JP2011164102A5 - - Google Patents

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Publication number
JP2011164102A5
JP2011164102A5 JP2011018053A JP2011018053A JP2011164102A5 JP 2011164102 A5 JP2011164102 A5 JP 2011164102A5 JP 2011018053 A JP2011018053 A JP 2011018053A JP 2011018053 A JP2011018053 A JP 2011018053A JP 2011164102 A5 JP2011164102 A5 JP 2011164102A5
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JP
Japan
Prior art keywords
field head
waveguide means
light
field
input
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JP2011018053A
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English (en)
Japanese (ja)
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JP5910805B2 (ja
JP2011164102A (ja
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Priority claimed from FI20105110A external-priority patent/FI124951B/fi
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Publication of JP2011164102A publication Critical patent/JP2011164102A/ja
Publication of JP2011164102A5 publication Critical patent/JP2011164102A5/ja
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Publication of JP5910805B2 publication Critical patent/JP5910805B2/ja
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JP2011018053A 2010-02-05 2011-01-31 光学システム Active JP5910805B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä
FI20105110 2010-02-05

Publications (3)

Publication Number Publication Date
JP2011164102A JP2011164102A (ja) 2011-08-25
JP2011164102A5 true JP2011164102A5 (enExample) 2014-03-20
JP5910805B2 JP5910805B2 (ja) 2016-04-27

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ID=41727659

Family Applications (1)

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JP2011018053A Active JP5910805B2 (ja) 2010-02-05 2011-01-31 光学システム

Country Status (4)

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US (1) US8760640B2 (enExample)
JP (1) JP5910805B2 (enExample)
DE (1) DE102011000456B4 (enExample)
FI (1) FI124951B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9194798B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometer for hyperspectral refractive index detection
US9194799B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometers
DE102012102983A1 (de) * 2012-04-05 2013-10-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls
US8692985B1 (en) * 2012-11-19 2014-04-08 J.A. Woollam Co., Inc. Method of determining refractive index of prism shaped material
RU2563310C2 (ru) * 2014-01-09 2015-09-20 Акционерное общество "Швабе-Технологическая лаборатория" (АО "Швабе - Технологическая лаборатория") Способ измерения средней дисперсии света и устройство для его осуществления
DE102015106795A1 (de) * 2015-04-30 2016-11-03 Anton Paar Optotec Gmbh Wellenlängenkalibration für Refraktometer
JP6791081B2 (ja) * 2017-09-26 2020-11-25 株式会社島津製作所 屈折率測定装置及び屈折率測定方法
US10386232B2 (en) * 2017-12-15 2019-08-20 Horiba Instruments Incorporated Compact spectroscopic optical instrument
CN111007037A (zh) * 2019-11-23 2020-04-14 成都佳鑫德科技有限公司 一种基于光学器件的液体浓度测量装置、计算机设备及计算机可读存储介质
FI20206374A1 (en) * 2020-12-28 2022-06-29 Kxs Tech Oy Refractometer
DE102021116991A1 (de) 2021-07-01 2023-01-05 Hochschule Düsseldorf Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zum Bestimmen frequenzabhängiger Brechungsindizes

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4306805A (en) * 1979-06-04 1981-12-22 Arrington James R Refractometric device
JPS6111637A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体センサ
JPH0652238B2 (ja) * 1988-02-03 1994-07-06 株式会社フジクラ 流体屈折計およびこれを用いた流体密度計
DE3831346A1 (de) * 1988-09-15 1990-04-05 Zeiss Carl Fa Refraktometer mit brechzahlabhaengiger aperturteilung
US5042893A (en) * 1990-11-09 1991-08-27 Hewlett-Packard Company Direct mount coupling to a spectrophotometer
FI96451C (fi) * 1993-09-07 1996-06-25 Janesko Oy Refraktometri
JPH10318919A (ja) * 1997-05-19 1998-12-04 Nippon Soken Inc 屈折率測定装置
US6496636B1 (en) * 1997-06-13 2002-12-17 Mark Stephen Braiman Support planar and tapered quasi-planar germanium waveguides for infrared evanescent-wave sensing
US6070093A (en) * 1997-12-02 2000-05-30 Abbott Laboratories Multiplex sensor and method of use
US6538727B2 (en) * 2000-04-17 2003-03-25 Paul H. Nicholas Electronic device for distinguishing sugar sweetened beverages from artificially sweetened ones
JP2003315268A (ja) * 2002-04-19 2003-11-06 Mitsubishi Electric Corp 粉塵検出装置
JP4213441B2 (ja) * 2002-09-20 2009-01-21 シャープ株式会社 トナー飛散量検出装置および画像形成装置
US20050151975A1 (en) * 2004-01-14 2005-07-14 Ivan Melnyk Fabry-perot fiber optic sensing device and method
CN101044530B (zh) * 2004-07-02 2010-05-05 古河电气工业株式会社 光供电型传感系统
JP4911606B2 (ja) 2007-03-08 2012-04-04 倉敷紡績株式会社 全反射減衰型光学プローブおよびそれを用いた水溶液分光測定装置
KR20100124737A (ko) 2008-02-01 2010-11-29 레어 라이트, 인크. 임계 주변 반사 분광법을 위한 방법, 장치 및 키트
US7619725B1 (en) 2008-05-12 2009-11-17 Sealite Engineering, Inc. Optically amplified critical wavelength refractometer
GB2460305B (en) 2008-11-11 2010-06-16 Univ Montfort Determining the particle size distribution of a suspension

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