JP2012248907A - Power semiconductor device - Google Patents

Power semiconductor device Download PDF

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Publication number
JP2012248907A
JP2012248907A JP2012208219A JP2012208219A JP2012248907A JP 2012248907 A JP2012248907 A JP 2012248907A JP 2012208219 A JP2012208219 A JP 2012208219A JP 2012208219 A JP2012208219 A JP 2012208219A JP 2012248907 A JP2012248907 A JP 2012248907A
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Prior art keywords
connecting member
resin
power semiconductor
semiconductor device
insulating layer
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Inventor
Shingo Sudo
進吾 須藤
Tatsuo Ota
達雄 太田
Nobutake Taniguchi
信剛 谷口
Hiroshi Yoshida
博 吉田
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/34Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
    • H01L2224/36Structure, shape, material or disposition of the strap connectors prior to the connecting process
    • H01L2224/37Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
    • H01L2224/37001Core members of the connector
    • H01L2224/37099Material
    • H01L2224/371Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2224/37138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/37147Copper [Cu] as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/34Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
    • H01L2224/39Structure, shape, material or disposition of the strap connectors after the connecting process
    • H01L2224/40Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
    • H01L2224/4005Shape
    • H01L2224/4009Loop shape
    • H01L2224/40095Kinked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/34Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
    • H01L2224/39Structure, shape, material or disposition of the strap connectors after the connecting process
    • H01L2224/40Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
    • H01L2224/401Disposition
    • H01L2224/40135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/40137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]

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  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent a mold resin from entering and adhering to an external terminal part in a power semiconductor device molded from a resin.SOLUTION: In the power semiconductor device which includes a heat sink 5, an insulating layer 6 provided on a main surface of the heat sink, a plurality of wiring patterns 7 provided on a main surface of the insulating layer, a plurality of external terminals 2 and 3 provided so as to contact the plurality of wiring patterns, a connecting member 12 of thermoplastic resin for connecting the plurality of external terminals with one another, and a resin case body 1 of thermoplastic resin covering the insulating layer 6 and the wiring patterns 7, occurrence of cracks of the resin case body 1 due to an external force is prevented as well as enabling simplification of a manufacture process by causing rigidity of the thermoplastic resin composing the connecting member 12 to be higher than that of the thermoplastic resin composing the resin case body 1.

Description

この発明は、金型にモールド樹脂を注入することにより筐体を構成する電力半導体装置に係り、外部端子近傍における樹脂バリの発生を抑制し、外力によるパッケージの亀裂の発生を防止した電力半導体装置に関するものである。   The present invention relates to a power semiconductor device that constitutes a casing by injecting a mold resin into a mold, and suppresses the generation of resin burrs in the vicinity of external terminals and prevents the occurrence of cracks in a package due to external force It is about.

従来の電力半導体装置においては、例えば特許文献1に開示されている電力半導体装置のように、エポキシ樹脂等の熱硬化性樹脂によりトランスファーモールド成形することが一般的であった。このような電力半導体装置では、金型に十分な精度が得られていない場合、端子部にエポキシ樹脂が入り込み付着し、仕上げ時に付着したエポキシ樹脂を取り除く必要があった。このため特許文献1においては、エポキシ樹脂のような耐熱性樹脂からなる連結部材によって外部端子を一体化した出力端子ブロックを金型に当接させることにより、端子部にエポキシ樹脂が入り込み付着することを防止している。   In a conventional power semiconductor device, for example, as in the power semiconductor device disclosed in Patent Document 1, it is common to perform transfer molding using a thermosetting resin such as an epoxy resin. In such a power semiconductor device, when sufficient accuracy is not obtained in the mold, the epoxy resin enters and adheres to the terminal portion, and it is necessary to remove the epoxy resin adhered at the time of finishing. For this reason, in Patent Document 1, the epoxy resin enters and adheres to the terminal portion by bringing the output terminal block in which the external terminals are integrated into contact with the mold by a connecting member made of a heat resistant resin such as an epoxy resin. Is preventing.

特開平8−125114号公報 (図1)JP-A-8-125114 (FIG. 1)

しかしながら、このような連結部材により一体化された出力端子ブロックを使用しても、端子部にエポキシ樹脂が入り込み付着することを完全に防止することは困難であった。すなわち、出力端子ブロックを金型に当接させるためには、外部端子の半導体素子に対する当接面から連結部材までの距離が高精度に決定されるように出力端子ブロックを製作する必要があるが、従来例のように外部端子を金型にセットしてエポキシ樹脂を注入して出力端子ブロックを成形する方法では、上記距離が精度良く保たれた出力端子ブロックを得ることは困難である。また、外部端子の半導体素子に対する当接面には曲げ加工がはいるが、このような曲げ加工は一般的に上記エポキシ樹脂に依る成形の後に行われるが、その加工バラツキにより上記距離にバラツキが生じる。さらには、たとえ上記距離が精度良く保たれた出力端子ブロックが得られたにしても、外部端子と半導体素子とを半田付けする際の半田厚みのバラツキも考慮しなければならない。   However, even if an output terminal block integrated by such a connecting member is used, it is difficult to completely prevent the epoxy resin from entering and adhering to the terminal portion. That is, in order to bring the output terminal block into contact with the mold, it is necessary to manufacture the output terminal block so that the distance from the contact surface of the external terminal to the semiconductor element to the connecting member is determined with high accuracy. In a method of forming an output terminal block by setting an external terminal in a mold and injecting an epoxy resin as in the conventional example, it is difficult to obtain an output terminal block in which the above distance is maintained with high accuracy. In addition, the contact surface of the external terminal with respect to the semiconductor element is bent, but such bending is generally performed after molding with the epoxy resin, but the distance varies due to the processing variation. Arise. Furthermore, even if an output terminal block in which the above distance is maintained with high accuracy is obtained, it is necessary to consider the variation in solder thickness when soldering the external terminal and the semiconductor element.

上述したように、出力端子ブロックにおいて外部端子の半導体素子に対する当接面から連結部材までの距離が高精度に保たれていなければ、モールド成形の際に出力端子ブロックと金型との間に僅かな隙間が発生するため、その隙間を通してやはり端子部にエポキシ樹脂が入り込み付着、いわゆるバリが付着することとなる。このためこのバリ取り作業が不可欠となり製造工程の複雑化を招いていた。さもなければ、高価な高精度の金型を必要としコストの増大を招いていた。さらに、パッケージを形成する樹脂は、半導体素子を比較的低圧で封止するため、分子量の小さい低粘度の樹脂を用いる必要があったが、そのため外部端子の曲げ加工工程やネジ締め工程等において加わる外力によりパッケージに亀裂が発生する惧れがあった   As described above, in the output terminal block, if the distance from the contact surface of the external terminal to the semiconductor element to the connecting member is not maintained with high accuracy, there is a slight gap between the output terminal block and the mold during molding. Since a large gap is generated, the epoxy resin also enters and adheres to the terminal portion through the gap, and so-called burrs adhere. For this reason, this deburring operation has become indispensable, resulting in a complicated manufacturing process. Otherwise, an expensive high-precision mold is required, resulting in an increase in cost. Furthermore, the resin forming the package needs to use a low-viscosity resin having a low molecular weight in order to seal the semiconductor element at a relatively low pressure. There was a risk of cracks in the package due to external force

この発明は、上述のような課題を解決するためになされたもので、その目的は、熱可塑性樹脂によりインジェクションモールド成形された電力半導体装置において、外部端子部にモールド樹脂が入り込み付着することを防止した電力半導体装置を提供しようとするものである。   The present invention was made to solve the above-described problems, and its purpose is to prevent mold resin from entering and adhering to external terminal portions in a power semiconductor device that is injection-molded with a thermoplastic resin. An electric power semiconductor device is to be provided.

前記の目的を達成するために、本発明に係る電力半導体装置は、放熱板と、前記放熱板の主表面上に設けられた絶縁層と前記絶縁層の主表面上に設けられた複数の配線パターンと、前記複数の配線パターンに当接するように設けられた複数の外部端子と、前記複数の外部端子を相互に連結する熱可塑性樹脂からなる連結部材と、前記絶縁層、前記配線パターンと前記外部端子とを覆う熱可塑性樹脂からなる筐体とを備え、前記連結部材を構成する熱可塑性樹脂は前記筐体を構成する熱可塑性樹脂よりも剛性が高いことを特徴とする。   In order to achieve the above object, a power semiconductor device according to the present invention includes a heat sink, an insulating layer provided on the main surface of the heat sink, and a plurality of wirings provided on the main surface of the insulating layer. A pattern, a plurality of external terminals provided in contact with the plurality of wiring patterns, a connecting member made of a thermoplastic resin that interconnects the plurality of external terminals, the insulating layer, the wiring pattern, and the And a casing made of a thermoplastic resin covering the external terminal, wherein the thermoplastic resin constituting the connecting member is higher in rigidity than the thermoplastic resin constituting the casing.

上記のような構成としたため、モールド成形の際に外部端子部にモールド樹脂が入り込み付着することがなく、その後のバリ取り作業を不要とすることにより製造工程の簡略化を可能とする、あるいは安価な金型を使用できコスト低減が可能となるとともに、高剛性の連結部材がパッケージを補強しパッケージの亀裂を防止するという効果を奏する。   Because of the above configuration, the molding resin does not enter and adhere to the external terminal part during molding, and the manufacturing process can be simplified by eliminating the need for subsequent deburring work, or at a low cost. In addition, the cost can be reduced and a highly rigid connecting member reinforces the package and prevents cracking of the package.

本発明に係る電力半導体装置の実施の形態1を示す斜視図である。1 is a perspective view showing a first embodiment of a power semiconductor device according to the present invention. 図1のA−A断面図で、上記電力半導体装置の内部構造を示している。FIG. 1 is a cross-sectional view taken along the line AA in FIG. 図1の電力半導体装置のモールド成形前の内部構造を示す斜視図である。FIG. 2 is a perspective view showing an internal structure of the power semiconductor device of FIG. 1 before molding. 図1の電力半導体装置の成形金型内での部品の設置状態の一例を示す断面図である。It is sectional drawing which shows an example of the installation state of components in the shaping die of the power semiconductor device of FIG. 図1の電力半導体装置の成形金型内での部品の設置状態の他の例を示す断面図である。It is sectional drawing which shows the other example of the installation state of components in the shaping die of the power semiconductor device of FIG. 本発明に係る電力半導体装置の実施の形態2の断面図である。It is sectional drawing of Embodiment 2 of the power semiconductor device which concerns on this invention. 本発明に係る電力半導体装置の実施の形態2の変形例を示す断面図である。It is sectional drawing which shows the modification of Embodiment 2 of the power semiconductor device which concerns on this invention. 本発明に係る電力半導体装置の実施の形態2の変形例を示す断面図である。It is sectional drawing which shows the modification of Embodiment 2 of the power semiconductor device which concerns on this invention. 本発明に係る電力半導体装置の実施の形態2の変形例を示す断面図である。It is sectional drawing which shows the modification of Embodiment 2 of the power semiconductor device which concerns on this invention. 本発明に係る電力半導体装置の実施の形態3のモールド成形前の内部構造を示す斜視図である。It is a perspective view which shows the internal structure before the shaping | molding of Embodiment 3 of the power semiconductor device which concerns on this invention. 本発明に係る電力半導体装置の実施の形態4のモールド成形前の内部構造を示す斜視図である。It is a perspective view which shows the internal structure before the shaping | molding of Embodiment 4 of the power semiconductor device which concerns on this invention.

<実施の形態1>
以下、本発明の実施の形態を図に基づいて説明する。図1は本発明に係る電力半導体装置の実施の形態1を示す斜視図である。図2は図1の電力半導体装置のA−A断面図である。図3は本発明に係る電力半導体装置の実施の形態1のモールド成形前の内部構造を示す斜視図である。
<Embodiment 1>
Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view showing a first embodiment of a power semiconductor device according to the present invention. 2 is a cross-sectional view of the power semiconductor device taken along the line AA in FIG. FIG. 3 is a perspective view showing the internal structure of the power semiconductor device according to the first embodiment of the present invention before molding.

図1において、電力半導体装置100は、例えばガラス繊維を配合することにより強度を向上させた熱可塑性樹脂であるポリフェニレンサルファイド樹脂(PPS樹脂)からなる樹脂筐体1により外形をなし、外部との入出力のための複数の入出力端子2及び複数の信号端子3等の外部端子を上部表面より露出させている。また電力半導体装置100は、自身を放熱フィン等に固定するための取付け穴4を、その樹脂筐体1に具えている。図2において、電力半導体装置100は、その底面に露出するように、銅又はアルミニウムのような高熱伝導材料を基材とする縦40mm×横70mmで厚さ2mmの放熱板5を具えている。放熱板5の上には、絶縁層6を介して厚さ0.3mmの銅からなる複数の配線パターン7が設けられている。絶縁層6は、例えばアルミナ又は窒化アルミニウム等の絶縁性の熱伝導フィラーを配合したエポキシ樹脂を基材とし、放熱板5と複数の配線パターン7とを絶縁するとともに、これらを固着する接着剤も兼ねている。   In FIG. 1, an electric power semiconductor device 100 has an outer shape formed by a resin casing 1 made of polyphenylene sulfide resin (PPS resin), which is a thermoplastic resin whose strength is improved by blending glass fibers, for example, and enters the outside. External terminals such as a plurality of input / output terminals 2 and a plurality of signal terminals 3 for output are exposed from the upper surface. In addition, the power semiconductor device 100 has a mounting hole 4 for fixing itself to a heat radiating fin or the like in the resin casing 1. In FIG. 2, the power semiconductor device 100 includes a radiator plate 5 having a length of 40 mm × width of 70 mm and a thickness of 2 mm, which is made of a high heat conductive material such as copper or aluminum, so as to be exposed on the bottom surface. A plurality of wiring patterns 7 made of copper having a thickness of 0.3 mm are provided on the heat sink 5 with an insulating layer 6 interposed therebetween. The insulating layer 6 is made of, for example, an epoxy resin containing an insulating heat conductive filler such as alumina or aluminum nitride as a base material. The insulating layer 6 insulates the heat sink 5 and the plurality of wiring patterns 7 and also has an adhesive for fixing them. Also serves as.

図3において、複数の配線パターン7上には、電力半導体素子であるIGBT8及びダイオード9が、Sn−Ag−Cuを基材とする半田により、その裏面において接合されている。IGBT8は四角形状で、例えば縦7.5mm×横9mm、厚さが170μmであり、表面にゲート電極及びエミッタ電極を有し、裏面にコレクタ電極を有している。ダイオード9は四角形状で、例えば縦4mm×横9mm、厚さが250μmであり、表面にアノード電極を有し、裏面にカソード電極を有している。   In FIG. 3, on the plurality of wiring patterns 7, IGBTs 8 and diodes 9 which are power semiconductor elements are joined on the back surface thereof with solder based on Sn—Ag—Cu. The IGBT 8 has a quadrangular shape, for example, a length of 7.5 mm × width of 9 mm, a thickness of 170 μm, a gate electrode and an emitter electrode on the front surface, and a collector electrode on the back surface. The diode 9 has a rectangular shape, for example, 4 mm long × 9 mm wide and 250 μm thick, and has an anode electrode on the front surface and a cathode electrode on the back surface.

IGBT8のエミッタ電極とダイオード9のアノード電極とは、例えば厚さ0.3mm、幅6mmの銅板からなり適切に曲げ加工の施された板状リード10により、やはりSn−Ag−Cuを基材とする半田を介して接続され、その板状リード10の一端は複数の配線パターン7のひとつに接続されている。このような板状リード10によりIGBT8及びダイオード9等の電力半導体素子間を結線することは、大電流を取り扱う上で好ましい。本実施の形態のように、IGBT8とダイオード9の板状リード10の配線方向と直交する横辺のサイズを等しくし、IGBT8とダイオード9とを互いに横辺が対向するように並置させておけば、板状リードの形状が単純になるため位置合わせを行う上で好ましい。IGBT8のゲート電極には別の信号リード11により複数の配線パターン7の一つと接続されている。   The emitter electrode of the IGBT 8 and the anode electrode of the diode 9 are made of, for example, Sn—Ag—Cu as a base material by a plate-like lead 10 made of a copper plate having a thickness of 0.3 mm and a width of 6 mm and appropriately bent. One end of the plate-like lead 10 is connected to one of the plurality of wiring patterns 7. It is preferable to connect the power semiconductor elements such as the IGBT 8 and the diode 9 with such a plate-like lead 10 when handling a large current. As in the present embodiment, the size of the lateral sides orthogonal to the wiring direction of the plate leads 10 of the IGBT 8 and the diode 9 are made equal, and the IGBT 8 and the diode 9 are juxtaposed so that the lateral sides face each other. Since the shape of the plate-like lead is simple, it is preferable for alignment. The gate electrode of the IGBT 8 is connected to one of the plurality of wiring patterns 7 by another signal lead 11.

複数の配線パターン7は複数の入出力端子2又は複数の信号端子3等の外部端子にさらに接続されている。複数の入出力端子2は相互に連結部材12により接続されており、複数の信号端子3も同様に相互に連結部材12により接続されており、それぞれ別個の端子ブロックを構成している。連結部材12は、樹脂筐体1と同じく、ガラス繊維を配合することにより強度を向上させた熱可塑性樹脂であるPPS樹脂からできており、図1にも示されているように樹脂筐体1の表面にその一部を露出させている。   The plurality of wiring patterns 7 are further connected to external terminals such as a plurality of input / output terminals 2 or a plurality of signal terminals 3. The plurality of input / output terminals 2 are connected to each other by a connecting member 12, and the plurality of signal terminals 3 are also connected to each other by the connecting member 12, and each constitutes a separate terminal block. The connecting member 12 is made of a PPS resin, which is a thermoplastic resin whose strength is improved by blending glass fibers, as in the case of the resin case 1, and as shown in FIG. A part of the surface is exposed.

このような電力半導体装置は次のようにして組み立てられる。まず、放熱板5上に絶縁層6を配置し、絶縁層6上に複数の配線パターン7を所定の位置に配置し、放熱板5と絶縁層6と複数の配線パターン7とを熱圧着により固着する。次に、放熱板6上に固着された配線パターン上の所定の位置にIGBT8及びダイオード9を半田により接合する。次に、板状リード10,信号リード11,複数の信号端子3と連結部材12により構成された端子ブロック及び複数の入出力端子2と連結部材12により構成された端子ブロックとを所定の配線パターン上に半田により接合する。最後に上記組立体を成形金型の中に設置し、PPS樹脂によるインジェクションモールドにより樹脂筐体1を成形した後、入出力端子2をネジ締めするためのナット(図示省略)を樹脂筐体1に設けられた穴(図示省略)に設置し、入出力端子2に曲げ加工を施すことにより図1に示された電力半導体装置が完成する。   Such a power semiconductor device is assembled as follows. First, the insulating layer 6 is disposed on the heat sink 5, a plurality of wiring patterns 7 are disposed at predetermined positions on the insulating layer 6, and the heat sink 5, the insulating layer 6, and the plurality of wiring patterns 7 are bonded by thermocompression bonding. Stick. Next, the IGBT 8 and the diode 9 are joined to a predetermined position on the wiring pattern fixed on the heat sink 6 by soldering. Next, the plate-like lead 10, the signal lead 11, the terminal block constituted by the plurality of signal terminals 3 and the connecting member 12, and the terminal block constituted by the plurality of input / output terminals 2 and the connecting member 12 are arranged in a predetermined wiring pattern. Join the top with solder. Finally, the assembly is placed in a molding die, the resin casing 1 is molded by injection molding using PPS resin, and then a nut (not shown) for tightening the input / output terminal 2 is screwed. The power semiconductor device shown in FIG. 1 is completed by placing the input / output terminal 2 in a bending process (not shown).

最後のインジェクションモールド工程についてさらに詳述する。成形金型内での部品の設置状態の一例を図4に示す。成形金型の一方である下型13の所定の位置に上記組立体が設置される。放熱板5の搭載位置を決定するために、下型13には高さ約200μm、1mm×3mmの位置決めピン13bが油圧又は空気圧により上下移動可能なように設けられており、上記組立体が所定の位置に設置された後はこの位置決めピン13bは下降させることができる。この位置決めピン13bは、成形後に成形金型から成形品を取り出すエジェクタピンと共用することも可能である。成形金型内に上記組立体を設置した後、成形金型の他方である上型14内に設けられた端子導出用溝14a内に複数の入出力端子2及び複数の信号端子3とが収容されるように上型14と下型13とを型締めする。このとき複数の入出力端子2又は複数の信号端子3等の外部端子を相互に連結している連結部材12は、端子導出用溝14aを覆うように上型14に当接している。   The final injection molding process will be further described in detail. An example of the installation state of the components in the molding die is shown in FIG. The assembly is installed at a predetermined position of the lower mold 13 which is one of the molding dies. In order to determine the mounting position of the heat sink 5, a positioning pin 13b having a height of about 200 μm and 1 mm × 3 mm is provided on the lower mold 13 so that it can be moved up and down by hydraulic pressure or air pressure. The positioning pin 13b can be lowered after being installed at the position. The positioning pin 13b can be shared with an ejector pin that takes out a molded product from a molding die after molding. After the assembly is installed in the molding die, a plurality of input / output terminals 2 and a plurality of signal terminals 3 are accommodated in a terminal lead-out groove 14a provided in the upper die 14 which is the other of the molding die. Then, the upper mold 14 and the lower mold 13 are clamped. At this time, the connecting member 12 that connects external terminals such as the plurality of input / output terminals 2 or the plurality of signal terminals 3 is in contact with the upper mold 14 so as to cover the terminal lead-out grooves 14a.

成形金型内での部品の設置状態上下逆にした例を図5に示す。成形金型の一方である下型13に上記組立体が設置され、複数の入出力端子2又は複数の信号端子3等の外部端子は端子導出用溝13a内に収容されている。放熱板5の搭載位置は上記端子導出用溝13aの位置で決定されるため、図4のような位置決めピンは不要である。成形金型内に上記組立体を設置した後、成形金型の他方である上型14と下型13とを型締めする。このとき複数の入出力端子2又は複数の信号端子3等の外部端子を相互に連結している連結部材12は、端子導出用溝13aの開口部を覆うように下型13に当接している。   FIG. 5 shows an example in which the parts are installed upside down in the molding die. The assembly is installed in the lower mold 13 which is one of the molding dies, and external terminals such as the plurality of input / output terminals 2 or the plurality of signal terminals 3 are accommodated in the terminal lead-out grooves 13a. Since the mounting position of the heat sink 5 is determined by the position of the terminal lead-out groove 13a, a positioning pin as shown in FIG. 4 is unnecessary. After the assembly is installed in the molding die, the upper die 14 and the lower die 13 which are the other of the molding die are clamped. At this time, the connecting member 12 that connects external terminals such as the plurality of input / output terminals 2 or the plurality of signal terminals 3 is in contact with the lower mold 13 so as to cover the opening of the terminal lead-out groove 13a. .

図4の例で説明すると、このように設置された成形金型の注入ゲート14bから、約300℃で溶融した状態の熱可塑性樹脂であるPPS樹脂が、成形金型内のキャビティに注入される。成形金型内にPPS樹脂が充填され圧力が加えられると、連結部材12は端子導出用溝14a周囲の上型壁面に約40MPaの樹脂圧によって押し付けられる。ここで連結部材12も同じ熱可塑性樹脂であるPPS樹脂からなっているため、注入ゲート14bから注入された溶融した状態のPPS樹脂と接触すると、その熱により連結部材12は軟化し、上記樹脂圧と相俟って上型14と連結部材12との間に生じていた僅かな隙間を完全に封鎖するため、注入樹脂が上記隙間を通って端子導出用溝14aに浸入し結果としてバリが発生することを防止している。図5の例での説明は省略するが上記と同様である。   In the example of FIG. 4, the PPS resin, which is a thermoplastic resin melted at about 300 ° C., is injected into the cavity in the molding die from the injection gate 14b of the molding die thus installed. . When PPS resin is filled in the molding die and pressure is applied, the connecting member 12 is pressed against the upper mold wall surface around the terminal lead-out groove 14a by a resin pressure of about 40 MPa. Here, since the connecting member 12 is also made of the same thermoplastic resin, PPS resin. When the connecting member 12 comes into contact with the molten PPS resin injected from the injection gate 14b, the connecting member 12 is softened by the heat and the resin pressure is increased. In combination with this, in order to completely seal the slight gap formed between the upper mold 14 and the connecting member 12, the injected resin enters the terminal lead-out groove 14a through the gap and as a result, burrs are generated. To prevent it. Although the description in the example of FIG. 5 is omitted, it is the same as above.

本実施の形態における端子ブロックは、従来例と同様に外部端子を金型にセットしてPPS樹脂を注入して成形する方法(インサート成形)で製作してもよいが、予め外部端子に相当する位置に適切な貫通孔を形成した連結部材12を用意しておき、外部端子を上記貫通孔に圧入して成形する方法(アウトサート成形)によって製作した方が好適である。上述の上型14と下型13との型締めの際に、上型14が連結部材12に当接し、上型14と連結部材12との間に圧力が加わる程度まで連結部材12を外部端子に対し滑動させることができ、かつ連結部材12の貫通孔と外部端子との間の摩擦力の範囲内で上記圧力を維持することができるためである。インサート成形であれば、外部端子と金型間のクリアランスを考慮に入れる必要があるため、外部端子と連結部材12との相対位置又は複数の外部端子間の相対位置のバラツキを抑えることは困難であるが、アウトサート成形であれば、外部端子と連結部材12との相対位置のバラツキは上記滑動で吸収でき、複数の外部端子間の相対位置のバラツキは金型の加工精度で決まるため端子位置の制御が容易となり、モールド成形の際に端子部にモールド樹脂が入り込み付着することを防止する上で好適である。   The terminal block in the present embodiment may be manufactured by a method (insert molding) in which an external terminal is set in a mold and PPS resin is injected and molded as in the conventional example, but corresponds to the external terminal in advance. It is preferable to prepare a connecting member 12 having an appropriate through-hole formed at a position and to manufacture the external terminal by press-fitting the through-hole into the through-hole (outsert molding). When the upper mold 14 and the lower mold 13 are clamped, the upper mold 14 comes into contact with the connecting member 12 and the connecting member 12 is externally connected to the extent that pressure is applied between the upper mold 14 and the connecting member 12. This is because the pressure can be maintained within the range of the frictional force between the through hole of the connecting member 12 and the external terminal. If it is insert molding, since it is necessary to take into account the clearance between the external terminal and the mold, it is difficult to suppress variations in the relative position between the external terminal and the connecting member 12 or between the plurality of external terminals. However, in the case of outsert molding, the variation in the relative position between the external terminal and the connecting member 12 can be absorbed by the above-mentioned sliding, and the variation in the relative position between the plurality of external terminals is determined by the processing accuracy of the mold. This is suitable for preventing the mold resin from entering and adhering to the terminal portion during molding.

端子ブロックをこのようなアウトサート成形により製作した場合、連結部材12の貫通孔と外部端子との間に僅かな隙間が発生する場合もあるが、本実施の形態にかかる電力半導体装置においては、その後のインジェクションモールド工程における高温のPPS樹脂の充填中に、連結部材12のPPS樹脂が軟化し充填圧力により加圧されることにより、上記隙間は封鎖されるので、隙間を経由した水分の浸入による高温高湿における信頼性の低下は生じない。   When the terminal block is manufactured by such outsert molding, a slight gap may occur between the through hole of the connecting member 12 and the external terminal, but in the power semiconductor device according to the present embodiment, During filling of the high-temperature PPS resin in the subsequent injection molding step, the gap is sealed by the softening of the PPS resin of the connecting member 12 and pressurization by the filling pressure, so that the penetration of moisture through the gap There is no decrease in reliability at high temperature and high humidity.

連結部材12は、その断面が図2に示されているように、その幅が樹脂筐体表面から樹脂筐体内部に向かうにつれ大きくなっていくような形状にするのが好適である。装置100を取付け穴4においてネジ締めした場合に、樹脂筐体1と連結部材12との境界面に発生する応力により、上記境界面に剥離が発生することを防止するためである。   As shown in FIG. 2, the connecting member 12 preferably has such a shape that its width increases as it goes from the surface of the resin casing to the inside of the resin casing. This is to prevent the boundary surface from being peeled off by the stress generated on the boundary surface between the resin casing 1 and the connecting member 12 when the device 100 is screwed in the mounting hole 4.

また、連結部材12には、分子量が大きく、ガラス繊維等のフィラーの充填量を増やした剛性の高いPPS樹脂を用いることも可能である。樹脂筐体1を形成する樹脂は、半導体素子であるIGBT8やダイオード9を比較的低圧で封止するため、分子量の小さい低粘度の樹脂を用いる必要があった。そのため、外部端子の曲げ加工工程やネジ締め工程等において加わる外力によりパッケージに亀裂が発生する惧れがあったが、連結部材12の材質を上記のような高剛性のPPS樹脂とすることにより、連結部材12により補強されてパッケージに亀裂が発生する惧れは無くなった。   Further, the connecting member 12 may be made of a highly rigid PPS resin having a large molecular weight and an increased amount of filler such as glass fiber. The resin forming the resin casing 1 needs to use a low-viscosity resin having a small molecular weight in order to seal the IGBT 8 and the diode 9 which are semiconductor elements at a relatively low pressure. Therefore, there was a risk that the package would crack due to external force applied in the bending process or screwing process of the external terminal, etc., but by using the high rigidity PPS resin as the material of the connecting member 12 as described above, There is no longer a possibility that the package is cracked by being reinforced by the connecting member 12.

このように、本発明の実施の形態に係る電力半導体装置においては、外部端子を相互に連結している連結部材12の材質をPPS樹脂のような熱可塑性樹脂とし、樹脂筐体1を構成する材質も同じPPS樹脂のような熱可塑性樹脂としたため、インジェクションモールド成形時において成形金型の上型14に設けられた端子導出用溝14aを覆うようにこの連結部材12を上型14に当接させることにより、注入樹脂が上記隙間を通って端子導出用溝14aに浸入し結果としてバリが発生することを防止できるという効果を奏する。   As described above, in the power semiconductor device according to the embodiment of the present invention, the material of the connecting member 12 that connects the external terminals to each other is a thermoplastic resin such as PPS resin, and the resin casing 1 is configured. Since the material is also a thermoplastic resin such as PPS resin, the connecting member 12 is brought into contact with the upper die 14 so as to cover the terminal lead-out groove 14a provided in the upper die 14 of the molding die at the time of injection molding. By doing so, it is possible to prevent the injected resin from entering the terminal lead-out groove 14a through the gap and, as a result, generating burrs.

<実施の形態2>
図6は本発明に係る電力半導体装置の実施の形態2の断面図である。本実施の形態の斜視図は実施の形態1の斜視図と同じ図1であり、図6は図1のB−B断面図にあたる。実施の形態1との相違点は入出力端子2に屈曲部2aを設けた点にあり、それ以外の構成は実施の形態1で示した構成と同じである。
<Embodiment 2>
FIG. 6 is a sectional view of a power semiconductor device according to a second embodiment of the present invention. The perspective view of the present embodiment is the same as FIG. 1 as the perspective view of the first embodiment, and FIG. 6 is a sectional view taken along the line BB of FIG. The difference from the first embodiment is that the input / output terminal 2 is provided with a bent portion 2a, and the other configuration is the same as the configuration shown in the first embodiment.

本実施の形態においては、端子ブロックは連結部材12と屈曲部2aを連結部材12と入出力端子2の配線パターン7に対する当接面との間に設けた入出力端子2とから構成されている。このような端子ブロックを他の部品と共に所定の配線パターン上に半田により接合した組立体を、実施の形態1と同様に成形金型の下型13の所定の位置に設置し、上型14内に設けられた端子導出用溝14a内に複数の入出力端子2及び複数の信号端子3とが収容されるように上型14と下型13とを型締めする。その過程で上型14は連結部材12に当接し、その型締め力により連結部材12に押し下げようとする力を加えるため、屈曲部2aに僅かにたわみが発生する。端子ブロックがアウトサート成形で製作されていた場合は、連結部材12は屈曲部2aまで滑動することとなるが、屈曲部2aのところで止まるため、やはり屈曲部2aに僅かにたわみが発生する。   In the present embodiment, the terminal block includes the connecting member 12 and the input / output terminal 2 provided with the bent portion 2a between the connecting member 12 and the contact surface of the input / output terminal 2 with respect to the wiring pattern 7. . An assembly in which such a terminal block is joined together with other parts onto a predetermined wiring pattern by soldering is installed at a predetermined position of the lower mold 13 of the molding die in the same manner as in the first embodiment, and the inside of the upper mold 14 The upper die 14 and the lower die 13 are clamped so that the plurality of input / output terminals 2 and the plurality of signal terminals 3 are accommodated in the terminal lead-out grooves 14 a provided in the upper part. In this process, the upper die 14 comes into contact with the connecting member 12 and applies a force to push down the connecting member 12 by the clamping force, so that a slight deflection occurs in the bent portion 2a. When the terminal block is manufactured by outsert molding, the connecting member 12 slides to the bent portion 2a, but stops at the bent portion 2a, so that the bent portion 2a is slightly bent.

この屈曲部2aのたわみによる弾性力により連結部材12は上型14の壁面に加圧接触させられる。このため、連結部材12と入出力端子2の配線パターン7に対する当接面との間の距離に多少のバラツキが存在しても、そのバラツキにより発生する上型14と連結部材12との間に生じていた僅かな隙間は、屈曲部2aの僅かなたわみにより吸収され、加えて上記加圧接触の効果により、注入樹脂が上記隙間を通って端子導出用溝14aに浸入し結果としてバリが発生することを防止できるという効果を奏する。   The connecting member 12 is brought into pressure contact with the wall surface of the upper mold 14 by the elastic force caused by the bending of the bent portion 2a. For this reason, even if there is some variation in the distance between the connecting member 12 and the contact surface of the input / output terminal 2 with respect to the wiring pattern 7, there is a gap between the upper mold 14 and the connecting member 12 generated by the variation. The slight gap that has occurred is absorbed by the slight deflection of the bent portion 2a, and in addition, due to the effect of the pressure contact, the injected resin enters the terminal lead-out groove 14a through the gap and as a result, burrs are generated. There is an effect that can be prevented.

このように構成された電力半導体装置においては、成形金型内の寸法によって端子高さを規定することができるため、放熱板の初期状態での反り等の影響を受けずに正確な端子高さを得ることができる。ここで端子高さとは、入出力端子2の上表面(筐体から露出する面)の放熱板5の裏面からの高さをいう。また、入出力端子2だけでなく信号端子3に対してもこのような屈曲部を設けることができ、同様な効果を奏することはいうまでも無いことである。入出力端子2や信号端子3のような外部端子に設ける屈曲部2aの形状については、図7に示されるように大きな曲率を有する半円状とすることもできる。曲率を大きくとることにより、型締めの際に屈曲部2aのたわみ量を大きく取ることができるからである。また、図8に示されるように屈曲部2aを複数個の屈曲で構成してもよい。放熱板6の面方向への屈曲部2a占有面積が小さくなり、板状リード10等を近接して配置することができるからである。さらに、図9に示されるように屈曲部2aを外部端子と配線パターン7との接合部としてもよい。外部端子の曲げ加工の回数を減らすことができるだけでなく、屈曲部の曲率を利用して半田のフィレット15を安定的に形成することができるため、半田量のバラツキを吸収しやすくできるからである。   In the power semiconductor device configured as described above, since the terminal height can be defined by the dimensions in the molding die, the accurate terminal height is not affected by the warp in the initial state of the heat sink. Can be obtained. Here, the terminal height refers to the height of the upper surface of the input / output terminal 2 (the surface exposed from the housing) from the back surface of the heat sink 5. Further, it is needless to say that such a bent portion can be provided not only for the input / output terminal 2 but also for the signal terminal 3 and has the same effect. About the shape of the bending part 2a provided in external terminals, such as the input / output terminal 2 and the signal terminal 3, as shown in FIG. 7, it can also be made into the semicircle shape which has a big curvature. This is because by increasing the curvature, it is possible to increase the amount of bending of the bent portion 2a during mold clamping. Further, as shown in FIG. 8, the bent portion 2a may be configured by a plurality of bends. This is because the area occupied by the bent portion 2a in the surface direction of the heat radiating plate 6 is reduced, and the plate-like lead 10 and the like can be arranged close to each other. Further, as shown in FIG. 9, the bent portion 2 a may be a joint portion between the external terminal and the wiring pattern 7. This is because not only the number of times of bending of the external terminals can be reduced, but also the solder fillet 15 can be stably formed by using the curvature of the bent portion, so that variations in the amount of solder can be easily absorbed. .

<実施の形態3>
図10は本発明に係る電力半導体装置の実施の形態3のモールド成形前の内部構造を示す斜視図である。実施の形態1との相違点は連結部材12の形状にあり、それ以外の構成は実施の形態1で示した構成と同じである。
<Embodiment 3>
FIG. 10 is a perspective view showing the internal structure of the power semiconductor device according to the third embodiment of the present invention before molding. The difference from the first embodiment lies in the shape of the connecting member 12, and the other configuration is the same as the configuration shown in the first embodiment.

連結部材12は、PPS樹脂からなり、連結している外部端子間に支柱部12aを有しており、外部端子と共に端子ブロックを構成している。ここで、支柱部12aは端子ブロックを支えるように絶縁層6に当接している。外部端子の配線パターン7への当接箇所の内任意の2箇所を結ぶ直線上以外の箇所で支柱部12aは絶縁層6に当接するように構成されており、端子ブロックは放熱板5上で自立する構造となっている。端子ブロックを配線パターン7に半田付けする際に、外部端子が直立するように半田付けが行われる必要があるが、このように連結部材12に支柱部12aを設け、一直線上に位置しない3点で支持されることにより、外部端子が傾いた状態で配線パターン7へ半田付けされることが防止される。   The connecting member 12 is made of PPS resin, has a column portion 12a between connected external terminals, and constitutes a terminal block together with the external terminals. Here, the column portion 12a is in contact with the insulating layer 6 so as to support the terminal block. The strut portion 12a is configured to contact the insulating layer 6 at a position other than a straight line connecting any two of the contact positions of the external terminal to the wiring pattern 7, and the terminal block is arranged on the heat sink 5. It has a self-supporting structure. When the terminal block is soldered to the wiring pattern 7, it is necessary to perform soldering so that the external terminals stand upright. In this way, the support member 12 is provided with the column portion 12 a and is not located on a straight line. As a result, the external terminals are prevented from being soldered to the wiring pattern 7 in a tilted state.

また、図10のような組立体を成形金型に設置し型締めする際に、連結部材12が支柱部12aにより絶縁層6に当接していることによって、絶縁層6の表面と連結部材12の上型に対向する面との距離が精度良く規定される。これにより支柱部12aが無ければ起こるかもしれない連結部材12と上型との間の隙間の発生により、注入樹脂が上記隙間を通って端子導出用溝14aに浸入し結果としてバリが発生することを防止できるという効果を奏する。   Further, when the assembly as shown in FIG. 10 is installed in a molding die and clamped, the connecting member 12 is in contact with the insulating layer 6 by the support 12a, so that the surface of the insulating layer 6 and the connecting member 12 are contacted. The distance from the surface facing the upper mold is accurately defined. Due to this, a gap between the connecting member 12 and the upper mold, which may occur if the column portion 12a is not present, causes the injected resin to enter the terminal lead-out groove 14a through the gap and as a result, burrs are generated. The effect that can be prevented.

このような構成とした場合、成形金型の型締め時に、放熱板5の反りにより絶縁層6又は連結部材12に予定外の力が加わる可能性もあるが、PPS樹脂で形成されている連結部材12はその弾性率が他の材料と比べて低いため破断しにくく、絶縁層6と連結部材12とが接触する部分の直上の金型面には端子導出用溝14aが形成されておらず、絶縁層6への加圧の反力を面で受けることとなるため、連結部材12が撓むことによる割れ等や絶縁層6への損傷は考慮しなくてもよい。   In such a configuration, there is a possibility that an unscheduled force may be applied to the insulating layer 6 or the connecting member 12 due to the warp of the heat sink 5 when the mold is clamped, but the connection made of PPS resin. Since the member 12 has a lower elastic modulus than other materials, it is difficult to break, and the terminal lead-out groove 14a is not formed on the mold surface immediately above the portion where the insulating layer 6 and the connecting member 12 are in contact with each other. In addition, since the reaction force of the pressure applied to the insulating layer 6 is received by the surface, it is not necessary to consider cracks caused by the bending of the connecting member 12 and damage to the insulating layer 6.

<実施の形態4>
図11は本発明に係る電力半導体装置の実施の形態4における内部構造を示す斜視図である。実施の形態3との相違点は連結部材12の形状にあり、それ以外の構成は実施の形態1で示した構成と同じである。
<Embodiment 4>
FIG. 11 is a perspective view showing the internal structure of the power semiconductor device according to the fourth embodiment of the present invention. The difference from the third embodiment lies in the shape of the connecting member 12, and the other configuration is the same as the configuration shown in the first embodiment.

本実施の形態において連結部材12は四辺形の放熱板5の周辺上で4つの細長い梁が閉ループなすように設けられており、複数の入出力端子2及び複数の信号端子3を連結し、併せて端子ブロックを構成している。このような端子ブロックは、インサート成形又はアウトサート成形のいずれの方法で製作するにしても、その連結部材12の部分は金型にガラス繊維を配合したPPS樹脂を注入することにより製作される。   In the present embodiment, the connecting member 12 is provided so that four elongated beams form a closed loop on the periphery of the quadrilateral heat sink 5, and connects the plurality of input / output terminals 2 and the plurality of signal terminals 3 together. Terminal block. Even if such a terminal block is manufactured by either insert molding or outsert molding, the portion of the connecting member 12 is manufactured by injecting a PPS resin in which glass fibers are blended into a mold.

一般的にガラス繊維が配合されたPPS樹脂の線膨張率は、ガラス繊維の配向方向で約20ppm/℃であり、ガラス繊維の配向方向に直交する方向で約40ppm/℃である。例えば図4のような成形金型にて樹脂筐体を形成した場合、ガラス繊維の配向方向は樹脂の流動方向である樹脂筐体1の長辺方向となる。したがって長辺方向の樹脂筐体の線膨張率は約20ppm/℃となり、放熱板5の材質である銅(約16ppm/℃)やアルミニウム(約23ppm/℃)の線膨張率とほぼ同等となり、長辺方向では熱膨張/収縮による装置の反りは発生しないが、短辺方向の樹脂筐体の線膨張率は約40ppm/℃となるため、短辺方向では熱膨張/収縮による装置の反りが発生する。   In general, the linear expansion coefficient of the PPS resin in which glass fibers are blended is about 20 ppm / ° C. in the orientation direction of the glass fibers and about 40 ppm / ° C. in the direction orthogonal to the orientation direction of the glass fibers. For example, when the resin casing is formed with a molding die as shown in FIG. 4, the orientation direction of the glass fiber is the long side direction of the resin casing 1 which is the resin flow direction. Therefore, the linear expansion coefficient of the resin casing in the long side direction is about 20 ppm / ° C., which is almost the same as the linear expansion coefficient of copper (about 16 ppm / ° C.) or aluminum (about 23 ppm / ° C.) which is the material of the heat sink 5. The warp of the device due to thermal expansion / contraction does not occur in the long side direction, but the linear expansion coefficient of the resin casing in the short side direction is about 40 ppm / ° C. Therefore, the warp of the device due to thermal expansion / contraction in the short side direction. Occur.

ここで、上述のように製作された端子ブロックの連結部材12ではガラス繊維は樹脂の流動方向であるループ方向に配向するため、四辺の閉ループ形状を有する連結部材12は長辺及び短辺のいずれの方向においても、その線膨張率は約20ppm/℃となり、放熱板5の線膨張率とほぼ同等となる。本実施の形態で開示するように、このような連結部材12を放熱板5の周辺上に対応するように四辺の閉ループ形状に配置することにより、上述したような装置の短辺方向での反りを緩和できる。すなわち、四辺の閉ループ形状の連結部材12の長辺部分の両端を線膨張率が約20ppm/℃の短辺部分で支えることになり、樹脂筐体1の短辺方向の熱膨張/収縮を抑制するからである。この際、連結部材12に分子量が大きくガラス繊維等のフィラーの充填量を増加させた高剛性のPPS樹脂を用いることにより、実施の形態1において記述したように、パッケージの強度向上と共に装置の反りの抑制という効果を同時に達成することも可能である。   Here, in the connection member 12 of the terminal block manufactured as described above, since the glass fiber is oriented in the loop direction which is the resin flow direction, the connection member 12 having a four-sided closed loop shape has either a long side or a short side. Also in this direction, the linear expansion coefficient is about 20 ppm / ° C., which is substantially equal to the linear expansion coefficient of the heat sink 5. As disclosed in the present embodiment, such a connecting member 12 is arranged in a four-sided closed loop shape so as to correspond to the periphery of the heat sink 5, thereby warping the apparatus as described above in the short side direction. Can be relaxed. That is, both ends of the long side portion of the four-side closed-loop connecting member 12 are supported by the short side portion having a linear expansion coefficient of about 20 ppm / ° C., thereby suppressing thermal expansion / contraction in the short side direction of the resin casing 1. Because it does. At this time, as described in the first embodiment, by using a high-rigidity PPS resin having a large molecular weight and an increased filling amount of a filler such as glass fiber for the connecting member 12, as described in the first embodiment, the warping of the apparatus is improved. It is also possible to achieve the effect of suppressing the above.

以上、図面に基づき本発明の具体的な実施の形態を説明したが、本発明はこれらに限らず種々の改変が可能である。例えば、上記各実施の形態においては、放熱板5上の回路については、エポキシ樹脂を基材とした絶縁層6によって接着された銅板の配線パターンであったが、アルミナや窒化アルミニウムといったセラミック絶縁基板上にロウ付けされた銅板の配線パターンでも良い。配線パターンの材料には銅が使用されているが、電気伝導性の良好な他の金属であっても良い。電力半導体素子はIGBT及びダイオードの組合せであったが、MOSFET、バイポーラトランジスタ、ダイオードその他のあらゆる電力半導体素子の単独又はいかなる組合せであっても良い。また、樹脂筐体1及び連結部材12の材料はPPS樹脂に限定されるものではなく、ポリブチレンテレフタラート樹脂等の熱可塑性樹脂であれば同様の効果を奏することはいうまでも無いことである。   While specific embodiments of the present invention have been described with reference to the drawings, the present invention is not limited to these and various modifications can be made. For example, in each of the above embodiments, the circuit on the heat sink 5 is a copper plate wiring pattern bonded by an insulating layer 6 based on an epoxy resin, but a ceramic insulating substrate such as alumina or aluminum nitride. The wiring pattern may be a copper plate brazed on top. Although copper is used as the material of the wiring pattern, other metal having good electrical conductivity may be used. The power semiconductor element is a combination of an IGBT and a diode, but may be a MOSFET, a bipolar transistor, a diode, or any other power semiconductor element alone or in any combination. Further, the material of the resin casing 1 and the connecting member 12 is not limited to the PPS resin, and it goes without saying that the same effect can be obtained if it is a thermoplastic resin such as polybutylene terephthalate resin. .

この発明に係る電力半導体装置は、産業用のモータ制御機器に適用することにより、その機器の電力変換効率の向上に寄与することができる。   By applying the power semiconductor device according to the present invention to an industrial motor control device, it is possible to contribute to an improvement in power conversion efficiency of the device.

1 樹脂筐体
2 入出力端子
2a 屈曲部
3 信号端子
4 取付け穴
5 放熱板
6 絶縁層
7 配線パターン
8 IGBT
9 ダイオード
10 板状リード
11 信号リード
12 連結部材
13 下型
13a 端子導出用溝
13b 位置決めピン
14 上型
14a 端子導出用溝
14b 注入ゲート
15 半田フィレット
1 Resin housing
2 Input / output terminal 2a Bent part 3 Signal terminal 4 Mounting hole 5 Heat sink 6 Insulating layer 7 Wiring pattern 8 IGBT
9 Diode 10 Plate-like lead 11 Signal lead 12 Connecting member 13 Lower die 13a Terminal lead groove 13b Positioning pin 14 Upper die 14a Terminal lead groove 14b Injection gate 15 Solder fillet

Claims (4)

放熱板と、
前記放熱板の主表面上に設けられた絶縁層と
前記絶縁層の主表面上に設けられた複数の配線パターンと、
前記複数の配線パターンに当接するように設けられた複数の外部端子と、
前記複数の外部端子を相互に連結する熱可塑性樹脂からなる連結部材と、
前記絶縁層、前記配線パターンと前記外部端子とを覆う熱可塑性樹脂からなる筐体と、
を備え、
前記連結部材を構成する熱可塑性樹脂は前記筐体を構成する熱可塑性樹脂よりも剛性が高いことを特徴とする電力半導体装置。
A heat sink,
An insulating layer provided on the main surface of the heat sink and a plurality of wiring patterns provided on the main surface of the insulating layer;
A plurality of external terminals provided in contact with the plurality of wiring patterns;
A connecting member made of a thermoplastic resin for connecting the plurality of external terminals to each other;
A housing made of a thermoplastic resin that covers the insulating layer, the wiring pattern and the external terminal;
With
The power semiconductor device, wherein the thermoplastic resin constituting the connecting member is higher in rigidity than the thermoplastic resin constituting the housing.
前記外部端子は、前記配線パターンに対する当接面と前記連結部材との連結部分との間に屈曲部を有していることを特徴とする請求項1記載の電力半導体装置。 The power semiconductor device according to claim 1, wherein the external terminal has a bent portion between a contact surface with respect to the wiring pattern and a connecting portion of the connecting member. 前記外部端子は少なくとも2つ以上あり、
前記連結部材は、前記絶縁層に当接するように延設された支柱部を有し、
前記外部端子の前記配線パターンに対する当接箇所の内任意の2箇所を結ぶ直線上以外の箇所で、前記支柱部は前記絶縁層に当接していることを特徴とする請求項1記載の電力半導体装置。
There are at least two external terminals,
The connecting member has a column portion extending so as to contact the insulating layer,
2. The power semiconductor according to claim 1, wherein the support portion is in contact with the insulating layer at a place other than a straight line connecting any two of the contact positions of the external terminal with respect to the wiring pattern. apparatus.
前記連結部材の形状は、前記放熱板の周辺上部に閉ループを構成するような形状であることを特徴とする請求項1記載の電力半導体装置。 The power semiconductor device according to claim 1, wherein a shape of the connecting member is a shape that forms a closed loop at an upper peripheral portion of the heat radiating plate.
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