JP2011516860A - 多重化画像を取得し、そして処理する方法及び装置 - Google Patents

多重化画像を取得し、そして処理する方法及び装置 Download PDF

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Publication number
JP2011516860A
JP2011516860A JP2011503042A JP2011503042A JP2011516860A JP 2011516860 A JP2011516860 A JP 2011516860A JP 2011503042 A JP2011503042 A JP 2011503042A JP 2011503042 A JP2011503042 A JP 2011503042A JP 2011516860 A JP2011516860 A JP 2011516860A
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image
color
light source
article
illumination light
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JP2011503042A
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English (en)
Japanese (ja)
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バレット，スペンサー，ビー．
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エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8838—Stroboscopic illumination; synchronised illumination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2011503042A 2008-03-31 2009-03-25 多重化画像を取得し、そして処理する方法及び装置 Withdrawn JP2011516860A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US4110508P 2008-03-31 2008-03-31
US61/041,105 2008-03-31
PCT/US2009/038299 WO2009123901A1 (en) 2008-03-31 2009-03-25 Method and apparatus for multiplexed image acquisition and processing

Publications (1)

Publication Number Publication Date
JP2011516860A true JP2011516860A (ja) 2011-05-26

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JP2011503042A Withdrawn JP2011516860A (ja) 2008-03-31 2009-03-25 多重化画像を取得し、そして処理する方法及び装置

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JP (1) JP2011516860A (zh)
KR (1) KR20100138985A (zh)
CN (1) CN101981411A (zh)
TW (1) TW201003038A (zh)
WO (1) WO2009123901A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010079387A (ja) * 2008-09-24 2010-04-08 Omron Corp 画像処理方法および画像処理装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103516962A (zh) * 2012-06-19 2014-01-15 全友电脑股份有限公司 影像撷取系统及方法
DE102014201144A1 (de) * 2014-01-22 2015-07-23 Zumtobel Lighting Gmbh Verfahren zur Steuerung einer adaptiven Beleuchtungsvorrichtung und Beleuchtungssystem zum Durchführen des Verfahrens
JP6260354B2 (ja) * 2014-03-04 2018-01-17 株式会社リコー 撮像装置、調整装置および調整方法
KR101663518B1 (ko) * 2014-07-14 2016-10-10 주식회사 제이에스티 릴테이프 검사장치
CN110793472B (zh) * 2019-11-11 2021-07-27 桂林理工大学 一种基于四元数奇异值熵指标的磨削表面粗糙度检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5000569A (en) * 1988-12-28 1991-03-19 Lamb-Weston, Inc. Light reflection defect detection apparatus and method using pulsed light-emitting semiconductor devices of different wavelengths
US5298963A (en) * 1992-02-26 1994-03-29 Mitsui Mining & Smelting Co., Ltd. Apparatus for inspecting the surface of materials
DE19643475C1 (de) * 1996-10-22 1998-06-25 Laser Applikationan Gmbh Verfahren zur Geschwindigkeitsmessung nach dem Laser-Doppler-Prinzip
US6091488A (en) * 1999-03-22 2000-07-18 Beltronics, Inc. Method of and apparatus for automatic high-speed optical inspection of semi-conductor structures and the like through fluorescent photoresist inspection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010079387A (ja) * 2008-09-24 2010-04-08 Omron Corp 画像処理方法および画像処理装置

Also Published As

Publication number Publication date
TW201003038A (en) 2010-01-16
KR20100138985A (ko) 2010-12-31
CN101981411A (zh) 2011-02-23
WO2009123901A1 (en) 2009-10-08

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