JP2012204718A - Joining device and joining method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a technique capable of improving connection reliability between connection terminals.SOLUTION: An upper clamp 16 and a lower clamp 17 clamp a work W having a connection pad 5 and a connection bump 6 positioned opposite and make the connection pad 5 and connection bump 6 abut against each other. An ultrasonic vibrator 32 vibrates the connection pad 5 and connection bump 6 abutting against each other. A heater 31 heats the connection pad 5 and connection bump 6 abutting against each other. A seal mechanism 14 is provided at a periphery of the upper clamp 16 and a plurality of lower clamps 17 to form a sealed space in which the clamped work W is included. The upper clamp 16 and lower clamp 17 further press the connection pad 5 and connection bump 6 which are heated to join the connection pad 5 and connection bump 6 together.

Description

  The present invention relates to a bonding apparatus and a bonding method, and more particularly to a technique effectively applied to a bonding apparatus and a bonding method for bonding a connection terminal of an electronic component and a connection terminal of a substrate when mounting the electronic component on a substrate.

  Japanese Laid-Open Patent Publication No. 4-171949 (Patent Document 1) discloses a technique relating to a method for manufacturing a semiconductor device in which a plurality of semiconductor elements are pressed onto a substrate by a batch crimping jig and heated to be crimped. Here, an insulating resin is used that holds the semiconductor element and the substrate mechanically while maintaining electrical connection.

  Japanese Unexamined Patent Application Publication No. 2006-120724 (Patent Document 2) discloses a technique related to an ultrasonic mounting method in which a semiconductor chip is ultrasonically bonded (ultrasonic welding) to a substrate.

JP-A-4-171949 JP 2006-120724 A

  For example, when an electronic component (for example, a semiconductor chip) is mounted on a wiring board, the connection terminals (connection bumps) of the electronic component and the connection terminals (connection pads) of the board need to be reliably electrically connected. In addition, in order to protect the connection terminals, it is necessary to provide connection reliability by providing an insulating resin between the electronic component and the wiring board. For example, an adhesive layer of NCF (Non Conductive Film) or NCP (Non Conductive Paste) is used as the insulating resin. In Patent Document 1, an insulating resin that is cured by thermal energy is used.

  By the way, when the connection terminal of the electronic component made of the solder bump is once melted to connect the connection terminal of the electronic component and the connection terminal of the wiring board, it is necessary to heat the connection terminal of the electronic component to the melting point of the solder.

  However, if the heat capacity on the side on which the wiring board is placed is large, the heating time until the temperature rises to the melting point of the solder becomes long, and the adhesive layer before being electrically connected to the connection terminal of the wiring board by the solder Curing of the resin progresses and there is a risk of poor connection. Moreover, when heating time becomes long, depending on the contact bonding layer, it is assumed that the fine air mixed beforehand expand | swells or foams by heating, and causes poor connection. The technique of Patent Document 1 is for applying thermal energy to cure the adhesive layer (insulating resin). When the thermal energy is applied until the connection terminal of the electronic component is melted, this is the case. It is thought that a bad connection will occur.

  Also, when mounting electronic components on a wiring board, the solder is melted to join the connection terminals and the adhesive layer is heated and cured. If anything (foreign matter) that interferes with the connection of a film or the like is present, a connection failure occurs.

  The objective of this invention is providing the technique which can improve the connection reliability of each member joined by clamping the workpiece | work containing a some member. The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  Of the inventions disclosed in the present application, the outline of typical ones will be briefly described as follows. A joining apparatus according to an embodiment of the present invention is a joining apparatus that clamps a workpiece including a first member and a plurality of second members bonded on the first member and collectively joins the members, A first clamper that clamps the workpiece corresponding to the first member; a plurality of second clampers that oppose the first clamper and clamp the workpiece corresponding to each of the plurality of second members; A heater that heats the clamped workpiece from the first clamper side, and an ultrasonic transducer that applies ultrasonic vibration to the clamped workpiece from at least one side of the first or second clamper And a sealing mechanism that is provided around the first clamper and the plurality of second clampers and forms a sealed space in which the clamped workpiece is contained.

  Of the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows. According to this embodiment, the connection reliability of each member joined by clamping a workpiece including a plurality of members can be improved.

It is sectional drawing which shows typically the joining apparatus in operation | movement in one Embodiment of this invention. It is sectional drawing which shows typically the joining apparatus in operation | movement following FIG. It is sectional drawing which shows typically the joining apparatus in operation | movement following FIG. It is sectional drawing which shows typically the joining apparatus in operation | movement in other embodiment of this invention. It is sectional drawing which shows typically the joining apparatus in operation | movement following FIG. It is sectional drawing which shows typically the joining apparatus in operation | movement following FIG. It is sectional drawing which shows typically the lower clamper in other embodiment of this invention. FIG. 8 is a cross-sectional view schematically showing a lower clamper during operation following FIG. 7. FIG. 9 is a cross-sectional view schematically showing the lower clamper during operation following FIG. 8. It is sectional drawing which shows typically the semiconductor device in the manufacturing process in one Embodiment of this invention. FIG. 11 is a cross-sectional view schematically showing the semiconductor device in the manufacturing process following FIG. 10. FIG. 12 is a cross-sectional view schematically showing the semiconductor device in the manufacturing process following FIG. 11.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiments, and the repetitive description thereof may be omitted.

(Embodiment 1)
The structure of the joining apparatus in this embodiment is demonstrated with reference to FIG. 1 A of this joining apparatus clamps the workpiece | work W (refer FIG. 10) containing the wiring board 2 (1st member) and the some electronic component 3 (2nd member) adhere | attached on this, A plurality of electronic components 3 are joined (crimped) together. That is, the bonding apparatus 1 </ b> A is a semiconductor manufacturing apparatus that manufactures a semiconductor device 7 (see FIG. 12) in which a plurality of electronic components 3 are mounted (electrically connected) to the wiring board 2. Note that, as shown in FIG. 11, the workpieces W may be collectively bonded so that the connection bumps 6 are in contact with the connection pads 5.

  The joining apparatus 1A is clamped by a clamp mechanism 10 that sandwiches and clamps the workpiece W, a pressurizing mechanism 11 (load mechanism) that pressurizes the clamped workpiece W, and a heating mechanism 12 that heats the clamped workpiece W. And a vibration mechanism 13 for applying ultrasonic vibration to the workpiece W. Furthermore, the joining apparatus 1A includes a seal mechanism 14 that seals a space containing the clamped workpiece W, and a compression mechanism 15 that makes the sealed space a compression space.

  First, the clamp mechanism 10 of the joining apparatus 1A will be specifically described. An upper clamper 16 (first clamper) and a plurality of lower clampers that are pressurizing means (pressurizing units) that are provided so as to be opposed to each other in the vertical direction, clamp the workpiece W by clamping the workpiece W, 17 (second clamper). The upper clamper 16 is made of, for example, alloy tool steel, and has an upper clamp surface 16a. The lower clamper 17 is made of, for example, alloy tool steel, and has a lower clamper surface 17a. The workpiece W is clamped by the upper clamp surface 16a and the lower clamp surface 17a. In the present embodiment, the workpiece W is clamped by the upper clamper 16 corresponding to the wiring board 2 and the plurality of lower clampers 17 corresponding to each of the plurality of electronic components 3.

  The upper clamper 16 is fixedly assembled below the upper base 21 (for example, made of alloy tool steel). The plurality of lower clampers 17 are fixedly provided on a support plate 22 (for example, made of alloy tool steel) at a predetermined interval. Each of the plurality of lower clampers 17 is provided so as to be inserted into a plurality of through holes 27a penetrating the bottom of a downwardly concave frame 27 (for example, made of alloy tool steel) in the thickness direction. The lower clamper 17 can be accurately aligned with the support plate 22 using the frame 27 in which the through holes 27a are formed at predetermined intervals.

  In the present embodiment, the upper clamper 16 has a block shape according to the size of the wiring board 2, and the lower clamper 17 has a rod shape according to the size of the electronic component 3 smaller than the wiring board 2. A plurality of rod-like lower clampers 17 orthogonal to each other are provided at predetermined intervals. Further, in this embodiment, since ultrasonic vibration is applied to the workpiece W from the lower clamper 17 side, the clamper surface 17a of the lower clamper 17 that is a surface in contact with the workpiece W is set to the shape (size) of the workpiece W, that is, the The size is adapted to the size of the part 3.

  Further, by adopting a configuration in which a plurality of lower clampers 17 are provided at a predetermined interval with respect to the upper clamper 16, the total heat capacity of the plurality of lower clampers 17 becomes smaller than the heat capacity of the upper clamper 16. In other words, since the overall volume of the plurality of lower clampers 17 is smaller than that of the upper clamper 16, when the same material is used as in the present embodiment, the overall heat capacity of the lower clamper 17 is higher. It is smaller than the clamper 16. As will be described later, in the present embodiment, the heating mechanism 12 is provided on the upper clamper 16 side. Therefore, when the workpiece W is clamped by the upper clamper 16 and the lower clamper 17, the lower clamper 17 having a small heat capacity is rapidly heated by the pre-heated upper clamper 16, and the workpiece W is also rapidly heated to a predetermined temperature. be able to.

  By rapidly heating the workpiece W, the solder of the connection bump 6 is also rapidly melted before the adhesive layer 4 is cured. For this reason, before the connection pad 5 and the connection bump 6 are joined, it is possible to prevent a connection failure caused by the adhesive layer 4 being cured. Further, since the workpiece W is heated rapidly, even if fine air is mixed in the adhesive layer 4, the air is prevented from expanding or foaming, resulting in poor connection. Can be prevented.

  The concave frame 27 is assembled with its opening edge fixed by a lower base 28 (for example, made of alloy tool steel). In the clamp mechanism 10 of the present embodiment, the upper base 21 is fixed, and the lower base 28 can be moved up or down using an electric motor or toggle ring (not shown) with respect to the upper base 21. The lower base 28 may be fixed, and the upper base 21 may be moved up and down with respect to the lower base 28.

  Further, a through hole 28a penetrating in the thickness direction is formed in the central portion of the lower base 28. The pressurizing mechanism 11 is provided in the through hole 28 a of the lower base 28. The plurality of lower clampers 17 are floatingly supported by the pressure mechanism 11 with respect to the lower base 28 via the support plate 22. The rod-like lower clamper 17 that is floatingly supported is easily vibrated by the vibration mechanism 13.

  Next, the pressure mechanism 11 of the bonding apparatus 1A will be specifically described. The pressurizing mechanism 11 includes an elevating mechanism 24 that can be moved up and down. On the elevating mechanism 24, a heat insulating block 23 (for example, made of alloy tool steel) for preventing the heat from the heat heating mechanism 12 from being transmitted to the elevating mechanism 24 is provided. A support plate 22 is provided on the heat insulation block 23.

  The elevating mechanism 24 supports the support plate 22 at a predetermined position so that the vibration of the workpiece W by the vibration mechanism 13 acts effectively. Further, the elevating mechanism 24 is pushed down until it comes into contact with the lower base 28 of the support plate 22 in accordance with the operation of the clamp mechanism 10 (see FIG. 3).

  The heat insulation block 23 is formed with a through hole 23a having a convex cross section penetrating at the center, and seal members 25 and 26 (for example, O-rings) are provided at both ends thereof. In the through hole 23a, the opening area on the lifting mechanism 24 side is made larger than the opening area on the support plate 22 side, so that heat is hardly transmitted to the lifting mechanism 24 side. Further, the heat capacity of the heat insulating block 23 is reduced by the through holes 23a whose inner spaces are sealed by the sealing members 25 and 26.

  In the present embodiment, the workpiece W clamped from the upper clamper 16 side is heated. In order to heat the workpiece W rapidly, it is desired that the heat capacity is small on the lower clamper 17 side. On the other hand, since the lower clamper 17 and the like are rapidly heated, it is conceivable that heat is rapidly conducted to the elevating mechanism 24 via the support plate 22 and the block below the support plate 22. Therefore, in the present embodiment, the heat-insulating block 23 having the convex through holes 23a in which the opening area on the lifting mechanism 24 side is made larger than the opening area on the support plate 22 side is used to make it difficult to transfer heat to the lifting mechanism 24 side. ing.

  Next, the heating mechanism 12 of the bonding apparatus 1A will be specifically described. The heating mechanism 12 includes a heater 31 that heats the workpiece W clamped from the upper clamp 16 side. The heater 31 is built in the upper clamper 16 so as to extend in the direction perpendicular to the paper surface of FIG. That is, in order to improve the heating capability, the heater 31 is provided in parallel with the upper clamp surface 16a.

  The heating capacity of the heater 31 is a temperature at which the adhesive layer 4 between the wiring board 2 and the electronic component 3 is cured in consideration of members having a heat capacity such as the upper clamper 16 and the lower clamper 17, and It is necessary to apply a temperature for melting the connection bumps 6 of the electronic component 3 to the clamped workpiece W. In addition, when the connection bump 6 is a solder bump, the melting point is, for example, about 250 to 260 ° C. Further, when the adhesive layer 4 is NCF or NCP, the adhesive layer 4 is cured by adding a predetermined time at, for example, 200 ° C. to 260 ° C.

  Next, the vibration mechanism 13 of the joining apparatus 1A will be specifically described. The vibration mechanism 13 includes an ultrasonic vibrator 32 that applies ultrasonic vibration to the clamped workpiece W from the lower clamper 17 side. The ultrasonic transducer 32 is connected to the lower clamper 17 via the rod 33 and the support plate 22. Accordingly, the vibration mechanism 13 vibrates the clamped workpiece W with the ultrasonic vibrator 32 as a vibration source and the rod 33, the support plate 22 and the lower clamper 17 as a horn portion. The frequency of the ultrasonic transducer 32 is, for example, about 20 to 100 kHz. In FIG. 1, the rod 33 is provided so as to penetrate the frame 27 and the lower seal block 35, but the through hole is sealed.

  A plurality of rod-like lower clampers 17 are provided on the support plate 22 so as to pass through the through holes 27 a of the frame 27. The size of the through hole 27 a is a size that does not interfere when the lower clamper 17 vibrates, and a gap is formed between the inner wall of the through hole 27 a and the side surface of the lower clamper 17.

  In the heating mechanism 12 described above, the heat capacity is reduced by making the lower clamper 17 a rod shape with respect to the block-like upper clamper 16. Thereby, the heating capability of the heating mechanism 12 is improved. Since the vibration mechanism 13 can vibrate without reducing the efficiency as the object is smaller, the clamp surface 17a matched to the size of the electronic component 3 can be vibrated to the electronic component 3 smaller than the wiring board 2. A rod-shaped lower clamper 17 is provided. That is, in the present embodiment, the lower clamper 17 is also used in order to make the heating mechanism 12 and the vibration mechanism 13 function. Thereby, the number of parts of 1 A of joining apparatuses can be decreased.

  Next, the sealing mechanism 14 of the joining apparatus 1A will be specifically described. The sealing mechanism 14 is provided around the upper clamper 16 and the plurality of lower clampers 17 and forms a sealed space (sealed space 37) in which the clamped workpiece W is contained. The seal mechanism 14 includes an upper seal block 34 and a lower seal block 35 provided around the upper clamper 16 and the lower clamper 17.

  The upper seal block 34 has a cylindrical shape made of alloy tool steel, for example, and is fixedly assembled at the outer peripheral portion below the upper base 21. An upper clamper 16 is provided inside the cylindrical upper seal block 34. A seal member 42 (for example, an O-ring) is provided at an edge of the upper seal block 34 on the lower seal block 35 side. The lower seal block 35 has a cylindrical shape made of, for example, alloy tool steel, and is fixedly assembled at the outer peripheral portion on the lower base 28. A lower clamper 17 is provided inside the cylindrical lower seal block 35. Further, the edge of the lower seal block 35 on the upper seal block 34 side is provided to face the seal member 42.

  In the joining apparatus 1 </ b> A, a gap is formed between the inner wall of the through hole 28 a of the lower base 28 and the side surface of the heat insulating block 23. The air gap prevents the heat insulating block 23 below the support plate 22 from contacting the lower base 28 by the operation of the vibration mechanism 13 to hinder vibration, and reduces friction when the pressure mechanism 11 is moved up and down. It is formed to make it. In order to form such a gap, the seal mechanism 14 includes a seal member 43 (for example, an O-ring) that seals between the through hole 28 a of the lower base 28 and the heat insulating block 23.

  With the seal mechanism 14 having such a configuration, the upper base 21 and the lower base 28 come close to each other, so that the seal member 42 comes into contact with the edge of the lower seal block 35, and the sealed space 37 (see FIG. 2) In this sealed space, the workpiece W can be rapidly heated by the heating mechanism 12.

  Next, the compression mechanism 15 of the joining apparatus 1A will be specifically described. The compression mechanism 15 includes a compressor 41 that introduces compressed air into a sealed space 37 through a flow path 36 formed in the lower seal block 35. When an ultrasonic wave is vibrated to the clamped workpiece W, a void may be generated from the adhesive layer 4 (see FIG. 11) due to the ultrasonic vibration. Therefore, in the present embodiment, the generation of voids can be suppressed by exciting ultrasonic waves in the compressed space 37 (hereinafter referred to as the compression space 37). By suppressing the generation of voids in this way, the connection reliability between the connection pads 5 and the connection bumps 6 provided on the workpiece W can be improved.

  In addition, when the adhesive layer 4 is heated by radiant heat from the heating mechanism 12 before clamping, there is a possibility that the adhesive layer 4 expands due to the generation of voids and a force is applied to pull the electronic component 3 away from the wiring board 2. Since the workpiece | work W is heated in the compression space 37, the malfunction that the electronic component 3 floats up or inclines can be prevented effectively. In addition, by setting the compression space 37 when ultrasonically vibrating, it is also efficient to apply a force that shifts the connection terminals due to expansion of the adhesive layer 4 due to the generation or expansion of voids in the adhesive layer 4. Can be prevented. In addition, since the plurality of electronic components 3 are bonded to the wiring board 2 in the compression space 37, ultrasonic vibration and pressure heating can be performed while applying uniform pressure to the plurality of adhesive layers 4. It is also possible to make the molding quality uniform.

  Next, the bonding apparatus 1A according to the present embodiment is used to clamp the workpiece W including the laminated wiring board 2 and the plurality of electronic components 3 to bond the members together, and to the wiring board 2 with electrons. A method for mounting the electronic component 3 for mounting the component 3 (a method for manufacturing the semiconductor device 7) will be specifically described with reference to FIGS. 1 to 3 and FIGS. FIGS. 10-12 respond | corresponds to the workpiece | work W in the joining apparatus 1A in operation | movement of FIGS. 1-3, The principal part is expanded and shown.

  First, as shown in FIG. 10, a plurality of connection pads 5 of the wiring board 2 and a plurality of connection bumps 6 of each electronic component 3 corresponding to each other are aligned to face each other, and an adhesive layer 4 ( For example, a workpiece W in which a plurality of electronic components 3 are bonded via NCF or NCP) is prepared. A plurality of electronic components 3 are aligned and temporarily press-bonded to the wiring board 2 in a matrix using, for example, a known flip chip bonder.

  The wiring board 2 is, for example, a glass epoxy board, in which a wiring pattern is formed, and connection pads 5 exposed from the insulating layer 8 are formed. The electronic component 3 is, for example, a semiconductor chip or a chip capacitor, and solder bumps are used as the connection bumps 6. In this embodiment, the connection bump 6 (solder bump) is melted and joined to the connection pad 5.

  Subsequently, as shown in FIG. 1, the workpiece W is placed on the lower clamper 17 by a transport device (not shown) in a state where the upper clamper 16 and the lower clamper 17 are separated. Specifically, a plurality of electronic components 3 are arranged on each of the clamp surfaces 17 a of the plurality of lower clampers 17. Further, the wiring board 2 of the workpiece W is disposed so as to face the clamp surface 16 a of the upper clamper 16.

  Subsequently, the upper base 21 and the lower base 28 are brought close to each other by the clamper mechanism 10 to seal the space 37 in which the workpiece W clamped by the seal mechanism 14 is contained. Thereafter, compressed air 37 is formed by introducing compressed air into the space 37 sealed by the compression mechanism 15. In this case, it is necessary to set the pressure of the compressed space 37 higher than atmospheric pressure and high enough to suppress the expansion of the void by introducing compressed air, and preferably set to a high pressure enough to crush the void. Is preferred. The compression space 37 can be formed until the seal of the space 37 is released, for example. However, it is preferable that the compression space 37 is formed until at least the adhesive layer 4 is cured in order to prevent air from being foamed or to actively discharge air.

  Next, as shown in FIG. 2, the upper base 21 and the lower base 28 are brought closer to each other, so that the workpiece W is sandwiched between the upper clamper 16 and the plurality of lower clampers 17 respectively corresponding to the plurality of electronic components 3. Pressurize. As a result, the plurality of electronic components 3 on the wiring board 2 are collectively clamped.

  In each electronic component 3, as shown in FIG. 11, the adhesive layer 4 is pushed out by the connection bumps 6, and the corresponding connection bumps 6 are collectively applied to the connection pads 5 of the wiring board 2. Make contact. Since the upper clamper 16 is preheated by the heating mechanism 12, the connection pad 5 and the connection bump 6 start to be heated when the upper clamper 16 comes into contact with the workpiece W. In this embodiment, since the sum of the heat capacities of the plurality of lower clampers 17 is smaller than the heat capacity of the upper clamper 16, the connection pads 5 and the connection bumps 6 start to be heated rapidly.

  Next, the vibration mechanism 13 (ultrasonic vibrator 32) applies ultrasonic vibration (for example, about 20 to 100 kHz) to the workpiece W to vibrate the connection pad 5 and the connection bump 6 that are in contact with each other. As described above, the connection bump 6 pushes the adhesive layer 4 and contacts the connection pad 5. For this reason, it is also conceivable that the adhesive layer 4 that cannot be pushed out is interposed between the connection pad 5 and the connection bump 6. Further, since the surfaces of the connection pads 5 and the connection bumps 6 are exposed before the wiring board 2 and the electronic component 3 are bonded to each other with the adhesive layer 4, it is considered that an oxide film is formed on the surfaces.

  Therefore, the ultrasonic vibrator 32 vibrates the contact pad 5 and the connection bump 6 that are in contact with each other, and removes the adhesive layer 4 and the oxide film. Further, more adhesive layers 4 and oxide films can be removed by applying ultrasonic vibration to the workpiece W until the heated connection bumps 6 are melted. Therefore, the connection reliability between the connection pads 5 and the connection bumps 6 provided on the work W can be improved by bonding the connection pads 5 and the connection bumps 6 in a state where they are removed.

  Further, when the same material (gold, silver, copper, solder, etc.) as the connection pad 5 and the connection bump 6 is used, it is possible to surely perform diffusion bonding by removing the oxide film by ultrasonic vibration. More reliable joining is possible. Even in such a case, the connection reliability between the connection pads 5 and the connection bumps 6 provided on the workpiece W can be improved. In the present embodiment, the case where the connection terminals (connection bumps 6) of the electronic component 3 are melted by heating will be described. However, the present invention is not limited thereto, and the connection terminals of the wiring board 2 may be melted. Even if both the connection terminal 2 and the connection terminal of the electronic component 3 are melted, the connection terminal of the wiring board 2 and the connection terminal of the electronic component 3 can be joined.

  After sealing, before the compression space 37 is formed, the space 37 sealed with a vacuum pump (not shown) may be decompressed through the flow path 36. By reducing the pressure, the fine air in the adhesive layer 4 and the foreign matter (floating matter) in the space 37 in which the work W is contained can be removed. Thereby, it is possible to prevent foreign matters from entering the semiconductor device 7 including the wiring board 2 and the electronic component 3.

  In the present embodiment, ultrasonic vibration is applied to the workpiece W in the compression space 37. Thereby, even if fine air is mixed in the adhesive layer 4 in advance, generation of voids can be suppressed. By suppressing the generation of voids in this way, the connection reliability between the connection pads 5 and the connection bumps 6 provided on the workpiece W can be improved.

  Subsequently, as shown in FIGS. 3 and 12, the lower clamper 17, the support plate 22, and the heat insulation block 23 are added by bringing the upper base 21 and the lower base 28 closer from the state of FIG. It is pushed down against the pressing force (first pressing force) of the pressure mechanism 11 (elevating mechanism 24) and is pushed down to a position where the support plate 22 contacts the lower base 28. Next, the pressurization mechanism 11 is driven by the second pressing force higher than the first pressing force, and the upper clamper 16 and the lower clamper 17 further pressurize the connection pads 5 and the connection bumps 6 heated by the heating mechanism 12. And the adhesive layer 4 is cured by heating.

  Thus, using the joining apparatus 1A, it clamps with respect to the workpiece | work W containing the some electronic component 3 adhere | attached on the wiring board 2, and each member is joined collectively. Thereby, the electronic component 3 is mounted on the wiring board 2 and the semiconductor device 7 is manufactured.

  By applying pressure simultaneously with heating as in the present embodiment, the connection bump 6 is melted when the connection pad 5 and the connection bump 6 are joined, so that the connection pad 5 and the connection bump 6 are easily joined (crimped). )can do. Further, by maintaining the compressed space 37 until the electronic component 3 is mounted on the wiring board 2, even if fine air is contained in the adhesive layer 4, the fine air can be compressed and miniaturized. Thus, it is possible to underfill between the wiring board 2 and the electronic component 3 with high quality. Thereby, it is possible to reduce the connection failure between the connection pads 5 and the connection bumps 6 provided on the workpiece W and to improve the connection reliability.

(Embodiment 2)
The structure of the joining apparatus in this embodiment is demonstrated with reference to FIG. The joining apparatus 1A according to the first embodiment applies ultrasonic vibration to the workpiece W clamped from the lower clamper 17 side. However, the joining apparatus 1B according to the present embodiment vibrates from the upper clamper 16 side.

  A horn 44, which is connected to the ultrasonic transducer 32 and has a plurality of protrusions 44 a that are in contact with the workpiece W at positions facing the plurality of lower clampers 17, is provided below the upper clamper 16. By providing the projection 44 a at a position facing the lower clamper 17, the workpiece W can be sandwiched and clamped by the horn 44 and the lower clamper 17.

  In the present embodiment, since the work W is clamped by the upper clamper 16 and the lower clamper 17 via the horn 44, the horn 44 can be regarded as a clamper. That is, the horn 44 is a clamper in which a protrusion 44 a having a clamp surface 44 b that matches the size of the electronic component 3 is formed. Further, in the present embodiment, since ultrasonic vibration is applied to the workpiece W from the upper clamper 17 side, the clamper surface 44b of the horn 44 (clamper) which is a surface in contact with the workpiece W is changed to the shape (size) of the workpiece W, That is, the size is adapted to the size of the electronic component 3.

  In the joining apparatus 1A, the plurality of electronic components 3 are arranged on each of the clamp surfaces 17a of the plurality of lower clampers 17, but it may be difficult to arrange the electronic components 3 if the thickness is small. Therefore, in the present embodiment, the electronic component 3 is mounted on the wiring substrate 2 by using the substrate holding plate 45 and holding the workpiece W thereon. Note that when the wiring board 2 having high rigidity and little bending like a ceramic substrate is used, the board holding plate 4 may be omitted and the wiring board 2 may be supported by the lower clamper 17.

  Next, the bonding apparatus 1B according to the present embodiment is used to clamp the workpiece W including the stacked wiring board 2 and the plurality of electronic components 3 to bond the members together, and to the wiring board 2 with electrons. A method for mounting the electronic component 3 for mounting the component 3 (a method for manufacturing the semiconductor device 7) will be specifically described with reference to FIGS. 4 to 6 and FIGS. 10 to 12 correspond to the workpiece W in the joining apparatus 1B in operation of FIGS. 4 to 6, and the wiring board 2 and the electronic component 3 are turned upside down and the main part is shown enlarged. Yes.

  First, as shown in FIG. 10, a plurality of connection pads 5 of the wiring board 2 and a plurality of connection bumps 6 of each electronic component 3 corresponding to each other are aligned to face each other, and an adhesive layer 4 ( For example, a workpiece W bonded via NCF or NCP) is prepared. Subsequently, as shown in FIG. 4, the workpiece W is placed on the lower clamper 17 by a transport device (not shown) in a state where the upper clamper 16 and the lower clamper 17 are separated from each other. At this time, the plurality of electronic components 3 are arranged to face the plurality of protrusions 44 a of the horn 44, respectively.

  Subsequently, the space 37 containing the workpiece W clamped by the seal mechanism 14 is sealed by bringing the upper base 21 and the lower base 28 close to each other by the clamper mechanism 10. Further, as shown in FIG. 5, the workpiece W is sandwiched and clamped by the upper clamper 16 (horn 44) and the lower clamper 17, and the adhesive layer 4 is pushed out by the connection bumps 6 as shown in FIG. The connection bumps 6 are brought into contact with each other.

  Thereafter, compressed air 37 is formed by introducing compressed air into the space 37 sealed by the compression mechanism 15. Next, the vibration mechanism 13 (ultrasonic vibrator 32) applies ultrasonic vibration (for example, about 20 to 100 kHz) to the workpiece W to vibrate the connection pads 5 and the connection bumps 6.

  Subsequently, as shown in FIGS. 6 and 12, the lower clamper 17, the support plate 22, and the heat insulating block 23 are added by bringing the upper base 21 and the lower base 28 closer to each other from the state of FIG. It is pushed down against the pressing force (first pressing force) of the pressure mechanism 11 (elevating mechanism 24) and is pushed down to a position where the support plate 22 contacts the lower base 28. Next, the pressurization mechanism 11 is driven by the second pressing force higher than the first pressing force, and the upper clamper 16 and the lower clamper 17 further pressurize the connection pads 5 and the connection bumps 6 heated by the heating mechanism 12. And the adhesive layer 4 is cured by heating.

  Thus, using the joining apparatus 1B, it clamps with respect to the workpiece | work W containing the some electronic component 3 adhere | attached on the wiring board 2, and each member is joined collectively. Thereby, the electronic component 3 is mounted on the wiring board 2 and the semiconductor device 7 is manufactured.

  In this way, by using the bonding apparatus 1B, the connection pads 5 of the wiring board 2 and the connection bumps 6 of the electronic component 3 are bonded, and the electronic component 3 is mounted on the wiring board 2, so that in the first embodiment. Similar to the bonding apparatus 1A, the connection reliability between the connection pads 5 and the connection bumps 6 provided on the workpiece W can be improved.

(Embodiment 3)
The lower clamper in the present embodiment will be described with reference to FIGS. Although the lower clamper 17 in the first embodiment is configured as a single unit, the lower clamper 17A in the present embodiment includes a pin-like vibration member 51 that applies ultrasonic vibration to the workpiece W, and a vibration member 51. A cylindrical pressurizing member 52 that is inserted and abuts against the workpiece W is configured. The vibrating member 51 is connected to the ultrasonic transducer 31, and the pressing member 52 is connected to the lifting mechanism 24.

  In the step of applying ultrasonic vibration to the workpiece W to vibrate the connection pads 5 and the connection bumps 6 as described with reference to FIG. Ultrasonic vibration is applied to the workpiece W in a state where the vibration member 51 is in contact (see FIG. 7). Further, in the step of pressurizing and joining the heated connection pads 5 and the connection bumps 6 with the upper clamper 16 and the lower clamper 17 as described with reference to FIG. The pressurizing member 52 is protruded relative to the vibration member 51 (see FIG. 8), and the connecting pad 5 and the connecting bump 6 are added while the protruding pressurizing member 52 is in contact with the electronic component 3. Pressure (see FIG. 9).

  In the first embodiment, when the heated connection pad 5 and the connection bump 6 are pressed by the upper clamper 16 and the lower clamper 17, the lower clamper 17 is connected to the ultrasonic transducer 32 via the rod 33. Therefore, there are cases where the ultrasonic transducer 32 is thermally expanded and cannot be pressurized accurately. Therefore, in the lower clamper 17A in the present embodiment, the vibration member 51 and the pressure member 52 are provided separately for vibration and pressure, so that the pressure can be accurately applied and bonded to the workpiece W. The connection reliability between the provided connection pad 5 and the connection bump 6 can be improved. In addition, heating of the ultrasonic transducer 32 can be suppressed.

  Although the present invention has been specifically described above based on the embodiments, it is needless to say that the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention.

  For example, in the above-described embodiment, a case has been described in which the first member is the wiring board 2 in the joining method in which the workpieces including the stacked first and second members are clamped and the members are joined together. For example, the first member may be another type of substrate (wiring substrate) such as an inorganic substrate such as an organic substrate or a ceramic substrate, a lead frame, or a semiconductor wafer. Moreover, the case where a 3rd member is further laminated | stacked on a 1st, 2nd member may be sufficient. For example, the first member may be a wiring board, and the second and third members may be semiconductor chips.

  For example, in the first embodiment, the case where the workpiece W is vibrated from the lower clamper 17 side and the workpiece W is vibrated from the upper clamper 16 side has been described in the second embodiment. The workpiece W may be vibrated from both sides of the lower clamper 17. Foreign matter can be removed more by applying vibration from both sides.

1A, 1B Bonding device 2 Wiring board (first member)
3 Electronic parts (second member)
4 Adhesive layer 5 Connection pad (first connection terminal)
6 Connection bump (second connection terminal)
16 Upper clamper (first clamper)
17, 17A Lower clamper (second clamper)
31 Heater 32 Ultrasonic vibrator W Work

Claims (9)

A joining apparatus that clamps a workpiece including a first member and a plurality of second members bonded on the first member and collectively joins the members,
A first clamper for clamping the workpiece corresponding to the first member;
A plurality of second clampers facing the first clamper and clamping the workpiece corresponding to each of the plurality of second members;
A heater for heating the clamped workpiece from the first clamper side;
An ultrasonic transducer for applying ultrasonic vibration to the clamped workpiece from at least one side of the first or second clamper;
A seal mechanism that is provided around the first clamper and the plurality of second clampers and forms a sealed space in which the clamped workpiece is contained;
A joining apparatus comprising: The joining apparatus according to claim 1,
And a compressor for introducing compressed air into the sealed space through a flow path formed in the sealing mechanism. The joining apparatus according to claim 1 or 2,
The first clamper is provided with a horn that is connected to the ultrasonic transducer and has protrusions that are in contact with the workpiece at respective positions facing the plurality of second clampers. Joining device. The joining device according to claim 1, 2, or 3,
Each of the plurality of second clampers includes a pin-like vibration member for applying ultrasonic vibration to the workpiece, and a cylindrical pressure member into which the vibration member is inserted and abutted against the workpiece. It is comprised, The joining apparatus characterized by the above-mentioned. A joining method for clamping a workpiece including stacked first and second members and joining the members together,
(A) A plurality of first connection terminals of the first member and a plurality of second connection terminals of the second members corresponding to each other are aligned to face each other, and an adhesive layer is interposed on the first member. Preparing a work to which the plurality of second members are bonded;
(B) sealing the space containing the workpiece, and sandwiching and pressing the workpiece with a first clamper for the first member and a plurality of second clampers for the plurality of second members,
(C) after the step (b), applying ultrasonic vibration to the workpiece to vibrate the first connection terminal and the second connection terminal that are in contact with each other;
(D) After the step (c), the workpiece is further pressurized by the first clamper and the plurality of second clampers to join the heated first connection terminal and the second connection terminal. A step of heat-curing the adhesive layer;
A bonding method comprising: The joining method according to claim 5, wherein
In the step (c), an ultrasonic vibration is applied to the workpiece until at least one of the heated first connection terminal and the second connection terminal is melted. In the joining method according to claim 5 or 6,
In the step (b), compressed air is introduced into the sealed space to form a compressed space, and in the step (c), ultrasonic vibration is applied to the workpiece in the compressed space. Method. In the joining method according to claim 5 or 6,
In the step (b), the sealed space is decompressed and compressed air is introduced to form a compressed space,
In the step (c), an ultrasonic vibration is applied to the workpiece in the compression space. In the joining method according to any one of claims 5 to 8,
The second clamper includes a pin-shaped vibration member that applies ultrasonic vibration to the workpiece, and a cylindrical pressure member that is inserted into the vibration member and contacts the workpiece. And
In the step (c), the vibration member is protruded relative to the pressurizing member, and ultrasonic vibration is applied to the workpiece while the vibration member is in contact with the pressure member.
In the step (d), the pressure member is protruded relatively to the vibration member, and the first connection terminal and the second connection terminal are pressurized in a state where the pressure member is in contact with the vibration member. The joining method characterized by the above-mentioned.

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