JP2011028042A5 - - Google Patents

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Publication number
JP2011028042A5
JP2011028042A5 JP2009174328A JP2009174328A JP2011028042A5 JP 2011028042 A5 JP2011028042 A5 JP 2011028042A5 JP 2009174328 A JP2009174328 A JP 2009174328A JP 2009174328 A JP2009174328 A JP 2009174328A JP 2011028042 A5 JP2011028042 A5 JP 2011028042A5
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JP
Japan
Prior art keywords
code sequence
light
reflected light
detection unit
time elapses
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JP2009174328A
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English (en)
Japanese (ja)
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JP2011028042A (ja
JP5347800B2 (ja
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Priority to JP2009174328A priority Critical patent/JP5347800B2/ja
Priority claimed from JP2009174328A external-priority patent/JP5347800B2/ja
Priority to US12/838,521 priority patent/US8243288B2/en
Priority to CN201010231427.4A priority patent/CN101968624B/zh
Publication of JP2011028042A publication Critical patent/JP2011028042A/ja
Publication of JP2011028042A5 publication Critical patent/JP2011028042A5/ja
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Publication of JP5347800B2 publication Critical patent/JP5347800B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009174328A 2009-07-27 2009-07-27 検出システムおよび検出方法 Expired - Fee Related JP5347800B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009174328A JP5347800B2 (ja) 2009-07-27 2009-07-27 検出システムおよび検出方法
US12/838,521 US8243288B2 (en) 2009-07-27 2010-07-19 Object detection system and object detection method
CN201010231427.4A CN101968624B (zh) 2009-07-27 2010-07-20 物体检测系统及物体检测方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009174328A JP5347800B2 (ja) 2009-07-27 2009-07-27 検出システムおよび検出方法

Publications (3)

Publication Number Publication Date
JP2011028042A JP2011028042A (ja) 2011-02-10
JP2011028042A5 true JP2011028042A5 (enExample) 2012-07-19
JP5347800B2 JP5347800B2 (ja) 2013-11-20

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Family Applications (1)

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JP2009174328A Expired - Fee Related JP5347800B2 (ja) 2009-07-27 2009-07-27 検出システムおよび検出方法

Country Status (3)

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US (1) US8243288B2 (enExample)
JP (1) JP5347800B2 (enExample)
CN (1) CN101968624B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012088426A2 (en) 2010-12-23 2012-06-28 Caterpillar Inc. Method and apparatus for measuring ash deposit levels in a particulate filter
WO2012176944A1 (ko) * 2011-06-22 2012-12-27 동국대학교 경주캠퍼스 산학협력단 신뢰성 있는 금속 표면 3차원 형상 추출 기법 및 시스템
CN104994769B (zh) * 2012-11-12 2019-12-17 婴童企业有限责任公司 勺子
US10580386B2 (en) * 2017-04-21 2020-03-03 Ford Global Technologies, Llc In-vehicle projected reality motion correction
US11327162B1 (en) 2017-11-20 2022-05-10 Waymo Llc Methods of calibrating or validating sensors by using a plurality of fiducials
JP6880512B2 (ja) * 2018-02-14 2021-06-02 オムロン株式会社 ３次元測定装置、３次元測定方法及び３次元測定プログラム
CN110940657A (zh) * 2019-12-12 2020-03-31 北京大学 一种对被测物体进行光谱检测的检测系统
WO2025100606A1 (ko) * 2023-11-10 2025-05-15 한국전자기술연구원 비가시 환경에서 로봇의 위치 추정 성능 평가 시스템 및 방법

Family Cites Families (17)

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US4108539A (en) * 1976-11-18 1978-08-22 Hewlett-Packard Company Reflecting lens system
US4820041A (en) * 1986-11-12 1989-04-11 Agtek Development Co., Inc. Position sensing system for surveying and grading
JP3400485B2 (ja) * 1993-03-23 2003-04-28 株式会社ワコム 光学式位置検出装置および光学式座標入力装置
JPH08136222A (ja) * 1994-11-12 1996-05-31 Omron Corp 三次元計測方法およびその装置
JPH10153653A (ja) * 1996-11-25 1998-06-09 Honda Access Corp 車載用レーザレーダ装置及びこれに応用可能なホログラムスキャナ
JP2000147124A (ja) * 1998-11-12 2000-05-26 Denso Corp 車載レーダ装置
JP4144960B2 (ja) 1999-03-18 2008-09-03 三洋電機株式会社 撮像装置及び画像合成装置並びに方法
US6836285B1 (en) * 1999-09-03 2004-12-28 Arete Associates Lidar with streak-tube imaging,including hazard detection in marine applications; related optics
US6545286B1 (en) * 1999-11-03 2003-04-08 The United States Of America As Represented By The Secretary Of The Interior Method and apparatus for water level determination
JP4217021B2 (ja) * 2002-02-06 2009-01-28 株式会社リコー 座標入力装置
JP4004316B2 (ja) * 2002-03-20 2007-11-07 株式会社トプコン 測量装置及び測量装置を用いて画像データを取得する方法
US7136753B2 (en) * 2002-12-05 2006-11-14 Denso Corporation Object recognition apparatus for vehicle, inter-vehicle control apparatus, and distance measurement apparatus
JP2005274232A (ja) * 2004-03-23 2005-10-06 Sharp Corp 位置検出装置、被検出器および位置検出システム
US7360703B2 (en) * 2004-09-23 2008-04-22 Ut-Battelle, Llc Laser scanning system for object monitoring
US7933001B2 (en) * 2005-07-11 2011-04-26 Kabushiki Kaisha Topcon Geographic data collecting system
US8330942B2 (en) * 2007-03-08 2012-12-11 Trimble Ab Methods and instruments for estimating target motion
JP2008286565A (ja) * 2007-05-16 2008-11-27 Omron Corp 物体検知装置

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