JP2011180047A - Pantograph monitoring system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a pantograph monitoring system detecting existence of defect or scooped-out in a shoe installed on a pantograph head by analyzing an image above a roof of a train. <P>SOLUTION: The pantograph monitoring system includes a monitoring camera which images above a roof of a train and an image processor which monitors condition of a pantograph by image-processing an image of the inspecting pantograph taken by the monitoring camera. The image processing part is equipped with a means, for inspecting and processing pantograph condition, having an image comparator 5h for small area to be inspected which compares an image of a pantograph head on a preset reference image with an image of the pantograph head on the input image and a comparison determination part 5i which determines existence of defect or scooped-out of the pantograph head based on the compared result. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an apparatus for inspecting the state of a pantograph by analyzing an image taken on a roof of a train, and in particular, detects the presence or absence of a chipping or a twist of a sliding board installed on the hull of the pantograph. The present invention relates to a pantograph monitoring device.

  2. Description of the Related Art Conventionally, an apparatus for measuring the thickness of a sliding board has been proposed as an apparatus for analyzing a pantograph state by analyzing an image taken on a roof of a train. For example, in Patent Document 1, an image obtained by photographing a pantograph from obliquely above by irradiating a flash lamp is used to detect a joining plane line between the upper surface of the sliding plate and the sliding plate and the hull from the luminance difference between the captured images, An apparatus is disclosed for determining the thickness of a strip as the distance between the edge of the top surface and the edge of the coupling surface line.

  Further, in Patent Document 2, an image obtained by photographing a pantograph from a slightly lower side than the horizontal by stroboscopic irradiation is used, and a gray edge is detected from the image, and the edges are connected to each other by connecting the edges. An apparatus for obtaining coordinate values and obtaining the thickness of a sliding plate from the difference between these coordinate values is disclosed.

JP 2004-312832 A JP 2002-150271 A

  The apparatuses described in Patent Documents 1 and 2 are apparatuses that measure the thickness of a sliding board installed on a hull of a pantograph by analyzing an image obtained by photographing the pantograph. For this reason, it is possible to inspect the wear state of the sliding plate as the state of the pantograph. The wear of the sliding plate is caused by gradually scraping the sliding plate due to the contact between the overhead wire and the sliding plate during traveling for supplying electric power to the electric train.

  However, as an abnormality occurring in the sliding plate, in addition to wear, as shown in FIG. 9, a chip 13 partially generated in the sliding plate 1b installed in the hull of the pantograph 1a, or a defect shown in FIG. There is a drowning 14 like this. The chip 13 and the sag 14 of the slip plate are large and small breaks that have occurred in the slip plate 1b. This occurs when a peripheral structure that supports the overhead wire contacts the sliding plate 1b for some reason during traveling of the train.

  As shown in FIGS. 9 and 10, if the train continues to run in the state where the slip plate 1 b is notched 13 or wrinkled 14, the overhead wire contacting the slide plate 1 b and the peripheral structure supporting the overhead wire are damaged. there is a possibility. For this reason, it is necessary to stop a train and to suppress damage to an overhead wire and surrounding structures depending on the degree of chipping 13 or twisting 14 generated in the sliding plate 1b.

  For this reason, the present invention analyzes an image taken on the roof of a train, and can detect the presence or absence of chipping or twisting of a sliding board installed on the hull of the pantograph. An object is to provide an apparatus.

  A pantograph monitoring device according to a first aspect of the present invention for solving the above-described problem is a monitoring unit that monitors the state of a pantograph by performing image processing on an input image captured by the imaging unit and an imaging unit that captures an image on the roof of a train. In the pantograph monitoring device provided with the image processing means for performing the above processing, the image processing means includes a slip board installed in a hull of a pantograph on a reference image registered in advance, and the slide board on the input image. A pantograph state inspection processing unit for comparing and monitoring the state of the sliding plate is provided.

  Further, the pantograph monitoring device according to the second invention is the pantograph monitoring device according to the first invention, wherein the pantograph state inspection processing means is sequentially located at the same position with respect to the hull of the reference image and the input image. Inspection small region setting means for setting a small region of the shape, inspection small region image comparison means for comparing images in each of the small regions, and comparison determination means for determining whether there is an abnormality for each of the small regions. It is characterized by.

  The pantograph monitoring device according to a third aspect of the invention is the pantograph monitoring device according to the second aspect of the invention, wherein the pantograph state inspection processing means positions the small region on the input image with respect to one input image. And inspection small region abnormality result data organizing means for creating inspection small region abnormality result data that associates the presence or absence of abnormality in the small region with each other.

  The pantograph monitoring device according to a fourth aspect of the invention is the pantograph monitoring device according to the third aspect of the invention, wherein the pantograph state inspection processing means collects the small areas adjacent to each other that are determined to be abnormal. An abnormality result detecting means for detecting a detection portion and outputting the position of the abnormality detection portion and the number of the small regions included in the abnormality detection portion is provided.

  According to a fifth aspect of the pantograph monitoring apparatus, in the pantograph monitoring apparatus according to the third or fourth aspect of the invention, image data input means for capturing the input image, pantograph detection information input means for acquiring pantograph detection information, Inspection setting means for outputting inspection setting information including an inspection range for the sliding plate, a size of the small region, and an interval for setting the small region, and a relative relationship between the pantograph on the input image based on the pantograph detection information A pantograph relative position calculating unit for calculating a position; and a result data output unit for outputting the inspection small region abnormality result data, wherein the inspection small region setting unit is configured to perform the inspection on the reference image based on the inspection setting information. Inspection small region setting position specifying means for outputting the position of the small region, the relative position of the pantograph and the reference Characterized by comprising the inspection small area position coordinate conversion means for determining the position of the small area on the input image based on the position of the small area on the image.

  According to the pantograph monitoring apparatus according to the first invention described above, the photographing means for photographing the train roof, and the image processing means for monitoring the state of the pantograph by image processing the input image photographed by the photographing means; In the pantograph monitoring device, the image processing means compares the sliding plate installed on the hull of the pantograph on the reference image registered in advance with the sliding plate on the input image to determine the state of the sliding plate. Because it has a pantograph state inspection processing means to monitor, it can analyze the images taken on the roof of the train and detect the presence or absence of slipping boards or drooping installed on the hull of the pantograph. Damage to surrounding structures that support the can be prevented.

  Further, according to the pantograph monitoring apparatus according to the second aspect of the invention, the pantograph state inspection processing means includes inspection small area setting means for sequentially setting small areas of the same shape at the same position with respect to the hull of the reference image and the input image.・ Equipped with inspection small area image comparison means for comparing images in each small area and comparison judgment means for judging the presence / absence of abnormality for each small area, so that chipping and wrinkling occurring on the sliding plate can be detected with high accuracy. can do.

  According to the pantograph monitoring device of the third invention, the pantograph state inspection processing means associates the position of the small area on the input image with the presence or absence of abnormality in the small area for one input image. Since the inspection small region abnormality result data organizing means for creating the inspection small region abnormality result data is provided, it is possible to acquire detailed information on the chipping and wrinkling occurring in the sliding plate.

  Further, according to the pantograph monitoring device according to the fourth aspect of the invention, the pantograph state inspection processing means detects an abnormality detection portion that is a collection of mutually adjacent small areas that are determined to be abnormal, and the abnormality detection portion Since the abnormality result detection means for outputting the position and the number of small regions included in the abnormality detection portion is provided, information for judging the degree of chipping or wrinkling that has occurred on the sliding plate can be presented.

  Further, according to the pantograph monitoring apparatus according to the fifth invention, the image data input means for capturing the input image, the pantograph detection information input means for acquiring the pantograph detection information, the inspection range for the slide plate, the size of the small area, and Inspection setting means for outputting inspection setting information consisting of intervals for setting small areas, pantograph relative position calculating means for calculating the relative position of the pantograph on the input image based on the pantograph detection information, and inspection small area abnormality result data Output result data output means, and the inspection small area setting means outputs inspection small area setting position specifying means for outputting the position of the small area on the reference image based on the inspection setting information, the relative position of the pantograph and the reference image And inspection small region position coordinate conversion means for obtaining the position of the small region on the input image based on the position of the small region on the upper side. In, it is possible to reliably detect missing or scooped occurred sliding plate.

It is explanatory drawing which shows the example of installation of the pantograph monitoring apparatus which concerns on Example 1 of this invention. It is a block diagram which shows schematic structure of the pantograph state inspection process part which concerns on Example 1 of this invention. FIG. 3A is an explanatory diagram illustrating an example of an inspection small region set in the reference pantograph image, and FIG. 3B is an explanatory diagram illustrating an example of an inspection small region set in the inspection pantograph image. It is explanatory drawing which shows the example of a setting of the test | inspection range in Example 1 of this invention. It is explanatory drawing which shows the example of a setting of the test | inspection small region size and test | inspection small region space | interval in Example 1 of this invention. It is a block diagram which shows schematic structure of the pantograph state inspection process part which concerns on Example 2 of this invention. It is explanatory drawing which shows the example of a detection of the abnormality detection area | region in Example 2 of this invention. It is explanatory drawing which shows the example of a detection of the abnormality detection part in Example 2 of this invention. It is explanatory drawing which shows the example of the chip | tip which generate | occur | produced in the pantograph slip board. It is explanatory drawing which shows the example of the twist which generate | occur | produced in the pantograph slip board.

  Hereinafter, the details of the pantograph monitoring apparatus according to the present invention will be described with reference to the drawings.

  A first embodiment of the pantograph monitoring apparatus according to the present invention will be described with reference to FIGS. FIG. 1 is an explanatory view showing an installation example of a pantograph monitoring apparatus according to the present embodiment, FIG. 2 is a block diagram showing a schematic configuration of a pantograph state inspection processing unit according to the present embodiment, and FIG. 3 shows an example of an inspection small area. FIG. 4 is an explanatory diagram showing an example of setting the inspection range in this embodiment, and FIG. 5 is an explanatory diagram showing an example of setting the inspection small region size and the inspection small region interval in this embodiment.

  As shown in FIG. 1, in this embodiment, the pantograph monitoring device is illuminated by a sensor 2 for detecting the approach of the train 1, a lighting device 3 that illuminates the roof of the train 1, and a lighting device 3 on the roof of the train 1. A monitoring camera 4 as a photographing means for photographing a region to be captured, and an image processing device 5 as an image processing means connected to the sensor 2, the illumination device 3, and the monitoring camera 4.

  The sensor 2 measures, for example, vibration of the rail 6 and is attached to the rail 6 and connected to a train approach warning unit (not shown) as train approach warning means. The train approach warning unit detects whether or not the train 1 is approaching according to the output of the sensor 2, and if it is determined that the train 1 is approaching, the train approach signal is sent as an alarm to the image processing device 5. It transmits to the imaging | photography process part 5A mentioned later.

  The lighting device 3 is installed in front of the traveling direction of the train 1 with respect to the sensor 2, and is configured to be turned on and off based on a signal from the imaging processing unit 5A.

  The surveillance camera 4 is installed at approximately the same position as the illumination device 3 so as to photograph an area illuminated by the illumination device 3 on the roof of the train 1, and starts photographing based on a signal from the photographing processing unit 5A. It is configured to do termination. An image captured by the monitoring camera 4 is transmitted to a pantograph search processing unit 5B described later of the image processing device 5.

  The position where the lighting device 3 and the monitoring camera 4 are installed is a position separated from the sensor 2 by a predetermined distance, for example, when the monitoring camera 4 is activated based on the output of the sensor 2, the train 1 performs this monitoring. The position at which shooting by the monitoring camera 4 can be started immediately before entering the field of view of the camera 4 is made.

  The image processing apparatus 5 includes a photographing processing unit 5A that controls photographing of the pantograph 1a, a pantograph search processing unit 5B that detects the pantograph 1a from the images photographed by the monitoring camera 4, and a pantograph 1a photographed by the monitoring camera 4. As a pantograph state inspection processing means for detecting a chipping or a wrinkle of a sliding board 1b (refer to FIG. 3 etc.) installed in a hull part of the pantograph 1a (hereinafter referred to as a pantograph hull). And a pantograph state inspection processing unit 5C.

  The imaging processing unit 5 </ b> A is a part that performs processing for imaging the roof of the train 1 that passes by controlling the sensor 2, the illumination device 3, and the monitoring camera 4.

  The pantograph detection processing unit 5B detects the image of the pantograph 1a from the image on the roof of the train 1 photographed by the photographing processing unit 5A, and outputs the position of the pantograph 1a on the image as pantograph detection information together with the image data. This is the part that performs processing.

  The pantograph state inspection processing unit 5C is a part that analyzes the image of the pantograph 1a detected by the pantograph search processing unit 5B and performs processing for detecting the presence or absence of the slipping plate 1b.

  Here, the processing in the imaging processing unit 5A and the pantograph search processing unit 5B uses a known method (for example, see Japanese Patent Application No. 2009-014850), and detailed description thereof is omitted.

  Hereinafter, the pantograph state inspection processing unit 5C will be described in detail. As shown in FIG. 2, the pantograph state inspection processing unit 5C includes an image data input unit 5a as an image data input unit, a pantograph detection information input unit 5b as a pantograph detection information input unit, and a setting unit 5c as an inspection setting unit. Storage unit 5d, pantograph relative position calculation unit 5e as pantograph relative position calculation unit, inspection small region position designation unit 5f as inspection small region setting position designation unit, and inspection small region position coordinate conversion as inspection small region position coordinate conversion unit Unit 5g, inspection small region image comparison unit 5h as inspection small region image comparison unit, comparison determination unit 5i as comparison determination unit, inspection small region abnormality result data organization unit 5j as inspection small region abnormality result data organization unit, and The result data output unit 5k is provided as result data output means.

  The image data input unit 5a includes a reference pantograph image 7 as shown in FIG. 3A extracted from a database (not shown), and an inspection pantograph image 8 as shown in FIG. Are input from the pantograph search processing unit 5B. The reference pantograph image 7 and the inspection pantograph image 8 are stored in the storage unit 5d as image data. Here, the reference pantograph image 7 is an image in which the sliding plate 1b selected from the images obtained by photographing the pantograph 1a is not missing or twisted, and is registered in advance in the database. The inspection pantograph image 8 is an image obtained by photographing the pantograph 1a that is the inspection object detected by the pantograph search processing unit 5B among the images photographed by the monitoring camera 4 controlled by the photographing processing unit 5A.

  The pantograph detection information input unit 5b inputs pantograph detection information including the position of the pantograph 1a on the inspection pantograph image 8 from the pantograph search processing unit 5B. The input pantograph detection information is stored in the storage unit 5d.

The setting unit 5c includes an inspection range 10 (see FIG. 4), inspection small region sizes W ₁ and W ₂ (see FIG. 5), inspection small region intervals D ₁ and D ₂ (see FIG. 5), and an inspection small region comparison threshold. The values are set and these are collected as inspection setting information. The inspection setting information is stored in the storage unit 5d. Here, as shown in FIG. 4, the inspection range 10 is an area surrounding the pantograph boat in the image (reference pantograph image 7, inspection pantograph image 8), and the inspection small region sizes W ₁ and W ₂ are as shown in FIG. Parameters for determining the size of small areas 9a and 9b (hereinafter referred to collectively as small areas 9), inspection small area intervals D ₁ and D ₂ , which determine the intervals for setting the inspection small areas 9, are described below. It is a parameter and is set so that adjacent inspection small regions 9 overlap each other. The small areas 9a and 9b are areas set as comparison targets at the same position on the pantograph boat body of the reference pantograph image 7 and the inspection pantograph image 8 as shown in FIG. The inspection small region comparison threshold is based on the comparison result between the images of the portions corresponding to the inspection small region 9 of the reference pantograph image 7 and the inspection pantograph image 8 (hereinafter referred to as “partial image”). This is a threshold value set in advance to determine whether or not there is any chipping or dripping.

  The storage unit 5d inputs and stores data output from each processing unit, and outputs necessary data to a desired processing unit in response to a request from each processing unit.

  The pantograph relative position calculation unit 5e inputs the pantograph detection information from the storage unit 5d, calculates the relative relationship between the position of the pantograph 1a on the reference pantograph image 7 and the position of the pantograph 1a on the inspection pantograph image 8, and outputs the result. It is summarized as pantograph relative position information. The pantograph relative position information is stored in the storage unit 5d.

  In short, as shown in FIG. 3, the position of the pantograph 1a on the reference pantograph image 7 and the position of the pantograph 1a on the inspection pantograph image 8 may be different from each other. Therefore, in order to set the small regions 9a and 9b at the same position on the sliding plate 1b with respect to the sliding plate 1b in the images of the reference pantograph image 7 and the inspection pantograph image 8, respectively, It is necessary to know the position of the pantograph 1a in each image of the pantograph image 8, in other words, the relative position of the pantograph 1a on the inspection pantograph image 8 with respect to the position of the pantograph 1a on the reference pantograph image 7. Therefore, in this embodiment, the pantograph relative position calculation unit 5e obtains the relative relationship between the position of the pantograph 1a on the reference pantograph image 7 and the position of the pantograph 1a on the inspection pantograph image 8 based on the pantograph detection information.

The inspection small area position designation unit 5f inputs the inspection range 10, the inspection small area sizes W ₁ and W ₂ , and the inspection small area intervals D ₁ and D ₂ from the storage unit 4d, and the inspection range in the reference pantograph image 7 The reference small area 9a is sequentially set at a desired position within 10, and the position of the reference small area 9a is output as the reference small area position Pa (see FIG. 5). The reference small area position Pa is stored in the storage unit 5d.

  The inspection small region coordinate conversion unit 5g inputs the reference small region position Pa and the pantograph relative position information from the storage unit 5d, and determines the position in the inspection range 10 in the inspection pantograph image 8 corresponding to the reference small region position Pa. It is calculated as the inspection small region position Pb (see FIG. 3) by coordinate conversion. The inspection small area position Pb is stored in the storage unit 5d. As described above, the inspection small region coordinate conversion unit 5g obtains a position on the inspection pantograph image 8 corresponding to the reference small region 9a based on the pantograph relative position information, thereby allowing each of the reference pantograph image 7 and the inspection pantograph image 8 to be obtained. A reference small area 9a and an inspection small area 9b can be set at the same position with respect to the sliding plate 1b on the image. Hereinafter, the reference small region position Pa and the inspection small region position Pb are collectively referred to as a small region position P.

The inspection small region image comparison unit 5h inputs the reference pantograph image 7, the inspection pantograph image 8, and the small region position 9 from the storage unit 5d, and compares partial images corresponding to the reference small region 9a and the inspection small region 9b, respectively. The comparison result is stored in the storage unit 5d. Here, the comparison between the two images uses a known method such as absolute value difference, normalized correlation, direction code collation (see Reference 3), etc., and the processing by the inspection small region image comparison unit 5h It is assumed that the entire inspection area 10 is performed based on the sizes W ₁ and W ₂ and the inspection small area intervals D ₁ and D ₂ .

  The comparison determination unit 5i inputs the comparison result and the inspection small region comparison threshold value from the storage unit 5d, and if a difference equal to or larger than the inspection small region comparison threshold value is recognized in the comparison result by the inspection small region image comparison unit 5h, Judge that there is an abnormality in the part. The determination result is stored in the storage unit 5d as missing data.

  The inspection small region abnormality result data organizing unit 5j inputs the inspection small region position Pb and missing / missing presence / absence data, and associates the inspection small region position Pb and missing / missing presence / absence data for one inspection pantograph image 8. A list is created and compiled as inspection small area abnormality result data. The inspection small area abnormality result data is stored in the storage unit 5d.

  The result data output unit 5k takes out the inspection small region abnormality result data from the storage unit 5d and outputs it as a pantograph state inspection result.

  Next, the flow of processing by the pantograph state inspection processing unit 5C will be briefly described. In the pantograph state inspection processing unit 5C of the present embodiment, first, image data and pantograph detection information are input in the image data input unit 5a and the pantograph detection information input unit 5b.

  Next, in the setting unit 5c, the pantograph relative position calculation unit 5e, the inspection small region position designation unit 5f, and the inspection small region position coordinate conversion unit 5g, the same in the inspection range 10 with respect to the reference pantograph image 7 and the inspection pantograph image 8, respectively. The reference small area 9a and the inspection small area 9b are set at the positions.

  Subsequently, the inspection small region comparison unit 5h compares the partial image corresponding to the reference small region 9a with the partial image corresponding to the inspection small region 9b using absolute value difference, normalized correlation, direction code verification, or the like. Do.

  Thereafter, in the comparison determination unit 5i, whether the difference between the two partial images is equal to or greater than a preset inspection small region comparison threshold value with respect to the comparison result by the inspection small region image comparison unit 5h. And the presence or absence of chipping or twisting of the sliding plate 1b is output.

Subsequently, the inspection small region abnormality result data organizing unit 5j creates inspection small region abnormality result data associated with the small region position P and the presence or absence of chipping determined by the comparison determination unit 5i, and this is generated as a result data output unit. At 5k, output as a pantograph state inspection result.
These processes are repeated until the inspection is completed.

  According to the pantograph monitoring apparatus according to the present embodiment configured as described above, it is possible to detect the presence or absence of chipping or dripping of the sliding plate 1b from an image obtained by photographing the roof of the train 1 with the monitoring camera 4.

  A second embodiment of the pantograph monitoring apparatus according to the present invention will be described with reference to FIGS. FIG. 6 is a block diagram showing a schematic configuration of the pantograph state inspection processing unit according to the present embodiment, FIG. 7 is an explanatory diagram showing an example of an abnormal inspection small region detected by the pantograph monitoring apparatus according to the present embodiment, and FIG. It is explanatory drawing which shows an example of the abnormality detection part detected by the pantograph monitoring apparatus which concerns on a present Example.

  The pantograph monitoring apparatus according to the present embodiment is obtained by adding an abnormality result detection unit 5l as an abnormality result detection unit shown in FIG. 6 to the pantograph monitoring apparatus of the first embodiment described above. The other configuration is the same as the configuration shown in FIG. 2 and described above. Hereinafter, the same units as those described in the first embodiment will be denoted by the same reference numerals, and redundant description will be omitted. explain.

As shown in FIG. 6, the abnormal result detection unit 5l takes out the inspection small region abnormality result data and the inspection small region sizes W ₁ and W ₂ from the storage unit 5d, and overlaps a plurality (as shown in FIG. 7). A set of (10) abnormality inspection subregions 11 is detected as one abnormality detection portion 12 as shown in FIG. Then, the position of the abnormality detection portion 12 in one inspection pantograph image 8 and the number of abnormality inspection subregions 11 included therein are collected as abnormality detection result data. The abnormality detection result data is stored in the storage unit 5d. Here, the abnormal inspection small region 11 is a rectangular region formed by integrating the inspection small region 9 in which an abnormality is found in the comparison determination unit 5i, and the abnormality detecting portion 12 is a plurality of overlapping abnormality inspection small regions 11 integrated together.

  In the present embodiment, the result data output unit 5k extracts and outputs the abnormality detection result data from the storage unit 5d in addition to the processing in the result data output unit 5k of the first embodiment.

  Next, processing by the pantograph state inspection processing unit 5C of the present embodiment will be briefly described. In the present embodiment, in the pantograph state inspection processing unit 5C, compared to the pantograph state inspection processing according to the first embodiment, the comparison judgment unit 5i has a chipping or squeezing of the sliding plate 1b based on the inspection small region comparison threshold value. The process after the process of outputting the presence / absence of this is different. Hereinafter, since the process until the process by the comparison determination unit 5i is the same as that of the first embodiment, the description thereof is omitted.

  In the pantograph state inspection processing unit 5C of the present embodiment, after the processing by the comparison determination unit 5i described above, the abnormality result detection unit 5l detects a set of a plurality of abnormal inspection subregions 11 that are overlapped as the abnormality detection portion 12. The position of the abnormality detection portion 12 included in one inspection small region 8 and the number of inspection small regions 9b included therein are collected as abnormality detection result data. Thereafter, the inspection data region abnormality result data and the abnormality detection result data are output as the pantograph state inspection result by the result data output unit 5k. These processes are repeated until the inspection is completed.

  According to the above-described pantograph monitoring device according to the present embodiment, in addition to the effects of the pantograph monitoring device according to the first embodiment, it is possible to acquire the scale of chipping or twisting of the sliding plate 1b, and the surroundings that support the overhead wire and the overhead wire It is possible to easily detect a large breakage of the sliding plate 1b with a very high risk of damaging the structure.

  In addition, this invention is not limited to the Example mentioned above, It cannot be overemphasized that a various change is possible in the range which does not deviate from the meaning of this invention. For example, in the first and second embodiments, data output from each processing unit is stored in the storage unit 5d, and necessary data is output from the storage unit 5d to a desired processing unit in response to a request from each processing unit. For example, data output from each processing unit may be directly input to a desired processing unit.

  The present invention relates to an apparatus for inspecting the state of a pantograph by analyzing an image taken on the roof of a train, and in particular, a pantograph monitoring apparatus for detecting the presence or absence of chipping or twisting of a slab installed in a hull of the pantograph It is suitable for application to.

  DESCRIPTION OF SYMBOLS 1 ... Train, 1a ... Pantograph, 1b ... Sliding plate, 2 ... Sensor, 3 ... Illuminating device, 4 ... Surveillance camera, 5 ... Image processing device, 5A ... Shooting processing unit, 5B ... Pantograph search processing unit, 5C ... Pantograph state Inspection processing unit, 5a ... image data input unit, 5b ... pantograph detection information input unit, 5c ... setting unit, 5d ... storage unit, 5e ... pantograph relative position calculation unit, 5f ... inspection small region position designation unit, 5g ... inspection small Area position coordinate conversion unit, 5h ... inspection small region image comparison unit, 5i ... comparison judgment unit, 5j ... inspection small region abnormality result data organizing unit, 5k ... result data output unit, 5l ... abnormality result detection unit, 6 ... rail, 7 ... Reference pantograph image, 8 ... Inspection pantograph image, 9, 9a, 9b ... Inspection small area, 10 ... Inspection range, 11 ... Abnormal inspection small area, 12 ... Abnormality detection part, 13 ... Missing, 14 ... 抉

Claims (5)

  In a pantograph monitoring apparatus comprising: an imaging unit that images a roof of a train; and an image processing unit that monitors the state of the pantograph by performing image processing on an input image captured by the imaging unit, the image processing unit includes: A pantograph state inspection processing unit is provided for comparing the sliding plate installed on the pantograph hull on the reference image registered in advance with the sliding plate on the input image and monitoring the state of the sliding plate. Pantograph monitoring device characterized by.   The pantograph state inspection processing means compares the images in the small areas with inspection small area setting means for sequentially setting small areas of the same shape at the same position with respect to the boat body of the reference image and the input image. 2. The pantograph monitoring apparatus according to claim 1, further comprising inspection small region image comparison means and comparison determination means for determining presence / absence of abnormality for each of the small regions.   Inspection in which the pantograph state inspection processing means creates inspection small region abnormality result data in which the position of the small region on the input image and the presence or absence of abnormality in the small region are associated with one input image 3. The pantograph monitoring device according to claim 2, further comprising small area abnormality result data organizing means.   The pantograph state inspection processing means detects an abnormality detection part that is a group of the adjacent small areas determined to be abnormal, and detects the position of the abnormality detection part and the small area included in the abnormality detection part. 4. The pantograph monitoring apparatus according to claim 3, further comprising an abnormality result detecting means for outputting the number.   Inspection setting information comprising image data input means for capturing the input image, pantograph detection information input means for acquiring pantograph detection information, an inspection range for the slide plate, a size of the small area, and an interval for setting the small area Inspection setting means for outputting, pantograph relative position calculation means for calculating the relative position of the pantograph on the input image based on the pantograph detection information, and result data output means for outputting the inspection small region abnormality result data The inspection small region setting means outputs inspection small region setting position designation means for outputting the position of the small region on the reference image based on the inspection setting information; and the relative position of the pantograph and the reference image on the reference image An inspection subregion position coordinate transformation method for obtaining the position of the subregion on the input image based on the position of the subregion. It is composed of a pantograph monitoring apparatus according to claim 3 or claim 4 wherein.

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