JP2012520471A5 - - Google Patents

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Publication number
JP2012520471A5
JP2012520471A5 JP2011554261A JP2011554261A JP2012520471A5 JP 2012520471 A5 JP2012520471 A5 JP 2012520471A5 JP 2011554261 A JP2011554261 A JP 2011554261A JP 2011554261 A JP2011554261 A JP 2011554261A JP 2012520471 A5 JP2012520471 A5 JP 2012520471A5
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JP
Japan
Prior art keywords
protocol
data
definition
under test
specific data
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JP2011554261A
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English (en)
Japanese (ja)
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JP5260758B2 (ja
JP2012520471A (ja
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Priority claimed from US12/404,158 external-priority patent/US8195419B2/en
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Publication of JP2012520471A publication Critical patent/JP2012520471A/ja
Publication of JP2012520471A5 publication Critical patent/JP2012520471A5/ja
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Publication of JP5260758B2 publication Critical patent/JP5260758B2/ja
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JP2011554261A 2009-03-13 2010-03-12 汎用プロトコルエンジン Active JP5260758B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/404,158 2009-03-13
US12/404,158 US8195419B2 (en) 2009-03-13 2009-03-13 General purpose protocol engine
PCT/US2010/027247 WO2010105238A2 (en) 2009-03-13 2010-03-12 General purpose protocol engine

Publications (3)

Publication Number Publication Date
JP2012520471A JP2012520471A (ja) 2012-09-06
JP2012520471A5 true JP2012520471A5 (https=) 2013-04-04
JP5260758B2 JP5260758B2 (ja) 2013-08-14

Family

ID=42729156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011554261A Active JP5260758B2 (ja) 2009-03-13 2010-03-12 汎用プロトコルエンジン

Country Status (8)

Country Link
US (2) US8195419B2 (https=)
EP (1) EP2406646B1 (https=)
JP (1) JP5260758B2 (https=)
KR (1) KR101297513B1 (https=)
CN (1) CN102341717B (https=)
MY (1) MY169817A (https=)
SG (1) SG173675A1 (https=)
WO (1) WO2010105238A2 (https=)

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TW201236395A (en) * 2011-02-23 2012-09-01 Novatek Microelectronics Corp TMDS receiver system and BIST method thereof
CN102655416A (zh) * 2011-03-04 2012-09-05 联咏科技股份有限公司 最小化传输差分信号接收器系统及其内建自我测试方法
US9521062B2 (en) * 2011-09-23 2016-12-13 Roche Diabetes Care, Inc. Communication test framework
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9959186B2 (en) 2012-11-19 2018-05-01 Teradyne, Inc. Debugging in a semiconductor device test environment
US9116785B2 (en) * 2013-01-22 2015-08-25 Teradyne, Inc. Embedded tester
US10162007B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently
US20140236527A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
EP2773068B1 (en) 2013-03-01 2019-04-10 Viavi Solutions Deutschland GmbH Test device and method
WO2015018455A1 (en) * 2013-08-09 2015-02-12 Advantest (Singapore) Pte. Ltd. Automated test equipment, instruction provider for providing a sequence of instructions, method for providing a signal to a device under test, method for providing a sequence of instructions and test system
US10288685B2 (en) * 2014-04-30 2019-05-14 Keysight Technologies, Inc. Multi-bank digital stimulus response in a single field programmable gate array
US9679098B2 (en) 2015-01-29 2017-06-13 Mentor Graphics Corporation Protocol probes
US10536553B1 (en) * 2015-09-04 2020-01-14 Cadence Design Systems, Inc. Method and system to transfer data between components of an emulation system
US9883412B2 (en) * 2016-01-04 2018-01-30 Microsoft Technology Licensing, Llc Verification of a wireless protocol implementation
US10481206B2 (en) * 2016-09-08 2019-11-19 Texas Instruments Incorporated Automatic test equipment (ATE) platform translation
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
JP7101814B2 (ja) 2019-01-22 2022-07-15 株式会社アドバンテスト 1または複数の被テストデバイスをテストするための自動試験装置、1または複数の被テストデバイスの自動試験のための方法、および、バッファメモリを使用するコンピュータプログラム
US11137910B2 (en) 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US11574248B2 (en) 2020-04-02 2023-02-07 Rovi Guides, Inc. Systems and methods for automated content curation using signature analysis
KR102440440B1 (ko) * 2020-12-16 2022-09-06 와이아이케이 주식회사 반도체 소자 검사 장치
TWI770855B (zh) * 2021-03-04 2022-07-11 凌華科技股份有限公司 裝置測試排序方法、裝置組態生成方法及其設備
WO2025154007A1 (en) * 2024-01-17 2025-07-24 Crea - Collaudi Elettronici Automatizzati S.R.L. Testing system and test method

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US6425101B1 (en) 1998-10-30 2002-07-23 Infineon Technologies North America Corp. Programmable JTAG network architecture to support proprietary debug protocol
US20030018457A1 (en) 2001-03-13 2003-01-23 Lett Gregory Scott Biological modeling utilizing image data
US7222261B2 (en) 2002-06-19 2007-05-22 Teradyne, Inc. Automatic test equipment for design-for-test (DFT) and built-in-self-test circuitry
US7181660B2 (en) * 2002-07-26 2007-02-20 Verigy Pte. Ltd. Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test
US7216273B2 (en) 2003-06-26 2007-05-08 Teradyne, Inc. Method for testing non-deterministic device data
US7702767B2 (en) * 2004-03-09 2010-04-20 Jp Morgan Chase Bank User connectivity process management system
US7340166B1 (en) 2004-07-15 2008-03-04 Verizon Services Corp. Methods and apparatus for automated testing and analysis of dense wavelength division multiplexing (DWDM), wavelength selective and/or optical switching devices
KR100628835B1 (ko) 2005-02-26 2006-09-26 한국정보통신기술협회 시나리오 기반의 데이터 방송 수신기 시험 자동화 장치 및방법
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US20090112548A1 (en) 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US20090113245A1 (en) 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus

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