JP2012049134A5 - - Google Patents

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Publication number
JP2012049134A5
JP2012049134A5 JP2011185511A JP2011185511A JP2012049134A5 JP 2012049134 A5 JP2012049134 A5 JP 2012049134A5 JP 2011185511 A JP2011185511 A JP 2011185511A JP 2011185511 A JP2011185511 A JP 2011185511A JP 2012049134 A5 JP2012049134 A5 JP 2012049134A5
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JP
Japan
Prior art keywords
target
ray
fan
optical
rays
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Application number
JP2011185511A
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English (en)
Japanese (ja)
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JP5923257B2 (ja
JP2012049134A (ja
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Priority claimed from US12/871,484 external-priority patent/US8311184B2/en
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Publication of JP2012049134A publication Critical patent/JP2012049134A/ja
Publication of JP2012049134A5 publication Critical patent/JP2012049134A5/ja
Application granted granted Critical
Publication of JP5923257B2 publication Critical patent/JP5923257B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011185511A 2010-08-30 2011-08-29 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム Expired - Fee Related JP5923257B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/871,484 2010-08-30
US12/871,484 US8311184B2 (en) 2010-08-30 2010-08-30 Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015190569A Division JP6050455B2 (ja) 2010-08-30 2015-09-29 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム

Publications (3)

Publication Number Publication Date
JP2012049134A JP2012049134A (ja) 2012-03-08
JP2012049134A5 true JP2012049134A5 (enExample) 2014-10-02
JP5923257B2 JP5923257B2 (ja) 2016-05-24

Family

ID=45566346

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2011185511A Expired - Fee Related JP5923257B2 (ja) 2010-08-30 2011-08-29 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム
JP2015190569A Expired - Fee Related JP6050455B2 (ja) 2010-08-30 2015-09-29 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2015190569A Expired - Fee Related JP6050455B2 (ja) 2010-08-30 2015-09-29 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム

Country Status (3)

Country Link
US (1) US8311184B2 (enExample)
JP (2) JP5923257B2 (enExample)
DE (1) DE102011053081B4 (enExample)

Families Citing this family (14)

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US8761346B2 (en) * 2011-07-29 2014-06-24 General Electric Company Multilayer total internal reflection optic devices and methods of making and using the same
US8693631B2 (en) 2011-08-29 2014-04-08 General Electric Company Craser device, imaging system and method
US20130182827A1 (en) * 2011-12-02 2013-07-18 Canon Kabushiki Kaisha X-ray waveguide and x-ray waveguide system
JP6108671B2 (ja) * 2012-03-13 2017-04-05 キヤノン株式会社 放射線撮影装置
EP2874251B1 (de) 2013-11-18 2016-02-24 Jean Müller GmbH Elektrotechnische Fabrik Elektrisches Installationsgerät
JP6025211B2 (ja) * 2013-11-28 2016-11-16 株式会社リガク Ｘ線トポグラフィ装置
US10082473B2 (en) * 2015-07-07 2018-09-25 General Electric Company X-ray filtration
JP6533006B2 (ja) * 2015-07-14 2019-06-19 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 強化されたｘ線放射を用いた撮像
WO2017009363A1 (en) * 2015-07-14 2017-01-19 Koninklijke Philips N.V. Imaging with modulated x-ray radiation
KR20170093500A (ko) * 2016-02-05 2017-08-16 주식회사바텍 엑스선 콜리메이터 및 이를 이용한 엑스선 영상 촬영 장치
US11169286B2 (en) * 2018-06-18 2021-11-09 Redlen Technologies, Inc. Methods of calibrating semiconductor radiation detectors using K-edge filters
WO2020086958A1 (en) * 2018-10-25 2020-04-30 The Johns Hopkins University Spatial-spectral filters for multi-material decomposition in computed tomography
CN113030131B (zh) * 2021-03-01 2022-10-28 浙江双元科技股份有限公司 一种基于x射线成像的图像采集设备及方法
JP2023181859A (ja) * 2022-06-13 2023-12-25 キヤノン株式会社 放射線撮像装置、情報処理装置、情報処理方法及びプログラム

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US5192869A (en) 1990-10-31 1993-03-09 X-Ray Optical Systems, Inc. Device for controlling beams of particles, X-ray and gamma quanta
JPH05107396A (ja) * 1991-10-14 1993-04-27 Nippon Telegr & Teleph Corp <Ntt> Ｘ線制御素子
US5604353A (en) 1995-06-12 1997-02-18 X-Ray Optical Systems, Inc. Multiple-channel, total-reflection optic with controllable divergence
JP2002093594A (ja) * 2000-09-18 2002-03-29 Ours Tex Kk Ｘ線管およびｘ線分析装置
EP1397813B1 (fr) 2001-06-01 2008-06-04 Xenocs Composant optique hybride pour applications rayons x, et procede associe
ES2271277T3 (es) 2001-06-19 2007-04-16 X-Ray Optical Systems, Inc. Sistema xrf dispersivo de longitud de onda que usa optica de enfoque para la excitacion y un monocromador de enfoque para la recogida.
WO2003012797A1 (en) 2001-07-27 2003-02-13 X-Ray Optical Systems, Inc. Methods and devices for aligning and determining the focusing characteristics of x-ray optics
JP2005530170A (ja) 2002-06-19 2005-10-06 グズノク 光学アセンブリ及びその製造方法
US7120228B2 (en) 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
JP2006337146A (ja) * 2005-06-01 2006-12-14 Canon Inc 軟ｘ線多層膜ミラー及びその製造方法、軟ｘ線多層膜ミラーを備えた光学系
JP2008012206A (ja) * 2006-07-10 2008-01-24 Ge Medical Systems Global Technology Co Llc Ｘ線断層撮影装置
KR100830549B1 (ko) * 2006-10-02 2008-05-21 원광대학교산학협력단 이중 조사방식의 유방촬영장치 및 그 장치를 이용한유방촬영방법
US7412131B2 (en) 2007-01-02 2008-08-12 General Electric Company Multilayer optic device and system and method for making same
US8194322B2 (en) * 2007-04-23 2012-06-05 Nikon Corporation Multilayer-film reflective mirror, exposure apparatus, device manufacturing method, and manufacturing method of multilayer-film reflective mirror
US7366374B1 (en) 2007-05-22 2008-04-29 General Electric Company Multilayer optic device and an imaging system and method using same
US20090041198A1 (en) 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
US7508911B1 (en) 2007-09-19 2009-03-24 General Electric Company X-ray imaging system and methods of using and forming an array of optic devices therein
US7742566B2 (en) 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
JP5218014B2 (ja) * 2008-12-17 2013-06-26 ウシオ電機株式会社 極端紫外光光源装置および極端紫外光光源装置の保守方法

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