JP2011528128A - 結像光学系 - Google Patents
結像光学系 Download PDFInfo
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- JP2011528128A JP2011528128A JP2011517767A JP2011517767A JP2011528128A JP 2011528128 A JP2011528128 A JP 2011528128A JP 2011517767 A JP2011517767 A JP 2011517767A JP 2011517767 A JP2011517767 A JP 2011517767A JP 2011528128 A JP2011528128 A JP 2011528128A
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- JP
- Japan
- Prior art keywords
- optical system
- image
- imaging
- imaging optical
- plane
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0663—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
Abstract
【選択図】図2
Description
5 物体平面
7 結像光学系
9 像平面
18,19 貫通開口部
M1からM6 ミラー
Claims (14)
- 物体平面(5)の物体視野(4)を像平面(9)の像視野(8)内に結像する複数のミラー(M1〜M6)を含み、該ミラーの少なくとも1つ(M5,M6)が結像光(3)の通過のための貫通開口部(18,19)を有する結像光学系(7)であって、
物体平面(5)の前5m〜2000mの範囲の結像光(3)のビーム経路に位置する入射瞳平面を有する、
ことを特徴とする結像光学系(7)。 - 0.4〜0.9の範囲の像側開口数を特徴とする請求項1に記載の結像光学系。
- 物体平面(5)の物体視野(4)を像平面(9)の像視野(8)内に結像する複数のミラー(M1〜M6)を含み、該ミラーの少なくとも1つ(M5,M6)が結像光(3)の通過のための貫通開口部(18,19)を有する結像光学系(21)であって、
物体平面(5)の前100mm〜5000mmの範囲の結像光(3)のビーム経路に位置する入射瞳平面(26)を有し、ミラー(M1〜M6)のうちの少なくとも1つの反射面が、自由曲面とし具現化される、
ことを特徴とする結像光学系(21)。 - 0.4〜0.9の範囲の像側開口数を特徴とする請求項3に記載の結像光学系。
- 0.7の像側開口数を特徴とする請求項4に記載の結像光学系。
- 前記像平面(9)は、前記物体平面(4)に対して平行に配置されることを特徴とする請求項1から請求項5のいずれか1項に記載の結像光学系。
- 正確に6つのミラー(M1〜M6)を特徴とする請求項1から請求項6のいずれか1項に記載の結像光学系。
- 1mm2よりも大きい像視野(8)を特徴とする請求項1から請求項7のいずれか1項に記載の結像光学系。
- 像側でテレセントリックであることを特徴とする請求項1から請求項8のいずれか1項に記載の結像光学系。
- 請求項1から請求項9のいずれか1項に記載の結像光学系と、
照明光(3)を前記結像光学系(7;21)の物体視野(4)に向けて誘導するための照明光学系(6)と、
を含むことを特徴とする光学系。 - マイクロリソグラフィのための投影露光装置であって、
請求項10に記載の光学系を含み、かつ
照明及び結像光(3)のための光源(2)を含む、
ことを特徴とする投影露光装置。 - 照明光学系(6)の瞳ファセットミラー(25)が、結像光学系(21)の入射瞳平面(26)に配置されることを特徴とする請求項11に記載の投影露光装置。
- 微細構造構成要素を生成する方法であって、
レチクル(10)及びウェーハ(11)を準備する段階と、
請求項11又は請求項12に記載の投影露光装置の補助により前記レチクル(10)上の構造を前記ウェーハ(11)の感光層上に投影する段階と、
前記ウェーハ(11)上に微細構造を生成する段階と、
を含むことを特徴とする方法。 - 請求項13に記載の方法に従って生成された微細構造構成要素。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US8114708P | 2008-07-16 | 2008-07-16 | |
DE102008033340A DE102008033340B3 (de) | 2008-07-16 | 2008-07-16 | Abbildende Optik |
US61/081,147 | 2008-07-16 | ||
DE102008033340.9 | 2008-07-16 | ||
PCT/EP2009/004429 WO2010006678A1 (en) | 2008-07-16 | 2009-06-18 | Imaging optics |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011528128A true JP2011528128A (ja) | 2011-11-10 |
JP5643755B2 JP5643755B2 (ja) | 2014-12-17 |
Family
ID=41110730
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011517767A Expired - Fee Related JP5643755B2 (ja) | 2008-07-16 | 2009-06-18 | 結像光学系 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9442386B2 (ja) |
EP (1) | EP2297612B1 (ja) |
JP (1) | JP5643755B2 (ja) |
KR (1) | KR101646285B1 (ja) |
CN (1) | CN102099742B (ja) |
DE (1) | DE102008033340B3 (ja) |
WO (1) | WO2010006678A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015532980A (ja) * | 2012-09-21 | 2015-11-16 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ方法及び装置 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102011005144A1 (de) * | 2010-03-17 | 2011-09-22 | Carl Zeiss Smt Gmbh | Reflektives optisches Element, Projektionssystem und Projektionsbelichtungsanlage |
WO2011131289A1 (en) * | 2010-04-22 | 2011-10-27 | Carl Zeiss Smt Gmbh | Imaging optics, and a projection exposure apparatus for microlithography having such an imaging optics |
EP2598931B1 (en) | 2010-07-30 | 2020-12-02 | Carl Zeiss SMT GmbH | Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type |
KR102330570B1 (ko) | 2012-02-06 | 2021-11-25 | 가부시키가이샤 니콘 | 반사 결상 광학계, 노광 장치, 및 디바이스 제조 방법 |
WO2014019617A1 (en) * | 2012-08-01 | 2014-02-06 | Carl Zeiss Smt Gmbh | Imaging optical unit for a projection exposure apparatus |
DE102014221175A1 (de) * | 2014-10-17 | 2016-04-21 | Carl Zeiss Smt Gmbh | Beleuchtungsoptik für ein Projektionsbelichtungssystem |
DE102016222033A1 (de) | 2016-11-10 | 2016-12-29 | Carl Zeiss Smt Gmbh | Verfahren zur Zuordnung von Feldfacetten zu Pupillenfacetten zur Schaffung von Beleuchtungslicht-Ausleuchtungskanälen in einem Be-leuchtungssystem in einer EUV-Projektionsbelichtungsanlage |
DE102017215544A1 (de) * | 2017-09-05 | 2017-10-19 | Carl Zeiss Smt Gmbh | Optisches system, optische anordnung und lithographieanlage |
WO2019218698A1 (zh) * | 2018-05-15 | 2019-11-21 | Xiong Xiangwen | 3D立体照射掩膜版(Mask)的极紫外光刻(EUVL)的高产量(HVM)曝光技术及系统装置 |
CN109283671B (zh) * | 2018-11-09 | 2020-01-07 | 中国科学院长春光学精密机械与物理研究所 | 一种轻小型大视场低畸变的类同轴五反光学系统 |
DE102019208961A1 (de) | 2019-06-19 | 2020-12-24 | Carl Zeiss Smt Gmbh | Projektionsoptik und Projektionsbelichtungsanlage mit einer solchen Projektionsoptik |
DE102022209908A1 (de) | 2022-09-21 | 2024-03-21 | Carl Zeiss Smt Gmbh | Facettenspiegel, Beleuchtungsoptik, Anordnung eines Facettenspiegels, Projektionsbelichtungsanlage und Verfahren zur Herstellung eines nanostrukturierten Bauelements |
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JP2001185480A (ja) * | 1999-10-15 | 2001-07-06 | Nikon Corp | 投影光学系及び該光学系を備える投影露光装置 |
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WO2007115596A1 (en) * | 2006-04-07 | 2007-10-18 | Carl Zeiss Smt Ag | Microlithography projection optical system and method for manufacturing a device |
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-
2008
- 2008-07-16 DE DE102008033340A patent/DE102008033340B3/de not_active Expired - Fee Related
-
2009
- 2009-06-18 CN CN200980127410XA patent/CN102099742B/zh active Active
- 2009-06-18 WO PCT/EP2009/004429 patent/WO2010006678A1/en active Application Filing
- 2009-06-18 EP EP09776780A patent/EP2297612B1/en not_active Not-in-force
- 2009-06-18 KR KR1020117001068A patent/KR101646285B1/ko active IP Right Grant
- 2009-06-18 JP JP2011517767A patent/JP5643755B2/ja not_active Expired - Fee Related
-
2011
- 2011-01-13 US US13/006,025 patent/US9442386B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2001185480A (ja) * | 1999-10-15 | 2001-07-06 | Nikon Corp | 投影光学系及び該光学系を備える投影露光装置 |
JP2003233005A (ja) * | 2002-02-07 | 2003-08-22 | Canon Inc | 反射型投影光学系、露光装置及びデバイス製造方法 |
JP2004031808A (ja) * | 2002-06-27 | 2004-01-29 | Nikon Corp | 露光装置の投影光学系、該投影光学系を備えた露光装置及び該露光装置を用いた露光方法 |
US20060232867A1 (en) * | 2004-12-23 | 2006-10-19 | Hans-Jurgen Mann | Catoptric objectives and systems using catoptric objectives |
WO2007115596A1 (en) * | 2006-04-07 | 2007-10-18 | Carl Zeiss Smt Ag | Microlithography projection optical system and method for manufacturing a device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2015532980A (ja) * | 2012-09-21 | 2015-11-16 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ方法及び装置 |
Also Published As
Publication number | Publication date |
---|---|
DE102008033340B3 (de) | 2010-04-08 |
US20110122384A1 (en) | 2011-05-26 |
KR20110039439A (ko) | 2011-04-18 |
JP5643755B2 (ja) | 2014-12-17 |
WO2010006678A1 (en) | 2010-01-21 |
CN102099742A (zh) | 2011-06-15 |
US9442386B2 (en) | 2016-09-13 |
KR101646285B1 (ko) | 2016-08-05 |
CN102099742B (zh) | 2013-09-25 |
EP2297612A1 (en) | 2011-03-23 |
EP2297612B1 (en) | 2013-01-23 |
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