JP2011250845A5 - - Google Patents

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Publication number
JP2011250845A5
JP2011250845A5 JP2010124871A JP2010124871A JP2011250845A5 JP 2011250845 A5 JP2011250845 A5 JP 2011250845A5 JP 2010124871 A JP2010124871 A JP 2010124871A JP 2010124871 A JP2010124871 A JP 2010124871A JP 2011250845 A5 JP2011250845 A5 JP 2011250845A5
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JP
Japan
Prior art keywords
wavefront
fundus
eye
optical system
wavefront sensor
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JP2010124871A
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English (en)
Japanese (ja)
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JP5545984B2 (ja
JP2011250845A (ja
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Priority to JP2010124871A priority Critical patent/JP5545984B2/ja
Priority claimed from JP2010124871A external-priority patent/JP5545984B2/ja
Publication of JP2011250845A publication Critical patent/JP2011250845A/ja
Publication of JP2011250845A5 publication Critical patent/JP2011250845A5/ja
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Publication of JP5545984B2 publication Critical patent/JP5545984B2/ja
Expired - Fee Related legal-status Critical Current
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JP2010124871A 2010-05-31 2010-05-31 波面補償付眼底撮影装置 Expired - Fee Related JP5545984B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010124871A JP5545984B2 (ja) 2010-05-31 2010-05-31 波面補償付眼底撮影装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010124871A JP5545984B2 (ja) 2010-05-31 2010-05-31 波面補償付眼底撮影装置

Publications (3)

Publication Number Publication Date
JP2011250845A JP2011250845A (ja) 2011-12-15
JP2011250845A5 true JP2011250845A5 (enExample) 2013-07-11
JP5545984B2 JP5545984B2 (ja) 2014-07-09

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ID=45415325

Family Applications (1)

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JP2010124871A Expired - Fee Related JP5545984B2 (ja) 2010-05-31 2010-05-31 波面補償付眼底撮影装置

Country Status (1)

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JP (1) JP5545984B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6292799B2 (ja) * 2012-10-26 2018-03-14 キヤノン株式会社 眼科装置およびその制御方法
JP6108810B2 (ja) * 2012-12-14 2017-04-05 キヤノン株式会社 眼科装置およびその制御方法
JP6116227B2 (ja) * 2012-12-14 2017-04-19 キヤノン株式会社 収差測定装置およびその方法
JP6230262B2 (ja) * 2012-12-28 2017-11-15 キヤノン株式会社 画像処理装置及び画像処理方法
JP6572560B2 (ja) * 2015-03-02 2019-09-11 株式会社ニデック 波面補償付眼底撮影装置
JP6556179B2 (ja) * 2017-03-22 2019-08-07 キヤノン株式会社 収差測定装置およびその方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5777719A (en) * 1996-12-23 1998-07-07 University Of Rochester Method and apparatus for improving vision and the resolution of retinal images
JP4510534B2 (ja) * 2004-06-22 2010-07-28 株式会社トプコン 光学特性測定装置及び眼底像観察装置
JP4988305B2 (ja) * 2006-10-31 2012-08-01 株式会社ニデック 眼科測定装置
JP2008161406A (ja) * 2006-12-28 2008-07-17 Topcon Corp 眼科装置
JP5207917B2 (ja) * 2008-10-24 2013-06-12 株式会社トプコン 波面収差測定装置及びその方法
JP5207916B2 (ja) * 2008-10-24 2013-06-12 株式会社トプコン 波面収差測定装置及びその方法

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