JP2011232110A5 - - Google Patents

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Publication number
JP2011232110A5
JP2011232110A5 JP2010101474A JP2010101474A JP2011232110A5 JP 2011232110 A5 JP2011232110 A5 JP 2011232110A5 JP 2010101474 A JP2010101474 A JP 2010101474A JP 2010101474 A JP2010101474 A JP 2010101474A JP 2011232110 A5 JP2011232110 A5 JP 2011232110A5
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JP
Japan
Prior art keywords
image
feature
defect
inspection object
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010101474A
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English (en)
Japanese (ja)
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JP2011232110A (ja
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Publication date
Application filed filed Critical
Priority to JP2010101474A priority Critical patent/JP2011232110A/ja
Priority claimed from JP2010101474A external-priority patent/JP2011232110A/ja
Priority to US13/091,235 priority patent/US20110261189A1/en
Publication of JP2011232110A publication Critical patent/JP2011232110A/ja
Publication of JP2011232110A5 publication Critical patent/JP2011232110A5/ja
Pending legal-status Critical Current

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JP2010101474A 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法 Pending JP2011232110A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010101474A JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法
US13/091,235 US20110261189A1 (en) 2010-04-26 2011-04-21 Inspection apparatus and defect detection method using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010101474A JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法

Publications (2)

Publication Number Publication Date
JP2011232110A JP2011232110A (ja) 2011-11-17
JP2011232110A5 true JP2011232110A5 (enExample) 2013-09-12

Family

ID=44815493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010101474A Pending JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法

Country Status (2)

Country Link
US (1) US20110261189A1 (enExample)
JP (1) JP2011232110A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011232111A (ja) * 2010-04-26 2011-11-17 Olympus Corp 検査装置及び検査装置の用いた欠陥検出方法
WO2015137019A1 (ja) * 2014-03-13 2015-09-17 コニカミノルタ株式会社 温度監視装置、及び、温度監視方法
JP6833366B2 (ja) * 2016-07-06 2021-02-24 キヤノン株式会社 情報処理装置、情報処理装置の制御方法及びプログラム
CN107808378B (zh) * 2017-11-20 2020-08-25 浙江大学 基于垂直纵横线轮廓特征的复杂结构铸件潜在缺陷检测方法
JP7148387B2 (ja) * 2017-12-28 2022-10-05 大和ハウス工業株式会社 外装材の損傷検出方法
CN113761048B (zh) * 2021-11-10 2022-03-25 中大检测(湖南)股份有限公司 地质灾害异常数据可视化处理方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5426506A (en) * 1993-03-22 1995-06-20 The University Of Chicago Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics
JP4590759B2 (ja) * 2001-03-14 2010-12-01 日本電気株式会社 ランド外観検査装置およびランド外観検査方法
JP4331541B2 (ja) * 2003-08-06 2009-09-16 オリンパス株式会社 内視鏡装置
US7489811B2 (en) * 2004-10-08 2009-02-10 Siemens Energy, Inc. Method of visually inspecting turbine blades and optical inspection system therefor
US7689003B2 (en) * 2006-03-20 2010-03-30 Siemens Energy, Inc. Combined 2D and 3D nondestructive examination
US7995829B2 (en) * 2007-08-01 2011-08-09 General Electric Company Method and apparatus for inspecting components

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