JP2011527074A5 - - Google Patents

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Publication number
JP2011527074A5
JP2011527074A5 JP2011516270A JP2011516270A JP2011527074A5 JP 2011527074 A5 JP2011527074 A5 JP 2011527074A5 JP 2011516270 A JP2011516270 A JP 2011516270A JP 2011516270 A JP2011516270 A JP 2011516270A JP 2011527074 A5 JP2011527074 A5 JP 2011527074A5
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JP
Japan
Prior art keywords
collection device
image
positional relationship
distance
actual
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Application number
JP2011516270A
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English (en)
Japanese (ja)
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JP5710472B2 (ja
JP2011527074A (ja
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Priority claimed from US12/217,224 external-priority patent/US7995216B2/en
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Publication of JP2011527074A publication Critical patent/JP2011527074A/ja
Publication of JP2011527074A5 publication Critical patent/JP2011527074A5/ja
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Publication of JP5710472B2 publication Critical patent/JP5710472B2/ja
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JP2011516270A 2008-07-02 2009-06-02 画像分析によるサンプリング処理における試料収集機器と分析表面との位置関係の制御 Active JP5710472B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/217,224 US7995216B2 (en) 2008-07-02 2008-07-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis
US12/217,224 2008-07-02
PCT/US2009/003346 WO2010002426A2 (en) 2008-07-02 2009-06-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis

Publications (3)

Publication Number Publication Date
JP2011527074A JP2011527074A (ja) 2011-10-20
JP2011527074A5 true JP2011527074A5 (https=) 2012-07-19
JP5710472B2 JP5710472B2 (ja) 2015-04-30

Family

ID=41381928

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011516270A Active JP5710472B2 (ja) 2008-07-02 2009-06-02 画像分析によるサンプリング処理における試料収集機器と分析表面との位置関係の制御

Country Status (5)

Country Link
US (1) US7995216B2 (https=)
EP (1) EP2319067A2 (https=)
JP (1) JP5710472B2 (https=)
CA (1) CA2729699C (https=)
WO (1) WO2010002426A2 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8519330B2 (en) 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
WO2012167259A1 (en) 2011-06-03 2012-12-06 Ut-Battelle, Llc Enhanced spot preparation for liquid extractive sampling and analysis
US9176028B2 (en) 2012-10-04 2015-11-03 Ut-Battelle, Llc Ball assisted device for analytical surface sampling
US9881235B1 (en) * 2014-11-21 2018-01-30 Mahmoud Narimanzadeh System, apparatus, and method for determining physical dimensions in digital images
US9632066B2 (en) 2015-04-09 2017-04-25 Ut-Battelle, Llc Open port sampling interface
US10060838B2 (en) 2015-04-09 2018-08-28 Ut-Battelle, Llc Capture probe
JP6934811B2 (ja) * 2017-11-16 2021-09-15 株式会社ミツトヨ 三次元測定装置
KR102004991B1 (ko) 2017-12-22 2019-10-01 삼성전자주식회사 이미지 처리 방법 및 그에 따른 디스플레이 장치
US11125657B2 (en) 2018-01-30 2021-09-21 Ut-Battelle, Llc Sampling probe
US20220143743A1 (en) * 2020-11-10 2022-05-12 Formalloy Technologies, Inc. Working distance measurement for additive manufacturing
DE102021128848B4 (de) * 2021-11-05 2025-08-07 Bruker Daltonics GmbH & Co. KG Vorrichtung zum desorbierenden Abtasten von Analytmaterial auf einem Probenträger
CN115325957B (zh) * 2022-07-25 2025-08-22 浙江大学 一种河口羽流染色实验中的深度测量方法

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US5222060A (en) * 1989-09-07 1993-06-22 Canon Kabushiki Kaisha Accessing method, and information processing method and information processing device utilizing the same
JPH0687003B2 (ja) * 1990-02-09 1994-11-02 株式会社日立製作所 走査型トンネル顕微鏡付き走査型電子顕微鏡
DE4116803A1 (de) * 1991-05-23 1992-12-10 Agfa Gevaert Ag Vorrichtung zur gleichmaessigen ausleuchtung einer projektionsflaeche
US5196713A (en) * 1991-08-22 1993-03-23 Wyko Corporation Optical position sensor with corner-cube and servo-feedback for scanning microscopes
US5467642A (en) * 1992-11-06 1995-11-21 Hitachi, Ltd. Scanning probe microscope and method of control error correction
US5557156A (en) * 1994-12-02 1996-09-17 Digital Instruments, Inc. Scan control for scanning probe microscopes
US5949070A (en) * 1995-08-18 1999-09-07 Gamble; Ronald C. Scanning force microscope with integral laser-scanner-cantilever and independent stationary detector
US5744799A (en) * 1996-05-20 1998-04-28 Ohara; Tetsuo Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces
US6518570B1 (en) * 1998-04-03 2003-02-11 Brookhaven Science Associates Sensing mode atomic force microscope
US6881954B1 (en) * 1999-07-27 2005-04-19 Hitachi Construction Machinery Co., Ltd. Scanning probe microscope and method of measurement
US6452174B1 (en) * 1999-12-13 2002-09-17 Mitsubishi Denki Kabushiki Kaisha Charged particle beam apparatus and method of controlling same
US6803566B2 (en) * 2002-04-16 2004-10-12 Ut-Battelle, Llc Sampling probe for microarray read out using electrospray mass spectrometry
US7026871B2 (en) * 2003-07-03 2006-04-11 Icefyre Semiconductor, Inc. Adaptive predistortion for a transmit system
US7388199B2 (en) * 2003-09-03 2008-06-17 Hitachi Kenki Fine Tech Co., Ltd. Probe manufacturing method, probe, and scanning probe microscope
JP2005106786A (ja) * 2003-10-02 2005-04-21 Jeol Ltd 走査形プローブ顕微鏡
JP2005257420A (ja) * 2004-03-11 2005-09-22 Sii Nanotechnology Inc 走査型プローブ顕微鏡
JP5001533B2 (ja) * 2004-08-25 2012-08-15 エスアイアイ・ナノテクノロジー株式会社 プローブのアプローチ方法
US7295026B2 (en) * 2005-06-03 2007-11-13 Ut-Battelle, Llc Automated position control of a surface array relative to a liquid microjunction surface sampler
JP2007018935A (ja) * 2005-07-08 2007-01-25 Hitachi High-Technologies Corp プローブ付き顕微鏡及びプローブ接触方法
JP2007179929A (ja) * 2005-12-28 2007-07-12 Hitachi High-Technologies Corp 荷電粒子線装置及び試料像表示方法

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