JP2012152304A5 - - Google Patents

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Publication number
JP2012152304A5
JP2012152304A5 JP2011012482A JP2011012482A JP2012152304A5 JP 2012152304 A5 JP2012152304 A5 JP 2012152304A5 JP 2011012482 A JP2011012482 A JP 2011012482A JP 2011012482 A JP2011012482 A JP 2011012482A JP 2012152304 A5 JP2012152304 A5 JP 2012152304A5
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JP
Japan
Prior art keywords
ray
generation point
slice direction
ray generation
shield
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JP2011012482A
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English (en)
Japanese (ja)
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JP2012152304A (ja
JP5661486B2 (ja
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Priority to JP2011012482A priority Critical patent/JP5661486B2/ja
Priority claimed from JP2011012482A external-priority patent/JP5661486B2/ja
Publication of JP2012152304A publication Critical patent/JP2012152304A/ja
Publication of JP2012152304A5 publication Critical patent/JP2012152304A5/ja
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Publication of JP5661486B2 publication Critical patent/JP5661486B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011012482A 2011-01-25 2011-01-25 Ｘ線検出器及びそれを備えたｘ線ｃｔ装置 Expired - Fee Related JP5661486B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011012482A JP5661486B2 (ja) 2011-01-25 2011-01-25 Ｘ線検出器及びそれを備えたｘ線ｃｔ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011012482A JP5661486B2 (ja) 2011-01-25 2011-01-25 Ｘ線検出器及びそれを備えたｘ線ｃｔ装置

Publications (3)

Publication Number Publication Date
JP2012152304A JP2012152304A (ja) 2012-08-16
JP2012152304A5 true JP2012152304A5 (enExample) 2014-03-06
JP5661486B2 JP5661486B2 (ja) 2015-01-28

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ID=46834719

Family Applications (1)

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JP2011012482A Expired - Fee Related JP5661486B2 (ja) 2011-01-25 2011-01-25 Ｘ線検出器及びそれを備えたｘ線ｃｔ装置

Country Status (1)

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JP (1) JP5661486B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013040859A (ja) * 2011-08-17 2013-02-28 Toshiba Corp Ｘ線検出器及びｘ線ｃｔ装置
CN105266835A (zh) * 2014-07-25 2016-01-27 Ge医疗系统环球技术有限公司 一种ct探测器
US9782138B2 (en) 2014-10-01 2017-10-10 Koninklijke Philips N.V. Imaging apparatus and method
JP7058998B2 (ja) * 2017-12-22 2022-04-25 キヤノンメディカルシステムズ株式会社 検出器モジュール及びｘ線ｃｔ装置
KR102781751B1 (ko) * 2020-03-04 2025-03-13 프리스매틱 센서즈 에이비 동적 오정렬 민감도를 감소시키는 갭 충전 재료를 갖는 에지-온 x-선 검출기

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05256950A (ja) * 1992-03-13 1993-10-08 Toshiba Corp Ｘ線コンピュータトモグラフィ装置用固体検出器
JPH11295430A (ja) * 1998-04-15 1999-10-29 Shimadzu Corp Ｃｔ用固体検出器
JP3977558B2 (ja) * 1998-10-20 2007-09-19 株式会社東芝 ２次元アレイ型ｘ線検出器、ｘ線検出器の製造方法及び２次元アレイ型ｘ線検出器を用いたｃｔスキャナ装置

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