentioned above, although the form for inventing was demonstrated, the above description is for making an understanding of this invention easy, and does not limit this invention. It goes without saying that the present invention can be changed and improved without departing from the gist thereof, and that the present invention includes equivalents thereof.

  For example, the positioning jig 7 described above can be widely applied to the measurement of the film thickness of various measuring objects 2 having the same side shape as the side face of the hexagon head and the side face of the hexagon nut.

DESCRIPTION OF SYMBOLS 1 Measurement jig | tool, 11 Slide member, 12 Guide member, 122a, 122b End surface, 1221 Through-hole, 2 Measurement object, 5 Film thickness meter, 520 Magnetic core, 52 Probe, 123a Projection part, 123c Projection part, 7 position Alignment jig, 71 base, 711 accommodation portion, 712a fitting groove, 712b fitting groove, 714 top plate, 715A first side plate, 715B second side plate, 72 opening surface, 720 front plate, 720A first slide groove , 720B second slide groove, 721A first arm, 722A first frame, 721B second arm, 722B second frame, 73A first contact member, 731A first contact plate, 732A first movable plate, 733A first Bent part, 73B second contact member, 731B second contact plate, 732B second movable plate, 733B second bent part, 734A first fixed screw, 735A first 1 slit, 734B second fixing screw, 735B second slit, 751 width adjustment knob, 752 slit, 76 gear box, 760 pinion, 761A first rack, 761B second rack, 762 bottom

Claims (10)

A film thickness meter having a rod-shaped magnetic core and a coil wound around the magnetic core, and measuring a film thickness based on a change in magnetic flux passing through the coil when an end of the magnetic core is brought close to an object to be measured A slide member to which the probe is fixed, and a guide member that supports the slide member to which the probe is fixed to slide in the axial direction of the magnetic core, and the guide member is an object to be measured of the magnetic core. Is used together with a measurement jig of a film thickness meter having a flat surface perpendicular to the axis of the magnetic core on the side approaching
A receiving portion that is received by fitting the guide member, and a base having an opening surface that allows the tip of the probe to pass through the flat surface in a state where the guide member is fitted to the receiving portion;
A first contact member having a first contact surface provided to extend from the base on one side of the opening surface;
A second contact member having a second contact surface provided to extend from the base on the other side of the opening surface opposite to the side on which the first contact member extends;
With
The first contact member is provided such that the first contact surface is in surface contact with a first outer surface that is one of the outer surfaces of the measurement object having a plurality of outer surfaces continuous via a ridgeline. ,
The opening surface is provided such that the flat surface of the guide member fitted into the housing portion faces a second outer surface that is continuous with the first outer surface via a ridgeline,
Each of the second contact members is provided such that the second contact surface is in surface contact with a third outer surface that is continuous with the second outer surface via a ridgeline,
A positioning mechanism that adjusts the position of the first contact surface relative to the base and the position of the second contact surface relative to the base ;
The first contact member and the second contact member include a mechanism for adjusting a length by which the first contact surface and the second contact surface extend from the base body,
Film thickness alignment tool. The film thickness meter alignment jig according to claim 1,
An operation control mechanism for controlling the operation of the positioning mechanism so that the first contact surface and the second contact surface have a symmetrical relationship with respect to the position of the tip of the probe passing through the opening surface;
Film thickness alignment tool. The film thickness meter alignment jig according to claim 1,
The first contact member has a first bent portion extending along the shape of the outer surface of the measurement object,
The second contact member has a second bent portion extending along the shape of the outer surface of the measurement object.
Film thickness alignment tool. A film thickness meter alignment jig according to claim 2,
The operation control mechanism includes:
A first rack provided continuously to the first contact member;
A second rack provided in parallel with the first rack continuously to the second contact member;
A pinion meshed so that the first rack and the second rack face each other;
Having
Film thickness alignment tool. A film thickness meter having a rod-shaped magnetic core and a coil wound around the magnetic core, and measuring a film thickness based on a change in magnetic flux passing through the coil when an end of the magnetic core is brought close to an object to be measured A slide member to which the probe is fixed, and a guide member that supports the slide member to which the probe is fixed to slide in the axial direction of the magnetic core, and the guide member is an object to be measured of the magnetic core. Is used together with a measurement jig of a film thickness meter having a flat surface perpendicular to the axis of the magnetic core on the side approaching
A receiving portion that is received by fitting the guide member, and a base having an opening surface that allows the tip of the probe to pass through the flat surface in a state where the guide member is fitted to the receiving portion;
A first contact member having a first contact surface provided to extend from the base on one side of the opening surface;
A second contact member having a second contact surface provided to extend from the base on the other side of the opening surface opposite to the side on which the first contact member extends;
With
The first contact member is provided such that the first contact surface is in surface contact with a first outer surface that is one of the outer surfaces of the measurement object having a plurality of outer surfaces continuous via a ridgeline. ,
The opening surface is provided such that the flat surface of the guide member fitted into the housing portion faces a second outer surface that is continuous with the first outer surface via a ridgeline,
Each of the second contact members is provided such that the second contact surface is in surface contact with a third outer surface that is continuous with the second outer surface via a ridgeline,
A positioning mechanism that adjusts the position of the first contact surface relative to the base and the position of the second contact surface relative to the base;
An operation control mechanism for controlling the operation of the positioning mechanism so that the first contact surface and the second contact surface are in a symmetrical relationship with respect to the position of the tip of the probe passing through the opening surface;
The operation control mechanism includes:
A first rack provided continuously to the first contact member;
A second rack provided in parallel with the first rack continuously to the second contact member;
A pinion meshed so that the first rack and the second rack face each other;
Having
Film thickness alignment tool. The film thickness meter alignment jig according to claim 1,
The guide member is a cylindrical body,
The flat surface constitutes an end surface of the cylindrical body of the guide member,
The slide member has an outer shape that can slide in close contact with the internal space of the cylindrical body of the guide member.
Film thickness alignment tool. The film thickness meter alignment jig according to claim 1,
When the slide member is slid in the direction of the measurement object, the slide member abuts on a convex portion protruding from the outer periphery of the probe and acts to move the probe in the direction of the measurement object. Having a structure,
Film thickness alignment tool. The film thickness meter alignment jig according to claim 1,
The flat surface has a through hole that penetrates the tip of the probe when the slide member is slid in the direction of the measurement object along the axial direction of the magnetic core.
Film thickness alignment tool. An alignment jig for a film thickness meter according to any one of claims 1 to 8,
The film thickness meter is an electromagnetic induction film thickness meter or an eddy current film thickness meter,
Film thickness alignment tool. An alignment jig for a film thickness meter according to any one of claims 1 to 8,
The measurement object is a hex bolt head or a hex nut,
Film thickness alignment tool.