JP2011148046A - Device and method of polishing, and method of testing dressing unit performance - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a polishing device with a dressing unit, regenerating a polishing surface on the surface of a pad by surely dressing a polishing pad while preventing self-excited vibration, in performing a dressing processing in the state where the polishing pad and a dressing member are brought in contact with each other. <P>SOLUTION: The polishing device includes: a substrate holding unit pressing a substrate against the polishing pad on a polishing table so as to polish the substrate; and a dressing unit bringing the dressing member in contact with the polishing pad so as to dress the polishing pad. Further, the dressing unit includes: a container containing inside a dressing unit body; and a weight placed on the container. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a polishing apparatus and method, and a performance testing method for a dressing unit, and in particular, a polishing apparatus and method including a dressing unit for regenerating a polishing pad surface of a polishing apparatus for polishing a semiconductor wafer, and a dressing unit. The present invention relates to a performance test method.

  In manufacturing a semiconductor element, as the miniaturization of the element progresses, the importance of the flat processing technique is increasing. In particular, a CMP (Chemical Mechanical Polishing) apparatus, that is, a chemical mechanical polishing apparatus has become an essential technology. This chemical mechanical polishing apparatus has been used in various processes such as STI (shallow trench isolation), ILD (interlayer dielectric) planarization, and recently, low-k planarization.

  Here, since the surface state of the polishing pad means the state of the surface directly in contact with the workpiece, it is important to maintain the surface state of this pad in a preferable state. A dressing member (also called a dresser) for dressing the pad has an ability to hold the slurry on the pad by abutting the polishing pad and scraping a part of the surface of the pad or by exposing the surface. As good, it is maintained in a state where it can be polished. Since the surface state of this pad deteriorates as it undergoes polishing processing, in order to maintain the preferable surface state, it is necessary to appropriately perform the polishing process during the polishing process or the time during the polishing process. It has been necessary to perform a conditioning (dressing) process.

  As this dresser, a brush dresser is known in addition to a dresser in which diamond abrasive grains are electrodeposited on a metal surface such as stainless steel. As a material used as a brush dresser, a polyamide-based synthetic resin (for example, nylon (registered trademark)) is known.

Further, the dressing unit provided in the polishing apparatus is provided with a mechanism for moving the dresser up and down and a rotating mechanism for rotating the dresser, and performing dressing of the pad by pressing while rotating the dresser.
Further, dressing of the polishing surface of the polishing pad by the above-described dressing unit includes a method of simultaneously performing the polishing of the substrate and a method of performing between the polishing of the substrate. In either method, the polished surface is scraped to some extent by dressing.

In the conventional dressing unit, the polishing pad (polishing surface) is dressed using a dressing member electrodeposited with abrasive grains such as diamond, and the vibration phenomenon of the dressing unit is extremely rare. . However, when a so-called soft pad using a soft material is used, if the dressing is performed using a diamond dresser as a dressing member, the polished surface of the pad after conditioning will be exposed more than necessary. This deteriorates the condition of the polishing surface of the pad, which may adversely affect the polishing performance. Therefore, it is conceivable to dress the pad with a brush so that the surface of the pad is not damaged more than necessary when dressing the pad surface.
Furthermore, when the surface of the pad is uneven, or in the case of a polishing pad in which a groove having a complicated shape is formed on the surface, the abrasive grains tend to stay inside the unevenness. A dresser using a brush may be used as a dressing member in order to remove the toner appropriately.

However, it has been found that when this brush dresser is used, a new problem occurs in some cases.
That is, since the tip of the brush contacts the pad surface, the contact area between the brush and the pad becomes extremely small. As a result, the frictional force acting between the pad and the brush becomes very large, so that a so-called stick-slip phenomenon occurs at the contact surface between the dresser and the pad. Stick means stick and slip means slip respectively. Therefore, in general, when an object is slid, it refers to a phenomenon that repeatedly gets caught or slipped on the way and is called a stick-slip phenomenon.
Furthermore, when dressing by using only abrasive brushes on the polishing pad without using abrasive grains such as diamond as a dressing member, the brush itself functions like a “spring” against pressing from above.
Therefore, the stick-slip phenomenon occurs because the frictional force acting between the pad and the brush is very large, and the brush itself also functions like a spring, depending on how the pressing force is applied during dressing. The inventors have newly found that self-excited vibration may occur from the dresser, and in particular, vibration from around the dresser swivel arm may become extremely large.

In general, it is known that self-excited vibration can occur due to special friction (see Non-Patent Document 1). However, solving the problem of self-excited vibration in the brush dresser is important from the following viewpoint. When the dresser is driven, it can be said that there is no problem if the self-excited vibration phenomenon that vibrates itself in some cases does not adversely affect the conditioning of the pad, but vibration occurs. Even after the pad surface was dressed, there was a case where proper dressing was not made. That is, an area where the foreign matter on the pad surface can be removed by vibration and an area where the foreign matter cannot be removed are generated. As a result, there are areas where the foreign matter cannot be removed. , May adversely affect the polishing performance. In addition, such vibration may adversely affect the operation of other devices.
In addition, for polishing pads and soft pads with complicated grooves formed on the surface, a diamond dresser using diamond as a dressing member should be used instead of a brush dresser if the pressing force during dressing is appropriately selected. There is. Also in this case, depending on the conditions, depending on the surface state of the pad, the frictional force acting between the pad and diamond increases, and a self-excited vibration phenomenon may occur. Therefore, even in the case of a diamond dresser, it is important to suppress self-excited vibration during dressing in advance.
Further, if vibration occurs during the polishing process, process loss increases. Therefore, after testing and confirming that no vibration is generated from the dressing unit in advance, it is necessary to install the dressing unit in the polishing apparatus.

Japanese Patent Laid-Open No. 2003-212355 JP 2002-210650 A

Transactions of the Japan Society of Mechanical Engineers (C) Vol.49 No.441 (Akira 58-5) 711-718

  Here, the flat surface of the polishing pad is not a perfect flat surface because it has unevenness at the time of application and the original thickness, and a groove is formed in the polishing pad itself. For example, when performing dressing by bringing the brush into contact with the polishing pad, if the self-excited vibration of the dressing unit is suppressed, it is possible to operate the brush so as to contact the polishing pad groove more accurately, This leads to more reliable dressing. Therefore, how to stably drive the dressing unit or dresser is a problem.

In addition, the combination of the soft pad and the brush dresser has a very large frictional force between the pad and the brush dresser. Excited vibration occurs. In addition, even when the frictional force between the polishing pad and the dressing member increases, self-excited vibration will occur from around the dresser swivel arm.
This self-excited vibration is generated at a frequency substantially equal to the natural frequency of itself (vibrating portion). And measures to make a major structural change by reviewing the main parts can be considered, but there was concern that the cost and lead time to the development of the measures would be enormous.

  In view of the above, the present invention provides a polishing apparatus provided with a dressing unit capable of performing stable dressing by reducing or preventing vibration of the dressing unit, and a polishing method using the polishing apparatus. With the goal. In addition, a dressing unit that can prevent self-excited vibration, reliably perform dressing of the pad, regenerate the polished surface of the pad surface, and reduce the occurrence of micro scratches on the polished surface of the semiconductor wafer. An object is to provide a polishing apparatus provided, and a polishing method using the polishing apparatus. Furthermore, the present invention provides a performance test method for testing a dressing unit so that vibration does not occur from the dressing unit even when dressing conditions change.

That is, in one embodiment of the present invention, a substrate holding unit that presses a substrate against a polishing pad on a polishing table and polishes, and a dressing unit that makes a dressing member contact the polishing pad and makes the polishing pad visible In the polishing apparatus, the dressing unit provides a polishing apparatus having a container that houses the dressing unit main body and a weight placed on the container. As described above, in the present invention, since the container for housing the dressing unit main body as the dynamic damper (dynamic vibration absorber) and the weight are employed on the container, generation of vibration can be reliably suppressed. In addition, since the weight is placed on the container, it is possible to freely adjust the size and frequency of the dynamic vibration absorber by changing the weight load. Can be suppressed. Here, the container refers to a dressing cover or housing that houses the dressing body inside.
Further, in one embodiment of the present invention, a substrate holding unit for holding the substrate and pressing the substrate against a polishing pad on a polishing table for polishing, and a dressing member in contact with the polishing pad to perform the polishing In a polishing apparatus including a dressing unit for visualizing a pad, the dressing unit is mounted on a container that accommodates a dressing unit main body, a dresser flange to which a dressing member is fixed, and a back wheel of the dresser flange. A polishing apparatus having a weight placed thereon. Here, the back wheel is a surface (back surface) different from the dressing member fixing surface of the dresser flange. Thus, in the present invention, since the weight is placed on the back wheel of the dresser flange, harmful vibrations can be reliably and easily suppressed by changing the weight load.
Further, in one embodiment of the present invention, a substrate holding unit for holding the substrate and pressing the substrate against a polishing pad on a polishing table for polishing, and a dressing member in contact with the polishing pad to perform the polishing In a polishing apparatus provided with a dressing unit for visualizing a pad, the dressing unit has a container that accommodates a dressing unit main body therein, and a mechanical pressing mechanism that is placed on the container. A polishing apparatus is provided. As described above, in the present invention, since the container for housing the dressing unit main body as a dynamic damper (dynamic vibration absorber) and the mechanical pressing mechanism placed on the container are employed, the generation of vibration is surely suppressed. did it. In addition, since a mechanical pressing mechanism placed on the container is adopted, it is possible to freely adjust the size and frequency of the dynamic vibration absorber by changing the load mechanically. In addition, harmful vibrations can be suppressed easily.
Preferably, the container that accommodates the dressing unit main body includes a housing that accommodates the dresser shaft and a dresser cover that is provided outside the housing and accommodates the dressing unit main body.
In one embodiment of the present invention, it is preferable to provide a polishing apparatus characterized in that a ball spline is provided around the dresser drive shaft, and a negative gap is formed around the ball spline.
Furthermore, in one embodiment of the present invention, there is provided a performance testing method for a dressing unit, wherein a first pressing load on a dressing member is set, and dressing is performed by the first pressing load, and in the first step A second step of determining the presence or absence of a vibration suppression effect by measuring the generated vibration, and changing the damping means of the dressing unit when it is determined that the vibration suppression effect does not exist; And a third step of changing the pressing load when the determination is made. Since it comprised in this way, in this invention, when it determines with a vibration suppression effect not existing in the damping means which acts as a dynamic damper (dynamic vibration absorber) of a dressing unit when arbitrary dressing loads are applied. Can adjust the size and frequency of the dynamic vibration absorber of the dressing unit, and if a damping effect is observed, add another dressing load to check whether harmful vibrations can be suppressed over the entire dressing load range. Therefore, the vibration resistance of the dressing unit can be ensured.
More preferably, the dressing member is a brush dresser.
More preferably, the dressing member is a diamond dresser.

According to one embodiment of the present invention, since the container for housing the dressing unit main body as the dynamic damper (dynamic vibration absorber) and the dressing unit having the weight on the container are adopted, the main vibration system of the dressing unit Since the natural vibration peak is split into a plurality of peaks by canceling the natural frequency of the vibration generated in the vibration, the vibration can be effectively suppressed or prevented. Moreover, even if vibration energy is generated, a dresser cover that diffuses the vibration energy to the surroundings of the dresser or the ground can be adopted, so that it is possible to prevent the dresser (dressing member) from causing a defective operation due to vibration. it can.
In addition, according to one embodiment of the present invention, it has a container that accommodates the dressing unit body therein, a dresser flange to which the dressing member is fixed, and a weight that is placed on the back wheel of the dresser flange. Since the dressing unit is used, the natural frequency of vibration generated in the main vibration system of the dressing unit is canceled and the natural vibration peak is divided into a plurality of peaks, so that vibration can be effectively suppressed or prevented. In addition, even if vibration energy is generated, a dresser cover that diffuses vibration energy to the surroundings of the dresser or the ground can be adopted, so that the dresser (dressing member) can be prevented from malfunctioning due to vibration. Can do.
Further, according to one embodiment of the present invention, since the dressing unit has a container that accommodates the dressing unit main body and a mechanical pressing mechanism that is placed on the container, the present invention According to this polishing apparatus and method, since the self-excited vibration can be prevented and dressing of the polishing pad can be performed reliably, the polishing surface of the pad surface can be effectively regenerated and the semiconductor wafer can be coated. A polishing apparatus or method including a dressing unit that can reduce generation of micro scratches on the polishing surface can be provided. In addition, since the damper load for suppressing the occurrence of vibration is variable so as to match the vibration state, the occurrence of vibration can be predicted and the self-excited vibration can be effectively prevented.
Further, according to the performance test method for a dressing unit of the present invention, it is possible to install the dressing unit in the polishing apparatus after confirming in advance that no vibration is generated from the dressing unit even if the dressing conditions change. Accordingly, it is possible to minimize process loss during polishing without generating vibration during the polishing process.

It is a top view which shows the arrangement configuration of each part of CMP apparatus (substrate polishing apparatus). It is a perspective view which shows the polish part of CMP apparatus (substrate polishing apparatus). It is the figure which showed typically the internal structure except the cover of the dressing unit. FIG. 4 is a diagram schematically showing the operation of the dressing unit (the diagram showing the operation of the dressing unit main body excluding the cover), and FIG. 4A is a diagram when the operating dressing unit is viewed from above in the vertical direction. It is. 4 (b) is a view of the operating dressing unit as viewed from the side, and FIG. 4 (c) is a partially enlarged view of the edge portion (region U) of the flange in FIG. 4 (b). It is. FIG. 4 (d) is a perspective view of the operating dressing unit as viewed from obliquely above. It is a figure which shows typically the dressing unit in this invention. FIG. 5A is a perspective view of a dressing unit in which a dresser cover is provided outside the housing and the swivel arm and a weight is placed on the top plate of the dresser cover as viewed from above in the vertical direction. FIG. 5 (b) is a perspective view of a dressing unit in which a dresser cover is provided outside the housing and the swivel arm and a weight is placed on the back wheel as viewed from above in the vertical direction. It is the figure which showed typically the mechanism of vibration suppression in this invention. It is a graph which shows the result of having suppressed the relationship between the frequency of the vibration which generate | occur | produced in the turning arm of Z-axis direction, and the transfer function strength, and the natural frequency of the self-excited vibration in the turning arm of Z-axis direction. It is a flowchart of the performance test method of a dressing unit.

  The best mode for carrying out the invention of the apparatus according to the present invention will be described with reference to examples.

  Hereinafter, examples will be described, but the present invention is not limited to the following examples, and various modifications can be made within the scope of the technical idea of the present invention. Here, the embodiment in which the weight is placed on the dresser cover has been described. However, as long as the dynamic damper acts, the weight position is naturally not limited to the form of the following embodiment.

  Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a plan view showing an arrangement configuration of each part of a substrate polishing apparatus according to the present invention. The substrate polishing apparatus includes a polishing table having a polishing surface, a substrate holding unit that holds a substrate to be polished and presses it against the polishing surface of the polishing table, and a film that measures the film thickness of a film formed on the substrate A thickness measuring unit.

  In this substrate polishing apparatus, a transfer robot 1004 moving on a traveling rail 1003 takes out and stores a substrate such as a semiconductor wafer stocked in a cassette 1001 and also places the unpolished and polished substrate on a mounting table 1050. And it is relayed to the transport robot 1020 and reciprocated between the rotary transporter 1027. Then, the substrate on the rotary transporter 1027 is positioned on the polishing table 100 while being held on the top ring 1 of the substrate holding unit described later, so that a plurality of substrates can be polished continuously. The substrate polishing apparatus is systematized. In the figure, reference numerals 1005 and 1022 denote washing machines, which are configured to wash and dry the polished substrate. Reference numeral 1036 denotes a polishing table, which is configured so that the substrate can be polished in two stages. Reference numerals 1038 and 3000 denote dressing units for dressing the polishing tables 100 and 1036, and reference numeral 1043 denotes a water tank for cleaning the dressing unit 1038.

  The substrate polishing apparatus includes an in-line film thickness measurement unit 200 that measures the film thickness of a semiconductor wafer or the like that has been cleaned and dried after polishing. As shown in FIG. 1, before the transfer robot 1004 stores the polished wafer in the cassette 1001, or after the transfer robot 1004 takes out the unpolished wafer from the cassette 1001 (in-line), the sensor coil is used. A conductive film of a substrate such as a semiconductor wafer from an eddy current signal, an optical signal incident and reflected on a polished surface by optical means, a temperature signal of a polished surface, or a reflected signal of a microwave alone or in an appropriate combination A film thickness measuring unit (measuring means) 200 for measuring the film thickness of an insulating film such as a Cu film, a barrier layer, or an oxide film is disposed. Then, the substrate polishing apparatus can detect that the conductive film is removed except for a necessary region such as a wiring portion or the insulating film is removed during or after polishing the substrate. The measurement value is detected by monitoring, the end point of the CMP process is determined, and an appropriate polishing process can be repeated.

  The substrate holding unit (top ring) 1 of this substrate polishing apparatus is an apparatus that holds a substrate such as a semiconductor wafer W to be polished and presses it against the polishing surface on the polishing table as described above. A polishing table 100 having a polishing pad (polishing cloth) 101 attached to the upper surface is provided below the top ring 1 constituting the substrate holding device. A polishing liquid supply nozzle 102 is installed above the polishing table 100, and the polishing liquid Q is supplied onto the polishing pad 101 on the polishing table 100 by the polishing liquid supply nozzle 102. There are various types of polishing pads available on the market, such as SUBA800, IC-1000, IC-1000 / SUBA400 (double-layer cloth) manufactured by Rodel, Surfin xxx-5, Surfin 000 manufactured by Fujimi Incorporated. Nitta Haas VISION PAD 3200/3500, JSR filler pad, etc. SUBA800, Surfin xxx-5, and Surfin 000 are non-woven fabrics in which fibers are hardened with urethane resin, and IC-1000 is a hard foamed polyurethane (single layer). The polyurethane foam is porous (porous) and has a large number of fine dents or pores on its surface.

  FIG. 2 is a perspective view of the polished portion of the CMP apparatus. The polishing unit includes a polishing table 11 that supports the polishing pad 10, a top ring 20 that polishes a polishing pad 10 in sliding contact with a substrate (object to be polished) such as a wafer, and dressing that dresses the dressing pad 10. Unit 30. The polishing pad 10 is attached to the upper surface of the polishing table 11, and the upper surface of the polishing pad 10 constitutes a polishing surface. The polishing table 11 is connected to a motor (not shown), and the polishing table 11 and the polishing pad 10 are rotated by the motor in a direction indicated by an arrow.

  The substrate holding unit 20 holds the substrate and presses the top ring head 21 that presses against the upper surface of the polishing pad 10, the top ring drive shaft 22 connected to the top ring head 21, and the top ring drive shaft 22 rotatably. And a top ring swing arm 23. The top ring swing arm 23 is supported by a top ring swing shaft 24. Inside the top ring swing arm 23, a motor (not shown) connected to the top ring drive shaft 22 is installed. The rotation of the motor is transmitted to the top ring head 21 via the top ring drive shaft 22, whereby the top ring head 21 rotates about the top ring drive shaft 22 in the direction indicated by the arrow.

  A liquid supply mechanism 25 that supplies the polishing liquid and the dressing liquid to the polishing surface of the polishing pad 10 is disposed adjacent to the substrate holding unit 20. The liquid supply mechanism 25 includes a plurality of supply nozzles, and the polishing liquid and the dressing liquid are supplied from the supply nozzles to the polishing surface of the polishing pad 10. The liquid supply mechanism 25 serves as both a polishing liquid supply mechanism that supplies a polishing liquid to the polishing pad 10 and a dressing liquid supply mechanism that supplies a dressing liquid (for example, pure water) to the polishing pad 10. A polishing liquid supply mechanism and a dressing liquid supply mechanism may be provided separately.

  The lower surface of the top ring head 21 constitutes a substrate holding surface that holds the substrate by vacuum suction or the like. The top ring drive shaft 22 is connected to a vertical movement actuator (for example, an air cylinder) not shown. Therefore, the top ring head 21 moves up and down via the top ring drive shaft 22 by the vertical movement actuator.

The substrate is polished as follows. The substrate is held on the lower surface of the top ring head 21, and the top ring head 21 and the polishing table 11 are rotated. In this state, the polishing liquid is supplied to the polishing surface of the polishing pad 10, and the top ring head 21 presses the substrate against the polishing surface of the polishing pad 10. The surface (lower surface) of the substrate is polished by a mechanical polishing action by abrasive grains contained in the polishing liquid and a chemical polishing action of the polishing liquid. The top ring swing shaft 24 is located on the radially outer side of the polishing pad 10. The top ring rocking shaft 24 is configured to be rotatable, so that the top ring head 21 can move between a polishing position on the polishing pad 10 and a standby position outside the polishing pad 10. . Further, when polishing, after the suction of the semiconductor wafer W by the suction portion of the substrate holding unit 1 is released, the semiconductor wafer W is held on the lower surface of the substrate holding unit 1 and the top connected to the top ring drive shaft 11. The ring air cylinder 111 is operated to press the retainer ring 3 (not shown) fixed to the lower end of the substrate holding unit 1 against the polishing surface of the polishing table 100 with a predetermined pressing force. In this state, a pressurized fluid having a predetermined pressure is supplied to a plurality of pressure chambers (not shown) of the substrate holding unit 1 to press the semiconductor wafer W against the polishing surface of the polishing table 100. Then, by flowing the polishing liquid Q from the polishing liquid supply nozzle 102, the polishing liquid Q is held on the polishing pad 101, and the polishing liquid Q is interposed between the surface (lower surface) of the semiconductor wafer W to be polished and the polishing pad 101. Polishing is performed in the existing state.

  The dressing unit 30 has a dresser 31 slidably in contact with the polishing surface of the polishing pad 10 using a soft pad with a soft pad surface, a spline shaft 32 connected to the dresser 31, and a spline shaft 32 that is rotatably held. The swivel arm 4 and a cover 33 that covers the entire body of the dressing unit 30 are provided. The lower surface of the dresser 31 (that is, the lower side of the dresser flange 42) constitutes a dressing surface that is in sliding contact with the polishing surface of the polishing pad 10. Abrasive grains such as diamond particles are fixed to the dressing surface. The turning arm 4 is supported by a motor shaft 34 on which a motor is installed. Inside the revolving arm 4, a rotating belt 38 connected to a motor provided on the motor shaft 34 and the spline shaft 32 is installed. The rotation of the motor 40 is transmitted to the dresser 31 via the swing arm 4 and the spline shaft 32, whereby the dresser 31 rotates about the spline shaft 32 in the direction indicated by the arrow.

  FIG. 3 is a view showing the internal structure of the dressing unit 30 in a form in which the cover 33 provided on the outer periphery of the swivel arm 4 is omitted (the housing 6 is provided inside the cover 33). The rotation motor 40 provides a rotational driving force for the belt 38, and the belt 38 rotates between two axes of the spline shaft 32 and the shaft that supports the rotation motor 40. The belt 38 is made of a material having excellent wear resistance and durability. During dressing, the belt 38 is rotated by the operation of the rotation motor 40. At this time, it rotates in the direction of F in FIG. Further, at the time of dressing, the rotary table 14 rotates in the direction E. Furthermore, at the time of dressing, as shown in FIG. 4B, a pressing force G against the dresser is generated by pressing the dresser downward.

When the belt driving wheel 43 rotates in the direction D and the belt 38 rotates in the direction C, the spline shaft 32 is also configured to rotate in the direction A similarly. The rotation of the spline shaft 32 in the direction A also rotates the brush dresser. As a result, the brush dresser 50 performs dressing as shown in FIG. Here, FIG.4 (d) is the perspective view which looked at FIG.4 (b) from the diagonally upper position.
The air cylinder 5 as a driving mechanism gives a driving force for moving the spline shaft 32 up and down, and can set a dressing pressing force against the brush pad during dressing.

  The swivel arm 4 of the dressing unit is provided around the belt 38 and prevents foreign matters such as dust from entering the belt during the rotation of the belt. Prevents it from spreading into the water. In the vicinity of the swivel arm 4, vibration has occurred in the conventional dressing unit.

  In the embodiment of the present invention, as shown in FIG. 5A, a top plate 51 and a cover 33 are provided on the upper part of the turning arm 4 of the dressing unit. Further, a weight 50 for applying a load is provided on the top plate 51, for example, on the axis of the spline shaft of the dresser on the top plate. That is, FIG. 5A shows a dressing unit provided with a container that accommodates the dressing unit main body and a weight placed on the top of the container. On the other hand, in FIG. 5B, instead of placing a weight on the top of the top plate 51, the weight 51 is placed on the back surface (back wheel) of the surface on which the dressing member of the rotating dresser flange 42 is fixed to suppress vibration. The apparatus configuration as described above is shown. That is, here, the back wheel means a surface (back surface) different from the dressing member fixing surface of the dresser flange, as shown in FIG.

  The dresser cover 33 has a semi-cylindrical shape and is installed at both ends of the turning arm 4. And by accommodating drive parts, such as a motor and an air cylinder, in the inside, those apparatuses are protected from external space.

  A stainless steel top plate 51 is provided on the top surface of the dresser cover 33. The top plate 51 functions as a dynamic damper when vibration occurs in the revolving arm 4.

  Furthermore, a weight (weight, load) 50 having a mass of 1 to 5 kg can be mounted on the top of the top plate 51 as a damper (FIG. 5 (a)). Here, in the present invention, since the weight load is variable, the natural frequency of the main vibration system and the natural frequency of the dynamic damper (dynamic vibration absorber) can be adjusted so as to be substantially the same. It is possible to cope with variations in numbers. Further, as an alternative example to the embodiment of FIG. 5A, an upper portion of the container that accommodates the dressing unit main body, for example, the upper position of the top plate 51 (the position of the weight 50 in FIG. 5A). As a separate pressing means, a pressing mechanism that can apply a variable load, such as a hydraulic cylinder, can be provided. If comprised in this way, it will become possible to perform operation for vibration suppression more simply.

  Here, the dresser cover 33 and the stainless steel top plate 51 serve as a spring and a damper, and the weight 50 serves as a mass. FIG. 6 schematically shows this relationship.

In general, self-excited vibration is generated by converting energy (in this case, frictional force by a brush dresser) to a low natural frequency. However, since the low natural frequency is designed to prevent self-excited vibration from occurring due to increased rigidity, energy is converted to the next lowest (and unmeasured) natural frequency in the Z direction, generating vibration. There was a possibility.
In the present invention, in order to prevent energy conversion to the natural frequency in the Z-axis direction that can occur at the time of dressing, that is, the occurrence of vibration in the vertical direction, 50 was successfully achieved, thereby effectively achieving vibration suppression and vibration prevention.

  In the present invention, a damper or a dynamic damper is a specific vibration frequency by attaching a vibration system consisting of a mass, a spring, and a damper to the main vibration system (part where vibration is to be suppressed) and adjusting this. On the other hand, the structure suppresses the vibration of the main vibration system.

And the experimental result of how the apparatus comprised in this way contributes to suppression of vibration generation and vibration absorption is shown in FIG.
In FIG. 7, the vertical axis represents the transfer function (response sensitivity to input), and the horizontal axis represents frequency (Hz). Here, the Z-axis direction means the direction of the axis perpendicular to the polishing pad, and the X-axis direction and the Y-axis direction are two orthogonal directions on a plane parallel to the polishing pad. It means the axial direction.
FIG. 7 shows the natural vibration result in the Z-axis direction of the vibration generated in the swing arm. When no load is applied directly above the top plate of the dresser swivel arm 300, it can be seen that the natural frequency of the swivel arm in the Z-axis direction has a vibration peak that shows a peak near a frequency of 90 Hz (curve d). -1). Although it is assumed that the self-excited vibration having a natural frequency of around 90 Hz is not likely to occur originally, in this case when the energy due to friction has increased, the self-excited vibration as shown by the curve d-1 has occurred. It is a thing. On the other hand, the curve when a weight of 2 kg is applied as a load member for preventing vibrations directly above the top plate of the dresser swivel arm is d-2. In this case, it was found that when a 2 kg load member was provided immediately above the top plate of the dresser swivel arm, it functions as a dynamic damper, and the peak near the frequency of 90 Hz indicated by the solid line is split.
That is, as is clear from FIG. 7, the natural frequency of the swivel arm in the Z-axis direction is the dynamic damper when a load member for preventing vibration is provided immediately above the top plate of the dresser swivel arm. It can be seen that the natural frequency peak originally generated near 90 Hz is split into two and the vibration is suppressed.

  In addition, there is an optimum value for the weight of the load member placed on the top plate of the dresser revolving arm 4 so that it functions as a dynamic damper. The inventors conducted the following experiment on this point. That is, the test was performed in two cases of 0 kg and 2 kg as the weight of the load member placed on the top plate 51 of the dresser swivel arm 4 (here, when placed on the position of FIG. 5A). The results are shown when the 7 mm dresser brush is used in all cases and the vertical load on the dresser is varied from 100 N to 400 N.

In Table 1, in the brush dresser, the magnitude of vibration of the brush dresser observed when the vertical load (pressing force) on the dresser is changed is measured. For example, in the case of Comparative Example 1 in Table 1, when the vertical load on the dresser is 100 N, the magnitude of the maximum value of the vibration curve of the brush dresser (see FIG. 7 for an example of the vibration curve) It shows that it became 0.01 (Grms). In Comparative Example 1, Comparative Example 2, and Example 1, the conditions other than those shown in the table were all the same. Specifically, a nylon brush (7 mm brush length) is used, and a measurement point is provided on a spline shaft that moves the brush dresser up and down, and the polishing table and the dresser are rotated together. And measured. In Table 1, for example, when a load of 100 N in the case of Comparative Example 1 was applied, the acceleration of vibration was 0.01 Grms, and vibration generation was sufficiently suppressed. However, in this case, since the load is small, there is a possibility that the conspicuous effect cannot always be sufficiently ensured when the uneven state of the pad surface is rough. On the other hand, the vibration values of the values of Comparative Example 2 and Example 1 when a load of 400 N was applied were at a level that can be evaluated as sufficiently suppressing the occurrence of vibration, although the values are different. (However, as will be described later, in the case of Comparative Example 2, vibration is generated by applying an external impact).
Here, when comparing Comparative Example 1 and Comparative Example 2 in Table 1, it was found that vibration was suppressed in the brush dresser using the dresser cover. That is, in the case of the comparative example 2, it is presumed that the natural vibration energy of the vibration is absorbed by using the dresser cover, and the maximum value of the natural vibration is suppressed.
Furthermore, in order to compare Comparative Example 2 and Example 1, a vibration convergence test was performed in which an impact was applied to the top of the dressing unit to forcibly generate vibration. As a result, it was found that vibration was generated when an impact was applied from the outside (Comparative Example 2), but this vibration was also suppressed when a weight was used (Example 1). In the case of Comparative Example 2, the maximum value of the natural vibration is suppressed, but in the case of Example 1, this functioned as a dynamic damper by placing a weight on the container, as shown in the result of FIG. It was estimated that the natural vibration peak was split into multiple peaks.
In Example 1, it was possible to dress the pad while reliably preventing the occurrence of self-excited vibration throughout the dressing process. Further, when the surface state of the polishing pad after sharpening was confirmed, there was no unevenness that caused a problem. Therefore, as compared with the conventional device, the polishing surface of the pad surface can be effectively regenerated and the generation of micro scratches on the polished surface of the semiconductor wafer can be reliably reduced.

That is, from the above experimental results, in order to suppress and prevent the occurrence of vibration of the brush dresser that does not generate vibration even when an impact is applied to the brush, a container that can accommodate the dressing body, a dresser cover is used, In addition, it has been found that it is effective to put a load on the top plate of the dresser swivel arm (preferably above the tip) in order to suppress vibration. Furthermore, from this test result, it was found that the vibration proofing effect can be expected by using the same means even when using a diamond dresser in which the occurrence of vibration is less prominent.
Furthermore, providing a weight near the vibration source is also effective for suppressing vibration.
In addition, although not shown in the table, it is also possible to further suppress vibration by providing a ball spline around the dresser drive shaft and forming a minus gap around the ball spline. Found. In addition, the state defined as “minus gap” here means that when the rigid body is sandwiched, the space width (interval) formed so as to sandwich the rigid body is compared with the diameter of the rigid body. Is a state in which the rigid body is sandwiched so as to have a value smaller than the original diameter dimension value of the rigid body.
Further, instead of providing the ball spline around the dresser driving shaft, an elastic support member made of, for example, an anti-vibration rubber material can be provided to suppress vibration. Even if comprised in this way, vibration suppression can be made more reliable.

Here, the vibration phenomenon is generally expressed as follows.

  That is, when a load is applied on the dresser swivel arm, the damping value is added to increase the ξ value, thereby increasing the damping coefficient and damping the vibration. In the curve d-2 in FIG. 7, the damper effect is effectively exhibited, the maximum peak of the natural vibration in the vicinity of 90 Hz of the curve d-1 is effectively split, and the occurrence of vibration itself is suppressed. Thus, on the container (for example, the top plate of the dresser swivel arm) that accommodates the load in the interior so as to effectively exhibit the effect as a dynamic damper that suppresses the vibration generated in the main vibration system. By arranging at an appropriate position, part of the natural frequency was canceled and the natural vibration peak was split into a plurality of peaks, so that vibration could be effectively suppressed.

  Next, the performance test method for confirming the suppression effect of the vibration generation of the dressing unit that performs dressing will be described. In this method, after the dressing unit described above is provided with the vibration suppressing means, the first pressing load on the dressing member is set and dressed, and then, when it is determined that the vibration suppressing effect does not exist, the vibration After reviewing the suppression means, dressing is performed with the same first pressing load, and testing is performed until a vibration suppression effect is obtained. In addition, when the vibration suppression effect is obtained by performing dressing with the first pressing load, it is tested whether the vibration suppression effect is obtained by performing dressing with another pressing load (second pressing load), It is a dressing unit performance test method for confirming whether the vibration suppressing effect is obtained in the entire pressing load range of the dressing unit (FIG. 8).

That is, in this embodiment, as shown in the flowchart of FIG. 8, first, when dressing the polishing pad by the dressing unit (300), the first pressing load to the dressing member is set and the first pressing load is set. (301, 302. First step).
Next, vibration generated in the first step is measured by a vibration measuring means installed in the vicinity of the polishing table during dressing (303. Optionally, the surface condition of the polishing pad after dressing is measured, for example, by optical measurement. It is possible to confirm that the sharpening effect is ensured by performing scanning / measurement with an apparatus or by visual confirmation). Then, it is determined whether or not there is a vibration suppression effect (304, second step). In order to automatically perform the calculation processing of this determination, a calculation device connected to the vibration measuring means and the pressing load changing means is separately provided. I can do it.
Furthermore, when it is determined that there is no vibration suppressing effect in the second step, the dressing test is continued with the first pressing load after changing the damping means without changing the pressing load on the dressing member ( Return from 305 to 302). If it is determined that there is a vibration suppressing effect in the second step, the pressing load on the dressing member is changed to the second pressing load, and dressing is performed with the second pressing load, and the entire range of pressing load ranges. Subsequently, it is confirmed whether the effect is obtained (306, third step).

  In this embodiment, the presence / absence determination of self-excited vibration and the setting change of the pressing load can be controlled using an arithmetic processor. Therefore, according to the present invention, it is possible to provide a method for quickly performing a performance test of a dressing unit in which vibration suppression is reliably performed.

  The present invention provides a polishing apparatus provided with a dressing unit, a polishing method using the same, and a testing method for the dressing unit, and polishes any material such as a silicon wafer, a compound semiconductor wafer, or a synthetic quartz wafer. It is a method applicable to the performance test of the dressing unit used for the apparatus thru | or the method applicable to the vibration suppression at the time of polishing, and a grinding | polishing apparatus.

1 Substrate holding unit 2 Top ring body 3 Retainer ring 4 Swivel arm (dresser swing arm)
5 Air cylinder 6 Housing 10 Polishing pad 11 Polishing table 20 Substrate holding unit 21 Top ring head 22 Top ring drive shaft 23 Swing arm 24 Top ring rocking shaft 25 Liquid supply mechanism 30 Dressing unit 31 Dresser 32 Spline shaft 33 Cover 34 Motor Axis (dresser swing axis)
35 Coupling 36 Bearing 37 Brush dresser (Brush)
38 Belt 39 Motor shaft 40 Rotating motor 41 Spline nut 42 Dresser flange 43 Belt drive wheel 50 Weight
51 Top plate 100 Polishing table 101 Polishing pad (polishing cloth)
102 Polishing liquid supply nozzle

200 In-line film thickness measurement unit 300 Test started
301 Pressing load to dressing member (first pressing load) setting step 302 Dressing by first pressing load
303 Vibration measurement step 304 Step 305 for determining the presence or absence of a vibration suppression effect based on the measurement result 305 Changing the weight of the weight (by the first pressing load) and further dressing step 306 Changing the pressing load on the dressing member Step 1001 (with second pressing load) 1001 Cassette 1003 Traveling rail 1004 Transfer robot 1005 Cleaning machine 1020 Transfer robot 1022 Cleaning machine 1027 Rotary transporter 1036 Polishing table 1038 Dressing unit 1043 Water tank 1050 Mounting table 3000 Dressing unit

A Rotating direction of the dresser flange B Rotating direction of the spline shaft C Rotating direction of the belt D Rotating direction of the belt drive wheel E Rotating direction of the rotating table F Rotating direction of the dresser G Pressing force against the dresser during dressing

Q Polishing liquid W Semiconductor wafer

Claims (9)

In a polishing apparatus comprising a substrate holding unit that presses and polishes a substrate against a polishing pad on a polishing table, and a dressing unit that contacts the dressing member with the polishing pad to make the polishing pad visible,
The dressing unit is
A container that houses the dressing unit body therein;
A weight placed on the container;
A polishing apparatus characterized by comprising: A substrate holding unit for holding the substrate and pressing the substrate against the polishing pad on the polishing table for polishing, and a dressing unit for bringing the dressing member into contact with the polishing pad and making the polishing pad visible In the polishing machine
The dressing unit is
A container that houses the dressing unit body therein;
A dresser flange to which the dressing member is fixed;
A weight placed on the back wheel of the dresser flange;
A polishing apparatus characterized by comprising: A substrate holding unit for holding the substrate and pressing the substrate against the polishing pad on the polishing table for polishing, and a dressing unit for bringing the dressing member into contact with the polishing pad and making the polishing pad visible In the polishing machine
The dressing unit is
A container that houses the dressing unit body therein;
A mechanical pressing mechanism placed on the container;
A polishing apparatus characterized by comprising:   The container that accommodates the dressing unit main body includes a housing that accommodates a dresser shaft and a dresser cover that is provided outside the housing and accommodates the dressing unit main body. The polishing apparatus according to any one of the above.   The polishing apparatus according to claim 1, wherein a ball spline is provided around the dresser drive shaft, and a minus gap is provided around the ball spline.   A polishing method comprising polishing a substrate using the polishing apparatus according to claim 1. A performance test method for a dressing unit,
A first step of setting a first pressing load on the dressing member and dressing with the first pressing load;
A second step of measuring the vibration generated in the first step and determining the presence or absence of a vibration suppression effect;
A third step of changing the damping means of the dressing unit when it is determined that the vibration suppression effect does not exist, and changing the pressing load when it is determined that the vibration suppression effect exists;
A method for testing the performance of a dressing unit.   The dressing unit performance test method according to claim 7, wherein the dressing member is a brush dresser.   The dressing unit performance test method according to claim 7, wherein the dressing member is a diamond dresser.

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