JP2012230017A5 - - Google Patents

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Publication number
JP2012230017A5
JP2012230017A5 JP2011098825A JP2011098825A JP2012230017A5 JP 2012230017 A5 JP2012230017 A5 JP 2012230017A5 JP 2011098825 A JP2011098825 A JP 2011098825A JP 2011098825 A JP2011098825 A JP 2011098825A JP 2012230017 A5 JP2012230017 A5 JP 2012230017A5
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JP
Japan
Prior art keywords
distal end
guide plate
cooling device
sample cooling
eccentric
Prior art date
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Application number
JP2011098825A
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English (en)
Japanese (ja)
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JP5346057B2 (ja
JP2012230017A (ja
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Priority to JP2011098825A priority Critical patent/JP5346057B2/ja
Priority claimed from JP2011098825A external-priority patent/JP5346057B2/ja
Priority to US13/454,393 priority patent/US9008270B2/en
Publication of JP2012230017A publication Critical patent/JP2012230017A/ja
Publication of JP2012230017A5 publication Critical patent/JP2012230017A5/ja
Application granted granted Critical
Publication of JP5346057B2 publication Critical patent/JP5346057B2/ja
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JP2011098825A 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置 Active JP5346057B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011098825A JP5346057B2 (ja) 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置
US13/454,393 US9008270B2 (en) 2011-04-26 2012-04-24 Sample cooling apparatus for X-ray diffractometer and X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011098825A JP5346057B2 (ja) 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置

Publications (3)

Publication Number Publication Date
JP2012230017A JP2012230017A (ja) 2012-11-22
JP2012230017A5 true JP2012230017A5 (https=) 2013-05-30
JP5346057B2 JP5346057B2 (ja) 2013-11-20

Family

ID=47067886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011098825A Active JP5346057B2 (ja) 2011-04-26 2011-04-26 Ｘ線分析装置の試料冷却装置及びｘ線分析装置

Country Status (2)

Country Link
US (1) US9008270B2 (https=)
JP (1) JP5346057B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9609729B2 (en) * 2013-04-19 2017-03-28 Raytheon Company X-ray cells and other components having gas cells with thermally-induced density gradients
DE102014205631B4 (de) * 2014-03-26 2017-06-01 Siemens Healthcare Gmbh Strahlersystem
CN106645237B (zh) * 2016-11-09 2023-08-25 丹东浩元仪器有限公司 一种x射线衍射仪用高温测量装置
KR102409643B1 (ko) * 2017-12-28 2022-06-16 가부시키가이샤 리가쿠 X선 검사 장치
WO2020105724A1 (ja) * 2018-11-23 2020-05-28 株式会社リガク 単結晶ｘ線構造解析装置および試料ホルダ
CN111624216B (zh) * 2020-07-23 2023-09-19 丹东通达科技有限公司 一种用于x射线衍射仪在高温下测量样品特性的检测装置
CN113640327B (zh) * 2021-06-03 2023-07-25 中国工程物理研究院材料研究所 一种大曲率微小件表面多层金属薄膜的无损检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3206377B2 (ja) 1995-07-05 2001-09-10 株式会社日立製作所 配線形成方法
JPH09229834A (ja) * 1996-02-20 1997-09-05 Rigaku Corp Ｘ線装置の試料支持装置
US6408047B1 (en) * 2000-10-04 2002-06-18 Rigaku/Msc, Inc. Method of providing high throughput protein crystallography
JP2002116158A (ja) * 2000-10-05 2002-04-19 Rigaku Corp Ｘ線測定方法及びｘ線装置
JP2002357381A (ja) * 2001-06-01 2002-12-13 Rigaku Corp 冷却装置及びｘ線装置
WO2003050598A2 (en) * 2001-12-12 2003-06-19 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
JP4023671B2 (ja) * 2002-08-06 2007-12-19 日本サーマルエンジニアリング株式会社 Ｘ線結晶解析用冷却方法および冷却装置
EP2008037A2 (en) * 2006-03-30 2008-12-31 Cornell Research Foundation, Inc. System and method for increased cooling rates in rapid cooling of small biological samples

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