JP2012520471A5 - - Google Patents
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- JP2012520471A5 JP2012520471A5 JP2011554261A JP2011554261A JP2012520471A5 JP 2012520471 A5 JP2012520471 A5 JP 2012520471A5 JP 2011554261 A JP2011554261 A JP 2011554261A JP 2011554261 A JP2011554261 A JP 2011554261A JP 2012520471 A5 JP2012520471 A5 JP 2012520471A5
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- Japan
- Prior art keywords
- protocol
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- under test
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/404,158 | 2009-03-13 | ||
| US12/404,158 US8195419B2 (en) | 2009-03-13 | 2009-03-13 | General purpose protocol engine |
| PCT/US2010/027247 WO2010105238A2 (en) | 2009-03-13 | 2010-03-12 | General purpose protocol engine |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012520471A JP2012520471A (ja) | 2012-09-06 |
| JP2012520471A5 true JP2012520471A5 (https=) | 2013-04-04 |
| JP5260758B2 JP5260758B2 (ja) | 2013-08-14 |
Family
ID=42729156
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011554261A Active JP5260758B2 (ja) | 2009-03-13 | 2010-03-12 | 汎用プロトコルエンジン |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US8195419B2 (https=) |
| EP (1) | EP2406646B1 (https=) |
| JP (1) | JP5260758B2 (https=) |
| KR (1) | KR101297513B1 (https=) |
| CN (1) | CN102341717B (https=) |
| MY (1) | MY169817A (https=) |
| SG (1) | SG173675A1 (https=) |
| WO (1) | WO2010105238A2 (https=) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201236395A (en) * | 2011-02-23 | 2012-09-01 | Novatek Microelectronics Corp | TMDS receiver system and BIST method thereof |
| CN102655416A (zh) * | 2011-03-04 | 2012-09-05 | 联咏科技股份有限公司 | 最小化传输差分信号接收器系统及其内建自我测试方法 |
| US9521062B2 (en) * | 2011-09-23 | 2016-12-13 | Roche Diabetes Care, Inc. | Communication test framework |
| US9910086B2 (en) | 2012-01-17 | 2018-03-06 | Allen Czamara | Test IP-based A.T.E. instrument architecture |
| US9959186B2 (en) | 2012-11-19 | 2018-05-01 | Teradyne, Inc. | Debugging in a semiconductor device test environment |
| US9116785B2 (en) * | 2013-01-22 | 2015-08-25 | Teradyne, Inc. | Embedded tester |
| US10162007B2 (en) * | 2013-02-21 | 2018-12-25 | Advantest Corporation | Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently |
| US20140236527A1 (en) * | 2013-02-21 | 2014-08-21 | Advantest Corporation | Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems |
| US10161993B2 (en) * | 2013-02-21 | 2018-12-25 | Advantest Corporation | Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block |
| EP2773068B1 (en) | 2013-03-01 | 2019-04-10 | Viavi Solutions Deutschland GmbH | Test device and method |
| WO2015018455A1 (en) * | 2013-08-09 | 2015-02-12 | Advantest (Singapore) Pte. Ltd. | Automated test equipment, instruction provider for providing a sequence of instructions, method for providing a signal to a device under test, method for providing a sequence of instructions and test system |
| US10288685B2 (en) * | 2014-04-30 | 2019-05-14 | Keysight Technologies, Inc. | Multi-bank digital stimulus response in a single field programmable gate array |
| US9679098B2 (en) | 2015-01-29 | 2017-06-13 | Mentor Graphics Corporation | Protocol probes |
| US10536553B1 (en) * | 2015-09-04 | 2020-01-14 | Cadence Design Systems, Inc. | Method and system to transfer data between components of an emulation system |
| US9883412B2 (en) * | 2016-01-04 | 2018-01-30 | Microsoft Technology Licensing, Llc | Verification of a wireless protocol implementation |
| US10481206B2 (en) * | 2016-09-08 | 2019-11-19 | Texas Instruments Incorporated | Automatic test equipment (ATE) platform translation |
| US10976361B2 (en) | 2018-12-20 | 2021-04-13 | Advantest Corporation | Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes |
| JP7101814B2 (ja) | 2019-01-22 | 2022-07-15 | 株式会社アドバンテスト | 1または複数の被テストデバイスをテストするための自動試験装置、1または複数の被テストデバイスの自動試験のための方法、および、バッファメモリを使用するコンピュータプログラム |
| US11137910B2 (en) | 2019-03-04 | 2021-10-05 | Advantest Corporation | Fast address to sector number/offset translation to support odd sector size testing |
| US11237202B2 (en) | 2019-03-12 | 2022-02-01 | Advantest Corporation | Non-standard sector size system support for SSD testing |
| US10884847B1 (en) | 2019-08-20 | 2021-01-05 | Advantest Corporation | Fast parallel CRC determination to support SSD testing |
| US11574248B2 (en) | 2020-04-02 | 2023-02-07 | Rovi Guides, Inc. | Systems and methods for automated content curation using signature analysis |
| KR102440440B1 (ko) * | 2020-12-16 | 2022-09-06 | 와이아이케이 주식회사 | 반도체 소자 검사 장치 |
| TWI770855B (zh) * | 2021-03-04 | 2022-07-11 | 凌華科技股份有限公司 | 裝置測試排序方法、裝置組態生成方法及其設備 |
| WO2025154007A1 (en) * | 2024-01-17 | 2025-07-24 | Crea - Collaudi Elettronici Automatizzati S.R.L. | Testing system and test method |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6425101B1 (en) | 1998-10-30 | 2002-07-23 | Infineon Technologies North America Corp. | Programmable JTAG network architecture to support proprietary debug protocol |
| US20030018457A1 (en) | 2001-03-13 | 2003-01-23 | Lett Gregory Scott | Biological modeling utilizing image data |
| US7222261B2 (en) | 2002-06-19 | 2007-05-22 | Teradyne, Inc. | Automatic test equipment for design-for-test (DFT) and built-in-self-test circuitry |
| US7181660B2 (en) * | 2002-07-26 | 2007-02-20 | Verigy Pte. Ltd. | Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test |
| US7216273B2 (en) | 2003-06-26 | 2007-05-08 | Teradyne, Inc. | Method for testing non-deterministic device data |
| US7702767B2 (en) * | 2004-03-09 | 2010-04-20 | Jp Morgan Chase Bank | User connectivity process management system |
| US7340166B1 (en) | 2004-07-15 | 2008-03-04 | Verizon Services Corp. | Methods and apparatus for automated testing and analysis of dense wavelength division multiplexing (DWDM), wavelength selective and/or optical switching devices |
| KR100628835B1 (ko) | 2005-02-26 | 2006-09-26 | 한국정보통신기술협회 | 시나리오 기반의 데이터 방송 수신기 시험 자동화 장치 및방법 |
| US7233875B2 (en) * | 2005-11-21 | 2007-06-19 | Sigmatel, Inc. | Test set for testing a device and methods for use therewith |
| US20090112548A1 (en) | 2007-10-30 | 2009-04-30 | Conner George W | A method for testing in a reconfigurable tester |
| US20090113245A1 (en) | 2007-10-30 | 2009-04-30 | Teradyne, Inc. | Protocol aware digital channel apparatus |
-
2009
- 2009-03-13 US US12/404,158 patent/US8195419B2/en active Active
-
2010
- 2010-03-12 EP EP10751521.5A patent/EP2406646B1/en active Active
- 2010-03-12 JP JP2011554261A patent/JP5260758B2/ja active Active
- 2010-03-12 SG SG2011058336A patent/SG173675A1/en unknown
- 2010-03-12 KR KR1020117023960A patent/KR101297513B1/ko active Active
- 2010-03-12 CN CN2010800108730A patent/CN102341717B/zh active Active
- 2010-03-12 MY MYPI2011004070A patent/MY169817A/en unknown
- 2010-03-12 WO PCT/US2010/027247 patent/WO2010105238A2/en not_active Ceased
-
2012
- 2012-05-04 US US13/464,650 patent/US8521465B2/en active Active
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