JP2013019720A5 - - Google Patents

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Publication number
JP2013019720A5
JP2013019720A5 JP2011151897A JP2011151897A JP2013019720A5 JP 2013019720 A5 JP2013019720 A5 JP 2013019720A5 JP 2011151897 A JP2011151897 A JP 2011151897A JP 2011151897 A JP2011151897 A JP 2011151897A JP 2013019720 A5 JP2013019720 A5 JP 2013019720A5
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JP
Japan
Prior art keywords
target substance
detection
detection target
sensor chamber
light
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Application number
JP2011151897A
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English (en)
Japanese (ja)
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JP5948746B2 (ja
JP2013019720A (ja
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Priority to JP2011151897A priority Critical patent/JP5948746B2/ja
Priority claimed from JP2011151897A external-priority patent/JP5948746B2/ja
Publication of JP2013019720A publication Critical patent/JP2013019720A/ja
Publication of JP2013019720A5 publication Critical patent/JP2013019720A5/ja
Application granted granted Critical
Publication of JP5948746B2 publication Critical patent/JP5948746B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011151897A 2011-07-08 2011-07-08 検出装置 Expired - Fee Related JP5948746B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011151897A JP5948746B2 (ja) 2011-07-08 2011-07-08 検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011151897A JP5948746B2 (ja) 2011-07-08 2011-07-08 検出装置

Publications (3)

Publication Number Publication Date
JP2013019720A JP2013019720A (ja) 2013-01-31
JP2013019720A5 true JP2013019720A5 (enExample) 2014-08-14
JP5948746B2 JP5948746B2 (ja) 2016-07-06

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ID=47691307

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011151897A Expired - Fee Related JP5948746B2 (ja) 2011-07-08 2011-07-08 検出装置

Country Status (1)

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JP (1) JP5948746B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017138340A (ja) * 2017-05-22 2017-08-10 セイコーエプソン株式会社 検出装置
KR102469917B1 (ko) * 2021-05-24 2022-11-23 한국과학기술원 입자 측정장치 및 입자 측정방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3482128B2 (ja) * 1998-06-30 2003-12-22 三菱電機株式会社 異常検出装置
US7361313B2 (en) * 2003-02-18 2008-04-22 Intel Corporation Methods for uniform metal impregnation into a nanoporous material
US20050266582A1 (en) * 2002-12-16 2005-12-01 Modlin Douglas N Microfluidic system with integrated permeable membrane
JP4926780B2 (ja) * 2007-03-27 2012-05-09 東京瓦斯株式会社 ガス導管内の物性変化推定方法、物性変化推定プログラム、及び物性変化推定装置
JP2009109395A (ja) * 2007-10-31 2009-05-21 Fujifilm Corp 微細構造体の作製方法、微細構造体、ラマン分光用デバイス、ラマン分光装置、分析装置、検出装置、および質量分析装置
EP2237022B1 (en) * 2008-01-16 2020-05-06 Nippon Telegraph and Telephone Corporation Flow rate measurement apparatus and method
JP5621983B2 (ja) * 2008-09-01 2014-11-12 日立化成株式会社 Ｓｐｒセンサー

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