JP2011232110A - 検査装置及び検査装置を用いた欠陥検出方法 - Google Patents

検査装置及び検査装置を用いた欠陥検出方法 Download PDF

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Publication number
JP2011232110A
JP2011232110A JP2010101474A JP2010101474A JP2011232110A JP 2011232110 A JP2011232110 A JP 2011232110A JP 2010101474 A JP2010101474 A JP 2010101474A JP 2010101474 A JP2010101474 A JP 2010101474A JP 2011232110 A JP2011232110 A JP 2011232110A
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Japan
Prior art keywords
image
defect
inspection
edge
file
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JP2010101474A
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English (en)
Japanese (ja)
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JP2011232110A5 (enExample
Inventor
Fumio Hori
史生 堀
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Olympus Corp
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Olympus Corp
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Priority to JP2010101474A priority Critical patent/JP2011232110A/ja
Priority to US13/091,235 priority patent/US20110261189A1/en
Publication of JP2011232110A publication Critical patent/JP2011232110A/ja
Publication of JP2011232110A5 publication Critical patent/JP2011232110A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Endoscopes (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
JP2010101474A 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法 Pending JP2011232110A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010101474A JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法
US13/091,235 US20110261189A1 (en) 2010-04-26 2011-04-21 Inspection apparatus and defect detection method using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010101474A JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法

Publications (2)

Publication Number Publication Date
JP2011232110A true JP2011232110A (ja) 2011-11-17
JP2011232110A5 JP2011232110A5 (enExample) 2013-09-12

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JP2010101474A Pending JP2011232110A (ja) 2010-04-26 2010-04-26 検査装置及び検査装置を用いた欠陥検出方法

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US (1) US20110261189A1 (enExample)
JP (1) JP2011232110A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011232111A (ja) * 2010-04-26 2011-11-17 Olympus Corp 検査装置及び検査装置の用いた欠陥検出方法
WO2015137019A1 (ja) * 2014-03-13 2015-09-17 コニカミノルタ株式会社 温度監視装置、及び、温度監視方法
JP2019120693A (ja) * 2017-12-28 2019-07-22 大和ハウス工業株式会社 外装材の損傷検出方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6833366B2 (ja) * 2016-07-06 2021-02-24 キヤノン株式会社 情報処理装置、情報処理装置の制御方法及びプログラム
CN107808378B (zh) * 2017-11-20 2020-08-25 浙江大学 基于垂直纵横线轮廓特征的复杂结构铸件潜在缺陷检测方法
CN113761048B (zh) * 2021-11-10 2022-03-25 中大检测(湖南)股份有限公司 地质灾害异常数据可视化处理方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002267428A (ja) * 2001-03-14 2002-09-18 Nec Corp ランド外観検査装置およびランド外観検査方法
JP2005055756A (ja) * 2003-08-06 2005-03-03 Olympus Corp 内視鏡装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5426506A (en) * 1993-03-22 1995-06-20 The University Of Chicago Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics
US7489811B2 (en) * 2004-10-08 2009-02-10 Siemens Energy, Inc. Method of visually inspecting turbine blades and optical inspection system therefor
US7689003B2 (en) * 2006-03-20 2010-03-30 Siemens Energy, Inc. Combined 2D and 3D nondestructive examination
US7995829B2 (en) * 2007-08-01 2011-08-09 General Electric Company Method and apparatus for inspecting components

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002267428A (ja) * 2001-03-14 2002-09-18 Nec Corp ランド外観検査装置およびランド外観検査方法
JP2005055756A (ja) * 2003-08-06 2005-03-03 Olympus Corp 内視鏡装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011232111A (ja) * 2010-04-26 2011-11-17 Olympus Corp 検査装置及び検査装置の用いた欠陥検出方法
WO2015137019A1 (ja) * 2014-03-13 2015-09-17 コニカミノルタ株式会社 温度監視装置、及び、温度監視方法
JP2019120693A (ja) * 2017-12-28 2019-07-22 大和ハウス工業株式会社 外装材の損傷検出方法
JP7148387B2 (ja) 2017-12-28 2022-10-05 大和ハウス工業株式会社 外装材の損傷検出方法

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Publication number Publication date
US20110261189A1 (en) 2011-10-27

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